Abstract: A light-emitting device is provided. The light-emitting device includes a substrate including a plurality of pixels, each pixel including a plurality of subpixels designed to emit light with different colors. The plurality of subpixels includes a first subpixel designed to emit red light, a second subpixel designed to emit green light, and a third subpixel designed to emit blue light. The first subpixel includes a first light source formed on the substrate, a red light-emitting layer covering the first light source, and a first yellow color filter covering the red light-emitting layer. The second subpixel includes a second light source formed on the substrate, a green light-emitting layer covering the second light source, and a second yellow color filter covering the green light-emitting layer. The third subpixel includes a third light source formed on the substrate. A method for fabricating the light-emitting device is also provided.

Abstract: A detection device for specimens includes an image sensor, a light-guiding structure, and a carrier. The image sensor includes a sensing area and a non-sensing area around the sensing area. The light-guiding structure is disposed on the image sensor. The light-guiding structure includes a central guiding portion, a reflection layer, and first guiding portions. The central guiding portion is located over the sensing area. The reflection layer is disposed on the image sensor and includes channels located over the non-sensing area. The first guiding portions are located in the channels, and connected to the central guiding portion and a side surface of the light-guiding structure. The carrier is disposed on the light-guiding structure, and has wells located over the sensing area. Each of the wells is configured to receive a specimen.

Abstract: A spectrum-inspection device includes a substrate including a first photodiode and a second photodiode. The spectrum-inspection device also includes an interference-type filter disposed over the first and second photodiodes. The interference-type filter allows a first light beam with wavelength of a multi-band to pass through. The multi-band includes a first waveband, a second waveband, a third waveband, and a fourth waveband. The spectrum-inspection device also includes a first absorption-type filter disposed over the first and second photodiodes. The first absorption-type filter allows a second light beam with wavelength of a first region to pass through. The spectrum-inspection device further includes a second absorption-type filter disposed over the second photodiode. The second absorption-type filter is disposed over the first absorption-type filter and allows a third light beam with wavelength of a second region to pass through, wherein the second region overlaps the first region.

Abstract: A filter collimator is provided. The filter collimator includes a substrate having a photodiode. The filter collimator also includes an interference-type and an absorption-type filter film disposed over the substrate. When a first light is incident at a first angle relative to the normal of the top surface of the substrate, the interference-type filter film has a transmittance greater than 50% in a first waveband, and when a second light is incident at a second angle relative to the normal of the top surface of the substrate, the interference-type filter film has a transmittance greater than 50% in a second waveband, the absorption-type filter film has a transmittance greater than 50% in a third waveband, and wherein the first waveband partially overlaps the third waveband, the second waveband does not overlap the third waveband, and the second angle is greater than the first angle.

Abstract: A filter collimator is provided. The filter collimator includes a substrate having a photodiode. The filter collimator also includes an interference-type and an absorption-type filter film disposed over the substrate. When a first light is incident at a first angle relative to the normal of the top surface of the substrate, the interference-type filter film has a transmittance greater than 50% in a first waveband, and when a second light is incident at a second angle relative to the normal of the top surface of the substrate, the interference-type filter film has a transmittance greater than 50% in a second waveband, the absorption-type filter film has a transmittance greater than 50% in a third waveband, and wherein the first waveband partially overlaps the third waveband, the second waveband does not overlap the third waveband, and the second angle is greater than the first angle.

Abstract: An optical sensor includes a sensing layer, a first shading filter, a second shading filter, and an alignment mark. The sensing layer includes an active area, a shading area, and a peripheral area. The sensing layer includes sensing units located in the active area. The first shading filter is disposed on the shading area. The second shading filter is disposed on the first shading filter. The alignment mark is disposed on the peripheral area. When a light beam is emitted to the shading area, the second shading filter is configured to block a first component of the light beam, and the first shading filter is configured to block a second component of the light beam.

Abstract: An optical sensor includes a sensing layer, a first shading filter, a second shading filter, and an alignment mark. The sensing layer includes an active area, a shading area, and a peripheral area. The sensing layer includes sensing units located in the active area. The first shading filter is disposed on the shading area. The second shading filter is disposed on the first shading filter. The alignment mark is disposed on the peripheral area. When a light beam is emitted to the shading area, the second shading filter is configured to block a first component of the light beam, and the first shading filter is configured to block a second component of the light beam.

Abstract: A color filter array having a lower density of the color blue is provided. The color filter array includes: a plurality of color filter units arranged in a 3×3 array. The color filter units include a blue filter and a plurality of other filters, and the blue filter is disposed in the center of each 3×3 array, wherein a number of the blue filter is fewer than that of each kind of the other filters in each 3×3 array.

Abstract: A spectrum-inspection device includes: a sensor unit array including a first sensor unit and a second sensor unit; a dual-band pass filter disposed on the sensor unit array to cover the first sensor unit and the second sensor unit, wherein the dual-band pass filter allows a first waveband and a second waveband of a light beam to pass through; and a filter disposed on the dual-band pass filter to cover the second sensor unit, wherein the filter allows wavelengths of a light beam longer than a first wavelength to pass through, wherein the first wavelength is longer than a peak wavelength of the first waveband and shorter than a peak wavelength of the second waveband.

Abstract: An image sensor includes a sensing layer for sensing a light beam and a number of pixel groups. Each of the pixel groups includes a yellow filter unit allowing a green light component and a red light component of the light beam to pass through, a green filter unit allowing the green light component of the light beam to pass through, and a blue filter unit allowing a blue light component of the light beam to pass through.

Abstract: A light filter structure is provided. The light filter structure includes a first filter layer disposed over the substrate. The first filter layer has a transmittance greater than 50% in a first waveband, wherein the first filter layer is an interference-type filter. The light filter structure further includes a second filter layer disposed over the substrate. The second filter layer has a transmittance greater than 50% in a second waveband, wherein the second filter layer is an absorption-type filter. The first waveband partially overlaps the second waveband at the wavelength in a third waveband, and the third waveband is in an IR region. Furthermore, an image sensor used as a time-of-flight image sensor is also provided.

Abstract: A detection device for specimens includes an image sensor, a light-guiding structure, a carrier, and a light source. The light-guiding structure is disposed on the image sensor, and includes a light-guiding layer and a top layer. The light-guiding layer is disposed on the image sensor. The top layer is disposed on the light-guiding layer. The carrier is disposed on the light-guiding structure. The carrier has a number of wells arranged in an array located over the guiding portions. Each of the wells is configured to receive a specimen.

Abstract: A spectrum-inspection device includes: a sensor unit array including a first sensor unit and a second sensor unit; a dual-band pass filter disposed on the sensor unit array to cover the first sensor unit and the second sensor unit, wherein the dual-band pass filter allows a first waveband and a second waveband of a light beam to pass through; and a filter disposed on the dual-band pass filter to cover the second sensor unit, wherein the filter allows wavelengths of a light beam longer than a first wavelength to pass through, wherein the first wavelength is longer than a peak wavelength of the first waveband and shorter than a peak wavelength of the second waveband.

Abstract: An image-sensor structure is provided. The image-sensor structure includes a substrate with a plurality of photoelectric conversion units formed therein, a plurality of color filters formed above the substrate, wherein the color filters are divided into red color filters, green color filters and blue color filters, a plurality of microlenses correspondingly formed above the color filters, a transparent material layer formed above the microlenses, a first filter blocking infrared (IR) light formed above the transparent material layer, a second filter allowing transmission of visible light formed above the first filter, and a lens module formed above the second filter.

Abstract: A spectrum-inspection device includes a multi-band pass filter, a filter array, and a sensing layer. The multi-band pass filter allows a first waveband, a second waveband, and a third waveband of a light beam to pass through. The light beam passes through the multi-band pass filter forms a multi-band beam. The filter array is disposed under the multi-band pass filter. The filter array includes a first filter allowing wavelengths of the multi-band beam longer than a first wavelength to pass through, a second filter allowing wavelengths of the multi-band beam longer than a second wavelength to pass through, and a third filter allowing wavelengths of the multi-band beam longer than a third wavelength to pass through. The second waveband is between the first wavelength and the second wavelength, and the third waveband is between the second wavelength and the third wavelength.

Abstract: The present invention provides an image sensor, including: a sensor array layer including a plurality of normal sensor units and a pair of autofocus sensor units; a plurality of color filter units disposed on the sensor array layer to cover the plurality of normal sensor units; a pair of IR-pass filter units disposed on the sensor array layer to respectively cover the pair of autofocus sensor units; a micro-lens layer including a plurality of micro-lenses disposed on the color filter units and the IR-pass filter units, wherein one of the pair of autofocus sensor units detects infrared light came from a first side, and the other of the pair of autofocus sensor units detects infrared light came from a second side opposite to the first side to perform a phase detection autofocus function.

Abstract: An image-sensor structure is provided. The image-sensor structure includes a plurality of color filter patterns divided into a first unit including one green filter, a second unit including one green filter, a third unit including one blue filter, and a fourth unit including one red filter, wherein the first unit is adjacent to the second unit; and a plurality of microlenses formed above the color filter patterns, wherein the microlenses are divided into a first microlens unit having one microlens above the one green filter of the first unit and the one green filter of the second unit, a second microlens unit above the one blue filter of the third unit, and a third microlens unit above the one red filter of the fourth unit.

Abstract: A color filter array having a lower density of the color blue is provided. The color filter array includes: a plurality of color filter units arranged in a 3×3 array. The color filter units include a blue filter and a plurality of other filters, and the blue filter is disposed in the center of each 3×3 array, wherein a number of the blue filter is fewer than that of each kind of the other filters in each 3×3 array.

Abstract: An image-sensor structure is provided. The image-sensor structure includes a substrate with a plurality of photoelectric conversion units formed therein, a plurality of color filters formed above the substrate, wherein the color filters are divided into red color filters, green color filters and blue color filters, a plurality of microlenses correspondingly formed above the color filters, a transparent material layer formed above the microlenses, a first filter blocking infrared (IR) light formed above the transparent material layer, a second filter allowing transmission of visible light formed above the first filter, and a lens module formed above the second filter.

Abstract: The present invention provides an image sensor, including: a sensor array layer including a plurality of normal sensor units and a pair of autofocus sensor units; a plurality of color filter units disposed on the sensor array layer to cover the plurality of normal sensor units; a pair of IR-pass filter units disposed on the sensor array layer to respectively cover the pair of autofocus sensor units; a micro-lens layer including a plurality of micro-lenses disposed on the color filter units and the IR-pass filter units, wherein one of the pair of autofocus sensor units detects infrared light came from a first side, and the other of the pair of autofocus sensor units detects infrared light came from a second side opposite to the first side to perform a phase detection autofocus function.