Abstract: An on-chip testing device separately locates must-repairs or preferred-repairs in a row direction and column direction of a memory array. A row counter and a column counter are operated to index the memory array in row-major order, and then in column-major order (or vice versa). A running total of the number of failures is kept for each row and column, when the running total equals or exceeds a predetermined value, the row or column is determined to be a must-repair or a preferred repair.

Abstract: A Dynamic Random Access Memory (DRAM) eliminates the need to route section signals to local phase drivers to generate local phase signals by gating local isolation signals and global phase signals together in the local phase drivers to generate the local phase signals. As a result, the die "footprint" of the DRAM is reduced.

Abstract: A redundancy architecture for repairing a DRAM includes fuse banks for storing the row addresses of defective rows in sub-arrays of the DRAM. Row decoders activate a redundant row in one of the sub-arrays in response to receiving a row address matching one of the stored defective row addresses and, at the same time, disable a redundant row in the other of the sub-arrays that is arranged in an order complementary to that of the activated redundant row. By activating a redundant row in one sub-array and disabling the corresponding redundant row in an adjacent sub-array, the architecture allows for repairs to be conducted in the one sub-array while a good row in the adjacent sub-array is allowed to continue in operation.

Abstract: A high speed, low-to-high voltage CMOS driver circuit has a CMOS output stage, an intermediate voltage translation stage, and an input stage. The input and intermediate stages are designed to generate mutually exclusive control signals which activate the PMOS and NMOS transistors of the output stage. The control signals operably turn "off" the active transistor before turning "on" the inactive transistor. Independent control signals substantially reduce or eliminate crossing current in the output stage to thereby reduce energy power waste.

Abstract: A memory device having two or more memory arrays and a testpath operatively connected to one of the memory arrays and not operatively connected to another of the memory arrays at substantially the same time. The memory device may include multiplexers and sense amplifiers to connect the datapath to the memory arrays. The memory device may also include a datapath connected to two or more memory arrays at the same time through multiplexers and sense amplifiers. The memory array may also be embodied as a memory system, including a processor, control logic, and the memory device. A method of operating a testpath of the memory device includes generating control signals to operatively connect the testpath to one of the memory arrays, and not to connect the testpath to another of the memory arrays at substantially the same time.

Abstract: DRAM self-test circuitry, when triggered by an external signal, performs an on-chip test of a DRAM memory array. The self-test circuitry writes either all ones or all zeroes to each set of physical rows having the same address within the segment to be tested, and then reads the rows a set at a time. If the data bits comprising the set do not all equal one or zero, a resultant error detection signal is generated and used to latch the failed addresses into a failed address queue. If the data bits are either all zeros or ones, the next set of rows are tested. When the self-test is complete, the failed addresses stored in the queue may be transmitted to an external, off-chip device or analyzed and acted on by on-chip error correction circuitry. The self-test circuitry further includes circuitry to detect data bit transitions between successive failing addresses latched in a the address queue.

Abstract: A memory self-stress mode capable of use during wafer burn-in such as for dynamic random access memory (DRAM) integrated circuits. A burn-in power supply voltage and ground voltage delivered to a common node of a plurality of memory cell storage capacitors and to an equilibrate node coupled to bit lines. An all row high test cycles word lines between a binary low logic level and a binary high logic level, thereby stressing the dielectric of the memory cell storage capacitors by imposing stress voltages of differing polarity. A half row high test cycles alternate word lines of a word line sequence thereby stressing undesired short circuit connections between adjacent word lines.

Abstract: A high speed, low-to-high voltage CMOS driver circuit has a CMOS output stage, an intermediate voltage translation stage, and an input stage. The input and intermediate stages are designed to generate mutually exclusive control signals which activate the PMOS and NMOS transistors of the output stage. The control signals operably turn "off" the active transistor before turning "on" the inactive transistor. Independent control signals substantially reduce or eliminate crossing current in the output stage to thereby reduce energy power waste.

Abstract: A memory self-stress mode capable of use during wafer burn-in such as for dynamic random access memory (DRAM) integrated circuits. A burn-in power supply voltage and ground voltage delivered to a common node of a plurality of memory cell storage capacitors and to an equilibrate node coupled to bit lines. An all row high test cycles word lines between a binary low logic level and a binary high logic level, thereby stressing the dielectric of the memory cell storage capacitors by imposing stress voltages of differing polarity. A half row high test cycles alternate word lines of a word line sequence thereby stressing undesired short circuit connections between adjacent word lines.

Abstract: An integrated circuit (IC) architecture includes a bit mask register (BMR) and a serial access memory (SAM) which share address decode and clock circuitry within a multiport random access memory chip. The integrated circuit also includes a random access memory and circuitry for performing a bit masked transfer between the serial access memory and the random access memory. Mask data may be clocked into the bit mask register, which may be cleared upon completion of a data transfer between the random access memory and the serial access memory. The mask data may also be inverted upon being transferred between the random access memory and the bit mask register. This architecture provides CLEAR and TRUE or COMPLEMENT masked transfer output ability in the BMR, and has utility in real-time video windowing in memory mapped computer graphics.

Abstract: A high speed, low-to-high voltage CMOS driver circuit has a CMOS output stage, an intermediate voltage translation stage, and an input stage. The input and intermediate stages are designed to generate mutually exclusive control signals which activate the PMOS and NMOS transistors of the output stage. The control signals operably turn "off" the active transistor before turning "on" the inactive transistor. Independent control signals substantially reduce or eliminate crossing current in the output stage to thereby reduce energy power waste.

Abstract: Presented is an integrated circuit chip including a random access memory (RAM) array, serial access memory (SAM), an arithmetic logic unit, a bidirectional shift register, and masking circuitry. The arithmetic logic unit, SAM, shift register, and masking circuitry are all as wide as one side of the RAM array, and are all communicable with each other via data transfer means. This allows wide word processing, user configurable for parallel processing. Bits masked by the masking circuitry are selectable by data in the bidirectional shift register, providing shiftable masking means. Random access and serial access are done through separate ports. The bidirectional shift register is optionally serially accessible. Methods of use are also presented.

Abstract: A memory integrated circuit chip of a predefined circuit topology has an on-chip topology logic driver. The topology logic driver selectively inverts data being written to and read from addressed memory cells in the memory IC based upon location of the addressed memory cells in the circuit topology of the memory array. The topology logic driver is preferably a logic circuit that embodies a boolean function defining the circuit topology. A method for testing and producing such memory ICs is also described.

Abstract: Presented is an integrated circuit chip including a random access memory (RAM) array, serial access memory (SAM), an arithmetic logic unit, a bidirectional shift register, and masking circuitry. The arithmetic logic unit, SAM, shift register, and masking circuitry are all as wide as one side of the RAM array, and are all communicable with each other via data transfer means. This allows wide word processing, user configurable for parallel processing. Bits masked by the masking circuitry are selectable by data in the bidirectional shift register, providing shiftable masking means. Random access and serial access are done through separate ports. The bidirectional shift register is optionally serially accessible. Methods of use are also presented.

Abstract: The invention is the circuit and method for selecting a window of desired address locations to be written. A start address and a stop address activate a start and stop decoder output respectively. The active start and stop decoder output signals are rippled through start and stop ripple circuitry which enables the outputs electrically interposed between the start and stop addresses respectively. AND circuitry ensures that only the outputs interposed between the start and stop addresses are activated in addition to the start and stop decoder outputs. The activated outputs comprise the window of desired address locations to be written.

Abstract: A semiconductor memory integrated circuit having a serial port is modified to improve noise immunity on the serial clock (SC) input. This may be achieved by locking out subsequent serial clock signals during a serial port operation. A serial clock lockout signal is derived from the serial timing chain and coupled to the serial clock input one-shot circuit, so as to disable the one-shot circuit beginning in response to an initial serial clock input signal. The serial clock lockout is released, i.e., the one-shot circuit is enabled, after a delay period sufficient for the output terminals to transition to valid states. Alternatively, the one-shot circuit may be replaced by a serial clock lockout latch. The serial clock input signal is gated to the serial clock latch only when a serial clock lockout signal provided by the serial clock lockout latch is not asserted.

Abstract: A CMOS reference voltage generation circuit having a reference stage and a drive stage. Feedback is provided from the generated reference voltage to the reference stage. The inventive circuit is characterized by low standby current requirements, quick correction to deviations in the output voltage due to load variations, and quick response in generation of a new reference voltage when supply voltage transitions.

Abstract: The invention is a compact multifunction logic circuit, offering low power operation and compact layout. It has utility in computer graphics processing circuitry. Internal and external data and inverse data inputs are provided to the three passthrough gates 21E, 21F and 21G. The circuit is designed so that one and only one of the passthrough gates 21E, 21F and 21G is activated at any given time. Therefore, even though all three passthrough gates 21E, 21F and 21G have inputs supplied by the outputs of NOR 22, XOR 20 and NAND 23 only one of the three gate outputs is passed to the final output node 19.

Abstract: An ECL input buffer is particularly well-suited for use with logic arrays where a large amount of current must be sunk by the row line, for example, when vertical fuse devices are used in an AND array. The input buffer provides means for pulling down the row line such that the entire amount of current sunk by the input buffer from the row line need not pass through a current source, thereby minimizing current consumption of the input buffer. A pull down current source is used which causes a pull down transistor to turn on, thereby pulling down the row line while requiring only the base current of the pull down transistor to be consumed by the current source. A pull up device is utilized and means are included for insuring that the pull up and pull down devices are not both turned on simultaneously, thereby preventing a current spike through the pull up and pull down means.

Abstract: An inventive presettable synchronous predecoded counter which provides predecoding and counting in a single circuit, with an inventive dual-input flip-flop included in the design. This predecoded counter is used advantageously to sequentially access elements in a semiconductor memory array. This invention offers small size and simple design.