Abstract: An electronic device comprises a multi-chip package including multiple memory dice that include a memory array, charging circuitry, polling circuitry and a control unit. The charging circuitry is configured to perform one or more memory events in a high current mode using a high current level or in a low current mode using a lower current level. The polling circuitry is configured to poll a power status node common to the multiple memory dice to determine availability of the high current mode. The control unit is configured to operate the charging circuitry in the high current mode to perform the one or more memory events when the polling circuitry indicates that the high current mode is available, and operate the charging circuitry in the low current mode to perform the one or more memory events when the polling circuitry indicates that the high current mode is unavailable.

Abstract: Methods of operating a memory include determining a target voltage level for an access line voltage, determining a target overdrive voltage level for gating the access line voltage to an access line coupled to a plurality of memory cells, generating a voltage level for the access line voltage in response to its target voltage level and generating a voltage level for gating the access line voltage to the access line in response to the target overdrive voltage level, and applying the access line voltage to the access line while applying the voltage level for gating the access line voltage to a control gate of a string driver connected to the access line.

Abstract: Integrated circuit devices might include a controller configured to cause the integrated circuit device to apply a first voltage level to a first conductor while applying a second voltage level to a second conductor, apply a third voltage level to the first conductor while applying a fourth voltage level to the second conductor, and apply a fifth voltage level to the first conductor while applying the second voltage level to the second conductor. The second voltage level might correspond to a target voltage level for the second conductor. A difference between the third voltage level and the first voltage level might have a polarity opposite the polarity of a difference between the fourth voltage level and the second voltage level, and the same polarity of a difference between the fifth voltage level and the first voltage level. The fifth voltage level might correspond to a target voltage level for the first conductor.

Abstract: Disclosed are systems and methods of dynamically calibrating a memory control voltage more accurately. According to disclosed implementations, a memory control voltage such as Vpass or Vwlrv may be calibrated during memory operation as a function of the change in slope of total string current, even during increase in the wordline voltage. In one exemplary method, the wordlines are increased in sequence from a start voltage to an end voltage in steps, slope change is measured at every step, the measured slope change is compared against a threshold, and an adjusted memory control voltage is determined as a function of a wordline voltage at which the change in slope reaches the threshold. As such, memory control voltage may be determined and dynamically calibrated with less sensitivity to operating parameters such as temperature, pattern, and/or time of programming.

Abstract: Memories including an array of memory cells, a local access line connected to a plurality of memory cells of the array of memory cells, a global access line, a transistor connected between the global access line and the local access line, and an energy store either selectively connected to a control gate of the transistor, or selectively connected to a control gate of a different transistor connected between the control gate of the transistor and a voltage node configured to receive a reference potential.

Abstract: Methods of operating a memory include determining a target voltage level for an access line voltage, determining a target overdrive voltage level for gating the access line voltage to an access line coupled to a plurality of memory cells, generating a voltage level for the access line voltage in response to its target voltage level and generating a voltage level for gating the access line voltage to the access line in response to the target overdrive voltage level, and applying the access line voltage to the access line while applying the voltage level for gating the access line voltage to a control gate of a string driver connected to the access line. Apparatus include a voltage regulator having variable resistance paths between a voltage signal node and an output node, and between the voltage signal node and an input of a comparator of the voltage regulator.

Abstract: Methods of operating a die might include determining an expected peak current magnitude of the die for a period of time, and outputting the expected peak current magnitude from the die prior to completion of the period of time. Apparatus might be configured to perform similar methods.

Abstract: Apparatus, systems, and methods are disclosed, including a high-voltage charge pump including multiple pump stages connected in series to provide a high-voltage output, a common discharge circuit, and multiple high-voltage devices coupled between the outputs of each of the multiple pump stages and the common discharge circuit. Each of the multiple pump stages include a low-voltage switching device. The common discharge circuit is coupled to each of the multiple pump stages and is configured to discharge the multiple pump stages when the multiple pump stages are disabled. The multiple high-voltage devices include a respective high-voltage device coupled between an output of each of the multiple pump stages and the common discharge circuit.

Abstract: Apparatuses and methods for mixed charge pumps with voltage regulator circuits is disclosed. An example apparatus comprises a first charge pump circuit configured to provide a first voltage, a second charge pump circuit configured to provide a second voltage, a plurality of coupling circuits configured to voltage couple and current couple the first voltage and the second voltage to a common node to provide a regulated voltage, and a feedback circuit configured to regulate the first voltage and the second voltage based on the regulated voltage.

Abstract: An electronic device comprises a multi-chip package including multiple memory dice that include a memory array, charging circuitry, polling circuitry and a control unit. The charging circuitry is configured to perform one or more memory events in a high current mode using a high current level or in a low current mode using a lower current level. The polling circuitry is configured to poll a power status node common to the multiple memory dice to determine availability of the high current mode. The control unit is configured to operate the charging circuitry in the high current mode to perform the one or more memory events when the polling circuitry indicates that the high current mode is available, and operate the charging circuitry in the low current mode to perform the one or more memory events when the polling circuitry indicates that the high current mode is unavailable.

Abstract: Method of operating an integrated circuit device might include applying a first voltage level to a first conductor while applying a second voltage level to a second conductor, applying a third voltage level to the first conductor while applying a fourth voltage level to the second conductor, and applying a fifth voltage level to the first conductor while applying the second voltage level to the second conductor. The second voltage level might correspond to a target voltage level for the second conductor. A difference between the third voltage level and the first voltage level might have a polarity opposite the polarity of a difference between the fourth voltage level and the second voltage level, and the same polarity of a difference between the fifth voltage level and the first voltage level. The fifth voltage level might correspond to a target voltage level for the first conductor.

Abstract: Apparatus and methods are disclosed for providing a bias, comprising a bias generator circuit including a high voltage (HV) circuit configured to generate a regulated high voltage (HV) from an HV line and provide the regulated HV at an HV regulated line and a low voltage (LV) circuit configured to generate a low voltage (LV) differential from the HV line and to provide the LV differential at an LV line, wherein the LV circuit is configured to direct current used to generate the LV differential into the HV regulated line.

Abstract: An electronic device includes a reconfigurable charge pump including selectively connectable pump units for varying a generated voltage level. A control circuit may is configured to activate or deactivate the reconfigurable charge pump. The reconfigurable charge pump may track a duration based on activating the reconfigurable charge pump. When the duration exceeds a threshold, the control circuit may generates a signal according to the generated voltage level to reconfigure the electrical connections between the selectively connectable pump units.

Abstract: Methods of operating a memory, and memories configured to perform similar methods, might include initiating discharge of a global access line that is connected to a local access line through a transistor, and electrically floating a control gate of the transistor, in response to a supply voltage decreasing to a first threshold, and initiating discharge of the control gate of the transistor in response to the supply voltage decreasing to a second threshold lower than the first threshold.

Abstract: A memory device includes a memory array comprising a plurality of planes, a plurality of voltage generation systems, and a controller. Each voltage generation system of the plurality of voltage generation systems is electrically coupled to a corresponding plane of the plurality of planes. The controller is configured to turn on each voltage generation system of the plurality of voltage generation systems in response to a first command to access a first plane of the plurality of planes. The controller is configured to operate the voltage generation system of the plurality of voltage generation systems corresponding to the first plane of the plurality of planes at a first clock frequency, and operate the remaining voltage generation systems of the plurality of voltage generation systems corresponding to the other planes of the plurality of planes at a second clock frequency less than the first clock frequency.

Abstract: A voltage generation system might include a resistive voltage divider having a first resistance connected between its output and a first feedback node and a second resistance connected between the first feedback node and a first voltage node, a capacitive voltage divider having a first capacitance connected between its output and a second feedback node and a second capacitance connected between the second feedback node and the first voltage node, a comparator having an input connected to the second feedback node, and a voltage generation circuit configured to generate a voltage level at its output responsive to an output of the comparator and to a clock signal, wherein the first feedback node is selectively connected to the second feedback node and selectively connected to a second voltage node, wherein the first resistance is selectively connected to the first feedback node, and wherein the second resistance is selectively connected to the first voltage node.

Abstract: Disclosed are systems and methods of dynamically calibrating a memory control voltage more accurately. According to disclosed implementations, a memory control voltage such as Vpass or Vwlry may be calibrated during memory operation as a function of the change in slope of total string current, even during increase in the wordline voltage. In one exemplary method, the wordlines are increased in sequence from a start voltage to an end voltage in steps, slope change is measured at every step, the measured slope change is compared against a threshold, and an adjusted memory control voltage is determined as a function of a wordline voltage at which the change in slope reaches the threshold. As such, memory control voltage may be determined and dynamically calibrated with less sensitivity to operating parameters such as temperature, pattern, and/or time of programming.

Abstract: Devices and techniques are disclosed herein to provide a high-voltage bias signal in a standby state of the storage system without exceeding a limited maximum standby current allowance of the storage system. The high-voltage bias signal can enable a string driver circuit in the standby state to couple a global word line to a local word line, to provide a bias to, or sink a voltage from, a pillar of a string of memory cells of the storage system in the standby state, such as to reduce read disturbances in the storage system.

Abstract: Apparatus, systems, and methods are disclosed, including a charge pump having a pumping function that includes multiple pump stages connected in series. Each pump stage includes a capacitor node coupled to a capacitive element, a low-voltage device including a dielectric layer having a threshold voltage, and an output node coupled to the capacitor node through the low-voltage device. The charge pump also includes a common discharge circuit coupled between a reference voltage and a common node. The charge pump also includes multiple high-voltage diodes, each coupled between the output node of a respective pump stage and the common node. The common discharge circuit includes a current source configured to supply a current to the output nodes when the pumping function of the charge pump is disabled.

Abstract: An electronic device comprises a multi-chip package including multiple memory dice that include a memory array, charging circuitry, polling circuitry and a control unit. The charging circuitry is configured to perform one or more memory events in a high current mode using a high current level or in a low current mode using a lower current level. The polling circuitry is configured to poll a power status node common to the multiple memory dice to determine availability of the high current mode. The control unit is configured to operate the charging circuitry in the high current mode to perform the one or more memory events when the polling circuitry indicates that the high current mode is available, and operate the charging circuitry in the low current mode to perform the one or more memory events when the polling circuitry indicates that the high current mode is unavailable.