Abstract: An electrochemical device includes: an electrode body including a positive electrode, a negative electrode, and a separator disposed between the positive electrode and the negative electrode; and an electrolyte containing a lithium salt. The negative electrode includes a negative current collector and a negative electrode mixture layer supported on the negative current collector. The negative electrode mixture layer contains a negative electrode active material that is reversibly doped with lithium ions, and the negative current collector has substantially no through-hole. A specific surface area of the negative electrode mixture layer is in a range from 30 m2/g to 60 m2/g, inclusive, and in a discharged state, a potential of the negative electrode is less than or equal to 0.2 V with respect to a Li counter electrode.

Abstract: This electricity storage module includes: a plurality of electricity storage device; a device holder; a first external output terminal and a second external output terminal which are configured to be electrically connected to the plurality of electricity storage devices; and a terminal holder having one end portion and another end portion, the one end portion being configured to have the first external output terminal attached thereto, the other end portion being configured to have the second external output terminal attached thereto. The first external output terminal includes a coupling terminal part protruding to an outer side of a terminal holder in a direction in which the first external output terminal and the second external output terminal are arranged. The second external output terminal includes an external connection terminal part capable of being connected to an external terminal or the coupling terminal part on an inner side of the terminal holder.

Abstract: This power storage module includes power storage devices (100), and a device holder (200) in which the power storage devices (100) are held. The device holder (200) includes accommodation parts (210) in which the power storage devices (100) are accommodated. Each accommodation part (210) includes a semicircular arc face (212) to which a peripheral face of the power storage device (100) is opposed, and linear faces (213) respectively continuous with both ends of the semicircular arc face (212) and each extending to an opening end of the accommodation part (210). Further, the power storage module includes an elastic adhesive (250) filled, in each accommodation part (210), between the peripheral face of the power storage device (100) and each linear face (213), and adhered to the peripheral face of the power storage device (100) and the linear face (213).

Abstract: This power storage module includes power storage devices (100), and a device holder (200) in which the power storage devices (100) are held. The device holder (200) includes accommodation parts (210) in which the power storage devices (100) are accommodated. Each accommodation part (210) includes a semicircular arc face (212) to which a peripheral face of the power storage device (100) is opposed, and linear faces (213) respectively continuous with both ends of the semicircular arc face (212) and each extending to an opening end of the accommodation part (210). Further, the power storage module includes an elastic adhesive (250) filled, in each accommodation part (210), between the peripheral face of the power storage device (100) and each linear face (213), and adhered to the peripheral face of the power storage device (100) and the linear face (213).

Abstract: This electricity storage module includes: a plurality of electricity storage device; a device holder; a first external output terminal and a second external output terminal which are configured to be electrically connected to the plurality of electricity storage devices; and a terminal holder having one end portion and another end portion, the one end portion being configured to have the first external output terminal attached thereto, the other end portion being configured to have the second external output terminal attached thereto. The first external output terminal includes a coupling terminal part protruding to an outer side of a terminal holder in a direction in which the first external output terminal and the second external output terminal are arranged. The second external output terminal includes an external connection terminal part capable of being connected to an external terminal or the coupling terminal part on an inner side of the terminal holder.

Abstract: In a circuit board on which a plurality of CPUs are mounted, the CPUs comprises: monitor units for outputting task statuses of the respective CPUs; and a diagnosis circuit connected to the plurality of CPUs, comparing and judging combinations of the task statuses of the plurality of CPUs based on information on task statuses outputted from the monitor units, and detecting false operations and failures of the circuit board.

Abstract: A snowmobile is provided with airbag systems including airbag bodies expanding from a portion near a steering handle bar respectively, one of the airbag bodies expanding rearward of a handle bar and outward of both the ends of the handle bar, and the other airbag body expanding toward a front side of rider's knees. Another airbag system includes an airbag body expanding from an upper surface of an engine hood on the front portion of a vehicle body frame and blowing up toward a windshield of the engine hood. The respective airbag systems are detachable from the vehicle body, and hence, can be stored indoors.

Abstract: The present invention relates to a DRAM stacked packages, a DIMM, a method for testing them, and a semiconductor manufacturing method. According to the present invention, there is provided a DRAM stacked package comprising: a plurality of stacked DRAMs; external terminals to which test equipment is connected, said external terminals being used to input/output at least address, command, and data; and an interface chip provided between said plurality of stacked DRAMs and said external terminals. The plurality of DRAMs and the interface chip are implemented on a package. The interface chip comprises: a test circuit including: an algorithmic pattern generator for generating a test pattern used to test the plurality of DRAMs; applying circuits for applying said generated test pattern to the plurality of DRAMs; and a comparator for comparing each response signal received from the plurality of DRAMs with an expected value for judgment.

Abstract: A snowmobile is provided with airbag systems including airbag bodies expanding from a portion near a steering handle bar respectively, one of the airbag bodies expanding rearward of a handle bar and outward of both the ends of the handle bar, and the other airbag body expanding toward a front side of rider's knees. Another airbag system includes an airbag body expanding from an upper surface of an engine hood on the front portion of a vehicle body frame and blowing up toward a windshield of the engine hood. The respective airbag systems are detachable from the vehicle body, and hence, can be stored indoors.

Abstract: A snowmobile is provided with airbag systems including airbag bodies expanding from a portion near a steering handle bar respectively, one of the airbag bodies expanding rearward of a handle bar and outward of both the ends of the handle bar, and the other airbag body expanding toward a front side of rider's knees. Another airbag system includes an airbag body expanding from an upper surface of an engine hood on the front portion of a vehicle body frame and blowing up toward a windshield of the engine hood. The respective airbag systems are detachable from the vehicle body, and hence, can be stored indoors.

Abstract: A snowmobile is provided with airbag systems including airbag bodies expanding from a portion near a steering handle bar respectively, one of the airbag bodies expanding rearward of a handle bar and outward of both the ends of the handle bar, and the other airbag body expanding toward a front side of rider's knees. Another airbag system includes an airbag body expanding from an upper surface of an engine hood on the front portion of a vehicle body frame and blowing up toward a windshield of the engine hood. The respective airbag systems are detachable from the vehicle body, and hence, can be stored indoors.

Abstract: A snowmobile is provided with airbag systems including airbag bodies expanding from a portion near a steering handle bar respectively, one of the airbag bodies expanding rearward of a handle bar and outward of both the ends of the handle bar, and the other airbag body expanding toward a front side of rider's knees. Another airbag system includes an airbag body expanding from an upper surface of an engine hood on the front portion of a vehicle body frame and blowing up toward a windshield of the engine hood. The respective airbag systems are detachable from the vehicle body, and hence, can be stored indoors.

Abstract: In a circuit board on which a plurality of CPUs are mounted, the CPUs comprises: monitor units for outputting task statuses of the respective CPUs; and a diagnosis circuit connected to the plurality of CPUs, comparing and judging combinations of the task statuses of the plurality of CPUs based on information on task statuses outputted from the monitor units, and detecting false operations and failures of the circuit board.

Abstract: Semiconductor testing equipment according to the present invention comprises: an algorithmic pattern generator for generating a test pattern for testing a memory under test and applying the pattern to the memory under test; a comparator for comparing a response signal from the memory under test and an expected value from tho algorithmic pattern generator; a fail address acquisition part for storing an address of the memory under test (fail address) when a result compared by the comparator is failed; a fail address analysis part for analyzing the failed address and calculating the address to be repaired (repair address); and a cycle-pattern generator for redundancy processing for inserting the address to be repaired into a test pattern and applying the address to the memory under test, so that even when capacity of the semiconductor memory is increased, a fabrication yield thereof is raised by testing the memory after the packaging and by performing the redundancy processing of a defective.

Abstract: The present invention relates to a DRAM stacked packages, a DIMM, a method for testing them, and a semiconductor manufacturing method. According to the present invention, there is provided a DRAM stacked package comprising: a plurality of stacked DRAMs; external terminals to which test equipment is connected, said external terminals being used to input/output at least address, command, and data; and an interface chip provided between said plurality of stacked DRAMs and said external terminals. The plurality of DRAMs and the interface chip are implemented on a package. The interface chip comprises: a test circuit including: an algorithmic pattern generator for generating a test pattern used to test the plurality of DRAMs; applying circuits for applying said generated test pattern to the plurality of DRAMs; and a comparator for comparing each response signal received from the plurality of DRAMs with an expected value for judgment.

Abstract: A signature circuit, i.e., a random-number generating circuit, is provided in a memory test apparatus. Also, a signature circuit is provided in each of devices-under-test. This configuration allows the large number of semiconductor integrated-circuit devices to be tested at one time with a high efficiency. This condition realizes a tremendous reduction in the test cost.

Abstract: A lubricating structure for engines, wherein an oil feed pump and an oil recovery pump are disposed so as to avoid interference between the oil feed and recovery pumps and a clutch mechanism and an increase in the size of the engine. The clutch mechanism 38 is disposed at a location toward a left end of a crankshaft 7 as an output shaft 7a, which is rotatably supported between an upper crankcase 5 and a lower crankcase 6, that is, disposed on a left side of an engine room. A magnet cover 60 is fixed to right side parts of the two crankcases 5, 6. A magnet MG is disposed between the two crankcases 5, 6 and the magnet cover 60 at a location toward a right end 7b of the crankshaft 7. An oil pump FEP for feeding lubricating oil is disposed between the two crankcases 5, 6 and the magnet cover 60, and an oil pump SCP for recovering lubricating oil is disposed between the two crankcases 5, 6 and the magnet cover 60.

Abstract: A snowmobile is provided with airbag systems including airbag bodies expanding from a portion near a steering handle bar respectively, one of the airbag bodies expanding rearward of a handle bar and outward of both the ends of the handle bar, and the other airbag body expanding toward a front side of rider's knees. Another airbag system includes an airbag body expanding from an upper surface of an engine hood on the front portion of a vehicle body frame and blowing up toward a windshield of the engine hood. The respective airbag systems are detachable from the vehicle body, and hence, can be stored indoors.

Abstract: An engine unit is supported by a body frame, and a front body portion is covered with a cowling. This cowling is made wider than the body frame to form a space in the vehicle widthwise direction between the body frame and cowling, and an air, cleaner unit is accommodated in this space. The air cleaner unit has a substantially flat filter, a filter support portion, and a filter insertion hole. The attachment direction of the filter is set in its longitudinal direction, and the filter insertion hole is formed in a position corresponding to the end face of the filter when it is attached. The filter, the filter support portion, and air cleaner lid member divide the air cleaner main body into a clean chamber and dirty chamber.

Abstract: Semiconductor testing equipment according to the present invention comprises: an algorithmic pattern generator for generating a test pattern for testing a memory under test and applying the pattern to the memory under test; a comparator for comparing a response signal from the memory under test and an expected value from tho algorithmic pattern generator; a fail address acquisition part for storing an address of the memory under test (fail address) when a result compared by the comparator is failed; a fail address analysis part for analyzing the failed address and calculating the address to be repaired (repair address); and a cycle-pattern generator for redundancy processing for inserting the address to be repaired into a test pattern and applying the address to the memory under test, so that even when capacity of the semiconductor memory is increased, a fabrication yield thereof is raised by testing the memory after the packaging and by performing the redundancy processing of a defective.