Abstract: Systems and method relating generally to solid state memory, and more particularly to systems and methods for generated data from a solid state memory.

Abstract: Cross-points of flash memory cell voltage distributions are determined by reading data from a portion of the flash memory two or more times using two or more different candidate reference voltages and determining corresponding decision patterns. The frequency of occurrence of the decision patterns in the data read from the flash memory is used to conceptually construct a histogram. The histogram is used to estimate the cross-points. Employing decision patterns enables multiple cross-point voltages to be determined with a minimum of read operations.

Abstract: A low-density parity-check decoder in a system with multi-level cells identifies zones of reliability where write errors or stuck cells are identifiable. The system uses assumedly successfully decoded pages associated with bits in a cell to identify candidate write errors or stuck cells and erases a corresponding log-likelihood ratio even where such log-likelihood ratio is saturated, thereby breaking a potential trapping set without post-processing.

Abstract: An apparatus includes one or more error-correction decoders, a buffer, at least one direct memory access (DMA) engine, and at least one processor. The buffer may be configured to store data to be decoded by the one or more error-correction decoders. The at least one DMA engine may couple the buffer and the one or more error-correction decoders. The at least one processor may be enabled to send messages to the at least one DMA engine. The messages may be configured to deliver DMA control information and corresponding datapath control information. Data may be read from the buffer based upon the DMA control information and delivered to the one or more error-correction decoders along with the corresponding datapath control information. The one or more error-correction decoders may be enabled to decode the data read from the buffer according to the corresponding datapath control information.

Abstract: In a data storage system having multi-level memory cells, a counter tracks the number of program/erase cycles, anticipated read cycles, or anticipated length of data retention of a cell. When a threshold number of cycles is reached or length of retention or read frequency are anticipated, the cell is programmed using more program voltage pulses, narrower program voltage pulses or some other modification to the incremental step programming pulse to reduce the range where the intermediate least significant (lower) bit read voltage may be erroneous, thereby reducing the probability of write errors when the most significant page (upper) is programmed.

Abstract: A method of optimizing solid state drive (SSD) soft retry voltages comprises limiting a number of voltage reads and properly spacing and determining the reference voltage at which each voltage is read based on desired Bit Error Rate (BER) and channel throughput. The method determines each reference voltage for a number of soft retry voltage reads based on a hard decision read. The spacing between each read reference voltage is constant since each SSD type requires a number of reads for an accurate presentation of soft retry voltages. The voltage distance between each successive read is limited to a multiple of the constant spacing while the multiple is based on success or failure of the first read. The method determines a limited number of reads, the constant spacing between reads, and a desired reference voltage for each read, thereby increasing valuable throughput of the channel and decreasing BER.

Abstract: Systems and method relating generally to data processing, and more particularly to systems and methods for characterizing a solid state memory.

Abstract: A method and apparatus for generating soft decision error correction code information. The method includes generating or creating a lookup table (LUT), such as a log likelihood ratio (LLR) lookup table, characterizing a flash memory device. The method also includes loading the lookup table into the SSD controller. The method also includes accessing the lookup table to assign LLR or other characteristic values to the cells of a flash memory device. The method also includes decoding the data in a flash memory device using the soft decision information provided by the lookup table and assigned to the appropriate cells of the flash memory device.

Abstract: An apparatus having a circuit and one or more processor is disclosed. The circuit is configured to receive a codeword from a memory. The memory is nonvolatile. The codeword generally has one or more errors. The processors are configured to generate read data by decoding the codeword repeatedly. The decoding includes a soft-decision decoding that uses a plurality of parameters calculated by (i) a first procedure, (ii) a second procedure in response to a plurality of failures of the decoding to converge using the first procedure and (iii) a third procedure in response to another failure of the decoding to converge using the second procedure.

Abstract: Systems and methods relating generally to solid state memory, and more particularly to systems and methods for recovering data from a solid state memory.

Abstract: A flash memory controller having soft-decoding error correcting code (ECC) logic generates log likelihood ratio or similar ECC decoder soft input information from decision patterns obtained from reading data from the same portion of flash memory two or more times. Each decision pattern corresponds to a voltage region bordering one of the reference voltages. Each decision pattern represents a combination of flash memory bit value decisions for a cell voltage within the voltage region corresponding to the decision pattern when a corresponding combination of the reference voltages are used to read the cell. Numerical values are then computed in response to combinations of the flash memory bit value decisions represented by the decision patterns. The numerical values are provided to the soft-decoding ECC logic to serve as soft input information.

Abstract: Systems and method relating generally to solid state memory, and more particularly to systems and methods for recycling data in a solid state memory.

Abstract: An apparatus comprising a first circuit and a second circuit. The first circuit may be configured to generate an output signal in response to (i) a value retrieved from a look-up table, and (ii) an index signal. The second circuit may be configured to generate the index signal in response to a plurality of page signals. The apparatus may manage decision patterns during a soft retry.

Abstract: Cross-points of flash memory cell voltage distributions are determined by reading data from a portion of the flash memory two or more times using two or more different candidate reference voltages and determining corresponding decision patterns. The frequency of occurrence of the decision patterns in the data read from the flash memory is used to conceptually construct a histogram. The histogram is used to estimate the cross-points. Employing decision patterns enables multiple cross-point voltages to be determined with a minimum of read operations.

Abstract: An apparatus includes a non-volatile memory and a controller. The controller may be configured to track one or more channel parameters of the non-volatile memory. The controller may be further configured to estimate an erase state voltage distribution of the non-volatile memory by selecting one or more parameters of the erase state distribution from a look-up table based upon at least one of the one or more channel parameters.

Abstract: Upon a read error, a flash memory controller adjusts a candidate reference voltage on successive read retries until either a read error no longer occurs or an optimal reference voltage is attained. Optimal reference voltages correspond to cross-points of flash memory cell voltage distributions. Cross-points can be determined by using different candidate reference voltages to read data from the memory and determining corresponding decision patterns. The frequency of occurrence of the decision patterns in the data read from the memory is used to conceptually construct a histogram. The histogram is used to estimate when a candidate reference voltage has been adjusted to a cross-point.

Abstract: An apparatus comprising a memory configured to store data and a controller. The controller may be configured to process a plurality of input/output requests to read/write to/from the memory. The controller is configured to (i) set a value of a threshold voltage based on an estimate, (ii) determine whether the read is successful, (iii) if the read is not successful, perform a plurality of reads with a varying value of the threshold voltage, (iv) read a calibration value from a look-up table based on the plurality of reads and (v) set the threshold value in response to the calibration value.

Abstract: The disclosure is directed to a system and method for nominal read voltage variations of a flash device. N reads are performed, each at a selected voltage offset from an initial read voltage. An N bit digital pattern associated with the selected voltage offsets is generated for the N reads. The N bit digital pattern generated by the N reads is mapped to a signed representation. A voltage adjustment based upon the signed representation is applied to at least partially compensate for a variation of the nominal read voltage to reduce bit error rate of the flash device.

Abstract: In an SSD controller reading from flash memory, subsequent to failure of an initial soft-decision decoding attempt based on a nominal LLR, soft-decision re-decoding attempts are made using compensated LLR soft-decision information sets, pre-calculated at respective read-equilibrium points corresponding to mean shifts and variance change in the actual charge-state distributions of the flash memory channel. According to embodiment, soft-decision re-decoding attempts are performed without a retry read, or overlapped with one or more retry reads. By overlapping re-decoding with one or more retry reads, the probability of successful decoding increases, the need for further retry reads diminishes, and throughput is improved. The LLR compensation becomes very effective over a large number of retry reads, improving decoding reliability and achieving close to optimal bit error rates, even in the presence of large channel variation.

Abstract: Mixed-granularity higher-level redundancy for NVM provides improved higher-level redundancy operation with better error recovery and/or reduced redundancy information overhead. For example, pages of the NVM that are less reliable, such as relatively more prone to errors, are operated in higher-level redundancy modes having relatively more error protection, at a cost of relatively more redundancy information. Concurrently, blocks of the NVM that are more reliable are operated in higher-level redundancy modes having relatively less error protection, at a cost of relatively less redundancy information. Compared to techniques that operate the entirety of the NVM in the higher-level redundancy modes having relatively less error protection, techniques described herein provide better error recovery. Compared to techniques that operate the entirety of the NVM in the higher-level redundancy modes having relatively more error protection, the techniques described herein provide reduced redundancy information overhead.