Patents by Inventor Yuuichi Matsumoto

Yuuichi Matsumoto has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Publication number: 20030104709
    Abstract: According to the present invention, there are provided a method for heat treatment of silicon wafers wherein a silicon wafer is subjected to a heat treatment at a temperature of from 1000° C. to the melting point of silicon in an inert gas atmosphere, and temperature decreasing in the heat treatment is performed in an atmosphere containing 1-60% by volume of hydrogen, a method for heat treatment of silicon wafers under a reducing atmosphere containing hydrogen by using a rapid heating and rapid cooling apparatus, wherein temperature decreasing rate from the maximum temperature in the heat treatment to 700° C. is controlled to be 20° C./sec or less, and a silicon wafer which has a crystal defect density of 1.0×104 defects/cm3 or more in a wafer bulk portion, a crystal defect density of 1.0×104 defects/cm3 or less in a wafer surface layer of a depth of 0.5 &mgr;m from the surface, a crystal defect density of 0.15 defects/cm2 or less on a wafer surface and surface roughness of 1.
    Type: Application
    Filed: January 9, 2003
    Publication date: June 5, 2003
    Applicant: Shin-Etsu Handotai Co., Ltd.
    Inventors: Norihiro Kobayashi, Shoji Akiyama, Yuuichi Matsumoto, Masaro Tamatsuka
  • Patent number: 6573159
    Abstract: According to the present invention, there are provided a method for heat treatment of silicon wafers wherein a silicon wafer is subjected to a heat treatment at a temperature of from 1000° C. to the melting point of silicon in an inert gas atmosphere, and temperature decreasing in the heat treatment is performed in an atmosphere containing 1-60% by volume of hydrogen, a method for heat treatment of silicon wafers under a reducing atmosphere containing hydrogen by using a rapid heating and rapid cooling apparatus, wherein temperature decreasing rate from the maximum temperature in the heat treatment to 700° C. is controlled to be 20° C./sec or less, and a silicon wafer which has a crystal defect density of 1.0×104 defects/cm3 or more in a wafer bulk portion, a crystal defect density of 1.0×104 defects/cm3 or less in a wafer surface layer of a depth of 0.5 &mgr;m from the surface, a crystal defect density of 0.15 defects/cm2 or less on a wafer surface and surface roughness of 1.
    Type: Grant
    Filed: August 14, 2000
    Date of Patent: June 3, 2003
    Assignee: Shin-Etsu Handotai Co., Ltd.
    Inventors: Norihiro Kobayashi, Shoji Akiyama, Yuuichi Matsumoto, Masaro Tamatsuka
  • Patent number: 4511496
    Abstract: A pellet of ethylene-vinyl acetate copolymer and a perfume are mixed in a mixer, and when the perfume has been impregnated into only the surface layer portion of the pellet, then a fine powder is added and mixed with the perfume-impregnated pellet for the purpose of coating the surface thereof.
    Type: Grant
    Filed: June 14, 1983
    Date of Patent: April 16, 1985
    Assignee: Soda Aromatic Company, Limited
    Inventor: Yuuichi Matsumoto
  • Patent number: 4492644
    Abstract: A slowly releasing perfume composition is obtained by mixing a granulated ethylene-vinyl acetate copolymer and a perfume which contains hydrocarbons and/or esters as an essential fragrant component, at a temperature in the range of about 10.degree. C. to about 50.degree. C.
    Type: Grant
    Filed: April 15, 1982
    Date of Patent: January 8, 1985
    Assignee: Soda Aoromatic Company, Limited
    Inventors: Yuuichi Matsumoto, Kiyomitsu Kawasaki, Masato Ishitani