SILICON LIGHT TRAP DEVICES, SYSTEMS AND METHODS
Embodiments relate to buried structures for silicon devices which can alter light paths and thereby form light traps. Embodiments of the lights traps can couple more light to a photosensitive surface of the device, rather than reflecting the light or absorbing it more deeply within the device, which can increase efficiency, improve device timing and provide other advantages appreciated by those skilled in the art.
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The invention relates generally to silicon devices and more particularly to optoelectronic silicon devices.
BACKGROUNDIn optoelectronic devices, light rays are absorbed and generate charge carriers within the device. These charge carriers typically are desired to be generated within a particular light ray absorption region, which can be defined by a depth within the device, such that they can be collected near the surface of the device.
Charge carriers generated deeper than the depth of this region can be thought of us undesirable noise. Conventional approaches to dealing with these charge carriers often relate to transporting them to the surface by extended electric fields or annihilating them by the targeted introduction of recombination centers. The former is not suitable in all situations, such as those with regions that must remain free of electrical fields for physical reasons, and is also limited by available voltage, while the latter reduces internal quantum efficiency and can be technically difficult to realize at very high impurity atom densities. Reduced quantum efficiency in turn can affect devices dimensions, and increased complexity and technological challenges can increase costs, which are undesired.
SUMMARYEmbodiments relate to light trap devices, systems and methods.
In an embodiment, a device comprises a silicon structure having a surface to be exposed to light rays; and a light trap structure formed within the silicon structure spaced apart from the surface and comprising a plurality of light trap elements adjacent one another and each having a surface proximate to and unparallel with the surface to be exposed to light rays.
In an embodiment, a light trap structure buried within a silicon structure and comprises a plurality of light trap elements adjacent one another and each having a surface proximate to and unparallel with a surface of the silicon structure to be exposed to light rays.
In an embodiment, a method comprises providing a silicon structure; and forming a plurality of light trap elements adjacent one another in the silicon structure and each having a surface proximate to and unparallel with a surface of the silicon structure to be exposed to light rays.
The invention may be more completely understood in consideration of the following detailed description of various embodiments of the invention in connection with the accompanying drawings, in which:
While the invention is amenable to various modifications and alternative forms, specifics thereof have been shown by way of example in the drawings and will be described in detail. It should be understood, however, that the intention is not to limit the invention to the particular embodiments described. On the contrary, the intention is to cover all modifications, equivalents, and alternatives falling within the spirit and scope of the invention as defined by the appended claims.
DETAILED DESCRIPTIONEmbodiments relate to buried structures for silicon devices which can alter light paths and thereby form light traps. Embodiments of the lights traps can couple more light to a photosensitive surface of the device, rather than reflecting the light or absorbing it more deeply within the device, which can increase efficiency, improve device timing and provide other advantages appreciated by those skilled in the art.
Referring to
In embodiments, light trap elements 104 comprise cavities filled with air or some other suitable gas or material. Light trap structure 100 also can comprise a single light trap element 104 having the overall outline shape of structure 100 depicted in
In the embodiment of
The particular radius of curvature (
Referring to
The embodiment of
Referring next to
The process can vary for other embodiments, such as the peaked light trap structure 100 of
Other features and elements can be incorporated in embodiments. For example, and referring to
Embodiments thereby provide improved light trap structures for silicon devices which can alter light paths. Embodiments of the lights traps can couple more light to a photosensitive surface of the device, rather than reflecting the light or absorbing it more deeply within the device, which can increase efficiency, improve device timing and provide other advantages appreciated by those skilled in the art.
Various embodiments of systems, devices and methods have been described herein. These embodiments are given only by way of example and are not intended to limit the scope of the invention. It should be appreciated, moreover, that the various features of the embodiments that have been described may be combined in various ways to produce numerous additional embodiments. Moreover, while various materials, dimensions, shapes, configurations and locations, etc. have been described for use with disclosed embodiments, others besides those disclosed may be utilized without exceeding the scope of the invention.
Persons of ordinary skill in the relevant arts will recognize that the invention may comprise fewer features than illustrated in any individual embodiment described above. The embodiments described herein are not meant to be an exhaustive presentation of the ways in which the various features of the invention may be combined. Accordingly, the embodiments are not mutually exclusive combinations of features; rather, the invention can comprise a combination of different individual features selected from different individual embodiments, as understood by persons of ordinary skill in the art. Moreover, elements described with respect to one embodiment can be implemented in other embodiments even when not described in such embodiments unless otherwise noted. Although a dependent claim may refer in the claims to a specific combination with one or more other claims, other embodiments can also include a combination of the dependent claim with the subject matter of each other dependent claim or a combination of one or more features with other dependent or independent claims. Such combinations are proposed herein unless it is stated that a specific combination is not intended. Furthermore, it is intended also to include features of a claim in any other independent claim even if this claim is not directly made dependent to the independent claim.
Any incorporation by reference of documents above is limited such that no subject matter is incorporated that is contrary to the explicit disclosure herein. Any incorporation by reference of documents above is further limited such that no claims included in the documents are incorporated by reference herein. Any incorporation by reference of documents above is yet further limited such that any definitions provided in the documents are not incorporated by reference herein unless expressly included herein.
For purposes of interpreting the claims for the present invention, it is expressly intended that the provisions of Section 112, sixth paragraph of 35 U.S.C. are not to be invoked unless the specific terms “means for” or “step for” are recited in a claim.
Claims
1. A device comprising:
- a silicon structure having a surface to be exposed to light rays; and
- a light trap structure formed within the silicon structure spaced apart from the surface and comprising a plurality of light trap elements adjacent one another and each having a surface proximate to and unparallel with the surface to be exposed to light rays.
2. The device of claim 1, wherein the surface proximate to and unparallel with the surface to be exposed to light rays has a radius.
3. The device of claim 1, wherein the surface proximate to and unparallel with the surface to be exposed to light rays comprises a peak.
4. The device of claim 3, wherein am angle of the peak is between about 50 degrees and about 60 degrees.
5. The device of claim 4, wherein the angle of the peak is about 54.7 degrees.
6. The device of claim 1, wherein the plurality of light trap elements each comprise a cavity within the silicon structure.
7. The device of claim 6, wherein each cavity is formed from a trench etched in the silicon structure.
8. The device of claim 1, wherein each surface proximate to and unparallel with the surface to be exposed to light rays is configured to reflect light toward the surface to be exposed to light rays at an angle greater than about 16 degrees.
9. The device of claim 1, wherein the device comprises a photodetector device.
10. The device of claim 1, wherein each light trap element is about 0.5 micrometers (μm) to about 3 μm wide and about 1 μm to about 5 μm high.
11. The device of claim 1, wherein each light trap element is spaced apart from the surface to be exposed to light rays by at least about 0.7 μm and not more than about 50 μm.
12. The device of claim 1, further comprising a structure formed on the surface to be exposed to light and comprising a plurality of light-focusing structures.
13. A light trap structure buried within a silicon structure and comprising:
- a plurality of light trap elements adjacent one another and each having a surface proximate to and unparallel with a surface of the silicon structure to be exposed to light rays.
14. The light trap structure of claim 13, wherein the plurality of light trap elements comprise a plurality of cavities.
15. The light trap structure of claim 13, wherein the surface proximate to and unparallel with the surface to be exposed to light rays has a radius.
16. The device of claim 13, wherein the surface proximate to and unparallel With the surface to be exposed to light rays comprises a peak.
17. The device of claim 16, wherein an angle of the peak is between about 53 degrees and about 56 degrees.
18. The device of claim 13, wherein the plurality of light trap elements each comprise a cavity within the silicon structure.
19. The device of claim 18, wherein each cavity is formed from a trench etched in the silicon structure.
20. The device of claim 13, wherein each surface proximate to and unparallel with the surface to be exposed to light rays is configured to reflect light toward the surface to be exposed to light rays at an angle greater than about 16 degrees.
21. The device of claim 13, wherein each light trap element is about 0.5 micrometers (μm) to about 3 μm wide and about 1 μm to about 5 μm deep.
22. The device of claim 13, wherein each light trap element is spaced apart from the surface to be exposed to light rays by at least about 0.7 μm and not more than about 50 μm.
23. A method comprising:
- providing a silicon structure; and
- forming a plurality of light trap elements adjacent one another in the silicon structure and each having a surface proximate to and unparallel with a surface of the silicon structure to be exposed to light rays.
24. The method of claim 23, wherein forming a plurality of light trap elements further comprises:
- forming a plurality of trenches in the silicon structure; and
- producing a cavity from each of the plurality of trenches.
25. The method of claim 24, further comprising forming a light-focusing structure on the silicon structure.
Type: Application
Filed: Oct 18, 2012
Publication Date: Apr 24, 2014
Applicant: INFINEON TECHNOLOGIES DRESDEN GMBH (Dresden)
Inventor: THORALF KAUTZSCH (DRESDEN)
Application Number: 13/654,917
International Classification: H01L 31/0216 (20060101); H01L 31/02 (20060101);