Sample rack

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Description

FIG. 1 is a front, top and right side perspective view of a sample rack according to the design;

FIG. 2 is a rear, top and left side perspective view thereof;

FIG. 3 is a rear, bottom and left side perspective view thereof;

FIG. 4 is a front elevational view thereof;

FIG. 5 is a rear elevational view thereof;

FIG. 6 is a left side elevational view thereof;

FIG. 7 is a right side elevational view thereof;

FIG. 8 is a top plan view thereof;

FIG. 9 is a bottom plan view thereof;

FIG. 10 is a cross-sectional view taken along line 10-10 of FIG. 4;

FIG. 11 is a cross-sectional view taken along line 11-11 of FIG. 8;

FIG. 12 is a cross-sectional view taken along line 12-12 of FIG. 8;

FIG. 13 is a cross-sectional view taken along line 13-13 of FIG. 4; and,

FIG. 14 is a cross-sectional view taken along line 14-14 of FIG. 4.

Claims

The ornamental design for a sample rack, as shown and described.

Referenced Cited
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Foreign Patent Documents
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Other references
  • U.S. Notice of Allowance issued in U.S. Appl. No. 29/828,131 dated Jul. 26, 2023 (10 pages).
Patent History
Patent number: D1015577
Type: Grant
Filed: Feb 24, 2022
Date of Patent: Feb 20, 2024
Assignee: Hitachi High-Tech Corporation (Tokyo)
Inventors: Yudai Fukushi (Tokyo), Yasuhiro Keta (Tokyo), Eiichiro Takada (Tokyo), Fuka Matsudaira (Tokyo), Ai Masuda (Tokyo)
Primary Examiner: Doris Clark
Application Number: 29/828,132
Classifications