Patents Assigned to HITACHI HIGH-TECH CORPORATION
  • Patent number: 11982631
    Abstract: A defect detection device including an illumination optical system, an image capturing optical system configured to capture an image of scattered light generated by the illumination optical system irradiating the wafer, and an image processing unit configured to process a picture of the image of the scattered light to extract a defect on the wafer. The image capturing optical system includes an objective lens, a filter unit configured to shield a part of light transmitted through the objective lens, and an imaging lens configured to form an image of light transmitted through the filter unit. The filter unit includes a first microlens array configured to condense parallel light transmitted through the objective lens, a shutter array including a light transmission unit at a focus position of the first microlens array, and a second microlens array disposed opposite to the first microlens array with respect to the shutter array.
    Type: Grant
    Filed: March 12, 2019
    Date of Patent: May 14, 2024
    Assignee: HITACHI HIGH-TECH CORPORATION
    Inventors: Yuko Otani, Kazuo Aoki, Shunichi Matsumoto, Yuta Urano
  • Patent number: 11982655
    Abstract: The present invention makes it possible to realize an analysis apparatus having a plurality of liquid chromatographs capable of judging separation performance and the like at the right timing and improving analysis performance early. Analysis starts and a mixed sample is prepared by adding a non-retaining ingredient to a measurement object sample and is introduced into an analysis flow path (S401 to S404). The mixed sample is separated into components by a separation column, the components are outputted as chromatogram data by a detector, and the analysis finishes (S404 to S406). Retention time and peak information are acquired from the chromatogram outputted from the detector, whether or not a measurement result is within an allowable range is judged, and the process shifts to next analysis when the measurement result is within the allowable range (S407 to S409).
    Type: Grant
    Filed: November 19, 2019
    Date of Patent: May 14, 2024
    Assignee: Hitachi High-Tech Corporation
    Inventors: Daisuke Akieda, Makoto Nogami, Iwao Suzuki, Masako Kawarai, Izumi Ogata, Shinya Ito
  • Patent number: 11983659
    Abstract: The present invention realizes a medical material transport system that is low-cost, stable, and safe, the medical material transport system being such that even if a failure occurs in an individual specimen transport device, the failure does not extend to the system as a whole. Collection of a specimen is requested from a specimen collection request terminal 107, and a management unit (108) issues a reception command 110 for the specimen. A drone 101 that has received the reception command 110 for the specimen departs from a standby dock 105 on the basis of the received information and flies to a specimen recovery location 106, and a specimen tray for placing the specimen is taken out from a specimen holder 102. A specimen container is contained in the specimen tray, and the specimen tray is returned to the specimen holder 102 and locked using a lock mechanism.
    Type: Grant
    Filed: February 5, 2020
    Date of Patent: May 14, 2024
    Assignee: Hitachi High-Tech Corporation
    Inventor: Hikaru Takizawa
  • Patent number: 11982681
    Abstract: Provided is an electrolyte analyzing device in which contamination caused by contacting different reagents with a suction nozzle is prevented when reagent replacement is performed by a user. The electrolyte analyzing device includes a reagent container setting unit 502 that sets a dilute solution bottle 101-1 which houses a dilute solution, an internal standard solution bottle 101-2 which houses an internal standard solution, and a reference electrode solution bottle 101-3 which houses a reference electrode solution. The reagent container setting unit includes a partition wall between the dilute solution bottle 101-1 and the internal standard solution bottle 101-2, and the reference electrode solution bottle 101-3 when the dilute solution bottle 101-1, the internal standard solution bottle 101-2, and the reference electrode solution bottle 101-3 are set.
    Type: Grant
    Filed: March 26, 2019
    Date of Patent: May 14, 2024
    Assignee: HITACHI HIGH-TECH CORPORATION
    Inventors: Takushi Miyakawa, Masaki Hara, Tetsuji Kawahara
  • Patent number: 11977026
    Abstract: This invention addresses the abovementioned problem, and the purpose of this invention is to provide a far-infrared spectroscopy device that uses an is-TPG method to generate far-infrared light, and is capable of efficiently detecting is-TPG light without a detection optical system being fine-tuned. Even if the far-infrared light incidence angles on an Si prism for detection are the same when far-infrared light having a first frequency is incident on a non-linear optical crystal for detection and when far-infrared light having a second frequency is incident on the non-linear optical crystal for detection, this far-infrared spectroscopy device adjusts the incidence surface angle of pump light in relation to the non-linear optical crystal for detection such that the angle of the far-infrared light in relation to the pump light within the non-linear optical crystal for detection can be appropriately set for each far-infrared light frequency (see FIG. 1A).
    Type: Grant
    Filed: December 27, 2019
    Date of Patent: May 7, 2024
    Assignee: Hitachi High-Tech Corporation
    Inventors: Mizuki Mohara, Kei Shimura, Kenji Aiko
  • Patent number: 11978612
    Abstract: A plasma processing apparatus includes a processing chamber in which a sample is subjected to plasma processing, a first radio frequency power supply that supplies radio frequency power for generating plasma, a sample stage on which the sample is mounted, and a second radio frequency power supply that supplies radio frequency power to the sample stage, the plasma processing apparatus further includes a DC power supply that applies a DC voltage, that is changed according to a periodically repeated waveform, to the sample stage, and the waveform of one cycle has a period in which amplitude changes by a predetermined amount or more during a predetermined time. Accordingly, charged particles on a wafer surface are removed, a trench shape with high verticality can be obtained, and damage to a film that is not to be etched inside a trench can be reduced.
    Type: Grant
    Filed: July 11, 2022
    Date of Patent: May 7, 2024
    Assignee: HITACHI HIGH-TECH CORPORATION
    Inventors: Isao Mori, Masaru Izawa, Naoki Yasui, Norihiko Ikeda, Kazuya Yamada
  • Patent number: 11977050
    Abstract: An analysis unit 111 for automatically analyzing a sample comprises a sample dispensing nozzle 2 for dispensing the sample and an electrolyte measurement unit 114 for carrying out internal standard liquid measurement one or more times at least before measuring the electric potential of the sample. If the electrolyte measurement unit 114 is to carry out the electric potential measurement of the sample in succession, a different internal standard liquid measurement operation is carried out before the electric potential measurement than if the electric potential measurement is not to be carried out in succession and there are to be gaps between measurement intervals. This results in the provision of an automated analyzer, automatic analysis system, and automatic sample analysis method that make it possible to reduce the influence of ambient temperature on electrolyte measurement, ensure measurement accuracy, and enhance overall device processing capacity.
    Type: Grant
    Filed: October 30, 2019
    Date of Patent: May 7, 2024
    Assignee: HITACHI HIGH-TECH CORPORATION
    Inventors: Masashi Fukaya, Akihiro Yasui
  • Patent number: 11977035
    Abstract: A surface shape detection device using differential interference optics achieves restoration error reduction of a surface shape while maintaining resolution.
    Type: Grant
    Filed: April 8, 2019
    Date of Patent: May 7, 2024
    Assignee: HITACHI HIGH-TECH CORPORATION
    Inventors: Kenichiro Yamada, Shinsuke Onoe, Makoto Hosaka
  • Patent number: 11978609
    Abstract: An electron gun EG in which mixing of secondary electrons is suppressed is provided. The electron gun EG has an electron source 1, an extraction electrode 2 for extracting an electron beam E1 from the electron source 1, and an acceleration electrode for accelerating the extracted electron beam E1. The extraction electrode 2 includes a diaphragm 4 for allowing a part of the electron beam E1 to pass through, a shield 5 positioned above the diaphragm 4 apart from the diaphragm 4, and a shield 6 positioned below the diaphragm 4 apart from the diaphragm 4. The diaphragm 4 has an opening OP4 having an opening diameter D4, the shield 5 has an opening OP5 having an opening diameter D5 which is greater than the opening diameter D4, and the shield 6 has an opening OP6 having an opening diameter D6 which is greater than the opening diameter D4.
    Type: Grant
    Filed: May 21, 2019
    Date of Patent: May 7, 2024
    Assignee: Hitachi High-Tech Corporation
    Inventor: Minoru Kaneda
  • Patent number: 11977099
    Abstract: A method for manufacturing a semiconductor device in which probes and the layout of the electrode pads of a test element group (TEG) are associated is provided. As a semiconductor device is miniaturized, a scribe area on a wafer also tends to decrease. Accordingly, it is necessary to reduce the size of a TEG arranged in the scribe area, and efficiently arrange an electrode pad for probe contact. Thus, it is necessary to associate the probes and the layout of the electrode pad. According to the method, a layout of a TEG electrode pad corresponding to a plurality of probes arranged in a fan shape or probes manufactured by Micro Electro Mechanical Systems (MEMS) technology is provided.
    Type: Grant
    Filed: February 6, 2018
    Date of Patent: May 7, 2024
    Assignee: Hitachi High-Tech Corporation
    Inventors: Tomohisa Ohtaki, Takayuki Mizuno, Ryo Hirano, Toru Fujimura, Shigehiko Kato, Yasuhiko Nara, Katsuo Ohki, Akira Kageyama, Masaaki Komori
  • Publication number: 20240142477
    Abstract: Provided is an automatic analyzer without necessity of manual air vent in a pump. This automatic analyzer comprises a water supply tank, a supply path connected to each mechanism of an automatic analyzer from the water supply tank, a water supply pump which supplies water to each mechanism from the water supply tank through the supply path, a detector which detects abnormality in the supply path, a waste liquid path branched from the supply path in a branch pipe provided in the supply path, a relief valve provided in the waste liquid path, and a control unit which controls the operation of each mechanism in the automatic analyzer, in which the control unit opens the relief valve while driving the water supply pump, based on the abnormality in the supply path detected by the detector.
    Type: Application
    Filed: February 17, 2022
    Publication date: May 2, 2024
    Applicant: HITACHI HIGH-TECH CORPORATION
    Inventors: Yasuhisa Oguro, Hiroyuki Takayama, Kouhei Nonaka
  • Patent number: 11971423
    Abstract: An automatic analyzer is capable of transporting a sample at an optimum timing and a method of transporting the sample. An automatic analyzer includes an analysis unit which measures a sample, a transport unit which transports the sample to the analysis unit, and a control unit which controls the analysis unit and the transport unit. A sample is transported to the analysis unit by a time of starting an aspirating operation on the sample by allowing the analysis unit to perform a pre-measurement operation for each measuring method which needs to be performed before aspirating the sample even when the sample is still in the transport unit.
    Type: Grant
    Filed: May 16, 2019
    Date of Patent: April 30, 2024
    Assignee: HITACHI HIGH-TECH CORPORATION
    Inventors: Naoto Suzuki, Masashi Akutsu, Akihiro Yasui
  • Patent number: 11971425
    Abstract: An automatic analysis device has a plurality of types of photometers having different quantitative ranges, and an analysis control unit for quantifying the desired component in specimens based on measurement values of one or more photometers selected from among the plurality of types of photometers. The analysis control unit: sets a switching region in an overlap region of respective quantitative ranges of the plurality of types of photometers, said switching region having a greater width than does the variation in quantitative values of the desired component based on the measurement values of photometers having the same specimen; compares the quantitative value of a quantitative range portion that corresponds to the switching region and the quantitative values of the desired component based on the measurement values of the photometers; and selects a photometer to be used in quantitative output of the desired component from among the plurality of types of photometers.
    Type: Grant
    Filed: April 28, 2023
    Date of Patent: April 30, 2024
    Assignee: HITACHI HIGH-TECH CORPORATION
    Inventors: Yuto Kazama, Masahiko Iijima, Sakuichiro Adachi
  • Patent number: 11971426
    Abstract: An automatic analysis device that avoids carryover and prevents deterioration of analysis performance without controlling reaction cell position is provided with: a reaction cell in which a sample and a reagent are mixed and allowed to react; a light source that radiates light onto the mixed liquid of the sample and the reagent; a detector that detects the light radiated from the light source; and a cleaning mechanism that cleans the reaction cell. The cleaning mechanism includes an intake nozzle that draws in liquid from the reaction cell and a discharge nozzle that discharges the liquid into the reaction cell; the intake nozzle and the discharge nozzle can move vertically; and the intake nozzle is cleaned by lowering the intake nozzle into the reaction cell, in which a cleaning liquid or cleaning water have been accumulated, without drawing in the cleaning liquid or the cleaning water.
    Type: Grant
    Filed: January 23, 2019
    Date of Patent: April 30, 2024
    Assignee: Hitachi High-Tech Corporation
    Inventors: Rei Konishi, Nobuhiko Sasaki, Masahiko Iijima
  • Patent number: 11971424
    Abstract: An automatic analyzer is provided which is easier to investigate when some troubles such as data abnormality occur in a sample analysis result as compared with an automatic analyzer according to the related art. The automatic analyzer includes: analysis units that perform analysis and quality control analysis for ensuring quality of the analysis; a storage medium that stores quality control results of the quality control analysis performed by the analysis units; a monitor that displays the quality control results; and a control PC that controls an operation of the analysis units (8, 9, and 16), executes, when an arbitrary result is selected from the quality control results stored in the storage medium, based on the selected quality control result, statistical calculation of the selected result and a quality control result performed in the past, and causes the monitor to display a statistical calculation screen as a statistical calculation result.
    Type: Grant
    Filed: March 20, 2019
    Date of Patent: April 30, 2024
    Assignees: HITACHI HIGH-TECH CORPORATION, ROCHE DIAGNOSTICS OPERATIONS, INC.
    Inventors: Yuichi Hirabayashi, Dai Inagi, Satoshi Yokotsuka, Youichi Aruga, Mohamed Abouelsoud
  • Patent number: 11971427
    Abstract: Provided is an automated analysis device capable of a more accurate determination of the sizes of bubbles included in a liquid. The automated analysis device includes a detection unit which detects bubbles included in a liquid, an internal standard solution syringe which executes a first liquid supply operation in which a liquid is supplied via the detection unit, a diluent syringe, a sipper syringe, solenoid valves, and a control device which determines whether the size of the bubbles detected during the first liquid supply operation is normal or not based on the operation speed of the liquid supply unit, and controls the operation of the liquid supply unit according to the determination.
    Type: Grant
    Filed: March 10, 2020
    Date of Patent: April 30, 2024
    Assignee: HITACHI HIGH-TECH CORPORATION
    Inventors: Akinao Fujita, Takushi Miyakawa, Tetsuji Kawahara
  • Patent number: 11971346
    Abstract: A biological sample detection device configured to acquire color information of an object of analysis without a deterioration in color extraction accuracy caused by incorrect extraction of color of a colored label and to measure the amount of liquid and determine the type of a sample, by analyzing the biological sample housed in a biological sample tube to which a colored label is attached, and determining whether or not a colored label is present on the biological sample tube; extracting the colored label determined to be present by the colored label presence determining process; removing the colored label from the color image and extracting a detection object region in the biological sample; and analyzing to acquire color information of the detection object region and analyze the liquid amount and the type of the biological sample.
    Type: Grant
    Filed: January 14, 2020
    Date of Patent: April 30, 2024
    Assignee: HITACHI HIGH-TECH CORPORATION
    Inventors: Mayu Sao, Nobuyoshi Shimane, Fumiyasu Sato, Tomoto Kawamura
  • Patent number: 11972560
    Abstract: A machine learning device with a processor and a memory, in which the processor receives an image and calculates a feature amount of an object included in the image, the processor identifies a local part from the feature amount and calculates a local identification value, the processor calculates an overall identification value using the local identification value, and the processor generates a classifier using the local identification value and the overall identification value and stores it in the memory.
    Type: Grant
    Filed: June 24, 2019
    Date of Patent: April 30, 2024
    Assignee: HITACHI HIGH-TECH CORPORATION
    Inventors: Hideharu Hattori, Yasuki Kakishita, Kenko Uchida, Sadamitsu Aso, Toshinari Sakurai
  • Publication number: 20240132951
    Abstract: A gene analyzer that analyzes a base sequence of a sample manages an observation environment and mobility correction amount data for correcting a position in a time direction of time-series data of signal intensities of a plurality of bases, and executes the following processes including: a process of scaling the mobility correction amount data associated with the observation environment different from a first observation environment to generate default mobility correction amount data when the gene analyzer receives time-series data of signal intensities of a plurality of bases acquired by electrophoresing the sample in the first observation environment; a process of correcting the position in the time direction of the time-series data of the signal intensities of the plurality of bases using an optimization algorithm; and a process of identifying the base sequence of the sample using the corrected time-series data of the signal intensities of the plurality of bases.
    Type: Application
    Filed: May 17, 2021
    Publication date: April 25, 2024
    Applicant: Hitachi High-Tech Corporation
    Inventor: Toru YOKOYAMA
  • Patent number: 11965820
    Abstract: A reaction vessel capable of measuring a light amount from a reaction liquid without degrading a function of maintaining the reaction vessel at a predetermined temperature is provided. A reaction vessel including a cylindrical shape centered on a first axis, in which an overall length in a first axis direction is longer than an overall length in a second axis direction and an overall length in a third axis direction, the second axis being perpendicular to the first axis and the third axis being perpendicular to the first axis and the second axis. The reaction vessel includes: an opening part which dispenses a liquid at a portion on one end side in the first axis direction; a first flat surface and a second flat surface which is substantially parallel to the first flat surface.
    Type: Grant
    Filed: June 20, 2019
    Date of Patent: April 23, 2024
    Assignee: Hitachi High-Tech Corporation
    Inventors: Yuya Matsuoka, Eiichiro Takada