Microscope

- Nikon
Skip to: Description  ·  References Cited  · Patent History  ·  Patent History
Description

FIG. 1 is a front elevational view of a microscope showing our new design;

FIG. 2 is a left side elevational view thereof;

FIG. 3 is a rear elevational view thereof;

FIG. 4 is a right side elevational view thereof;

FIG. 5 is a top plan elevational view thereof; and,

FIG. 6 is a bottom plan elevational view thereof.

Referenced Cited
U.S. Patent Documents
D273592 April 24, 1984 Armbruster
D296904 July 26, 1988 Lukaszewski
D340251 October 12, 1993 Frenkler et al.
D345746 April 5, 1994 Holbl
D354761 January 24, 1995 Komatsuzaki et al.
1853674 April 1932 Englemann
2166034 July 1939 Allison
2195657 April 1940 Oit
2967456 January 1961 Maier
3064529 November 1962 Straat
4283111 August 11, 1981 Wieber et al.
5198927 March 30, 1993 Rathbone et al.
Patent History
Patent number: D395664
Type: Grant
Filed: Mar 24, 1997
Date of Patent: Jun 30, 1998
Assignee: Nikon Corporation (Tokyo)
Inventors: Akira Nojima (Fussa), Arata Ono (Urawa)
Primary Examiner: Paula A. Mortimer
Law Firm: Oliff & Berridge, P.L.C.
Application Number: 0/68,641
Classifications
Current U.S. Class: Microscope (D16/131)
International Classification: 1606;