Semiconductor wafer inspection apparatus

Description

FIG. 1 is a front elevational view of a semiconductor wafer inspection apparatus, showing my new design;

FIG. 2 is a bottom view thereof;

FIG. 3 is a right side elevational view thereof;

FIG. 4 is a left side elevational view thereof;

FIG. 5 is a top view thereof;

FIG. 6 is a rear elevational view thereof; and,

FIG. 7 is a perspective view thereof.

The broken line showing in each of the figures is for illustrative purposes only and forms no part of the claimed design.

Claims

The ornamental design for a semiconductor wafer inspection apparatus, as shown and described.