Antenna

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Description

FIG. 1 is a top plan view;

FIG. 2 is a bottom plan view;

FIG. 3 is the front elevational view;

FIG. 4 is the rear elevational view;

FIG. 5 is a right side elevational view;

FIG. 6 is a left side elevational view;

FIG. 7 is a perspective view showing a top side, a front side, and a right side thereof; and,

FIG. 8 is a perspective view showing a bottom side, a rear side, and a left side thereof.

The antenna is used in the state in which the antenna is affixed to a semiconductor device such as an IC chip.

Claims

We claim, the ornamental design for an antenna, as shown and described.

Referenced Cited
U.S. Patent Documents
3810147 May 1974 Lichtblau
4605845 August 12, 1986 Takeda
D358142 May 9, 1995 Gloton
6381416 April 30, 2002 Manico et al.
6772546 August 10, 2004 Latschbacher et al.
D544469 June 12, 2007 Oshima
7335556 February 26, 2008 Yamaguchi et al.
7345583 March 18, 2008 Reid et al.
7354801 April 8, 2008 Sugiyama et al.
7471205 December 30, 2008 Garber et al.
20070023758 February 1, 2007 Tsurume et al.
20070107827 May 17, 2007 Takahashi et al.
20080001825 January 3, 2008 Kurokawa et al.
20080048180 February 28, 2008 Abe et al.
20080087990 April 17, 2008 Kato et al.
20080138971 June 12, 2008 Yamaguchi et al.
20080220570 September 11, 2008 Ohnuma et al.
20080237779 October 2, 2008 Yamazaki et al.
20080245880 October 9, 2008 Yamazaki
20080277660 November 13, 2008 Tsurume et al.
Foreign Patent Documents
1195024 January 2004 JP
1238384 May 2005 JP
D112282 June 2006 TW
D112283 August 2006 TW
Other references
  • Photo of RFID tag from http://media.prylfeber.se dated Apr. 28, 2006.
  • Photo of Texas Instruments RFID tags from http://www.mwrf.com dated May 6, 2005.
  • Drawing of RFID tag from http://www.cst.com dated Jan. 13, 2007.
  • Photo of RFID tag from http://unmediated.org dated Oct. 11, 2007.
Patent History
Patent number: D645029
Type: Grant
Filed: Nov 3, 2008
Date of Patent: Sep 13, 2011
Assignee: Semiconductor Energy Laboratory Co., Ltd. (Kanagawa-ken)
Inventors: Yuto Yakubo (Atsugi-Kanagawa), Kazuma Furutani (Kanagawa)
Primary Examiner: Celia Murphy
Assistant Examiner: John Windmuller
Attorney: Nixon Peabody LLP
Application Number: 29/327,248
Classifications