Semiconductor device
Latest Mitsubishi Electric Corporation Patents:
The broken lines shown in the drawings represent portions of the semiconductor device that form no part of the claimed design.
Claims
The ornamental design for a semiconductor device, as shown and described.
3762039 | October 1973 | Douglass et al. |
3846734 | November 1974 | Pauza et al. |
D288922 | March 24, 1987 | Olla |
4663833 | May 12, 1987 | Tanaka et al. |
D316848 | May 14, 1991 | Hasegawa et al. |
D317300 | June 4, 1991 | Hasegawa et al. |
D318271 | July 16, 1991 | Hasegawa et al. |
D345731 | April 5, 1994 | Owens et al. |
D357671 | April 25, 1995 | Terasawa et al. |
D357672 | April 25, 1995 | Terasawa et al. |
D358806 | May 30, 1995 | Siegel et al. |
D359028 | June 6, 1995 | Siegel et al. |
D360619 | July 25, 1995 | Terasawa et al. |
D389808 | January 27, 1998 | Yamada et al. |
D394244 | May 12, 1998 | Majumdar et al. |
D396450 | July 28, 1998 | Nishiura et al. |
D470825 | February 25, 2003 | Iwasaki et al. |
D476959 | July 8, 2003 | Yamada et al. |
D505399 | May 24, 2005 | Yoshida et al. |
D505400 | May 24, 2005 | Kawafuji et al. |
D539761 | April 3, 2007 | Takahashi et al. |
D548202 | August 7, 2007 | Takahashi |
D548203 | August 7, 2007 | Takahashi |
D587662 | March 3, 2009 | Soutome et al. |
D589012 | March 24, 2009 | Soyano et al. |
D606951 | December 29, 2009 | Soyano et al. |
D653633 | February 7, 2012 | Soyano |
D653634 | February 7, 2012 | Soyano |
D674760 | January 22, 2013 | Mochizuki et al. |
D686174 | July 16, 2013 | Soyano |
D704670 | May 13, 2014 | Chen et al. |
D704671 | May 13, 2014 | Chen et al. |
D705184 | May 20, 2014 | Takahashi et al. |
20010038143 | November 8, 2001 | Sonobe et al. |
20030042584 | March 6, 2003 | Yamaguchi |
20100149774 | June 17, 2010 | Matsumoto et al. |
1411477 | April 2011 | JP |
1411478 | April 2011 | JP |
Type: Grant
Filed: Aug 16, 2013
Date of Patent: Dec 16, 2014
Assignee: Mitsubishi Electric Corporation (Tokyo)
Inventors: Tatsuya Kawase (Chiyoda-ku), Noboru Miyamoto (Chiyoda-ku), Mikio Ishihara (Chiyoda-ku)
Primary Examiner: Elizabeth J Oswecki
Application Number: 29/464,434