Fluorescent X-ray coating thickness gauge

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Description

This application contains subject matter related to the following co-pending U.S. design patent application:

Application Ser. No. 29/529,938, filed herewith and entitled “Fluorescent X-Ray Coating Thickness Gauge”.

FIG. 1 is a perspective view of a fluorescent x-ray coating thickness gauge according to the design;

FIG. 2 is a front elevational view thereof;

FIG. 3 is a right side elevational view thereof;

FIG. 4 is a left side elevational view thereof;

FIG. 5 is a top plan view thereof;

FIG. 6 is a bottom plan view thereof;

FIG. 7 is a rear elevational view thereof; and,

FIG. 8 is a partially enlarged view of FIG. 2 showing the “power up” mode. The eleven circular elements within the interior rectangular feature are only visible in the “power-up” mode.

The dash-dot-dash broken lines shown in FIG. 2 and FIG. 8 are to identify the portion of the design shown in the enlarged view of FIG. 8. All other broken lines illustrate environmental subject matter and are for illustrative purposes only. The broken lines form no part of the claimed design.

Claims

The ornamental design for a fluorescent x-ray coating thickness gauge, as shown and described.

Referenced Cited
U.S. Patent Documents
D247226 February 14, 1978 Bruni
D320450 October 1, 1991 Hicaro, Jr.
D515707 February 21, 2006 Shinohara
D702350 April 8, 2014 Nasella
D724214 March 10, 2015 Ihara
Patent History
Patent number: D781424
Type: Grant
Filed: Jun 11, 2015
Date of Patent: Mar 14, 2017
Assignee: Hitachi High-Tech Science Corporation (Tokyo)
Inventors: Ai Masuda (Tokyo), Hiroyuki Noda (Tokyo), Toshiyuki Takahara (Tokyo), Ryouei Nozawa (Tokyo), Isao Yagi (Tokyo)
Primary Examiner: Anhdao Doan
Application Number: 29/529,941
Classifications