Fluorescent X-ray coating thickness gauge
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This application contains subject matter related to the following co-pending U.S. design patent application:
Application Ser. No. 29/529,938, filed herewith and entitled “Fluorescent X-Ray Coating Thickness Gauge”.
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Claims
The ornamental design for a fluorescent x-ray coating thickness gauge, as shown and described.
Type: Grant
Filed: Jun 11, 2015
Date of Patent: Mar 14, 2017
Assignee: Hitachi High-Tech Science Corporation (Tokyo)
Inventors: Ai Masuda (Tokyo), Hiroyuki Noda (Tokyo), Toshiyuki Takahara (Tokyo), Ryouei Nozawa (Tokyo), Isao Yagi (Tokyo)
Primary Examiner: Anhdao Doan
Application Number: 29/529,941