Microscope
- Nikon
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Description
The features shown in broken lines in the drawings depict portions of the article that form no part of the claimed design. The dash-dotted lines denote the boundary of the claim and form no part of the claimed design.
Claims
The ornamental design for a microscope, as shown and described.
Referenced Cited
U.S. Patent Documents
Other references
D354299 | January 10, 1995 | Hofmann-Igl |
D356804 | March 28, 1995 | Hofmann-Igl |
D369611 | May 7, 1996 | Hasegawa |
D690342 | September 24, 2013 | Funakoshi |
20030107800 | June 12, 2003 | Doering |
20040027654 | February 12, 2004 | Gonschor |
20100195199 | August 5, 2010 | Tamura |
- Catalog of “Eclipse Ti”, published by Nikon Corporation, Dec. 2014.
- Catalog of “Eclipse TS100”, published by Nikon Corporation, Mar. 2015.
Patent History
Patent number: D783072
Type: Grant
Filed: Apr 13, 2016
Date of Patent: Apr 4, 2017
Assignee: Nikon Corporation (Tokyo)
Inventors: Masaaki Yanagisawa (Chigasaki), Tatsuya Kobayashi (Tokyo)
Primary Examiner: Sheryl Lane
Assistant Examiner: Calvin E Vansant
Application Number: 29/561,114
Type: Grant
Filed: Apr 13, 2016
Date of Patent: Apr 4, 2017
Assignee: Nikon Corporation (Tokyo)
Inventors: Masaaki Yanagisawa (Chigasaki), Tatsuya Kobayashi (Tokyo)
Primary Examiner: Sheryl Lane
Assistant Examiner: Calvin E Vansant
Application Number: 29/561,114
Classifications
Current U.S. Class:
Microscope (D16/131)