Instrument cluster
Latest DENSO International America, Inc. Patents:
The rear edge of the instrument cluster is depicted by a broken lines since it forms no part of the claimed design. Portions of the gauges are depicted by broken lines since they form no part of the claimed design.
Claims
The ornamental design for an instrument cluster, as shown and described.
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Type: Grant
Filed: Dec 4, 2015
Date of Patent: Jul 11, 2017
Assignees: DENSO International America, Inc. (Southfield, MI), DENSO CORPORATION (Kariya, Aichi-pref.)
Inventors: Marc Arceo (Livonia, MI), Teruhito Suzuki (Northville, MI), Dustin Garrett (Coleman, MI), Cary Horvath (Dearborn, MI)
Primary Examiner: Phillip S Hyder
Application Number: 29/547,534