Component for X-ray detector
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The features shown in broken lines depict environmental subject matter only and form no part of the claimed design.
Claims
The ornamental design for a component for X-ray detector, as shown and described.
4574983 | March 11, 1986 | Fatkin |
5317617 | May 31, 1994 | Lange |
RE37614 | April 2, 2002 | Ohlson |
7019303 | March 28, 2006 | Homme |
7151263 | December 19, 2006 | Homme |
7242011 | July 10, 2007 | Nakajo |
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20040047448 | March 11, 2004 | Kerschner |
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Type: Grant
Filed: Sep 27, 2016
Date of Patent: Jun 26, 2018
Assignee: HAMAMATSU PHOTONICS K.K. (Hamamatsu-shi, Shizuoka)
Inventor: Tatsuya Onishi (Hamamatsu)
Primary Examiner: Andhao Doan
Application Number: 29/578,998