Layout of contacts

- AEHR TEST SYSTEMS
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Description

FIG. 1 is a bottom view of a portion of an electronics tester showing a layout of contacts according to an embodiment of our design with non-essential features shown in dotted lines; and,

FIG. 2 is a bottom view of a portion of the layout of contacts according to the embodiment of our design.

Claims

The ornamental design of a layout of contacts, as shown and described.

Referenced Cited
U.S. Patent Documents
D810706 February 20, 2018 Soyano et al.
10243108 March 26, 2019 Chou
Patent History
Patent number: D875579
Type: Grant
Filed: Apr 8, 2019
Date of Patent: Feb 18, 2020
Assignee: AEHR TEST SYSTEMS (Fremont, CA)
Inventors: Jovan Jovanovic (Santa Clara, CA), Scott E. Lindsey (Brentwood, CA), Steven C. Steps (Saratoga, CA), David S. Hendrickson (San Jose, CA)
Primary Examiner: Antoine Duval Davis
Application Number: 29/686,859