Unijunction Transistor, I.e., Three Terminal Device With Only One P-n Junction Having A Negative Resistance Region In The I-v Characteristic (epo) Patents (Class 257/E27.08)
  • Patent number: 7973344
    Abstract: Double gate JFET with reduced area consumption and fabrication method therefore. Double-gate semiconductor device including a substrate having a shallow trench isolator region comprising a first STI and a second STI, a channel region having a first and second channel edges, the channel region formed in the substrate and disposed between and in contact with the first STI and the second STI at the first and second channel edge. The first STI has a first cavity at the first channel edge, and the second STI has a second cavity at the second channel edge. The device further includes a gate electrode region comprising conductive material filling at least one of the first and second cavities. At least one of the first and second cavities is physically configured to provide electrical coupling of the gate electrode region to a back-gate P-N junction.
    Type: Grant
    Filed: April 30, 2008
    Date of Patent: July 5, 2011
    Assignee: SuVolta, Inc.
    Inventor: Srinivasan R. Banna
  • Patent number: 7763880
    Abstract: A multi-terminal electrically actuated switch comprises a source electrode, a drain electrode, and an active region physically connected to both electrodes. The active region comprises at least one primary active region comprising at least one material that can be doped or undoped to change its electrical conductivity, and a secondary active region comprising at least one material for providing a source/sink of ionic species that act as dopants for the primary active region(s). A gate electrode is physically connected to the source/sink region. Methods of operating the switch are also provided.
    Type: Grant
    Filed: February 14, 2007
    Date of Patent: July 27, 2010
    Assignee: Hewlett-Packard Development Company, L.P.
    Inventor: R. Stanley Williams
  • Patent number: 6777757
    Abstract: A programmable memory cell comprised of a transistor located at the crosspoint of a column bitline and a row wordline is disclosed. The transistor has its gate formed from the column bitline and its source connected to the row wordline. The memory cell is programmed by applying a voltage potential between the column bitline and the row wordline to produce a programmed n+ region in the substrate underlying the gate of the transistor.
    Type: Grant
    Filed: April 26, 2002
    Date of Patent: August 17, 2004
    Assignee: Kilopass Technologies, Inc.
    Inventors: Jack Zezhong Peng, David Fong