Plural Tests Patents (Class 324/227)
  • Patent number: 5565771
    Abstract: A magnetic testing device for detecting loss of metallic area and internal and external defects in elongated magnetically-permeable objects includes a permanent magnet assembly having poles adapted to be spaced apart in the longitudinal direction of an elongated object for inducing a longitudinal magnetic flux in a section of the object between the poles of the magnet assembly, the magnet assembly being strong enough to magnetically saturate the section of the object. A tubular pole piece is arranged to surround the object adjacent each pole of the permanent magnetic assembly for directing the magnetic flux into the object at one pole and out of the object at the other pole. Hall effect devices are placed in the path of the magnetic flux for sensing the reduction of the flux passing through the elongated object due to any reduction of cross-sectional area of the elongated object between the pole pieces caused by loss of metallic area in the elongated object.
    Type: Grant
    Filed: January 18, 1995
    Date of Patent: October 15, 1996
    Assignee: Noranda, Inc.
    Inventors: Michel Hamelin, Frank Kitzinger
  • Patent number: 5541510
    Abstract: This invention uses a single eddy current coil to measure multiple parameters of conductive target simultaneously using a single fixed frequency. For example, the system consisting of the sensor coil, connecting cable, and signal conditioning electronics, can measure the thickness of a target and the distance of the target from the coil. Alternatively, it could simultaneously measure the distance of the target to the coil, i.e. lift-off, and one of the electrical properties of the target, such as the resistivity. The present system is useful in material characterization of targets where the lift-off information can be used to correct for any lift-off induced error in the apparent resistivity. In general, it can determine any pair of two characteristics of the target/sensor relationship simultaneously.
    Type: Grant
    Filed: April 6, 1995
    Date of Patent: July 30, 1996
    Assignee: Kaman Instrumentation Corporation
    Inventor: Tim Danielson
  • Patent number: 5525903
    Abstract: A sensor arrangement and a method of acquiring properties of the surface layer (3) of a metallic target (2), which allow a nondestructive and substantially distance-independent measurement to be performed, with the requirements to be met by the sensor positioning being minimal. The sensor arrangement (1) comprises a combination of at least one eddy-current sensor (5) with at least one displacement measuring sensor (6), the depth of penetration of the eddy currents generated by the eddy-current sensor (5) corresponding to at least twice the thickness of the surface layer (3), and the displacement measuring sensor (6) serving to determine the distance of the sensor arrangement (1) from the target surface (4).
    Type: Grant
    Filed: August 18, 1994
    Date of Patent: June 11, 1996
    Assignee: Micro-Epsilon Messtechnik GmbH & Co. KG
    Inventors: Roland Mandl, Axel Seikowsky, Andreas Spang
  • Patent number: 5508610
    Abstract: An electrical conductivity tester accurately measures the time-varying electrical conductivity .sigma.(t) and steady-state electrical conductivity .sigma..sub.ss of a test material. In a first embodiment, the transmission phase of a probe circuit is monitored to determine the conductivity of a test material. In the first embodiment, an oscillator circuit generates a reference oscillator signal. A probe circuit receives the reference oscillator signal, magnetically couples to the test material, and modifies the reference oscillator signal via electromagnetic induction to derive a modified transmission phase signal. Finally, a phase detector circuit derives a transmission phase signal by combining the reference oscillator signal and the modified transmission phase signal, the transmission phase signal being directly convertible to the conductivity. In a second embodiment, an amplifier is connected to the probe circuit to form an oscillator circuit.
    Type: Grant
    Filed: December 3, 1992
    Date of Patent: April 16, 1996
    Assignee: Georgia Tech Research Corporation
    Inventors: Robert K. Feeney, Ajeet Rohatgi, David R. Hertling
  • Patent number: 5501105
    Abstract: The present invention is a method and system for accurately analyzing shaft encoder signals from rotating machines. The invention reduces noise and other interferences in the encoder signals by novel means that yield an unprecedented power for extracting useful information. Signal distortion due to variation in the rotation rate of the machinery and due to FFT leakage are eliminated by acquiring digital values of the encoder signals at a set of discrete times that are determined by the properly averaged rotation rate of the shaft and requiring a fixed integer number of these discrete times per rotation of the shaft. Amplitude modulation is eliminated by proper spectral combination of left and right sidebands of the main encoder signal. Additive noise is removed by multiplying sidebands and averaging the results over a number of data records.
    Type: Grant
    Filed: August 15, 1994
    Date of Patent: March 26, 1996
    Assignee: Monitoring Technology Corp.
    Inventors: Walter Hernandez, Richard Sutermeister
  • Patent number: 5483160
    Abstract: An eddy current testing system consists of a multi-sensor probe, a computer and a special expansion card and software for data collection and analysis. The probe incorporates an excitation coil, and sensor coils; at least one sensor coil is a lateral current-normal coil and at least one is a current perturbation coil.
    Type: Grant
    Filed: February 28, 1994
    Date of Patent: January 9, 1996
    Assignee: United Kingdom Atomic Energy Authority
    Inventors: James A. Gulliver, Christopher C. Holt, Kenneth D. Boness, Martin R. Anderson, deceased
  • Patent number: 5475305
    Abstract: A magnetic inspection probe for use in the planar measurement of magnetic properties in two or more defined directions. The inspection probe includes a cup-shaped outer body, a centrally disposed central core, a field generating power coil, a flux coil for measuring magnetic induction and a plurality of field detection elements disposed in various known orientations. In use, the inspection probe of the present invention permits the detection and measurement of anisotropy of material characteristics in at least two directions across the plane of measurement.
    Type: Grant
    Filed: February 18, 1993
    Date of Patent: December 12, 1995
    Assignee: Iowa State University Research Foundation, Inc.
    Inventors: David C. Jiles, Michael K. Devine
  • Patent number: 5473248
    Abstract: A system and method of automatic, in-line electrical quality control of a carbon anode including detecting internal flaws in the carbon anode by measuring an eddy-current loss of the carbon anode and determining intrinsic resistivity of the carbon anode by measuring resistivity of the carbon anode and determining the electrical quality of the carbon anode according to the measured eddy-current loss and the measured resistivity.
    Type: Grant
    Filed: April 3, 1995
    Date of Patent: December 5, 1995
    Assignee: The University of Maryland at College Park
    Inventors: Paul R. Haldemann, Eman P. Fawzi
  • Patent number: 5473247
    Abstract: Apparatus for non-destructive examination of a plate for defects existing in one of both of opposed first and second surfaces thereof includes a rotatable support platform, an eddy current coil structure for inducing eddy currrents in the plate located at a first location in the platform, a first magnetic flux generator disposed at a second location in the platform, the second location being opposite the first location on a line extending from the first location through the platform center. A drive unit rotates the platform relative to the plate.
    Type: Grant
    Filed: April 6, 1993
    Date of Patent: December 5, 1995
    Assignee: Magnetic Analysis Corporation
    Inventors: Zhongging You, Robert A. Brooks, Richard Colman, Paul J. Bebick
  • Patent number: 5467014
    Abstract: A device for measuring the thickness of a layer of coating on a metal surface is disclosed. The device includes a housing, a first magnetic probe mounted on the housing for measuring the thickness of the layer on a metal substrate containing iron, and a second eddy current probe mounted on the housing for measuring the thickness of the layer on a metal substrate which does not contain iron. The first and second probes are physically separated from each other on the housing. A calculating circuit receives the output of one of the first and second probes and calculates the thickness of the layer as a function of the output of the one of the first and second probes. A display is coupled to the calculating circuit for displaying the thickness of the layer being measured.
    Type: Grant
    Filed: December 9, 1992
    Date of Patent: November 14, 1995
    Inventor: Norbert Nix
  • Patent number: 5461313
    Abstract: There is provided a transient electromagnetic method and apparatus for inspecting objects. The apparatus includes a sensing portion, which has a transmitting antenna and at least one receiving antenna thereon. The sensing portion is located adjacent to the object which is to be inspected such that the antennas are adjacent to the object. There is also a magnet located adjacent to the sensing portion. The magnet has poles located adjacent to the object, so as to provide a steady-state magnetic field to the object. By inducing eddy currents into the object, families of cracks, such as caused by environmental conditions, can be detected. In addition, magnetic flux leakage methods can be used in combination with the transient electromagnetic method to further assisting detecting crack families in pipeline inspection applications.
    Type: Grant
    Filed: June 21, 1993
    Date of Patent: October 24, 1995
    Assignee: Atlantic Richfield Company
    Inventors: William M. Bohon, Pedro F. Lara
  • Patent number: 5453689
    Abstract: Apparatus and methods are disclosed which provide increased sensitivity, selectivity and dynamic range for non-contact measurement of actual physical and/or kinematic properties of conducting and magnetic materials. The apparatus and methods are based upon various methods for increasing sensitivity, selectivity and dynamic range through proper construction of a magnetometer sensor and for proper selection of operating point parameters for the application. A measurement apparatus for measuring one or more MUT properties includes an electromagnetic winding structure which, when driven by an electric signal, imposes a magnetic field in the MUT and senses an electromagnetic response. An analyzer is provided for applying the electric signal to the winding structure. A property estimator is coupled to the winding structure and translates sensed electromagnetic responses into estimates of one or more preselected properties of the material.
    Type: Grant
    Filed: December 6, 1991
    Date of Patent: September 26, 1995
    Assignee: Massachusetts Institute of Technology
    Inventors: Neil J. Goldfine, James R. Melcher, deceased
  • Patent number: 5442285
    Abstract: The present invention provides an eddy current sensing device capable of in-situ operation within a high temperature and high vibration environment of a combustion turbine engine. The eddy current sensing device is preferably utilized in an eddy current sensing system for monitoring crack formation and displacement of rotating members of the combustion turbine engine. The method according to the present invention provides inducing eddy currents in the rotating member, detecting the eddy currents, providing a signal indicative of the detected eddy currents, filtering the signal based on the condition to be monitored and evaluating the filtered signal to determine whether the condition, such as the formation of a crack in the surface of the rotating member exists, and if so, determining whether the condition is critical or routine.
    Type: Grant
    Filed: February 28, 1994
    Date of Patent: August 15, 1995
    Assignee: Westinghouse Electric Corporation
    Inventors: Paul J. Zombo, Michael J. Metala, Charles C. Moore, Paul Guenther, Oran L. Bertsch
  • Patent number: 5430376
    Abstract: A microcomputer or PC based non-destructive coated-object testing system and method combines thermoelectrically measured surface coating thickness data with flaw/crack depth data determined from eddy current measurements of the surface of the object to locate and selectively identify faults or cracks which penetrate the surface coating. The microcomputer controls scanning of eddy-current and thermoelectric probes over the object surface and stores measured data along with surface coordinate information to provide a color-keyed graphics display of surface conditions for visual analysis.
    Type: Grant
    Filed: June 9, 1993
    Date of Patent: July 4, 1995
    Assignee: General Electric Company
    Inventor: John R. M. Viertl
  • Patent number: 5418456
    Abstract: A production measuring system is provided for early identification of dimensional or operational problems in a pilger forming device. The forming device has a mandrel for supporting a tubular workpiece to be elongated and thinned, at least two opposed dies bearing against the workpiece, and a mechanical drive for rolling the dies over the workpiece under pressure while periodically rotating and advancing the workpiece along the mandrel. Sensors are directed at the workpiece and produce signals reflecting displacement of the workpiece in rotation, axial displacement and transverse displacement. The signals can be compared to nominal standards and/or graphed and displayed, for visualizing operational conditions. The sensors can be disposed axially before or after the dies, or both.
    Type: Grant
    Filed: June 17, 1992
    Date of Patent: May 23, 1995
    Assignee: Westinghouse Electric Corporation
    Inventors: Charles S. Cook, Edward S. Diaz
  • Patent number: 5418457
    Abstract: A system and method is provided for aligning a scanning surface of an inspection probe relative to a workpiece surface under inspection. The probe preferably includes at least three alignment eddy current elements, each producing a respective spacing indication electrical signal in accordance with a spacing between each alignment eddy current element and the workpiece. The system further comprises processing means which receives each spacing-indication electrical signal so as to generate data indicative of the relative alignment between the scanning surface of the probe and the workpiece surface. A controller is responsive to the alignment data for aligning the probe such that in operation the scanning surface thereof is substantially parallel relative to the workpiece surface. The probe can include inspection eddy current elements, in which case the alignment and the inspection eddy current elements can be fabricated to form an integral eddy current inspection probe.
    Type: Grant
    Filed: March 12, 1993
    Date of Patent: May 23, 1995
    Assignee: General Electric Company
    Inventors: Kristina H. V. Hedengren, John D. Young
  • Patent number: 5416411
    Abstract: A system is provided for measuring the thickness of a ferromagnetic layer formed over a conductive base layer. An eddy current probe is provided for measuring the thickness of the ferromagnetic layer. The eddy current probe can be placed in direct contact with the ferromagnetic layer, or it may be spaced above its surface by an unknown standoff distance. This spacing may be caused by the presence of an overlying nonferrous, nonconductive layer applied over the ferromagnetic layer, or it may be an air gap over the ferromagnetic layer. An analog detector connected to the probe provides output values in two dimensions corresponding to the modulation of the probe's magnetic field by the ferromagnetic and conductive layers. These values are utilized to determine a mapping between the detector output values and ferromagnetic layer thickness and standoff values. The output of the mapping function provides two values, a ferromagnetic layer thickness and a standoff distance, which corresponds to the detected values.
    Type: Grant
    Filed: January 8, 1993
    Date of Patent: May 16, 1995
    Assignee: Lockheed Fort Worth Company
    Inventor: Dirk A. Elsmore
  • Patent number: 5414356
    Abstract: A fluxmeter includes an application unit for applying a magnetic field, a superconducting quantum interference element and a flux transmitting circuit. The flux transmitting circuit includes a pickup coil formed of a superconducting print coil and a core for the pickup coil. The core is formed of a soft magnetic material. The core serves to suppress the leakage of magnetic flux to magnetically couple the pickup coil and the superconducting quantum interference element efficiently to improve the sensitivity and resolution of the fluxmeter. The pickup coil may be manufactured by photolithography, sputtering, laser beam deposition, MBE deposition, MOCVD or spray pyrolysis.
    Type: Grant
    Filed: July 30, 1991
    Date of Patent: May 9, 1995
    Assignee: Hitachi, Ltd.
    Inventors: Toshihiko Yoshimura, Tasuku Shimizu, Yuichi Ishikawa, Masahiro Otaka, Yuko Koguchi, Kunio Enomoto, Kunio Hasegawa, Makoto Hayashi, Kazuo Takaku
  • Patent number: 5394083
    Abstract: A multiparameter magnetic imaging system and method to be used in the localized measurement of the magnetic properties of a material and the display of those properties in the form of a false color image indicating the occurrence of those properties across the surface of a sample specimen. The system includes an inspection probe to measure certain magnetic parameters across the surface of the specimen and means to determine a multiplicity of magnetic property values based on the measured data. The system also includes a visual display system which selectively displays the data relating to the determined magnetic properties in the form of a false color image indicating the presence and variation of these magnetic properties across the specimen surface.
    Type: Grant
    Filed: August 20, 1992
    Date of Patent: February 28, 1995
    Assignee: Iowa State University Research Foundation, Inc.
    Inventor: David C. Jiles
  • Patent number: 5371462
    Abstract: Disclosed are methods for processing and interpreting data acquired from an eddy current probe array inspection system, based on a background subtraction technique. Test and reference waveform data sets are acquired, and subsequently combined. However, the data sets are first normalized and registered to the same position, registering on characteristic signals produced when scanning over edges. Specific techniques are disclosed for normalizing, correcting for spatial offsets, determining the actual locations of edge signals by peak detection and correlation, and adjusting for variations in the number of points in the test and reference data sets.
    Type: Grant
    Filed: March 19, 1993
    Date of Patent: December 6, 1994
    Assignee: General Electric Company
    Inventors: Kristina H. V. Hedengren, Patrick J. Howard
  • Patent number: 5343146
    Abstract: A gauge probe for a handheld combination coating thickness gauge allows the combination coating thickness gauge to measure both nonferrous coatings on ferrous substrate and nonconductive coatings on conductive nonferrous substrate. The gauge probe enables the combination coating thickness gauge to determine automatically, with a single probe, the substrate characteristics, and to effect a measurement of the coating thickness on that substrate. The technique used to measure coatings on a ferrous substrate utilizes a permanent magnet to provide a constant magnetic flux and a Hall sensor and thermistor arranged to measure the temperature-compensated magnetic flux density at one of the poles of the permanent magnet. The flux density at the magnet pole can be related to a nonferrous coating thickness on a ferrous substrate. The technique used to measure nonconductive coatings on a conductive nonferrous substrate utilizes eddy current effects.
    Type: Grant
    Filed: October 5, 1992
    Date of Patent: August 30, 1994
    Assignee: De Felsko Corporation
    Inventors: Frank J. Koch, Leon C. Vandervalk, David J. Beamish
  • Patent number: 5292007
    Abstract: Method of and apparatus for continuous non-destructive testing of bar-shaped specimens formed of iron-containing material of specific quality characteristics, where the bar-shaped specimens, such as pipes, move on a roll table (2) along an elongated path through two testing blocks (8, 9) spaced apart along the path. The testing blocks (8, 9) are mechanically decoupled from one another and are logically linked to an electronic testing installation (10). As a specimen moves through a first testing block (8) a signal is developed indicating the presence or absence of flaws and their location in the specimen. The location is referred to the length of the specimens. The testing blocks (8, 9) are located between a supply station (1) and a sorting station (3) with the roll table (2) extending between the two stations. Based on the signals generated, the specimens are sorted in the sorting station between an accepted tray (4) and a number of rejected trays (5, 6, 7) for reworkable or scrap specimens.
    Type: Grant
    Filed: March 11, 1991
    Date of Patent: March 8, 1994
    Assignee: Benteler Aktiengesellschaft
    Inventors: Gerhard Beer, Georg Kellersohn
  • Patent number: 5270646
    Abstract: Edge position determination of metallic materials by means of evaluation of the voltages which are induced in coils located at the edges of the material below the material and partially covered by the material as well as coils located inside of the first-mentioned coils in the transverse direction of the material, which latter coils are completely covered by the material in connection with a decaying magnetic field which is generated by the same coils.
    Type: Grant
    Filed: April 29, 1992
    Date of Patent: December 14, 1993
    Assignee: Asea Brown Boveri AB
    Inventors: Erik Kihlberg, Sten Linder, Lennart Thegel
  • Patent number: 5255981
    Abstract: A temperature sensor has a body whose thermal expansion is evaluated in the event of a change in temperature, there being deposited on the body a layer which has a layer structure containing less than 8% by weight of phosphorus, preferably containing up to 3% by weight of phosphorus, up to 2% by weight of an element of main group IV or main group V, in particular antimony, and up to 5% by weight of a transition metal element, in particular cobalt. The percentages by weight resulting from the sum being increased up to 100% with nickel. The layer modifies the magnetic flux in a coil arrangement comprising at least one coil. This change in the magnetic flux in the coil arrangement is evaluated and the change in the magnetic flux being detected as a change in the inductance. The change in length of the body and the change in temperature are deduced therefrom.
    Type: Grant
    Filed: January 29, 1993
    Date of Patent: October 26, 1993
    Assignee: Mercedes-Benz AG
    Inventors: Edmund Schiessle, Khaldoun Alasafi, Ralf Gutohrlein
  • Patent number: 5245279
    Abstract: A direct-current electromagnetic device for nondestructively detecting localized discontinuities in ferromagnetic objects is disclosed. The device comprises an adjustable dc excitor means, a magnetic flux injector means, an external magnetic field detector means, a plurality of position sensors, a signal processing means and a control means. It is particularly adapted for detecting flaws in soiled and distorted ferromagnetic objects such as water wall tubes in industrial boilers. An apparatus incorporating the device and a method of detecting discontinuities are also disclosed.
    Type: Grant
    Filed: June 18, 1992
    Date of Patent: September 14, 1993
    Assignee: Niagara Mohawk Power Corporation
    Inventor: Gabor J. Bendzsak
  • Patent number: 5218295
    Abstract: System for processing fine position signals pulse-width modulates signals from two magnetic sensors for producing sinusoidal wave signals different from each other in phase by a quarter cycle in correspondence with the scale pitches, then switches the phase so as to bring the pair of pulse-modulated signals in phase with each other, then calculates the weight constants for the pair of pulse-width modulated signals in phase in order that of said pair of pulse-width modulated signals in phase, any one having a higher linearity will be treated at a handsome rate, and then subjects said pulse-width modulated signals to weighted mean by the use of the resultant weight constants, with the result that the pair of pulse-width modulated signals will become free from disorder at the switching point, thereby producing signals of a high accuracy representing fine positions corresponding to the scale pitch divided at regular intervals.
    Type: Grant
    Filed: April 15, 1991
    Date of Patent: June 8, 1993
    Assignee: Kayaba Kogyo Kabushiki Kaisha
    Inventors: Masakazu Nakazato, Yoshitsugu Tsuchiya, Kazuhisa Ikenoya, Yoichi Shimoura
  • Patent number: 5198765
    Abstract: A wire rope is tested simultaneously for multiple types of defects by magnetically saturating the rope at two locations in one sense and at an intermediate location in an opposite sense. A sensing coil at any of these locations detects cross sectional area variations in the rope. Two sensing coils positioned respectively between each pair of adjacent locations defect contact pattern variations in the rope. Broken wires are detected by two coils located respectively on opposing sides of the intermediate location and spaced apart by a distance which equals the radius of the coils.
    Type: Grant
    Filed: November 6, 1991
    Date of Patent: March 30, 1993
    Inventor: Nicolaas T. Van Der Walt
  • Patent number: 5180046
    Abstract: Coin discrimination apparatus comprises a path (1) for passage of coins under test; sensor coils (2, 3, 4) forming an inductive coupling with a coin under test during its passage along the path, each of the sensor coils being connected in a resonant circuit (10, 11, 12) which exhibits a resonant frequency that varies in dependence upon the inductive coupling between the coil and coin, control circuitry (14) which maintains the resonant circuit at the resonant frequency while a coin under test is inductively coupled to the coil, and amplitude responsive circuitry (MPU) responsive to the change in the amplitude of an oscillatory signal developed by the resonant circuit when the coin under test passes the sensor coil to discriminate between different coins, wherein the control circuitry includes a zero crossing detector (A1) responsive to the oscillatory signal crossing a zero threshold level for producing a rectangular waveform corresponding to the oscillatory signal, and drive circuitry (FF1, 2; OR1, 2) respon
    Type: Grant
    Filed: February 26, 1991
    Date of Patent: January 19, 1993
    Inventors: Les Hutton, John Kershaw
  • Patent number: 5164669
    Abstract: The invention is a method and apparatus for characterizing residual uniaxial stress in a ferromagnetic test member by distinguishing between residual stresses resulting from positive (tension) forces and negative (compression) forces by using the distinct and known magnetoacoustic (MAC) and a novel magnetoacoustic emission (MAE) measurement circuit means. A switch permits the selective operation of the respective circuit means.
    Type: Grant
    Filed: July 23, 1990
    Date of Patent: November 17, 1992
    Assignee: The United States of America as represented by the Administrator of the National Aeronautics and Space Administration
    Inventors: Min Namkung, Peter W. Kushnick, William T. Yost, John L. Grainger
  • Patent number: 5158166
    Abstract: A coin validator includes improved compensation circuitry for compensating for ambient conditions such as temperature or the presence of metallic objects, includes a path (1) for passage for coins under test, sensor coils (2, 3, 4) which form an inductive coupling with coins under test during their passage along the path, detectors (DM1, ADC) responsive to the impedance presented by the coil in the absence of a coin, for producing an ambient condition signal which is a function of an ambient condition such as temperature of the presence of metallic objects a controller (MPU 17) responsive to the inductive coupling between a coin travelling along the path past the coil, for providing signal which is a function of a characteristic of the coin, and a microprocessor (MPU) for modifying operation of the controller in dependence upon the ambient condition signal.
    Type: Grant
    Filed: May 18, 1990
    Date of Patent: October 27, 1992
    Assignee: Coin Controls Limited
    Inventor: Andrew W. Barson
  • Patent number: 5140264
    Abstract: The present invention provides a method and apparatus for performing nondestructive material assessment of service exposed combustion turbine blades. According to the invention, the testing is accomplished by inserting eddy current (EC) probes into the blade's cooling holes, and evaluating the eddy current response of the blade. The eddy current probes are preferably coupled together in a differential mode. The measured response is then compared with a previously determined response corresponding with a known material condition. An assessment of the blade is made on the basis of this comparison.
    Type: Grant
    Filed: June 24, 1991
    Date of Patent: August 18, 1992
    Assignee: Westinghouse Electric Corp.
    Inventors: Michael J. Metala, C. Gerard Beck
  • Patent number: 5134368
    Abstract: On the basis of a finding that a magnetic hysteresis of a metal material, among magnetization characteristics changing with secular degradation of the metal material, shows a clear correspondence with the degree of degradation of the metal material, a change in such a magnetization characteristic is measured to estimate the degree of secular degradation of the metal material. In a typical embodiment, a superconducting quantum interference device is used to detect the magnetization characteristic of a measuring object. According to the present invention, the degree of embrittlement of a metal material used in an environment of high temperatures can be quickly detected in a non-destructive fashion so that the danger of brittle fracture of the metal material can be reliably prevented.
    Type: Grant
    Filed: November 8, 1990
    Date of Patent: July 28, 1992
    Assignee: Hitachi, Ltd.
    Inventors: Masahiro Otaka, Kunio Enomoto, Kunio Hasegawa, Makoto Hayashi, Tasuku Shimizu, Kazuo Takaku
  • Patent number: 5109195
    Abstract: A method and apparatus for testing steel components for temper embrittlement uses magneto-acoustic emission to nondestructively evaluate the component. Acoustic emission signals occur more frequently at higher levels in embrittled components. A pair of electromagnets are used to create magnetic induction in the test component. Magneto-acoustic emission signals may be generated by applying an AC current to the electromagnets. The acoustic emission signals are analyzed to provide a comparison between a component known to be umembrittled and a test component. Magnetic remanence is determined by applying a DC current to the electromagnets, then turning the magnets off and observing the residual magnetic induction.
    Type: Grant
    Filed: December 12, 1989
    Date of Patent: April 28, 1992
    Inventors: Sidney G. Allison, Min Namkung, William T. Yost, John H. Cantrell
  • Patent number: 5089776
    Abstract: A magnetic defect detector having a pair of rotatable cylinders made of nonmagnetic material which pinch a running steel strip therebetween, two pairs of bearings being engaged with the end parts of the pair of cylinders. A pair of stationary shafts are respectively housed in the cylinders, the end parts of which are engaged with the bearings. A yoke is housed in one of the cylinders, the free ends of which are placed near to the pinched strip, and a magnetizing coil surrounds the yoke. At least one sensor is housed in the other of the cylinders, and it is placed near to the pinched strip.
    Type: Grant
    Filed: September 10, 1990
    Date of Patent: February 18, 1992
    Assignee: NKK Corporation
    Inventors: Takato Furukawa, Kenichi Iwanaga, Atsuhisa Takegoshi
  • Patent number: 5059905
    Abstract: A tool dullness indicator and method comprising the measurement of eddy currents at a known, controlled frequency directly in the tool by measuring the phase angle shift in a coil when a sample is put into or next to the coil. The phase angle change caused by presence of a workpiece is measured when the tool is sharp to provide a reference reading taking into account the surface hardness and other bulk properties of the workpiece, and arriving at a parameter that is dependent on eddy current changes, such as phase angle shift or other measurable changes related to eddy currents in the part, and then analyzing the workpiece, either while working, or at a set programmed check time to determine when the tool is dull as a function of the change in eddy current characteristics caused by work hardening.
    Type: Grant
    Filed: August 28, 1989
    Date of Patent: October 22, 1991
    Assignee: Innovex Inc.
    Inventor: Vladimir Drits
  • Patent number: 5059903
    Abstract: On the basis of a finding that a magnetic hysteresis of a metal material, among magnetization characteristics changing with secular degradation of the metal material, shows a clear correspondence with the degree of degradation of the metal material, a change in such a magnetization characteristic is measured to estimate the degree of secular degradation of the metal material, In a typical embodiment, a superconducting quantum interference device is used to detect the magnetization characteristic of a measuring object. According to the present invention, the degree of embrittlement of a metal material used in an environment of high temperatures can be quickly detected in a non-destructive fashion so that the danger of brittle fracture of the metal material can be reliably prevented.
    Type: Grant
    Filed: September 21, 1988
    Date of Patent: October 22, 1991
    Assignee: Hitachi, Ltd.
    Inventors: Masahiro Otaka, Kunio Enomoto, Kunio Hasegawa, Makoto Hayashi, Tasuku Shimizu, Kazuo Takaku
  • Patent number: 5056016
    Abstract: A measuring device for contactless control of a design of structural elements composed of an electrically conductive material comprises at least one coil through which an alternating current flows and whose measuring voltage is influenced by a structural element, and electronic evaluating unit arranged to compare the measuring voltage of the coil influenced by the structural element with a nominal value, the coil being formed as a cylindrical coil.
    Type: Grant
    Filed: January 10, 1990
    Date of Patent: October 8, 1991
    Assignee: Robert Bosch GmbH
    Inventors: Klaus Dobler, Hansjoerg Hachtel
  • Patent number: 5051694
    Abstract: A measuring device for contactless determination of condition of screw shaped structural elements comprises two oppositely located coils supplied with an alternating current spaced from one another so that an electrically conductive structural element passes therebetween, and transporting elements formed so that the structural element is guided on an edge so that a distance between the structural element and at least one of the coils remains constant during a measuring process.
    Type: Grant
    Filed: January 10, 1990
    Date of Patent: September 24, 1991
    Assignee: Robert Bosch GmbH
    Inventors: Klaus Dobler, Hansjoerg Hachtel
  • Patent number: 5051696
    Abstract: A surface testing device comprising a vibratory system for the reciprocating movement of a sensor carrier (3) arranged above the surface to be tested and comprising an exciter arrangement for operating the system at or in the vicinity of its resonance frequency wherein the vibratory system contains spring elements in the form of pneumatic springs (5, 6) acting on the sensor carrier (3) in opposite directions, which pneumatic springs (5, 6) are pretensioned in the rest state of the system by a magnitude corresponding to at least half of the displacement path of the sensor carrier (3) FIG. 1.
    Type: Grant
    Filed: November 16, 1989
    Date of Patent: September 24, 1991
    Assignee: Thyssen Industries AG
    Inventor: Erhard Schmale
  • Patent number: 5043663
    Abstract: A method and apparatus for determining the extent of defects in tubular elements for use in an oil or gas well is disclosed. The apparatus includes an electromagnetic or other suitable inspection device, cooperating with longitudinal and circumferential position detectors for determining the position and configuration of all defects within a tubular member. Signal generating means are provided for producing signals corresponding to the configuration, longitudinal position, and circumferential position of the defects located within the wall of the tubular member. The signals are processed, preferably by a computer, so that the presence, nature, and precise location of each defect is determined and visually displayed at a suitable display means. Display means are provided for generating a two-dimensional visual display wherein the circumferential and longitudinal positions of the defects are selectably displayed.
    Type: Grant
    Filed: May 10, 1990
    Date of Patent: August 27, 1991
    Assignee: Baker Hughes Incorporated
    Inventor: Clive C. Lam
  • Patent number: 5019777
    Abstract: An eddy current testing system consists of a multi-sensor probe, a computer and a special expansion card and software for data collection and analysis. The probe incorporates an excitation coil, and sensor coils; at least one sensor coil is a lateral current-normal coil and at least one is a current perturbation coil.
    Type: Grant
    Filed: November 6, 1989
    Date of Patent: May 28, 1991
    Assignee: United Kingdom Atomic Energy Authority
    Inventors: James A. Gulliver, Christopher C. Holt, Kenneth D. Boness, Martin R. Anderson, deceased
  • Patent number: 5015948
    Abstract: A two wire transducer and associated circuit processes an output voltage of the transducer to produce a first signal proportional to the position of a non-contacting movable core and to produce a second signal proportional to the temperature of operation of the transducer. The associated circuit includes an excitation source or current driver which provides a fixed frequency sinusoidal constant current across the transducer coil; and first and second demodulator circuits respectively extract position and temperature signals from the voltage developed across the coil of the transducer device. Thus, both temperature and position information are provided by a single device over a single pair of leads.
    Type: Grant
    Filed: April 24, 1989
    Date of Patent: May 14, 1991
    Assignee: Cadillac Gage Textron Inc.
    Inventor: Sydney K. Tew
  • Patent number: 5008621
    Abstract: A multiparameter magnetic inspection system for providing an efficient and economical way to derive a plurality of independent measurements regarding magnetic properties of the magnetic material under investigation. The plurality of transducers for a plurality of different types of measurements operatively connected to the specimen. The transducers are in turn connected to analytical circuits for converting transducer signals to meaningful measurement signals of the magnetic properties of the specimen. The measurement signals are processed and can be simultaneously communicated to a control component. The measurement signals can also be selectively plotted against one another. The control component operates the functioning of the analytical circuits and operates and controls components to impose magnetic fields of desired characteristics upon the specimen.
    Type: Grant
    Filed: April 14, 1989
    Date of Patent: April 16, 1991
    Assignee: Iowa State University Research Foundation, Inc.
    Inventor: David C. Jiles
  • Patent number: 4995497
    Abstract: A coin discrimination apparatus discriminates authenticity and a denomination of a coin by oscillation magnetic fields of high and low frequencies in a low frequency band in which generated magnetic fluxes allow a coin to pass therethrough. A first oscillation coil for generating an oscillation magnetic field of a low frequency and a reception coil are arranged at coin contact and coin non-contact surfaces, respectively, of an inclined coin path to face each other. A second oscillation coil is arranged on the coin non-contact surface to be separated from the reception coil by a predetermined distance in a coin rolling direction and generates an oscillation magnetic field of a high frequency.
    Type: Grant
    Filed: June 30, 1987
    Date of Patent: February 26, 1991
    Assignee: Tamura Electric Works, Ltd.
    Inventors: Osamu Kai, Masaaki Tsukada, Hiroshi Tachibana
  • Patent number: 4987367
    Abstract: Measurement of a physical property such as coercive force of a member to be inspected is performed at a plurality of locations in one region of the member. Similar measurement is performed in a plurality of different regions of the member and a maximum or minimum value (extreme value) is determined for each of the regions. On the basis of the extreme values thus determined, a recurrence period is determined in accordance with an extreme value statistic theory with the aid of a computer, whereon an estimated maximum value of the physical property of the member as a whole is determined from the recurrence period. On the basis of the estimated maximum value, the degree of deterioration of the member is predicted by the computer by consulting the data indicating the previously determined relation between the physical property and the degree of deterioration.
    Type: Grant
    Filed: September 12, 1989
    Date of Patent: January 22, 1991
    Assignee: Hitachi, Ltd
    Inventors: Yuichi Ishikawa, Toshihiko Yoshimura, Tasuku Shimizu, Masahiro Otaka, Kazuo Takaku
  • Patent number: 4954777
    Abstract: Detection of both surface defects of a non-ferromagnetic test body as well s the presence of ferromagnetic particles in the test body by inducing eddy currents and D.C. fields in the body. The resulting signal voltages are filtered and separately examined.
    Type: Grant
    Filed: December 9, 1988
    Date of Patent: September 4, 1990
    Assignee: Institut Dr. Friedrich Forster Prufgeratebau GmbH & Co. KG
    Inventors: Walter Klopfer, Fritz Haug, Dale Gabauer, James Workley
  • Patent number: 4950987
    Abstract: The present invention discloses a single sensor performing both tactile and proximity sensing. The sensor includes a magnetic field generator, a magnetic field sensor for sensing changes in the magnetic field in response to an object changing position with respect to the field to provide proximity sensing. By providing for relative movement between the response to the object touching the sensor, tactile sensing is provided.
    Type: Grant
    Filed: March 3, 1989
    Date of Patent: August 21, 1990
    Assignee: University of North Carolina at Charlotte
    Inventors: John M. Vranish, Pradeep K. Yadav
  • Patent number: 4947117
    Abstract: A method is disclosed for detecting the T.sub.1 phase in aluminum-lithium alloys through simultaneous measurement of conductivity and hardness. In employing eddy current to measure conductivity, when the eddy current decreases with aging of the alloy, while the hardness of the material continues to increase, the presence of the T.sub.1 phase may be detected.
    Type: Grant
    Filed: January 3, 1989
    Date of Patent: August 7, 1990
    Assignee: Iowa State University Research Foundation
    Inventors: Otto Buck, David J. Bracci, David C. Jiles, Lisa J. H. Brasche, Jeffrey E. Shield, Leonard S. Chumbley
  • Patent number: 4931730
    Abstract: A method and apparatus for generating and detecting magnetization responses from ferromagnetic, ferrimagnetic, paramagnetic, or diamagnetic materials comprises a means for generating an alternating magnetic field. The cycle of the alternating magnetic field includes a first magnetization pulse and a second demagnetization pulse, the energy content of the magnetization pulse and the demagnetization pulse being approximately equal, the time duration of the magnetization pulse being substantially longer than the time period of the magnetization pulse, the demagnetization pulse having a higher magnetic field strength than the magnetization pulse magnetic field strength. The effect of the alternating magnetic field on the material to be tested is measured by magnetic field detectors. The field detectors generate electrical signals which are fed to an oscilloscope, a comparator, or a computer for analysis.
    Type: Grant
    Filed: October 15, 1987
    Date of Patent: June 5, 1990
    Assignee: Dam Patent A/S
    Inventors: Terje Olsen, Nils C. Lekven, Julius Hartai
  • Patent number: 4929894
    Abstract: A method and apparatus for increasing the throughput of memory disk drive quality control testing. The apparatus consists of a delay line for delaying the input signal from the read circuitry by one period of said input signal. A difference amplifier subtracts the delayed input signal from the undelayed input signal and couples the difference to one input of a comparator. The comparator compares the difference signal to a threshold used to indicate the presence of an "additional pulse". This test is performed simultaneously with a "missing pulse" test. The method involves delaying the input signal by one period and subtracting the delayed signal from the undelayed signal. A comparison of the difference to a predetermined threshold is then performed and where the threshold is exceeded, the corresponding location on the track under test is recorded as a probable defect. This method is performed simultaneously with a conventional method of performing a "missing pulse" test.
    Type: Grant
    Filed: August 23, 1988
    Date of Patent: May 29, 1990
    Assignee: Memory Technology
    Inventor: Michael R. Monett