Abstract: Electronic probes are provided. One such electronic probe includes: a housing configured to house electronic components; a coaxial cable connector configured to rotationally engage the housing, the coaxial cable connector having at least one inner surface that faces at least a portion of a first hole that extends through the coaxial cable connector, and having at least one outer surface; a coaxial cable having an inner conductor and an outer conductor, the outer conductor being attached to the at least one inner surface of the coaxial cable connector, and the inner conductor extending through the first hole in the coaxial cable connector. Methods and other systems are disclosed.

Abstract: A multi-channel, low input capacitance signal probe head has a housing that receives one or more substrates having input signal pads exposed on one end of the substrate. The substrate is positioned in the housing such that the signal contact pads are exposed at an open end of the housing. A removable signal contact holder mounts to the housing and supporting electrically conductive elastomer signal contacts. The holder is disposed over an open end of housing such that the elastomer signal contacts engage the input signal pads. A probe head retention member is provided for securing the multi-channel signal probe head to a device under test.

Abstract: Device for measuring an electrical current (I) that flows through a strip conductor (1), with a current-less measuring conductor (3) extending in the flow direction of the current, along and in the proximity of a measuring section (2) of the strip conductor (1), one end of the measuring conductor (3) being electrically connected with one end of the measuring section (2), the other end of the measuring section being provided with a first measuring point (4), and with a second measuring point (5) being electrically connected with the other end of the measuring section (2), characterised in that the measuring section (2) is rectilinear, that the second measuring point (5) is connected directly with the measuring section (2), and a voltage (U) is taken from the measuring points (4, 5).

Abstract: A testing head having vertical probes is presented. The testing head a first and a second plate-like holder provided with respective guide holes, a contact probe adapted to be received in the guide holes and having a contact tip adapted to establish mechanical and electrical contact to a corresponding contact pad of an integrated electronic device to be tested, the contact probe being deformed in a deflection region located between the plate-like holders as the contact tip abuts onto the contact pad. The contact probe further comprises a rigid arm extending laterally from a body of the contact probe and terminating in the contact tip, the rigid arm being adapted to offset the contact point of the contact probe with the corresponding contact pad with respect to a longitudinal axis of the contact probe.

Abstract: One or more termination circuits or networks having compensation properties that are operative to reduce reflections occurring between a probe utilized by a test and measurement analyzer to test a device under test (DUT), such as an integrated circuit device, and the device under test itself are employed. The termination circuits are preferably small and less obtrusive than larger connectors and their compensation networking compensates for the connection of the probe to the DUT as well as connection of the cable from the probe to the analyzer performing the test and measurement function. The functionality of the termination circuits may be located at the DUT in a termination network connector or within the structure of the probe itself.

Abstract: A multi-meter test lead system has a probe having a pointed distal end and a proximal end couplable to supplemental electronic components. An outer sleeve has a distal end with a semi-cylindrical opening and a proximal end with a circular opening at the end and slots adjacent thereto. An inner sleeve has and open distal with an adjacent opening and a pair of diametrically opposed slots adjacent to the proximal end. The inner sleeve is adapted to slidably receive the probe and with the inner sleeve and probe are adapted to be slidably positioned within the outer sleeve to allow movement of the inner sleeve axially inwardly of the outer sleeve in response to a force by the user. A coil spring is within the outer sleeve. A pair of finger pads with an action pin extending through the outer sleeve and inner sleeve.

Abstract: A probe cartridge assembly and a multi-probe assembly (10) including a mounting plate having a plurality of the probe cartridge assemblies mounted on the mounting plate. The probe cartridge assembly generally includes a mounting member, a probe insulator (30), a probe (40), a ferrule (50), a lead insulator (60), a retaining member (70), and a wire having an electrical lead. The electrical lead is positioned within a cavity in the ferrule, and an inclined surface of the ferrule is contacted to an inclined surface of the probe within an area defined by the probe insulator and the lead insulator. The probe insulator and the lead insulator are held within an area defined by the mounting member and the retaining member. The retaining member and the mounting member are adjustably mated to each other in order to provide a clamping force to ensure proper electrical interconnection between the electric lead, the ferrule, and the probe.

Abstract: An electrical probe for a flying leadset of a logic analyzer probe has coaxially aligned internal elements enclosed in an insulating cover. The probe has an electrically conductive contact having contact fingers extending in one direction from a support member and a contact member extending in the opposite direction. A sleeve abuts the contact member and receive a center conductor of a conductive cable that is secured in the contact member. The insulating cover has a contact cover portion and a over-mold portion that are chemically bonded together. The contact fingers are positioned in the contact cover and the over-mold portion encapsulates the rest of the probe. The contact fingers are aligned parallel with one side of a square aperture formed in the contact cover. A resistive element may be interposed between the contact member and the sleeve.

Abstract: The present invention is a non-invasive cable tester. The cable tester comprises a sensor for detecting an electric field emitted by a live electric cable. The resulting signal from the sensor is then filtered, amplified, and compared to a threshold value to determine the energization status of the electric cable. A meter can be provided to get a reading of the amplified signal that can be compared to a predetermined threshold value. Also, a detector circuit can be provided that includes a comparator in electrical communication with a light-emitting device such as a light-emitting diode. The detector circuit processes the amplified signal and compares it to a predetermined threshold value. If the electric cable is energized, the output of the comparator either causes the light-emitting device to emit light or not emit light, as desired. This enables an operator to determine the status of the electric cable simply by determining whether the light-emitting device is lit.

Abstract: A voltage probe includes a signal lead that is configured to be soldered to a probing location in a device that is to be probed by the voltage probe, and a first cable that is coupled to the signal lead and that is configured to conduct an output signal that is responsive to an input signal that is received by the signal lead from the device. The signal lead has a thermal conductivity of less than 200 Watts per meter Kelvin (W/mK). Methods and other systems for providing electrical connections to devices under test are disclosed.

Abstract: A measurement probing system has a measurement probe having a housing, spring loaded coaxial probe assembly and a pressure sensor that generates a resistive activation signal in response to movement of the housing in relation to the spring loaded coaxial probe assembly. The activation signal is applied to control circuitry in a control module for generating an output signal to drive an RF relay to couple the probing tip of the measurement probe from electrical to input circuitry of a measurement test instrument. The control circuitry further includes a TTL buffer circuit for generating the output signal in response to a TTL logic signal from a controller for automated testing of a device under test.

Abstract: An apparatus and method for detecting motor bearing defects obtains motor current transient data during motor start-up, analyzes the motor current transient data via discrete wavelet transform, and compares the wavelet sub-bands to a baseline signature of a bearing-defect-free motor to detect bearing defects.

Abstract: The invention involves storing information about the probe frequency response in the probe itself. The information preferably consists of a set of one or more characteristic frequency response data points. Each data point includes at least the gain of the probe at a given frequency. More preferably, each data point includes the complex transfer characteristic of a probe (S21 in FIG. 2) and optionally the complex output reflectivity of the probe (S22 in FIG. 2) and the frequency (F in FIG. 2) at which the data applies. A variable number of frequency points can be stored, as necessary, to adequately describe the probe's response. The probe also preferably stores a header containing the number of stored data points. The invention readily extends to probes having multiple gain settings or multiple bandwidth settings, by simply storing multiple sets of S21, S22 and F data.

Abstract: The invention relates to a high frequency probe tip, particularly for printed circuit boards and/or HF cables, having a connecting end (10) to which a measuring cable may be connected for linking to a measuring device, with an earth contact (16) and a measuring tip (12), on which at least one signal contact (14) is formed, whereby a coaxial conductor (18) with an earth conductor arrangement (20) and at least one signal conductor (22) surrounded by a dielectric (24) connects the connecting end (10) to the measuring tip (12). Starting from the measuring tip (12), the earth conductor arrangement (20) is so designed over a predetermined region (30) of the high frequency probe tip that at least one of the signal conductors (22) is displaceable within the earth conductor arrangement (20) together with the dielectric (24) surrounding said signal conductor.

Abstract: An electronic test probe is built including a switch or other control device coupled to the test equipment, and electrically isolated from the probe tip, such that a user may make a measurement with the probe, and then without moving the probe, activate the control device to change the configuration of the test equipment. This allows a user to make different measurements of the same part of a device without having to remove the probe from the device to change the configuration of the test equipment. Further by configuring the control device to save data or print data from the test equipment, the user may save or print data without removing their hand from the probe. Also, since the control device is electrically isolated from the probe tip, activating the control device does not electrically interfere with the voltage at the probe tip.

Abstract: A tool for determining the continuity of an electrical circuit for an internal combustion engine includes a single body member with male connectors projecting from the opposite ends and a lead wire having a 90° connection boot at one end and an inline connection boot at the opposite end is useful for attachment to the heads of spark plugs regardless of their orientation in an engine block.

Abstract: The invention provides a mosaic decal probe, in which a mosaic of probe chips is assembled into a thin membrane that is suspended in a ring which is made of a material that has a TCE matching that of silicon. The membrane is mounted on the ring in tension, such as it stays in tension throughout a functional temperature range. In this way, the membrane exhibits a functional TCE matching that of the ring. The probe chip preferably has spring contacts on both sides. Apertures are cut in the membrane to allow the spring contacts on one side of the membrane to protrude through the membrane and contact the printed wiring board. The spring contacts which contact the printed wiring board are allowed to slide during temperature excursions, thereby decoupling the TCE mismatch between the probe chip and the printed wiring board. Two preferred embodiments are currently contemplated. A first embodiment of the invention uses a low-count mosaic comprised of few probe chips, for example four probe chips.

Abstract: Systems and methods for wideband active probing of devices and circuits in operation are provided. One such embodiment includes a probe amplifier housing that at least partially contains a probe amplifier circuitry. The probe amplifier circuitry and the probe housing are configured to be separately arranged and positioned from connected probing and signal monitoring apparatuses. Methods are also provided.

Abstract: A portable voltage and current (VI) probe including voltage and current probes, a clamshell assembly, and insulation sections for attachment to at least one transmission line. A stripper tool removes sections of a cover and a shield from the transmission line. Probes are then installed onto the transmission line. A clamshell assembly is placed onto the exposed transmission line surrounding the probes. The probes are insulated and connected to at least one detecting circuit.

Abstract: A voltage probe including a transmission line having an inner conductor and an outer conductor. An electrode is spaced apart from the outer conductor. A dielectric is disposed between the electrode and the outer conductor, adjacent an inner surface of the outer conductor. An exemplary method of implementing the voltage probe may include providing the dielectric adjacent the outer conductor. The electrode separated from the outer conductor by the dielectric and positioned adjacent to the dielectric is provided. A signal is measured from the electrode indicating a transmission voltage in the transmission line.

Abstract: A test device for internet and telephone lines is provided. The test device includes: a main test set having a stretched casing in which a first circuit board is installed, wherein an internet plug and an internet receiving socket are soldered on the first circuit board and a connecting portion is located on one end of the main test set, the internet plug being formed on the connecting portion; and a secondary test tool having a stretched casing in which a second circuit board is installed, wherein an internet plug and an internet receiving socket are soldered on the second circuit board and a recessed connecting portion is located on one end of the secondary test tool, the internet receiving socket being formed on the recessed connecting portion.

Abstract: A multimeter includes a body portion, a cover pivotally connected to the frame such that the cover is selectively moveable about a rotational axis between an open position and a closed position, and a probe assembly including a pair of measuring lines connectable to the frame. The cover includes a magnetic portion on an exterior surface thereof that is configured and positioned to magnetically mount the body portion for use in an inclined relation to a metal surface when the cover is in the open position, and to magnetically mount the body portion to a metal surface when in the closed position.

Abstract: Testing a CMOS integrated circuit includes establishing a current threshold value, powering the integrated circuit in static and idle conditions, measuring the current absorbed by the integrated circuit and comparing this with the threshold value and accepting or rejecting the integrated circuit if the comparison shows that the current absorbed measured is respectively lower or higher than the threshold value. To improve discrimination between non-faulty and faulty devices, the threshold value is obtained by forming two measurement transistors in the integrated circuit, one n channel and the other p channel, biasing these in the cut-off zone and measuring their sub-threshold currents.

Abstract: Method and apparatus for accurately determining the presence of voltage at capacitive test points and for determining the phase angle relationship between two capacitive points. The detection of the presence of the voltage at the capacitive test points is independent of the voltage range in the systems, independent of the contamination or defects that may occur in the capacitive test point systems. The phase angle relationship is determined based on the actual phase angle difference between the voltage waveforms at the capacitive test points independent of the capacitive divider ratio difference and the capacitive test point voltage accuracy.

Abstract: A needle-card adjusting device for planarizing needle sets on a needle card, in which the needle card is connected to a circuit board used as a contact interface to a test head. The needle-card adjusting device has a separate, dynamically operating adjusting unit for adjusting the needle-card.

Abstract: An electric potential sensor comprises a tuning fork having two legs; a detecting electrode provided on one leg of the tuning fork so as to face a surface of which an electric potential is to be detected; a driving piezoelectric member provided on at least one leg of the tuning fork; and feedback piezoelectric members respectively provided on both legs of the tuning fork.

Abstract: The present invention is a meter lead holder device. It includes a base, arm securing mechanism attached to the base, and a first arm having a first end and a second end. The first arm is movably connected to the arm securing mechanism, as well as being moveable in at least a first plane relative to the arm securing mechanism. A meter lead holding mechanism for holding a meter lead is located at the second end of the first arm. Rotation mechanism is connected to at least two of the base, the arm securing mechanism, the first arm and the meter lead holding means. The rotation mechanism is adapted for rotation of the meter lead holder device relative to the base, and includes a locking mechanism for locking and unlocking the first arm in a plurality of positions relative to the arm securing mechanism.

Abstract: An electrical test probe tip of the present invention has a longitudinal axis extending from a first end to a second end and an electrically conductive interior extending substantially therebetween. A conductive exterior-most surface at least partially surrounds the electrically conductive interior. The test probe tip has a maximum length measured from the first end to the second end and has a minimum length measured from the first end to the second end. An electrically insulated surface at the first end substantially descends from the maximum length to the minimum length. The electrical test probe tip may be inserted between a target IC pin and the electrically insulated surface faces the adjacent IC pin.

Abstract: Systems and methods for wideband single-end probing of variably spaced probe points are provided. One such embodiment includes a probe housing. The probe housing at least partially surrounds a probe barrel. A probe barrel end cap extends from the probe barrel and at least partially surrounds a probe tip. The longitudinal axis of the probe tip is offset from the longitudinal axis of the probe barrel. A ground tip is adjacent to the probe tip and electrically connected to the probe barrel. Methods are also provided.

Abstract: The circuit arrangement serves to identify an input signal (s1) assigned to a predetermined signal class. It comprises signal-matching electronics (1) responsive to a current component and/or a voltage component of the input signal (s1) and providing a corresponding output signal (s2). By means of signal recognition electronics (2) of the circuit arrangement, the output signal (s2) is transformed into a recognition signal (c1) representative of the signal class.

Abstract: A probe for connecting a device under test to a measurement device that corrects for dc errors and noise generated by the current flowing through the ground shield of a transmission line used by the probe. The probe identifies a voltage drop in the ground preferably using an additional line between the device under test and the measurement device. The signal provided to the measurement device is corrected based on the identified voltage drop.

Abstract: An electrical probe for a flying leakiest of a logic analyzer probe has coaxially aligned internal elements enclosed in an insulating cover. The probe has an electrically conductive contact having contact fingers extending in one direction from a support member and a contact member extending in the opposite direction. A sleeve abuts the contact member and receive a center conductor of a conductive cable that is secured in the contact member. The insulating cover has a contact cover portion and a over-mold portion that are chemically bonded together. The contact fingers are positioned in the contact cover and the over-mold portion encapsulates the rest of the probe. The contact fingers are aligned parallel with one side of a square aperture formed in the contact cover. A resistive element may be interposed between the contact member and the sleeve.

Abstract: A switchless, hand-held probe and method for detecting and alerting a user to the presence of an AC voltage on a conductor that minimizes the intermittent activation of the probe's indicator due to static charge build-up. The probe comprises an antenna, an indicator, detector circuitry and activation circuitry. The probe alerts a user through the use of an indicator to the presence of electrical energy on a conductor. The antenna senses the electrical energy radiated from the conductor. When the electrical energy sensed by the antenna satisfies a particular measurement threshold, a signal is generated by the detector circuitry and received by the activation circuitry. The activation circuitry activates the indicator after a sufficient number of signals are received from the detector circuitry during a given period of time.

Abstract: Disclosed herein is a probe for measuring voltage/current of a low voltage power distribution cable. A probe has a body having a first opening and a first recess and made of an insulating material. A lower core is inserted into the first recess of the body, and a coil is wound around an insulating material installed at the lower core for detecting an induction current. A capacitor and a resistor are connected between output lines extended from the coil so as to filter out noise components, and a ground line is electrically connected to one end of the lower core. A voltage detection terminal is electrically connected to the low voltage power distribution cable for detecting voltage applied to the low voltage power distribution cable. A voltage output line is used for outputting the detected voltage. A connector is connected to output sides of the output lines extended from the coil, the ground line and the voltage output line.

Abstract: A high-bandwidth electrical test probe having a probe contact spring of reduced size and characteristic capacitance is presented. The probe includes a contact spring connected at one end to the input port of a probe circuit. The opposite end of the contact spring enters the a probe socket and a predetermined angle of entry. The probe socket has a bore formed therein which is arranged at a non-zero angle relative to the angle of entry of the contact spring into said probe socket bore, thereby guaranteeing electrical contact with the bore. The design allows the use of a very small contact spring, on the order of tens of mils, thereby reducing the parasitic capacitance of the spring and allowing much higher bandwidths than heretofore achievable.

Abstract: A probe whose characteristic impedance can be accurately adjusted to a desired value with the production of a small number of prototypes. The probe includes a first line with a signal terminal to be connected to a signal electrode of a circuit to be measured and at least one first region connected to the signal terminal and to which one end of a chip capacitor is connected, a second line connected to a terminal of the first line and a junction to be connected to a measuring instrument at the remaining terminal, and an impedance matched to a characteristic impedance of the measuring instrument, a ground connector with a ground terminal to be connected to the ground electrode of the circuit to be measured, and at least one second region connected to the ground terminal and on which the remaining terminal of the chip capacitor is mounted in one-to-one correspondence with the first region.

Abstract: A deskew fixture has a multilayer circuit board from which pairs of mirrored signal launch contact extend from both sides of the circuit board. One pair of contacts is coupled to electrical ground and the other pair is connected via equal length, electromagnetically coupled strip lines to a signal source. Probe holders are mounted on the circuit boards to support measurement probes with the probing contacts of the measurement probes coupled to the signal launch contacts. Additional pairs of signal launch contacts may be provided with one pair receiving a positive signal from the signal source and another pair receiving a negative signal via equal length, electromagnetically coupled strip lines from the signal source for deskewing differential measurement probes.

Abstract: A cartridge system includes a main probing head body with electronics positioned therein. Further, the cartridge system includes a probing tip cartridge having a probing tip. An electrical contact mechanism electrically couples the electronics to the probing tip when the probing tip cartridge is in mating relationship with the main probing head body. The types may be, for example, a pointed tip, a socket tip, or a grabber tip.

Abstract: A probe tip adapter for a measurement probe has at least a first electrically conductive element with a bore at one end and a probing contact formed on the other end. The bore of the electrically conductive element has an electrically conductive elastomer disposed therein having sufficient tensile strength, compression set, hardness, deflection force, elongation and percent recovery for repeatably securing the electrically conductive element to the probing tip of the measurement probe. The probing contact may be configured as a probing tip having a shaft that tapers at one end to a point and as a square pin adapter with a bore formed in the electrically conductive element that receives a spring contact. The probe tip adapter is useable with both single ended and differential measurement probes.

Abstract: A probe head holder for a measurement probe head has a probe head mount and a highly elastic, high hoop strength retention member that flexibly secures the measurement probe head to the probe head holder. The probe head mount has a first surface adapted to receive the measurement probe head and a second surface extending from the first surface having at least a first groove formed therein normal to the first surface. The retention member is positioned around the holder and the probe head with a portion of the retention member being disposed in the groove. The probe head holder may be attached to a probe arm of a probing station.

Abstract: A contamination resistant probe attachment device attaches over an opening in a top cover of a disc drive to couple a testing probe to the interior of the disc drive. The attachment device has a base for surrounding and attaching around the opening in the top cover in the disc drive and a centrally located aperture for communicating with an upwardly extending flexible tube. The flexible tube having a first and second end, the first end attaching to the base and a second end defining an engagement opening throughwhich a disc drive testing probe is inserted.

Abstract: A circuit test light includes a reel-shaped housing formed of a light-transmitting material, with a light source disposed in the hub of the reel and connected to the proximal ends of two elongated test leads, the distal ends of which are respectively connected to connector assemblies. At least one of the connector assemblies includes a base connector and a plurality of adapter connectors selectively connectable to the base connector for use with different types of test terminals. The leads can be wound around the hub of the reel for storage when not in use, being retained in place by a suitable strap.

Abstract: A processing system for processing a substrate with a plasma comprises a processing chamber configured for containing a plasma and a substrate support. Electrodes are coupled to the substrate support and an RF power source is coupled to each of the electrodes for biasing the electrodes to create a DC bias on a substrate positioned on the supporting surface. Multiple voltage measurement circuits are electrically coupled to the RF power source and the electrodes to measure voltages at multiple points. A precursor determines the DC bias levels of the electrodes based on the multiple measurement points.

Abstract: The present invention is a meter lead holder device. It includes a base, arm securing mechanism attached to the base, and a first arm having a first end and a second end. The first arm is movably connected to the arm securing mechanism, as well as being moveable in at least a first plane relative to the arm securing mechanism. A meter lead holding mechanism for holding a meter lead is located at the second end of the first arm. Rotation mechanism is connected to at least two of the base, the arm securing mechanism, the first arm and the meter lead holding means. The rotation mechanism is adapted for rotation of the meter lead holder device relative to the base, and includes a locking mechanism for locking and unlocking the first arm in a plurality of positions relative to the arm securing mechanism. There is attachment mechanism connected to the base for attachment thereof to a stationary site. In some embodiments, there is a second arm with the same functions as the first arm.

Abstract: A method of locating a defective bulb or socket in a light strand. The method includes connecting an electric power connector interface plug to exhibit an electro magnetic field thereat for checking its wires for operability of a fuse situated in the interface plug, and traversing an electro magnetic field detector along the non-illuminated bulb/sockets starting with the first non-illuminated bulb/socket closest to the interface and continuing in succession down the light strand until a non-illuminated bulb/socket is located that exhibits an electro magnetic field detection test opposite than that of the previous electro magnetic field detection test. Thereby identifying the non-illuminated bulb and/or socket with an electro magnetic field which is directly adjacent to a non-illuminated bulb and/or bulb socket that has no electro magnetic field as defective. If only this bulb is defective, its replacement will illuminate all bulbs in its circuit.

Abstract: A low capacitance probe tip and socket for a measurement probe has a probe tip extending through an insulating plug and a recess defining a socket formed in the plug. The socket has an aperture formed therein that provides access the low capacitance probe tip. An electrically conductive contact is disposed in the aperture that extends into the socket and is in electrical contact with the low capacitance probe tip. In one embodiment, the socket is formed parallel to the low capacitance probe tip. In a further embodiment, the socket is formed at an angle to the low capacitance probe tip with the electrically conductive contact being an electrically conductive elastomeric material disposed at the distal end of the socket in electrical contact with the low capacitance probe tip.

Abstract: A tool for diagnosing and repairing defective wires. The tool is configured as a pair of pliers, wherein the pliers have the ability to cut, strip and twist wire. The pliers also contain two different piercing probes. The first piercing probe extends away from the body of the pliers, thereby enabling the pliers to be used as a circuit testing probe. The second piercing probe is located at a specific point on the jaws of the pliers. When a wire is placed in the jaws of the pliers at that point, the wire becomes pierced by the second piercing probe as the plier jaws close. The force at which the second piercing probe is biased against the wire is determined by the degree of manual force applied to the handles of the pliers. As either piercing probe pierces the insulation surrounding a wire, the body of the pliers is brought to the same electrical potential as the wire. A wire lead extends from the pliers and connects to a ground potential at a remote location.

Abstract: A non-resonant microwave imaging microscope and associated probe. The probe includes a sensor unit with two fixed electrodes, preferably a large outer electrode surrounding a small inner electrode which are approximately co-planar, thereby protecting the small inner electrode from an uneven topography. The outer electrode may be deposited on a conically shaped dielectric disk having a bore through which the inner electrode is placed. Non-resonant circuitry couples the inner electrode to the probe signal variably selected in the range of 10 MHz-50 GHz and to an amplifier whose output is coupled to a signal processor detector in-phase and out-of-phase components of the current or voltage across the two electrodes. A mechanical positioner moves the probe vertically towards the sample and scans it across the sample.

Abstract: A miniaturized electrical resistivity (ER) probe based on a known current-voltage (I-V) electrode structure, the Wenner array, is designed for local (point) measurement. A pair of voltage measuring electrodes are positioned between a pair of current carrying electrodes. The electrodes are typically about 1 cm long, separated by 1 cm, so the probe is only about 1 inch long. The electrodes are mounted to a rigid tube with electrical wires in the tube and a sand bag may be placed around the electrodes to protect the electrodes. The probes can be positioned in a borehole or on the surface. The electrodes make contact with the surrounding medium. In a dual mode system, individual probes of a plurality of spaced probes can be used to measure local resistance, i.e. point measurements, but the system can select different probes to make interval measurements between probes and between boreholes.

Abstract: An electrical test probe tip capable of establishing an electrical connection to test objects on a circuit board and particularly to rounded or irregularly shaped test objects. A preferred embodiment of the notched electrical test probe tip of the present invention has a probing tip with a longitudinal planar axis. Two planar contact surfaces substantially form an inverted “V” from the longitudinal planar axis when viewed from either side of the probing tip. The probing tip has a notch defined therein when viewed from both the front and the back. Optionally the preferred embodiment may have an exterior insulating coating. This configuration can be constructed by starting with an elongate electrically conductive blank and drilling an at least partial central bore substantially parallel to the longitudinal planar axis. Then two planar cuts are made removing a portion of the blank to expose the contact surfaces.