Abstract: A wide bandwidth attenuator input circuit for a measurement probe has a Z0 attenuator circuit coupled in series with a compensated RC attenuator circuit. The series attenuator elements of the Z0 and the compensated RC attenuator circuits are coupled via a controlled impedance transmission line to the shunt attenuator elements of the Z0 and the compensated RC attenuator circuits. The shunt element of the Z0 attenuator element terminates the transmission line in its characteristic impedance. The junction of the series and shunt attenuator elements are coupled to the input of a buffer amplifier. At low and intermediate frequencies, the compensated RC attenuator circuit attenuates an input signal while at high frequencies, the compensated RC attenuator circuit acts as a short and the Z0 attenuator circuits attenuates the input signal.

Abstract: Resistances of signal paths within a interconnect structure for linking input/output (I/O) ports of an integrated circuit (IC) tester to test points of an IC are measured by the IC tester itself. To do so the interconnect structure is used to link the tester's I/O ports to a similar arrangement of test points linked to one another through conductors. Drivers within the tester, which normally transmit digital test signals to IC test points via the I/O ports when the IC is under test, are modified so that they may also either transmit a constant current through the I/O ports or link the I/O ports to ground or other reference potential. The tester then transmits known currents though the signal paths interconnecting the tester's I/O ports.

Abstract: A microwave spectroscopy probe has a center conductor between a first ground plane and a second ground plane. A dielectric member has fluid channel between the center conductor and the first ground plane.

Abstract: A device to access and/or verify connections between a chip package and a printed circuit board (“PCB”), specifically within packages lacking back-side measurement access, includes a housing for insertion between the chip package and PCB. A passageway in the housing connects an entrance and an exit from the housing. The entrance is disposed on an end of the housing facing away from the chip package. The exit is disposed on a side of the housing below the chip package such that the passageway is directed at a signal path between the chip package and the PCB. A conductor disposed in the passageway is movable between a retracted position in which a contact end of the conductor is disposed within the passageway of the housing and an extended position in which the contact end of the conductor is disposed outside of the housing and in contact with the signal path.

Abstract: A coplanar waveguide (CPW) probe includes at least one center probe element, each having a respective center probe contact point and at least one peripheral probe element, each having a respective peripheral contact point. The pitch between the at least one center contact point and the at least one peripheral contact point is adjustable.

Abstract: The characteristics of an object are measured using an electrical characteristics measurement device in which a probe includes a signal terminal, a ground terminal, and a variable resistance element is connected via a coaxial cable to a measuring instrument. The calibration of the probe entails adjusting the resistance value of the variable resistance element, setting the impedance of the distal end vicinity of the probe essentially to zero, and establishing a match with the coaxial cable and measuring instrument. When the electrical characteristics of the object are measured, the resistance value of the variable resistance element is varied in accordance with the impedance created by the side of the circuit containing the measurement object as viewed from the contact between the object and the signal terminal and ground terminal, and the input impedance of the probe is set to a value that does not affect the operation of the object.

Abstract: Disclosed is a novel electrical probe that stores probe-specific information. A probe implemented in accordance with the invention includes a processor, memory, and a communications interface. Probe-specific information such as a probe identifier and/or calibration parameters that affect the true value of a measurement are stored in the probe memory. The probe-specific information may be retrieved by the processor from the probe memory via the communications interface.

Abstract: A coplanar waveguide (CPW) probe includes at least one center probe element, each having a respective center probe contact point and at least one peripheral probe element, each having a respective peripheral contact point. The pitch between the at least one center contact point and the at least one peripheral contact point is adjustable.

Abstract: Resistances of signal paths within a interconnect structure for linking input/output (I/O) ports of an integrated circuit (IC) tester to test points of an IC are measured by the IC tester itself. To do so the interconnect structure is used to link the tester's I/O ports to a similar arrangement of test points linked to one another through conductors. Drivers within the tester, which normally transmit digital test signals to IC test points via the I/O ports when the IC is under test, are modified so that they may also either transmit a constant current through the I/O ports or link the I/O ports to ground or other reference potential. The tester then transmits known currents though the signal paths interconnecting the tester's I/O ports.

Abstract: The present invention provides a device for automatic detection of battery polarity, wherein a detector circuit is structured from detector terminals, detector units, positive voltage electrical connecting units and negative voltage electrical connecting units. Operational procedure involves first connecting battery electrical conducting units with the detector terminals of the detector circuit, when the detector terminals are connected to positive poles of the battery, then one set or more than one set of the detector units of the detector circuit detect positive voltage, which actuate an electrical connection with the positive voltage electrical connecting units, thus connecting positive poles of the detector device to the detector terminals and connecting to positive poles of the battery, at the same one set or more than one set of the detector units determine negative voltage and actuate a connection with the negative voltage electrical connecting units, thereby forming a complete circuit.

Abstract: A circuit arrangement having a voltage regulator, which is designed to generate a regulated operating voltage, and a voltage monitoring unit, which is designed to monitor the regulated operating voltage for deviations from desired values. The voltage monitoring unit has a first detector, which is designed to cause an alarm signal to be generated when the first detector detects that the regulated operating voltage is outside a first voltage interval, and a second detector, which is designed to cause an initiator to initiate countermeasures which influence the regulated operating voltage when the second detector detects that the regulated operating voltage is outside a second voltage interval, which is inside the first voltage interval.

Abstract: A modular active test probe and removable tip module therefor. Within the scope of the invention, there is a probe tip module comprising a first probe tip adapted for probing a circuit under test to receive a signal therefrom. The probe tip module includes an amplifier having a first input solidly connected to the probe tip, an output connected to an output connector, and a housing for supporting the probe tip, the amplifier, and the output connector. A probe body is cooperatively adapted with the housing for repeatably removably receiving at least the output connector.

Abstract: The present invention relates to a quick reference electrical voltage testing tool utilizing a variable voltage range light bulb and digital read out voltage meter both incorporated in the testing tool's handle. The variable voltage range light bulb indicates to the user the knowledge of voltage present and the digital voltage read out indicates the measured amount of voltage available to the tested component. This allows for a faster diagnosis of an electrical problem particularly when voltage sensitive components are being tested. When testing electrical components for non-operation, this quick reference tool will allow a much quicker diagnoses of an electrical problem without the need of a voltage meter.

Abstract: The present invention relates to a quick reference electrical voltage testing tool utilizing a variable voltage range light bulb and digital read out voltage meter both incorporated in the testing tool's handle. The variable voltage range light bulb indicates to the user the knowledge of voltage present and the digital voltage read out indicates the measured amount of voltage available to the tested component. This allows for a faster diagnosis of an electrical problem particularly when voltage sensitive components are being tested. When testing electrical components for non-operation, this quick reference tool will allow a much quicker diagnoses of an electrical problem without the need of a voltage meter.

Abstract: A probe for an array of interconnecting leads between a PCA and an IC has one or more contacts extending laterally from or plated upon one or more arms formed of a flexible printed circuit, and connected by traces along the arm(s) to a header that itself affords connection to measurement equipment. The flexible printed circuit is thin enough to loosely slide between the top of the PCA or PCB and the bottom of the IC. The arm or arms is/are narrow enough to slide between the adjacent leads forming the array, while the normally flat contacts will successively interfere with, to engage and electrically contact, consecutive layers of leads as the probe is progressively inserted. An arm is not so stiff that it cannot yield by a slight compressive warping as the contacts encounter leads. Indexing may be ‘by feel’ or by visible indicia along a top surface of the probe or by a reticle device that moves over the top of the IC, which then has a pattern of indicia corresponding to lead location.

Abstract: A signal acquisition probe has a double cushioned spring loaded probing tip assembly disposed in a housing. A first compressive element produces a first pre-loaded compressive force and an increasing compressive force on the probing tip assembly and a second compressive element produces a second pre-loaded compressive force and an increasing compressive force on the probing tip assembly subsequent to the first increasing compressive force. First and second double cushioned spring loaded probing tip assemblies may be disposed in a housing to produce a differential signal acquisition probe.

Abstract: A probe-type electrical tester having a lamp, a first pointed electrode connected to the lamp, and a second electrode comprising an alligator clip connected to the lamp. The pointed electrode occupies a sleeve which is telescopingly stored within the tester. The sleeve terminates in a hook shaped guard for receiving jacketed conductors to be held during testing and to prevent injury from the pointed electrode. The sleeve is manually extended. A lever then causes the pointed electrode to advance within the sleeve after the sleeve has reached the fully projected position, to enable piercing of the jacket of the jacketed conductor being tested. A detent holds the lever in the fully projected position, and the sleeve in its projected position. The sleeve prevented from escaping from the tester. When the pointed electrode is retracted, the lever can also be substantially retracted into the tester body.

Abstract: An interface module. The interface module includes a probe identification module configured for connection to an identification bus, a probe detect module configured for connection to a detect-control bus, a power control module configured for connection to the detect-control bus, a control and data module configured for connection to a control-data bus, and multiple connectors. Each connector has an associated hot swap circuit. For each connector, if the probe detect module detects connection of that connector to a test probe via connection of that connector to the probe detect module, the probe identification module is configured to enable transfer of an identification label identifying that test probe to that test probe via that connector and the control and data module is configured to enable transfer of control instructions and data between the control-data bus and the test probe via connection of the control and data module to that connector.

Abstract: A cell controller having excellent productivity is provided. A cell-con 80 has 12 ICs IC-1 to IC-2 mounted on a substrate, and these ICs detect voltages of respective cells constituting a cell pack, perform capacity adjustment on the respective cells, and are mounted two by two on rectangular longer sides of a rectangular continuous straight line L-L? defined on a substrate from the IC-1 on a highest potential side to the IC-12 on a lowest potential side continuously in order of potential differences of the corresponding cell packs. Distances between the rectangular shorter sides of the rectangular continuous straight line L-L? are the same. On the cell-con 80, between the IC-1 to IC-12 having different ground voltages, each of the ICs has signal output terminals connected to signal input terminals of a lower order IC respectively in an electrically non-insulated state.

Abstract: A voltage detector that more accurately measures AC voltage of a voltage conductor by correcting the voltage detected directly by the detector's contact probe to account for the conductor's size and shape. The housing of the detector has plural non-contact electrode sensors spaced apart over its surface for sensing capacitive charging currents in the detector's vicinity. By combining voltages sensed by these electrode sensors to the probe's measured voltage, the detector can correct the contact probe measurement for voltages that bypass the contact probe or other conductors in the vicinity that product their own capacitive charging currents. A microprocessor in the housing of the present detector adds or subtracts sensed voltages depending on whether they are input or output voltages, respectively.

Abstract: A test probe for executing high-frequency measurements comprises: a coaxial high-frequency wave guide containing an inner conductor and an outer conductor for delivering a primary electrical potential and a secondary electrical potential, respectively, a supporting structure conductively connected to at least the outer conductor and to at least two contact elements for creating a contact with an electronic circuit to be tested. The support structure is provided with conductive paths for the transmission respectively of a high-frequency signal from the inner conductor and a high-frequency ground potential from the outer conductor to at least one contact element and each conductive path is conductively connected to the inner or outer conductor. The support structure has at least one U-shaped cut-out with a width essentially equivalent to an outer diameter of the wave guide and sides of the U-shaped cut-out are connected to the outer conductor.

Abstract: A voltage verification unit and method for determining the absence of potentially dangerous potentials within a power supply enclosure without Mode 2 work is disclosed. With this device and method, a qualified worker, following a relatively simple protocol that involves a function test (hot, cold, hot) of the voltage verification unit before Lock Out/Tag Out and, and once the Lock Out/Tag Out is completed, testing or “trying” by simply reading a display on the voltage verification unit can be accomplished without exposure of the operator to the interior of the voltage supply enclosure. According to a preferred embodiment, the voltage verification unit includes test leads to allow diagnostics with other meters, without the necessity of accessing potentially dangerous bus bars or the like.

Abstract: A current probing system has a current probe and a detachable adapter. The current probe has a probe body with electrically conductive contacts that mate with electrically conductive contacts on the adapter. Leads extend from the adapter for coupling to a current carrying conductor. The leads can connect to a plug that is coupled to a current diverting device for coupling a current signal to the current probe. The adapter may also include a switch that selectively couples the current signal to the current probe when the adapter is mated with the current probe. The contacts of the current probe are coupled to a current sensing circuit which generates a voltage output representative of the current signal. The voltage output is coupled to an oscilloscope via an electrical cable.

Abstract: The characteristic evaluating system of the present invention includes: a cable-driving transmitter transmitting a signal to one end of a cable to be measured; a load connected to the other end of the cable; a probe detecting a common mode current of the cable; a receiver receiving a signal detected by the probe; and a controller controlling the cable-driving transmitter, the load, and the receiver. The cable-driving transmitter is constructed such that a plural transmission condition is selectable when transmitting the signal. The load is constructed such that plural termination conditions corresponding to the signals transmitted to the cable is selectable. The characteristic of the cable is measured by scanning relative positions of the probe and the cable in a longitudinal direction of the cable.

Abstract: The present invention provides a high-voltage measuring device capable of providing sufficient electric isolation between resistors and between resistors and a voltage measurement circuit without necessity of enlarging a size of a substrate for carry thereon the circuit. A high-voltage measuring device mounted on a substrate, including a high-voltage input terminal pair, a measuring terminal pair, a voltage measuring circuit having input terminals connected to the measuring terminal pair, and two resistive parts. One of the resistive parts electrically connects one of high-voltage input terminal pair and one of measuring terminal pair. The other of resistive parts electrically connects between the other of high-voltage input terminal pair and the other of measuring terminal pair.

Abstract: A fixture for radio frequency (“RF”) testing of an assembled wireless device, the wireless device having a removable casing concealing one or more RF spring connectors, the fixture comprising: a retainer for receiving the wireless device with the removable casing removed; a coaxial connector mounted through the retainer, the coaxial connector having a center contact and a shield contact, the coaxial cable with external test equipment; a circuit board mounted on an inner side of the retainer and having one or more pads each for receiving one of the center and shield contacts; and, one or more probes mounted on ones of the pads for contacting ones of the RF spring connectors to distribute the RF test signals.

Abstract: A method of measuring at least one electrical property of a semiconductor wafer includes providing an elastically deformable and electrically conductive contact having an insulative oxide layer formed on an exterior surface thereof by a controlled oxidation process, such as, without limitation, thermal oxidation, anodic oxidation or deposition oxidation. A first electrical contact is formed between the oxide layer on the surface of the contact and a dielectric layer overlaying a top surface of the semiconductor wafer and a second electrical contact is formed with the semiconductor wafer. A CV type stimulus is applied between the first electrical contact and the second electrical contact. A response of the semiconductor wafer to the CV type stimulus is measured and at least one electrical property of the dielectric layer, the semiconductor wafer or both is determined from the response.

Abstract: A probe apparatus has first and second access ports and a measurement port. The first and second access ports are adapted to be interposed in a test circuit. A voltage amplifier and a voltage splitter are adapted to present the second access port and the measurement port each with a voltage representative of a voltage received by the first access port.

Abstract: Novel systems of an evanescent microwave probe (EWP) are disclosed, which enable measurements of physical properties of a sample with enhanced sensitivity and resolution, simultaneously. In one embodiment, new shielding features are added to the probe (which may be of either a sharpened tip or loop configuration) to reduce the effects of residual far field radiation, while maintaining the probe section that extends beyond the shielding aperture of the resonator. To further increase the sensitivity of the instrument, an automatic gain-controlled active feedback loop system may be added to the probe resonator to form a self-oscillator. This new active circuit feature significantly increases the effective Q of the resonator probe, enhancing the sensitivity of both the frequency and Q measurement.

Abstract: A probe used for a high electric current. The prove comprises an outer pipe having a cylindrical configuration which is opened at upper and lower ends thereof; a plunger installed in an upper part of the outer pipe to be elastically extended out of and retracted into the outer pipe, and brought into contact with a contact terminal of a test object; a contact member installed in a lower part of the outer pipe and electrically connected with a contact terminal of a circuit board; and a plurality of contact wires installed at a region where the plunger and the contact member are engaged with each other, to electrically connect the plunger to the contact member, and each having one end which is bent outward.

Abstract: A low capacitance measurement probe having an outer conductor forming an outer wall; a non-conductive spacer forming a first wall between a conductive layer and the outer conductor; the conductive layer forming a second wall coupled to the interior of the first wall; an insulating layer forming a third wall coupled to the interior of the second wall; and an inner conductor forming an inner wall coupled to the interior of the third wall. The probe may include a knob or a button in the inner conductor at a tip of the probe to increase the surface area of the inner conductor in order to the sensitivity of the probe.

Abstract: A voltage detector is combined with a test instrument probe to provide an indication of the presence of a.c. voltage when the test instrument probe approaches or comes in contact with a source of a.c. voltage.

Abstract: A high-bandwidth electrical test probe having a probe contact spring of reduced size and characteristic capacitance is presented. The probe includes a contact spring connected at one end to the input port of a probe circuit. The opposite end of the contact spring enters the a probe socket and a predetermined angle of entry. The probe socket has a bore formed therein which is arranged at a non-zero angle relative to the angle of entry of the contact spring into said probe socket bore, thereby guaranteeing electrical contact with the bore. The design allows the use of a very small contact spring, on the order of tens of mils, thereby reducing the parasitic capacitance of the spring and allowing much higher bandwidths than heretofore achievable.

Abstract: A molded voltage sensor is provided that achieves excellent sensing accuracy over a wide temperature range by molding promary and secondary capacitances are of a voltage divider into a solid dielectric material and wherein th e capacitances are preferably fabricated from the same material, or at least materials having nearly identical temperature coefficients of permittivity. In a preferred arrangement, a first member of dielectric material includes a conductive pattern of the outer surface thereof and an electrical connection attached to the conductive pattern. The first memberis the molded into a prerdetermined location with respect to a central conductor and a layer of the dielectric molding material is also molded over the exterior of the first member. Another conductive pattern is formed on the over-molded layer. The overall assembly is then molded to form a body of the sesired shape and provides insulation between the conductor and the conductive patterns.

Abstract: A measuring apparatus with storage that measures and analyzes both stray currents from subway rails or power lines and the pipe-to-soil voltage of a buried metallic structure simultaneously is disclosed. The data measuring apparatus with storage for measuring stray currents from subway rails or power lines and the pipe-to-soil voltage of a buried metallic structure in accordance with the present invention comprises measuring means, which is a portable module that allows easy installation at one or multiple measurement points of the buried metallic structure, for measuring stray currents from the subway rails or power lines and the pipe-to-soil voltage of a buried metallic structure simultaneously and for storing and transmitting the measurement data and analytic computing means for receiving the measurement data transmitted from the measuring means and for databasing and graphically displaying the received measurement data for time-synchronous data analysis.

Abstract: A voltage detector used to determine if an exposed or unexposed wire or terminal is “hot.” The voltage detector includes a low density EMF field detecting circuit and a high density EMF field detecting circuit each coupled to an indicator to inform the user that the “hot” wire or terminal is nearby. In the preferred embodiment, the voltage detector includes an LED flashlight that uses a voltage multiplying circuit that enables it to use a single AA or AAA battery. The voltage multiplying circuit raises the battery voltage from 1.5 volts to approximately 5 volts required to sufficiently energize the main LED. In the preferred embodiment, the LED's reflector acts as the sensor probe for detecting the presence of electric field densities.

Abstract: A method for calibrating a pulsed measurement system, the system having a pulse generator unit, a measurement unit and a probe unit having a first and a second probe tip. The first tip, the pulse generator unit and the measurement unit are all interconnected by respective cables to a power divider network and an additional cable connects the second tip to the measurement unit. The method includes determining the transfer characteristics of the power divider network; measuring the characteristics of the system with the probe tips being open; measuring the characteristics of the system with the probe tips being interconnected; and calculating calibration constants for the system from the measurements and the transfer characteristics. The measurements are performed for pulses having specific characteristics.

Abstract: A RF current transformer sensor includes a first sensor portion and a second sensor portion. The first and second sensor portions are configured to define a fixed opening for receiving a test object. The RF current transformer sensor is capable of detecting current pulses between the first sensor portion and the second sensor portion for sensing partial discharges from the test object. Further disclosed is a method of partial discharge sensing.

Abstract: A microwave imaging microscope and associated probe, or a read head. The probe or the read head includes a sensor unit with three fixed electrodes, preferably a stimulating electrode surrounding a sensing electrode and isolated by a grounded electrode. Circuitry couples the stimulating electrode to the probe signal variably selected in the range of 100 MHz to 100 GHz and couples the sensing electrode to a signal processor detecting in-phase and out-of-phase components of the current or voltage across the sensing electrode and the grounded electrode. A mechanical positioner moves the probe vertically towards the sample and scans it across the sample. The probe may be formed by semiconductor processing methods on a silicon chip.

Abstract: An electrode is made by turning a harness such that the electrode has a predetermined are for detecting capacitance. A method of manufacturing of an electrode includes step so turning a wire, and shaping the electrode with the wire. The electrode has a predetermined area for detecting capacitance.

Abstract: A coplanar waveguide (CPW) probe includes at least one center probe element, each having a respective center probe contact point and at least one peripheral probe element, each having a respective peripheral contact point. The pitch between the at least one center contact point and the at least one peripheral contact point is adjustable.

Abstract: Integrated voltage and current (VI) probe (18) for integration inside a transmission line (17) having inner (3) and an outer (4) conductors. Current probes, often implemented as loop antennas, can be coupled to the outer conductor. The probes can either be built onto the same panel or on different panels.

Abstract: An apparatus (100) and method (300) for determining the status of a electric cable (20) is provided. The apparatus (100) rigidly includes a probe (104) having coaxial contacts (150, 152) and including a melt unit (102) configured to melt an insulating jacket (32) of the cable (20), an instrumentation unit (106) coupled to the probe (104) and housing a cable analysis circuit (186), a status display unit (188) coupled to the instrumentation unit (106), an insulated shank (108) coupled to the instrumentation unit (106), and a hotstick adapter (110) coupled to the insulated shank (108). The cable analysis circuit (186) includes a connection determination circuit (200) configured to determine if an electrical connection between the probe (104) and the cable (20) is a valid connection, and a status determination circuit (222) configured to determine the status of the cable (20) while the electrical connection is a valid connection.

Abstract: A probe provides electrical communication between a coating and a processing system. One optional feature includes an outwardly projecting, electrically conductive engaging member that is held in a captivation structure releasably retained in a housing and engages a contact that is inside the probe and connected with the processing system. Another optional feature of the probe provides the electrically conductive engaging member in the form of a pin or pins captivated in a light-transmissive structure adjacent a light-emitting source. Another optional feature of the probe includes a restraining structure that defines a frustoconical seat for engaging a conical distal end of an electrically conductive pin that is adapted to contact the coating.

Abstract: A voltage sensor is described that consists of a plurality of identical series-connected sections, where each section is comprised of an arrangement of impedance elements. The sensor is optimized to provide an output ratio that is substantially immune to changes in voltage, temperature variations or aging. The voltage sensor can be scaled to various voltage levels by varying the number of series-connected sections.

Abstract: A micromachined probe apparatus and methods for making and using same to characterize liquid in a fluidic channel and map embedded charge in a sample on a substrate are provided. The probe apparatus includes an integrated scanning tip and a dither actuation mechanism. The actuation is achieved using a bent-beam electrothermal actuator, and the probe tip is insulated from the actuator with a wide isolation gap. The device is fabricated by a modified micro electro-discharge machining process which allows electrical isolation within the micromachined structure using an epoxy plug. The apparatus may be used to measure changes in the external surface potential of a microfluidic channel as a function of varying pH of liquid inside the channel. The apparatus also may be used to map embedded charge in a thin layer on a substrate, showing it to be suitable for monitoring microelectronics manufacturing processes.

Abstract: Disclosed is a novel electrical probe that stores probe-specific information. A probe implemented in accordance with the invention includes a processor, memory, and a communications interface. Probe-specific information such as a probe identifier and/or calibration parameters that affect the true value of a measurement are stored in the probe memory. The probe-specific information may be retrieved by the processor from the probe memory via the communications interface.

Abstract: A method and apparatus for testing integrated circuits by subjecting the circuits to an electromagnetic disturbance. A probe is provided, equipped with a horn cover designed to be applied to a printed circuit on which an integrated circuit is mounted. Within this horn cover, a core shield channels the electrical field that is deployed in a zone in which connections from the integrated circuit to the printed circuit that it carries are situated. The effectiveness of the electromagnetic interference injected in the integrated circuit is increased to the point that a true measurement of the resistance of this integrated circuit to the electromagnetic interferences may be carried out.

Abstract: A low capacitance measurement probe is disclosed. The low capacitance measurement probe comprises an outer conductor forming an outer wall having an exterior and an interior; a non-conductive spacer forming a first wall having an exterior and an interior with the non-conductive spacer being coupled to the interior of the outer conductor; a conductive layer forming a second wall having an exterior and an interior, the conductive layer coupled to the interior of the first wall; an insulating layer forming a third wall having an exterior and an interior, the insulating layer coupled to the interior of the second wall; and an inner conductor forming an inner wall having an exterior and an interior, the inner conductor coupled to the interior of the third wall. A low capacitance measurement probe system and a method of using a low capacitance measurement probe are also disclosed.

Abstract: A portable voltage and current (VI) probe including voltage and current probes, a clamshell assembly, and insulation sections for attachment to at least one transmission line. A stripper tool removes sections of a cover and a shield from the transmission line. Probes are then installed onto the transmission line. A clamshell assembly is placed onto the exposed transmission line surrounding the probes. The probes are insulated and connected to at least one detecting circuit.