Abstract: A virtual load board includes a connection port, a conversion circuit, and an indication unit, wherein the connection port comprises at least one terminal. The terminal receives an output voltage from the liquid crystal display control board. The conversion circuit converts the output voltage into an operating voltage for the indication unit and supplies the operating voltage to the indication unit. A test system and a test method for liquid crystal display control board are also provided. With the above-discussed arrangement, the virtual load board replaces a liquid crystal display panel to carry out a reliability test of the liquid crystal display control board, and has the advantages of small volume and low cost and can be accommodated, together with the liquid crystal display control board, in reliability test equipment in order to carry out a reliability test of the liquid crystal display control board in a specific environment.

Abstract: A testing device is provided for testing a display panel including a first circuit board. The testing device includes a second circuit board and a pressing element. The second circuit board includes a main body, multiple test pads, multiple testing circuits and multiple conducting elements. The test pads are arranged on a first surface of the main body and corresponding to respective pins of the first circuit board. The testing circuits are formed on the second surface of the main body and corresponding to respective test pads. The first circuit board is stacked on the second circuit board. The testing circuits are electrically with respective pins through respective conducting elements and respective test pads. The pressing element presses a stacking region between the first circuit board and the second circuit board, thereby facilitating close contact between the first circuit board and the second circuit board.

Abstract: A test pad structure may include a plurality of test pads and a plurality of connection leads. A plurality of the test pads may be sequentially arranged from a wiring pattern on a substrate and arranged in rows parallel with one another. The plurality of the test pads may include a first group of test pads having at least one pad arranged in a first row and a second group of test pads having at least two pads. A plurality of the connection leads may extend from end portions of the wiring pattern to be connected to the plurality of test pads. A plurality of the connection leads may include at least one inner lead passing between the at least two pads of the second group of the test pads arranged in a second row closest to the first group of the test pads. The at least one inner lead may be connected to at least one pad of the at least two pads of the second group of the test pads arranged in a third row next to the second row.

Abstract: A method of the invention for performing burn-in test includes assembling, on a fixture stand, a plurality of light source elements and a plurality of light detectors for monitoring a light output from a corresponding one of the plurality of light source elements; and electrifying the plurality of light source elements in a state where at least the plurality of light source elements and the plurality of light detectors are immersed in an insulation liquid. Thereby, it is realized to hold a stable temperature in a short period of time, to maintain a temperature that does not deviate from normal load conditions, and to perform a sorting test between defect parts and good part for light source unit chips without causing damage to the elements.

Abstract: A method of processing of solar cells includes determining that a back-contact solar cell is defective. The back-contact solar cell includes a first plurality of interconnect pads at a first edge thereof, and a second plurality of interconnect pads at a second, opposed thereof, the first and second pluralities of interconnect pads having opposite operational charges. The back-contact solar cell is then diced to define at least first and second back-contact solar cell sections. The first back-contact solar cell section has at least two interconnect pads, of the plurality of interconnect pads, at respective opposed edges thereof.

Abstract: A method for detecting a bright dot or a dark dot in a LCD comprising applying a first detection voltage to a color filter substrate common electrode and forming a first voltage difference between the color filter substrate common electrode and a pixel electrode on an array substrate; collecting a first luminance value of the bright dot or the dark dot after the bright dot or the dark dot is observed; switching the first detection voltage applied to the color filter substrate common electrode to a second detection voltage, and thus forming a second voltage difference between the color filter substrate common electrode and the pixel electrode; collecting a second luminance value of the bright dot or the dark dot; determining the difference between the first luminance value and the second luminance value, so that the bright dot or the dark dot can be determined to result from a liquid crystal cell defect or an array substrate defect.

Abstract: A voltage test device used in liquid crystal display (LCD) panels, including test solder pads and test lines, is proposed. The test solder pads are connected to an LCD panel through the test lines. Each of the test lines includes a switch test line and a signal-inputting test line. The voltage test device further includes a first connector. The switch test line includes a first portion of the switch test line and a second portion of the switch test line. The first portion of the switch test line is connected to the second portion of the switch test line through the first connector. The first connector is used for preventing the electric current in excess of a predetermined threshold from flowing inside the LCD panel. Meanwhile, a voltage testing system used in LCD panels is proposed.

Abstract: A testing device suitable for a testing apparatus with light inspection of a display panel is provided, in which the testing device includes a main part and two contact parts. The testing device is fixed to the testing apparatus with light inspection by the main part. Two contact parts are respectively extended from two ends of the main part along a first direction, and each of the contact parts has a plurality of tips. The tips of each contact part have different heights. Besides, a testing apparatus is also provided. Therefore, the abovementioned testing device and the testing apparatus are able to drastically extend the user lifetime, improve the inspection accuracy and save cost.

Abstract: To provide a display device having a test circuit with high accuracy for testing in the step after a counter substrate is attached and before shipping, and to provide a display device having a correction circuit inside the display device, for the case where a defect occurs. A pixel circuit operated by a gate line and a source line, a first wiring formed at the same time as the gate line, a second wiring formed at the same time as the source line, and a test circuit of detecting a defect of the pixel circuit by using potentials of the first wiring and the second wiring are provided over a substrate.

Abstract: An electro-optical device includes a substrate, a plurality of unit circuits that includes a plurality of scanning lines, a plurality of data lines and electro-optical elements provided corresponding to intersecting regions of the scanning lines and the data lines and is formed in a display region of the substrate, a plurality of pixel circuits that includes electro-optical elements and is formed in the display region and a sealing member that seals the electro-optical elements of the plurality of pixel circuits formed in the display region and is attached to the substrate, wherein a test circuit is formed between an attaching region at which the sealing member is attach to the substrate and the display region.

Abstract: A flexible substrate includes a substrate body; a plurality of lines that are arranged on the substrate body; a plurality of connection terminals that are arranged on an end portion of the substrate body and electrically connected to the respective lines; an integrated circuit that is arranged on the substrate body and electrically connected to at least one of the lines; and an inspection electrode that is arranged on the substrate body and electrically connected to the integrated circuit and capable of outputting a signal processed in the integrated circuit.

Abstract: A plurality of gate lines are formed on an insulating substrate in the horizontal direction, a gate shorting bar connected to the data lines is formed in the vertical direction and a gate insulating film is formed thereon. A plurality of data lines intersecting the gate lines are formed on the gate insulating film in the vertical direction, and a data shorting bar connected to the data lines is formed outside the display region. A first shorting bar is formed on the gate insulating film, located between the gate lines and the gate shorting bar, and connected to the odd gate lines. A second secondary shorting bar is formed parallel to the first shorting bar and connected to the even gate lines.

Abstract: A method of fabricating a liquid crystal display device includes forming a gate driver and array elements in at least one cell area of a mother substrate while forming a test element in at least one test area of the mother substrate, and inspecting the test element to determine an operational state of the gate driver.

Abstract: In one embodiment of the present invention, a signal conversion circuit is disclosed which is suitably used in a multiprimary liquid crystal display device, and a multiprimary liquid crystal display device having such a signal conversion circuit. A signal conversion circuit according to one embodiment of the present invention is for use in a multiprimary liquid crystal display device, and converts an input video signal to a multiprimary signal corresponding to four or more primary colors. When generating a multiprimary signal for displaying dark skin, the signal conversion circuit according to an embodiment of the present invention applies a conversion to the video signal so that a color difference ?u?v?=((u??u60?)2+(v??v60?)2) is 0.

Abstract: In an array substrate and a display apparatus, a pixel part has a plurality of gate lines, a plurality of data lines, and a plurality of pixels electrically connected to the gate and data lines. A driving circuit drives the pixel part electrically connected to a first end of the gate lines. An inspection circuit is electrically connected to a second end of the gate lines, and inspects the pixel part in response to an inspection signal externally provided. Thus, positions and causes for defects of the pixel part may be accurately detected, thereby improving inspecting efficiency.

Abstract: A method for testing a liquid crystal panel is provided. The method simulates an outside force endured by the liquid crystal panel when the liquid crystal panel is assembled as a finished product, so that unqualified liquid crystal panels can be detected before the finished product is put into use.

Abstract: An organic light emitting display device may include a plurality of pixels, a plurality of scan lines for selectively applying a scan signal to the pixels, a plurality of data lines crossing the scan lines for applying a data signal to the respective pixels, a scan driver for applying a scan signal to the scan lines, and at least one first testing unit electrically connected to the scan driver, wherein at least one output line of the first testing unit is electrically connected to the scan driver, and at least one other output line of the first testing unit is electrically disconnected and in an electrically open state.

Abstract: Inoperative or defective electroluminescent (EL) emitters in an EL display having a plurality of subpixels are detected. Current flow through a drive transistor in a subpixel is turned off, a selected test current is provided through the EL emitter in the subpixel using a current source, and the voltage at a second electrode of a readout transistor in the subpixel is measured to provide a status signal representative or characteristics of the selected EL emitter. The status signal for the subpixel is compared to the respective status signals of neighboring subpixels to determine whether the EL emitter in the subpixel is defective.

Abstract: The present invention relates to a display device. The display device includes a display panel having gate lines and data lines, a driving chip mounted on the display panel, and a flexible printed circuit film (FPC) attached to the display panel. The display panel includes a plurality of first to third pads, a first switching element, a second switching element, a first test pad, and a second test pad. The plurality of first to third pads are sequentially disposed and electrically connected with each other. The first switching element is interposed between the first pad and the second pad. The second switching element is connected to the third pad. The first test pad is commonly connected to control terminals of the first and second switching elements. The second test pad is connected to an input terminal of the second switching element. According to the present invention, processing time and production yield can be increased by improving the detection performance in a visual inspection test process.

Abstract: A plasma damage detection test structure is disclosed. The plasma damage detection test structure includes a first antenna, a voltage source, a ground reference, a first transistor comprising a first source, a first gate, and a first drain. The plasma damage detection test structure further includes a second transistor comprising a second source, a second gate, and a second drain. The first gate is conductively coupled to said first antenna, said first drain and said second drain are conductively coupled to said voltage source, and said first source and said second source are conductively coupled to said ground reference. In various embodiments multiple antennas may be used. The antennas may be multiple configurations, such as a symmetric arrangement or asymmetric arrangement. In various embodiments, multiple transistors in parallel or cross-couple arrangements may be used.

Abstract: An auto probe device used in a method of testing a plurality of signal lines of a liquid crystal panel includes a printed circuit board having a shorting bar, a flexible printed circuit board having a plurality of connection patterns electrically connected to the shorting bar of the printed circuit board, and a plurality of contact pins contacting the plurality of pads formed in a non-display area of the liquid crystal panel. Such an auto probe device reduces a defect generation rate in a lighting test of the liquid crystal panel so that accuracy of the lighting test may be improved.

Abstract: A test circuit for an electronic device including a liquid crystal display (LCD) device. The LCD device includes a pulse width modulator (PWM) to provide voltages to a display panel of the LCD device, a plurality of feedback circuits to output feedback voltages to the PWM, and a power supply to provide an operating voltage for the PWM. When the electronic device is in a test mode, the feedback circuits respectively decrease the feedback voltages, such that the PWM increases the voltages output to the display panel according to the feedback voltages, the increased voltages reach predetermined test voltages and test the electronic device.

Abstract: A method of testing the display panel is provided. a display panel is provided, wherein the display panel has shorting bars and testing pads in a first peripheral area, and IC pads in a second peripheral area. A first stage test is performed to input a common voltage signal and a plurality of first stage test signals to the testing pads. A switching step is implemented to stop inputting the first stage test signals. A second stage test is carried out to input at least a second stage test signal to the IC pads.

Abstract: An evaluation apparatus includes a lighting control section for lighting a liquid crystal display panel including switch-type touch sensors, a pressing section for pressing the liquid crystal display panel that is being lit, and a sensor data acquisition section for acquiring outputs from touch sensors disposed within a region of the liquid crystal display panel that is pressed by the pressing section. The pressing section is made of a material having transparency. With this apparatus, it is possible to inspect switch-type touch sensors of a liquid crystal display panel for defects by checking a display state in a region to which a load is being applied.

Abstract: An active device array includes a plurality of scan lines, a plurality of data lines, a plurality of pixel structures, a first testing circuit, a second testing circuit, a third testing circuit and a fourth testing circuit. Each of the pixel structures is connected to one of the scan lines and one of the data lines. The first testing circuit is electrically connected to the odd scan lines; the second testing circuit is electrically connected to the (4n+1)th scan lines wherein n is zero or a positive integer; the third testing circuit is electrically connected to the even scan lines; the fourth testing circuit is electrically connected to the (4n+2)th scan lines.

Abstract: The invention relates to a testing apparatus for testing a 5-wire resistive touch panel of an electronic system. The testing apparatus comprises a voltage control unit, a signal control unit, an electronic unit and a determining unit. The electronic unit is used for generating at least one output signal corresponding to a first voltage level and a second voltage level generated by the voltage control unit and a detecting signal generated by the signal control unit. The determining unit coupled to the electronic unit is used for determining the status of the electronic unit according to the at least one output signal.

Abstract: An exemplary method for manufacturing a liquid crystal display (LCD) includes providing an LCD panel (201) including a common voltage initialization circuit (2011); testing and inspecting the LCD panel for defects of the LCD panel, and thereby obtaining a preferred common voltage for the LCD panel; writing parameters of the preferred common voltage to the common voltage initialization circuit; and mounting a driving integrated circuit on the LCD panel, the driving integrated circuit being connected to the common voltage initialization circuit. The driving integrated circuit is connected to the common voltage initialization circuit.

Abstract: A method for detecting a storage voltage, a display apparatus using the storage voltage and a method for driving the display apparatus. The method for detecting the storage voltage includes applying a test voltage to a storage line in a display panel having an active layer disposed between the storage line and a data line while varying the test voltage, the active layer being in an active state or an inactive state according to the test voltage, and detecting the storage voltage corresponding to the test voltage in an inactive state of the active layer. Thus, the display panel is driven by using the detected storage voltage, so that an aperture ratio may be increased and current consumption may be decreased.

Abstract: A probe apparatus and method of terminating a probe that probes a semiconductor device with a signal cable from a tester side by side at a proximal end of the probe and a distal end of the signal cable. In one embodiment, the probe apparatus includes: a chassis; a dielectric block mounted in the chassis for retaining the probe, the probe extending on the chassis from a proximal end of the probe to the dielectric block, extending through the dielectric block, and projecting from the dielectric block towards the semiconductor device at a distal end of the probe; and a terminating apparatus, mounted in the chassis, for terminating the proximal end of the probe with a distal end of the signal cable side by side.

Abstract: An LCD panel apparatus comprises a pixel array, a first common electrode terminal, a second common electrode terminal, a plurality of first current directional devices and a plurality of second current directional devices. The pixel array comprises a plurality of common lines. Each first current directional device is connected in series between a first side of each common line and the first common electrode terminal. Each second current directional device is connected in series between a second side of each common line and the first common electrode terminal. The second common electrode terminal is connected between the first side of each common line and each first current directional device. The current flows through each common line in a single direction so as to detect any defects in the common line.

Abstract: A test method of a liquid crystal display panel is provided. The liquid crystal display panel includes a plurality of pixels and a testing pad. The pixels are disposed at intersections between a first, a second, and a third data lines and a plurality of scan lines. In the test method, each of the scan lines is driven to connect liquid crystal capacitors of the pixels to the first, the second, and the third data lines. A first and a second test voltages are respectively supplied to the first and the second data lines, wherein the first test voltage is not equal to the second test voltage. The first data line is floated. The floated first data line is measured through the testing pad to determine whether the liquid crystal capacitors of the pixels electrically connected to the first and the second data lines are electrically connected with each other.

Abstract: A testing device suitable for a testing apparatus with light inspection of a display panel is provided, in which the testing device includes a main part and two contact parts. The testing device is fixed to the testing apparatus with light inspection by the main part. Two contact parts are respectively extended from two ends of the main part along a first direction, and each of the contact parts has a plurality of tips. The tips of each contact part have different heights. Besides, a testing apparatus is also provided. Therefore, the abovementioned testing device and the testing apparatus are able to drastically extend the user lifetime, improve the inspection accuracy and save cost.

Abstract: A thin film transistor (TFT) array having test circuitry includes a thin film transistor array body having a plurality of pixels. Test circuitry is integrally formed with the body. The test circuitry includes a power supply for supplying power via the test circuitry to the body; and a plurality of wireless switches to activate selected pixels.

Abstract: Disclosed are a liquid crystal display panel and apparatus, which can prevent electrolytic corrosion or other corrosion of on-off pads in a test pad part. The liquid crystal display panel comprises: a pixel part having a plurality of pixels arranged in a matrix at intersections of a plurality of gate lines and a plurality of data lines; a gate pad part having a plurality of gate pads, each of the gate pads connected with the corresponding gate lines to deliver a gate signal; a data pad part having a plurality of data pads, each of the data pads connected with the corresponding data lines to deliver a data signal; a test pad part having at least one or more on-off pads delivering a test signal to the gate lines or the data lines; and a switching device for cutting off the gate signal and/or the data signal so as not to be provided to the on-off pads upon driving the liquid crystal display panel.

Abstract: An inspection circuit is used for inspecting signal wires of a display area. The inspection circuit includes a shorting bar, plural first shorting switches, and plural second shorting switches. The plurality of the first and the second shorting switches are disposed at different sides of the display area for increasing space between each adjacent shorting switch so as to reduce coupling effect. In the inspection circuit, a first shorting switch is electrically connected between the shorting bar and first end of one signal wire, and a second shorting switch is electrically connected between the second end of that signal wire and second end of another signal wire.

Abstract: A target position detection apparatus for a robot includes: a robot including an arm configured to be freely moved in at least two directions of X and Y axes, the arm having a wrist axis provided at a distal end of the arm and configured to be freely moved in a horizontal direction, and the wrist axis being provided with an end effector; and a control unit adapted for driving a memory to store a teaching point therein and controlling an operation of the robot such that the end effector will be moved toward the teaching point stored in the memory.

Abstract: A differential signaling system, wherein a first wiring and a second wiring are coupled between a sending end and a receiving end as a differential signal line. A termination resistor is coupled between the first wiring and the second wiring in the receiving end side. A test circuit is coupled to the termination resistor in parallel, and amplifies and detects a variation of a differential impedance due to the differential signal line. The test circuit includes: a differential test amplifier for amplifying a variation in the differential impedance of the first wiring or the second wiring; a switching unit installed at an input terminal of the differential test amplifier for controlling an operation of the differential test amplifier; and a peak detector for converting an output signal of the differential test amplifier into a direct current component.

Abstract: Methods and apparatus for determining whether a malfunctioning pixel in a large area substrate, such as a liquid crystal display (LCD) panel, is due to the pixel itself or to the driver circuit for that pixel and for localizing any driver circuit defects are provided. In an effort to localize the driver circuit defects, test pads coupled to the input and/or output of certain driver circuits may be fabricated on the substrate. The voltage or charge of these test pads may be detected using any suitable sensing device, such as an electron beam, an electro-optical sensor, or an electrode in close proximity to the surface of the pixels and/or drivers capacitively coupled to the pixel or driver. For some embodiments, the defective driver circuits may be repaired in the same area as the test area or may be transported via conveyor or robot to a separate repair station.

Abstract: Provided is a method for measuring one or more properties of liquid crystals in an automated manner. Also provided is a liquid crystal analysis instrument (LCAS) that automatically measures one or more properties of liquid crystals.

Abstract: A display includes a substrate provided with a display region and a non-display region. A plurality of display electrodes are arranged on the substrate. A plurality of switching elements are respectively connected to the display electrodes. Each of the switching elements includes a control electrode and a data electrode. A plurality of scan lines are respectively connected to the control electrodes of the switching elements. A plurality of data lines are respectively connected to the data electrodes of the switching elements. A scan line electrostatic protection and test circuit is provided in the non-display region and connected to the scan lines The scan line electrostatic protection and test circuit includes an electrostatic protection circuit provided with a protection element which is normally in a non-conduction state and is set in a conduction state by generated static electricity, and an inspection circuit to inspect a conduction state of the scan lines by way of the protection element.

Abstract: An exemplary liquid crystal display (200) includes a liquid crystal panel, a gate driving circuit (210), and a data driving circuit (220). The liquid crystal panel includes a pixel array (230), a short-circuit test circuit (240), and a control circuit (290). The short-circuit test circuit and the control circuit cooperatively form a discharging circuit. When the liquid crystal display is powered off, electric charge stored in the liquid crystal panel is discharged through the discharging circuit. The gate driving circuit is configured for scanning the liquid crystal panel. The data driving circuit is configured for providing gray-scale voltages to the liquid crystal panel when the liquid crystal panel is scanned.

Abstract: A built-in self-test (BIST) circuit for a liquid crystal display (LCD) source driver includes at least one digital-to-analog converter (DAC) and at least one buffer coupled to the respective DAC, wherein the buffer is reconfigurable as a comparator. A first input signal and a second input signal are coupled to the comparator. The first input signal is a predetermined reference voltage level. The second input signal is a test offset voltage in a test range.

Abstract: An electro-optical device includes a substrate, a plurality of unit circuits that includes a plurality of scanning lines, a plurality of data lines and electro-optical elements provided corresponding to intersecting regions of the scanning lines and the data lines and is formed in a display region of the substrate, a plurality of pixel circuits that includes electro-optical elements and is formed in the display region and a sealing member that seals the electro-optical elements of the plurality of pixel circuits formed in the display region and is attached to the substrate, wherein a test circuit is formed between an attaching region at which the sealing member is attach to the substrate and the display region.

Abstract: An organic light emitting display device may include a pixel portion including a plurality of pixels, which are coupled to scan lines and data lines, a scan driver adapted to provide scan signals to the scan lines, a first transistor group adapted to test the plurality of pixels, the first transistor group being directly connected to first ends of the data lines, a second transistor group adapted to test the plurality of pixels, the second transistor group being connected to second ends of the data lines, a data distributor coupled between the second ends of the data lines and the second transistor group, a first wire group extending in a first direction at an outer area of the light emitting display device, and a second wire group extending in a second direction at the outer area of the light emitting display device.

Abstract: A display substrate includes a substrate, signal lines and test lines. The substrate includes a pixel region where pixels are disposed, a buffer region surrounding the pixel region and a grinding region surrounding the buffer region. The signal lines pass through the buffer region from the grinding region to provide the pixels with a driving signal. The test lines are disposed on the grinding region and the buffer region, respectively, so that the test lines intersect the signal lines in a lattice structure. Each of the test lines is electrically connected to the signal lines of a first number calculated by dividing a second number of the signal lines by a third number of the test lines. Thus, the performance of the pixels used for displaying an image may be tested more precisely.

Abstract: In one embodiment of the present invention, an electrostatic discharge withstand voltage evaluating device includes: an application device, including a first connecting section and a second connecting section, for supplying pulse electric charge, the first connecting section being connectable to one or whole terminal (s) of one of input terminals and output terminals of a source driver, and supplying electric charge to the source driver, the second connecting section being connectable to one or whole terminal(s) of the other one of the input terminals and the output terminals, and enabling said one or whole terminal(s) of the other one of the input terminals and the output terminals to be grounded; and a common connecting section being connectable to the plurality of output terminals of the source driver, and causing the plurality of output terminals to be electrically connected to each other, wherein the output terminals of the source driver are connected, via the common connecting section, to one of the fir

Abstract: An FPC (2) includes: wiring lines (8a) and (8b) which extend toward a display panel (1); and terminals (T1) and (T2) which are connected to the wiring lines (8a) and (8b), respectively. The display panel (1) includes a short-circuit wiring line (5) for short-circuiting the wiring lines (8a) and (8b). The EPC (2) and the display panel (1) are connected to each other so that the wiring lines (8a) and (8b) are short-circuited via the short-circuit wiring line (5) in a connection part between the FPC (2) and the display panel (1). A liquid crystal display device (30) includes a signal application circuit (31) for applying a signal to the terminal (T1) and a monitoring circuit (32) for comparing the signal applied to the terminal (T1) with a signal outputted from the terminal (T2).

Abstract: The present invention relates to methods for inspection of defects in an electrophoretic display and related devices. The method may be carried out with one or more testing electrodes. The method comprises applying a voltage difference to two testing electrodes which are in contact with the display panel, or applying a voltage difference to a testing electrode and a electrode layer. The methods may be applied in in-line or off-line inspection of a display panel.

Abstract: Provided are a liquid crystal panel unit having a liquid crystal panel and a flexible printed circuit connected to each other and a method for inspecting the same with which continuity between an electrode terminal on a panel substrate of the liquid crystal panel and a wiring pattern of the flexible printed circuit can be checked with a simple and reliable method. A liquid crystal panel (3) that has a panel substrate (2) and an opposite substrate (1) disposed opposite the panel substrate (2) via a liquid crystal layer, and a flexible printed circuit (10) in which a connection portion (14) of a wiring pattern (13) is connected to an electrode terminal (4) formed on the panel substrate (2) are provided. The electrode terminal (4) has an electrode inspection region (8) that is exposed in a state where the flexible printed circuit (10) is connected, and an opening portion (17) that exposes the wiring pattern (13) is formed in a base film (11) of the flexible printed circuit (10).

Abstract: Each sensor of a linear array of sensors includes, in part, a sensing electrode and an associated feedback circuit. The sensing electrodes are adapted to be brought in proximity to a flat panel having formed thereon a multitude of pixel electrodes in order to capacitively measure the voltage of the pixel electrodes. Each feedback circuit is adapted to actively drive its associated electrode via a feedback signal so as to maintain the voltage of its associated electrode at a substantially fixed bias. Each feedback circuit may include an amplifier having a first input terminal coupled to the sensing electrode and a second input terminal coupled to receive a biasing voltage. The output signal of the amplification circuit is used to generate the feedback signal that actively drives the sensing electrode. The biasing voltage may be the ground potential.