Abstract: The disclosure provides a delay estimation device and a delay estimation method. The delay estimation device includes a pulse generator, a digitally controlled delay line (DCDL), a time-to-digital converter (TDC), and a control circuit. The pulse generator receives a reference clock signal, outputs a first clock signal in response to a first rising edge of the reference clock signal, and outputs a second clock signal in response to a second rising edge of the reference clock signal. The DCDL receives the first clock signal from the pulse generator and converts the first clock signal into phase signals based on a combination of delay line codes. The TDC samples the phase signals to generate a timing code based on the second clock signal. The control circuit estimates a specific delay between the first clock signal and the second clock signal based on the timing code.

Abstract: It is an object of the present invention to provide a technique capable of reducing power consumption of a semiconductor device even when the semiconductor device operates at high speed. The semiconductor device includes a module for outputting a signal, a delay element, a first output circuit having an input and an output, a first external terminal connected to the output of the first output circuit and to be connected to a signal wiring, and a second external terminal. The input of the first output circuit receives the signal delayed by the delay element. The second external terminal receives the signal without passing through the delay element. The signal of the second external terminal is used to change the potential level of the signal wiring to be connected to the first external terminal before the first output circuit changes the potential of the first external terminal based on the delayed signal.

Abstract: Techniques are described for implementing adaptive coding and modulation (ACM) in regenerative satellite systems to adapt the modulation and/or FEC coding of transmitted waveforms to the conditions of the link. In a first implementation, ACM is implemented on an uplink from a terminal to a regenerative satellite. In this implementation, an uplink modulation and coding combination (ModCod) is estimated by the transmitting terminal based on the quality of signals received from the regenerative satellite on the downlink. In a second implementation, ACM may be implemented on a downlink from a regenerative satellite to a terminal. In this implementation, a transmit terminal may insert a field in a transmitted packet header that indicates a downlink ModCod to be used by the regenerative satellite when transmitting packets to a receiving terminal. The regenerative satellite may reencode and remodulate the packet using the ModCod indicated in the field of the packet header.

Abstract: A circuit for estimating a time difference between a first signal and a second signal, the circuit comprising: a first signal line for receiving the first signal; a delay unit configured to receive the second signal and delay the second signal so as to provide a plurality of delayed versions of the second signal, each delayed version being delayed by a different amount of delay to the other delayed versions; a comparison unit configured to compare each of the delayed versions of the second signal with the first signal so as to identify which of the delayed versions of the second signal is the closest temporally matching signal to the first signal; and a difference estimator configured to estimate the time difference between the first and second signals in dependence on the identified delayed version.

Abstract: An apparatus including a memory subsystem. The memory subsystem includes a data input and a clock input. The apparatus also includes a variable delay circuit coupled to one of the data input or the clock input. Additionally, the apparatus includes a controller coupled to the variable delay circuit. The controller is configured to dynamically control the delay of the variable delay circuit. The controller may adjust the delay of the variable delay circuit based on at least one of timing data for a memory subsystem design of the memory subsystem, timing data for the memory subsystem, a voltage applied to the memory subsystem, or a temperature of the memory subsystem.

Abstract: According to one aspect, embodiments herein provide a digital unit cell comprising a photodiode, an integration capacitor coupled to the photodiode and configured to accumulate charge generated by the photodiode responsive to an input light signal incident on the photodiode over an integration period, a comparator coupled to the integration capacitor and configured to compare a voltage across the integration capacitor with a voltage reference and to generate a clock signal at a first level each time a determination is made that the voltage across the integration capacitor is greater than the voltage reference, a shift register coupled to the comparator and configured to receive the clock signal from the comparator and increase a count value each time the clock signal at the first level is received from the comparator, and an output coupled to the shift register and configured to provide the count value to an external system.

Abstract: According to an embodiment, a method of generating a clock pulse includes receiving a leading edge at a clock input at a time when an enable signal is active, generating an edge at a clock output based on the received leading edge at the clock input, latching a logic value corresponding to the edge at the clock output, preventing changes at the clock input from affecting the latched logic value after the logic value is latched, resetting the latched logic value after a first delay time, and maintaining the reset logic value until a second edge is received at the clock input. The second edge at the clock input matches the leading edge at the clock input.

Abstract: Methods, systems, and apparatuses for providing layer-2 connectivity through a non-routed ground segment network, are described. A system includes a non-autonomous gateway in communication with a satellite configured to relay data packets. The non-autonomous gateway is configured to receive the data packets from the satellite at layer-1 (LI) of the OSI-model, generate a plurality of virtual tagging tuples within the layer-2 packet headers of the plurality of data packets. The non-autonomous gateway is further configured to transmit, at layer-2 (L2) of the OSI-model, the virtually tagged data packets. Each of the packets may include a virtual tagging tuple and an entity destination. The system further includes a L2 switch in communication with the non-autonomous gateway. The L2 switch may be configured to receive the data packets and transmit the data packets to the entity based on the virtual tuples associated with each of the data packets.

Abstract: Disclosed herein is a semiconductor device that includes: a measurement circuit which measures propagation time of an internal clock signal; a delay adjustment circuit which adjusts the propagation time of the internal clock signal on the basis of a result of measurement by the measurement circuit; and a data output circuit which outputs a data signal in synchronization with the internal clock signal.

Abstract: A multi-phase generator includes an oscillator unit including a plurality of first buffer units forming a single closed loop and a delay unit including a plurality of second buffer units respectively connected to a plurality of nodes, wherein each of the plurality of nodes is connected between two adjacent buffer units of the first buffer units. A phase of an output signal of a second buffer unit, among the second buffer units, lags behind a phase of an output signal of a first buffer unit, among the first buffer units.

Abstract: Programmable delay circuitry, which includes an input buffer circuit and variable delay circuitry, is disclosed. The variable delay circuitry includes an input stage, a correction start voltage circuit, and a variable delay capacitor. The input buffer circuit is coupled to the input stage, the correction start voltage circuit is coupled to the input stage, and the variable delay capacitor is coupled to the input stage. The programmable delay circuitry is configured to provide a fixed time delay and a variable time delay.

Abstract: Representative implementations of devices and techniques provide bipolar time-to-digital conversion. For example, either a positive time duration or a negative time duration may be converted to a digital representation by a linear time-to-digital converter (TDC). A set of logic functions may be applied to the input of the TDC to provide start and/or stop signals for the TDC. Further, a correction component may be applied to an input or an output of the TDC to compensate for a delay offset of the TDC.

Abstract: In a first clock frequency multiplier, multiple injection-locked oscillators (ILOs) having spectrally-staggered lock ranges are operated in parallel to effect a collective input frequency range substantially wider than that of a solitary ILO. After each input frequency change, the ILO output clocks may be evaluated according to one or more qualifying criteria to select one of the ILOs as the final clock source. In a second clock frequency multiplier, a flexible-injection-rate injection-locked oscillator locks to super-harmonic, sub-harmonic or at-frequency injection pulses, seamlessly transitioning between the different injection pulse rates to enable a broad input frequency range. The frequency multiplication factor effected by the first and/or second clock frequency multipliers in response to an input clock is determined on the fly and then compared with a programmed (desired) multiplication factor to select between different frequency-divided instances of the frequency-multiplied clock.

Abstract: Method, modules and a system formed by connecting the modules for controlling payloads. An activation signal is propagated in the system from one module to the modules connected to it. Upon receiving an activation signal, the module (after a pre-set or random delay) activates a payload associated with it, and transmits the activation signal (after another pre-set or random delay) to one or more modules connected to it. The system is initiated by a master module including a user activated switch producing the activation signal. The activation signal can be propagated in the system in one direction from the master to the last module, or carried bi-directionally allowing two way propagation, using a module which revert the direction of the activation signal propagation direction. A module may be individually powered by an internal power source such as a battery, or connected to an external power source such as AC power.

Abstract: In at least one aspect, an apparatus includes a plurality of inverter groups and a plurality of bias current sources. The plurality of inverter groups is configured to amplify a signal. Each of the inverter groups has one or more inverters and is in communication with at least one other inverter group of the plurality of inverter groups. Each of the bias current sources is configured to provide a bias current to a different inverter group of the plurality of inverter groups to perform signal amplification.

Abstract: The present invention relates to a semiconductor circuit including: a delay unit for delaying an input signal by a predetermined time to output the delayed signal; a voltage adjusting unit for charging and discharging voltage according to a level of the input signal; and a combination unit for controlling the charging and discharging operations of the voltage adjusting unit according to signals generated using the level of the input signal and a level of the signal output from the delay unit, and it is possible to effectively remove low level noise and high level noise which are respectively mixed in a high level signal and a low level signal input to the semiconductor circuit.

Abstract: Embodiments of the disclosure relate to an all-digital technique for generating an accurate delay irrespective of the inaccuracies of a controllable delay line. A sub-sampling technique based delay measurement unit capable of measuring delays accurately for the full period range is used as the feedback element to build accurate fractional period delays based on input digital control bits. The delay generation system periodically measures and corrects the error and maintains it at the minimum value without requiring any special calibration phase. A significant improvement in accuracy is obtained for a commercial programmable delay generator chip. The time-precision trade-off feature of the delay measurement unit is utilized to reduce the locking time. Loop dynamics are adjusted to stabilize the delay after the minimum error is achieved, thus avoiding additional jitter.

Abstract: A delay line with cell by cell power down capability and methods of use are provided. The delay cell includes a first gate transistor coupled to a voltage supply, a second gate transistor coupled to ground, and a reset signal provided to at least one of the first gate transistor and the second gate transistor. The reset signal turns the delay cell on and off.

Abstract: A signal transmission/reception system includes a transmission line, a signal transmission circuit configured to generate a transfer signal and transfer the transfer signal through the transmission line, wherein a logic value of the transfer signal is changed whenever a pulse signal is input to the signal transmission circuit, and a signal reception circuit configured to receive the transfer signal through the transmission line and generate a restoration signal using the transfer signal and a delayed transfer signal obtained by delaying the transfer signal.

Abstract: An apparatus for demodulating an Amplitude Shift Keying (ASK) encoded signal is provided. The apparatus comprises a peak detector, a first comparator, a threshold generator, a delay circuit, and a second comparator. The peak detector is configured to detect a peak voltage, and the first comparator is coupled to the peak detector and receives a first threshold voltage. The threshold generator is coupled to the peak detector and is configured to generate a second threshold voltage that is proportional to peak voltage. The delay circuit is coupled to the first comparator, and the second comparator is coupled to the delay circuit and that is coupled to the threshold generator so as to receive the second threshold voltage.

Abstract: In one embodiment, a configurable delay element has three stages. The first stage has an 8-buffer first delay chain and an (8×1) first mux that selects one of the eight first-delay-chain outputs. The second stage has a 24-buffer second delay chain connected to receive the first-mux output and organized into three 8-buffer sub-chains and a (4×1) second mux that selects one of the four second-delay-chain outputs. The third stage has a 96-buffer third delay chain connected to receive the second-mux output and organized into three 32-buffer sub-chains and a (4×1) third mux that selects one of the four third-delay-chain outputs as the delay-element output signal. A delay-element controller provides glitch-less updates to the signal used to control the delay-element muxes by timing those updates to occur when all delay-element buffers have the same state. The controller bases the update timing on the delay-element output signal.

Abstract: A delay circuit for an RFID tag includes a power supply input and a power supply output and one or more delay circuits in cascade connection between the power supply input and the power supply output. A first delay circuit includes a passive circuit, a second delay circuit includes a ramp circuit, and a third delay circuit includes a current mirror circuit.

Abstract: A delay generator comprises: a current source for supplying a current; a first delay portion, connected to the current source, comprising at least a plurality of inverters and a first capacitor having a first capacitance; and a second delay portion, connected to the current source, comprising at least a plurality of inverters and a second capacitor having a second capacitance, wherein the first capacitance is the same as the second capacitance, wherein the first delay portion generates a first delay by discharging of the first capacitor, wherein the second delay portion generates a second delay by charging of the second capacitor, and wherein the total delay generated by the delay generator is obtained by summation of the first delay and the second delay.

Abstract: The clock signal detection circuit includes a lock detection circuit, a duty cycle detection circuit, a first logic circuit, and a counter. The lock detection circuit detects whether an input clock signal and a feedback clock signal of a delay locked loop are in phase. The duty cycle detection circuit detects whether the duty cycle of the input clock signal is within a percentage range. The first logic circuit, electrically connected to the lock detection circuit and the duty cycle detection circuit, outputs a detecting result signal which is at first logic level when the input clock signal are in phase with the feedback clock signal, and the duty cycle of the input clock signal is within a percentage range. The counter outputs a lock detection signal which is at the first logic level when the detecting result signal has maintained at the first logic level for a first constant period of time.

Abstract: A delay generator comprises: a current source for supplying a current; a first delay portion, connected to the current source, comprising at least a plurality of inverters and a first capacitor having a first capacitance; and a second delay portion, connected to the current source, comprising at least a plurality of inverters and a second capacitor having a second capacitance, wherein the first capacitance is the same as the second capacitance, wherein the first delay portion generates a first delay by discharging of the first capacitor, wherein the second delay portion generates a second delay by charging of the second capacitor, and wherein the total delay generated by the delay generator is obtained by summation of the first delay and the second delay.

Abstract: A data delay control circuit and method that can adaptively reflect changes in an operating environment, such as an operating temperature, an operating voltage and a manufacturing process of a semiconductor chip. The data delay control circuit is designed to be able to adaptibly delay data when an expected delay of a predetermined period should be required when the semiconductor chip is designed. The data delay circuit includes a clock oscillation unit that can reflect changes in a delay period of a delay cell and automatically adjust the delay period of the delay cell. Since the data delay circuit includes a monitoring circuit and a plurality of delay paths, the data delay circuit can provide a delay path having a desired delay value. Therefore, even when the operating environment of a semiconductor device changes, the data delay circuit can control the delay period of a data signal.

Abstract: A driver chain circuit and methods are provided. The driver chain circuit includes a plurality of voltage regulators and an inverter chain. The plurality of voltage regulators are operable to provide a bias to respective groups of one or more inverters within the inverter chain. The inverter chain includes a plurality of groups of one or more inverters. Each group of inverters is configured to receive a bias from a respective one of the plurality of voltage regulators.

Abstract: In one embodiment, a configurable delay element has three stages. The first stage has an 8-buffer first delay chain and an (8×1) first mux that selects one of the eight first-delay-chain outputs. The second stage has a 24-buffer second delay chain connected to receive the first-mux output and organized into three 8-buffer sub-chains and a (4×1) second mux that selects one of the four second-delay-chain outputs. The third stage has a 96-buffer third delay chain connected to receive the second-mux output and organized into three 32-buffer sub-chains and a (4×1) third mux that selects one of the four third-delay-chain outputs as the delay-element output signal. A delay-element controller provides glitch-less updates to the signal used to control the delay-element muxes by timing those updates to occur when all delay-element buffers have the same state. The controller bases the update timing on the delay-element output signal.

Abstract: A delay chain initialization circuit that converts a singled-sided signal to a dual sided-signal. The dual-sided delay chain including a data rail and a complement rail. Each of the data rail and data complement rail include inverter chains that are interconnected through cross-coupled inverter pairs. The delay chain initialization circuit being adapted to produce, at an output, a data signal and a data complement signal that are substantially simultaneous.

Abstract: A device is disclosed for measuring a plurality of time intervals.

Abstract: A technique for increasing the charge storage capacity of a charge storage device without changing its inherent charge transfer function. The technique may be used to implement a charge domain signal processing circuits such as Analog to Digital Converters (ADCs) used in digital radio frequency signal receivers.

Abstract: A DC-coupled two-stage gate driver circuit for driving a junction field effect transistor (JFET) is provided. The JFET can be a wide bandgap junction field effect transistor (JFET) such as a SiC JFET. The driver includes a first turn-on circuit, a second turn-on circuit and a pull-down circuit. The driver is configured to accept an input pulse-width modulation (PWM) control signal and generate an output driver signal for driving the gate of the JFET.

Abstract: A dual rail delay chain having cross-coupled inverters that interconnect the two rails. Delay chain embodiments include cross-coupled inverters that are part of a feed forward signal path between the two rails and are of a larger size than inverters associated with the two rails. The large size feed forward cross-coupled inverters contribute to an enhanced resolution of the delay chain.

Abstract: Test signal generator (3) generates test signals represented, by four points, which comprise two sets of two points positioned in point symmetry with respect to the origin of an I/Q orthogonal coordinate system. Envelope detector (8) detects the amplitude of an envelope of the output signal from an orthogonal modulator when the test signals represented by four points are generated, and outputs a signal proportional to the square of the amplitude. Comparing unit (9) calculates an average value of output signals from envelope detector ( ) when the test signals represented by the two points of each set are generated. Controller (10) adjusts the amplitudes and/or phases of the test signals so that the average values produced when the test signals represented by the two sets of the two points are generated are equal to each other, and calculates an I/Q mismatch quantity based on the adjusted results.

Abstract: A sampling circuit including a number of state elements or flip-flops. The state elements or flip-flops are each clocked by a signal that causes them to sample their inputs at a predetermined time. In sampling a plurality of digital inputs, a captured delay chain value is stored by the sampling circuit. Each flip-flop holds one bit and together the total number of bits represent this captured delay chain value. Each flip-flop is provided with a data and a data complement signal as an input, the data and data complement signal being substantially simultaneous. In operation each flip-flop includes a direct connection of the data and data complement signals to a pair of transistors that further operate to capture the logical value carried by the input.

Abstract: An exemplary gate driving circuit is adapted for receiving an external gate power supply voltage and an external control signal, sequentially generating multiple internal shift data signal groups and thereby sequentially outputting multiple gate signals. Each of the internal shift data signal groups includes multiple sequentially-generated internal shift data signals. The gate driving circuit includes multiple gate signal generating modules. Each of the gate signal generating modules includes a voltage modulation circuit and a gate output buffer circuit. The voltage modulation circuit modulates the external gate power supply voltage according to a corresponding one of the internal shift data signal groups and the external control signal, and thereby a modulated voltage signal is obtained. The gate output buffer circuit includes a plurality of parallel-coupled output stages. The output stages output the modulated voltage signal as a part of the gate signals during the output stages being sequentially enabled.

Abstract: A reference circuit and method for mitigating switching jitter and delay-locked loop (DLL) using same are provided. The reference circuit and method determine a number of steps of a fine delay line (FDL) that are equivalent to a step of a coarse delay line (CDL). Switching jitter of the DLL is reduced since the delay of the step of the CDL that is switched when on an underflow or overflow condition of the FDL is detected is equivalent to the delay of the provided number of steps of the FDL.

Abstract: An improved bias generator incorporates a reference voltage and/or a reference current into the generation of bias voltages. In some cases, the output of a biased delay element has a constant voltage swing. A delay line of such constant output voltage swing delay elements may be shown to provide reduced power consumption compared to some known self-biased delay lines. Furthermore, in other cases, providing the reference current to a novel bias generator allows a delay line of delay elements biased by such a novel bias generator to show reduced sensitivity to operating conditions, reduced sensitivity to variation in process parameters and improved signal quality, thereby providing more robust operation.

Abstract: A delay circuit with a delay time being more accurate and a circuit area being reduced is provided. The delay circuit includes a resistance element 3, a capacitor element 4 and a connection wiring 6. The connection wiring 6 includes a first polysilicon layer 13a above a substrate 10, and a first silicide layer 14a which connects the resistance element 3 and the capacitor element 4 and is on the first polysilicon layer 13a. The capacitor element 4 includes a diffusion layer 12b in the surface region of the semiconductor substrate 10, a gate insulating layer 15b on the diffusion layer 12b, a second polysilicon layer 13b on the gate insulating layer 15b, and a second silicide layer 14b on the second polysilicon layer 13b. The resistance element 3 includes a third polysilicon layer 13c above the semiconductor substrate 10. The first, second and third polysilicon layers 13a, 13b and 13c are integrally provided. The first and second silicide layers 14a and 14b are integrally provided.

Abstract: A semiconductor device includes a latency signal generating circuit for generating a latency signal corresponding CAS latency by measuring a delay amount reflected at a delay locked loop and reflecting the measured delay amount at a read command signal, and a delay locked loop for controlling an internal clock signal applied to the latency signal generating circuit corresponding to the read command and the latency signal. The semiconductor device includes an internal clock signal generating block configured to generate an internal clock signal, a latency generating block configured to generate a latency signal by synchronizing a read command signal with the internal clock signal at a time corresponding to a CAS latency value and a measured delay value, and an input controlling block configured to activate the reference clock signal using an external clock signal in response to the read command signal and the latency signal.

Abstract: Delay associated with each of two signals along respective transmission paths is accurately measured using a delay measurement circuit that is fabricated in situ on the actual device where the circuitry for propagating the two signals is fabricated. Thus, the measured delay associated with each of the two signals is subject to the same fabrication-dependent attributes that affect the actual circuitry through which the two signals will be propagated during operation of the device. The skew between the two signals is quantified as the difference in the measured delays. Coarse and fine delay modules are defined within the transmission path of each of the two signals. Based on the measured skew between the two signals, the coarse and fine delay modules are appropriately set to compensate for the skew. The appropriately settings for the coarse and fine delay modules can be stored in non-volatile memory elements.

Abstract: An apparatus includes a delay line having multiple delay cells coupled in series. The delay line is configured to receive an input signal and to propagate the input signal through the delay cells. The apparatus also includes multiple sampling circuits configured to sample the input signal at different taps in the delay line and to output sampled values. The delay line has (i) a finer resolution closer to a target tap and (ii) a coarser resolution farther away from the target tap on each side of the target tap. For example, taps nearer the target tap can be closer to each other in order to support the finer resolution, and taps farther from the target tap can be farther apart from each other in order to support the coarser resolution. The apparatus can further include an encoder configured to encode the sampled values in order to generate an encoded value.

Abstract: A delay circuit of a semiconductor device increases its delay time as an external voltage increases. The delay circuit can also ensure a desired delay time according to an external voltage, without additional delay circuits. The delay circuit of the semiconductor device includes a first delay unit, and a second delay. The second delay unit has a propagation delay characteristic different from that of the first delay unit with respect to variation of a power supply voltage, wherein the first delay unit is supplied with a first power supply voltage independent of variation of an external voltage, and the second delay unit is supplied with a second power supply voltage dependent on the variation of the external voltage.

Abstract: A deskew system includes a first voltage control delay receiving a data signal and generating N-numbered delayed data signals obtained by delaying a phase of the data signal in units of 90/N, where N is a natural number that is not less than 1. In response to a phase control signal, a second voltage control delay receives a clock and generates N-numbered delayed clocks by delaying a phase of the clock in units of 90/N. A skew compensation control unit generates a plurality of skew control signals to compensate for skew between the data signal and the clock based on the data signal, the N-numbered delayed data signals, the clock, and the N-numbered delayed clocks.

Abstract: A programmable delay element with a variable delay generator employs feed forward and feedback control signals to corresponding feed forward and feedback control elements integrated within the variable delay generator. The variable delay generator is responsive to a control signal. The variable delay generator uses transfer switches to couple reactive circuit elements to a signal node in accordance with the control signal. The feed forward element couples a fixed voltage to corresponding nodes of the feed back element. The feedback element completes a bypass circuit to apply the fixed voltage to the signal node once the programmable delay element has delayed a source signal. The feed forward element is responsive to a buffered version of the source signal. The feedback element is responsive to a buffered version of the output of the delay element. A corresponding method for reducing frequency induced delay variation in a programmable delay element is disclosed.

Abstract: An improved bias generator incorporates a reference voltage and/or a reference current into the generation of bias voltages. In some cases, the output of a biased delay element has a constant voltage swing. A delay line of such constant output voltage swing delay elements may be shown to provide reduced power consumption compared to some known self-biased delay lines. Furthermore, in other cases, providing the reference current to a novel bias generator allows a delay line of delay elements biased by such a novel bias generator to show reduced sensitivity to operating conditions, reduced sensitivity to variation in process parameters and improved signal quality, thereby providing more robust operation.

Abstract: A pulse control device is maintained with a constant pulse width corresponding to a change of process or temperature. The pulse control device comprises a fuse set for selectively outputting a delay increase signal and a delay decrease signal that have a different state based on a cutting or non-cutting state of a fuse on which information on a change of process is programmed, and a pulse generator provided with a plurality of delay cells with predetermined time delay for selectively increasing or decreasing the number of the plurality of delay cells depending on the delay increase signal and the delay decrease signal to generate an internal clock with a pulse width corresponding to the number of the increased or decreased delay cells.

Abstract: A circuit and method for measuring duty cycle uncertainty in an on-chip global clock. A global clock is provided to a delay line at a local clock buffer. Delay line taps (inverter outputs) are inputs to a register that is clocked by the local clock buffer. The register captures clock edges, which are filtered to identify a single location for each edge. Imbalance in space between the edges indicated imbalance in duty cycle. Up/down signals are generated from any imbalance and passed to a phase locked loop to adjust the balance.

Abstract: A delay circuit is disclosed. A switched-capacitor group includes a plurality of switched-capacitor units, each of which have a switching element and a capacitive element charged/discharged by turning on/off the switching element. The switched-capacitor units are connected such that the input signal is input in common to all of the switched-capacitor units and the capacitive elements are charged as well such that the capacitive elements are discharged to allow the output signal to be output from the switched-capacitor units. A switching control unit performs on/off control of the switching elements to cause the capacitive elements to be charged in sequence based on the input signal, causing the capacitive element charged last time to be discharged to allow the output signal to be output in sequence from the switched-capacitor units, and performs control of all of the switching elements to be turned off upon on/off switching of the switching elements.

Abstract: A method of delaying successive first and second input signals by first and second different selectable time periods using a programmable delay line comprising a sequence of delay elements, each introducing a delay, the method comprising the steps of: providing a control signal to each delay element, the control signal selectively being in a first logic state or a second logic state wherein in a first logic state the delay element selects an input from an adjacent delay element thereby to select the delay elements as part of a set of delay elements introducing said selectable time period and in a second logic state the delay element is not selected in the set; setting the control signals for a first number of adjacent delay elements to the first logic state to introduce the first selectable time period wherein the control signals for the delay elements in the sequence not in the first number are set to the second logic state; and setting the control signals of a second number of adjacent delay elements to the