Coating Or Surface Layer Thickness Patents (Class 33/834)
  • Patent number: 11549795
    Abstract: Disclosed herein is a gauge for slurry coating thickness determination. The gauge includes a body and at least three probes extending from the body. The at least three probes provide a go-no-go indicator including a first demarcation that defines a minimum slurry coating thickness and a second demarcation that defines a maximum slurry coating thickness. A minimum no-go region is defined between the first demarcation and a probe tip, a maximum no-go region is defined between the second demarcation and the body, and a go region is defined between the first demarcation and the second demarcation.
    Type: Grant
    Filed: April 23, 2021
    Date of Patent: January 10, 2023
    Assignee: RAYTHEON TECHNOLOGIES CORPORATION
    Inventors: Guolin Oo, Tracy A. Propheter-Hinckley
  • Patent number: 9958248
    Abstract: A high spot material gauging device applies high spot detection material in multiple depths to provide a basis for correctly determining a depth of material to be removed to produce a planar surface. The device includes a block having a planar first face. Each of a plurality of channels extends into the first face of the block. Each channel has a planar bottom surface parallel to the face of the block. The bottom surface of each channel is a unique respective depth measured transversely from the face of the block such that each channel is configured for applying a unique thickness of high spot material onto a planar control surface.
    Type: Grant
    Filed: July 7, 2016
    Date of Patent: May 1, 2018
    Inventor: Rolf G. Laemmer
  • Patent number: 9605938
    Abstract: A method and associated system for determining geometry of a deformed pipe or conduit or wellbore, the method comprising: collecting, determining and/or receiving measurement data indicative of a plurality of radii of the pipe or conduit using equipment centred in the pipe at two or more points a known distance from the measurement point but not at the measurement point itself; selecting a deformation type and/or deformation model; processing the measurement data to determine one or more geometrical properties of the pipe or conduit, the geometrical properties being indicative of, or associated with, one or more deformations, shapes or profiles of at least part of the pipe or conduit; and guiding and/or constraining at least a part of the processing of the measurement data using the selected deformation type or model and/or fitting the selected deformation model to the measurement data.
    Type: Grant
    Filed: April 3, 2015
    Date of Patent: March 28, 2017
    Assignee: E.V. Offshore Limited
    Inventor: Steve Helmore
  • Patent number: 9285260
    Abstract: At least one probe assembly is used to measure the height of material dispensed into the bin of a hopper assembly.
    Type: Grant
    Filed: September 27, 2013
    Date of Patent: March 15, 2016
    Assignee: BAKER HUGHES INCORPORATED
    Inventors: Brent Naizer, Jay D. Jordan, Patrick Thomson, Zheng Chen
  • Patent number: 8763270
    Abstract: A device for measuring the depth of concrete comprising an elongated spine, a stepped blade attached at the distal end of the spine and having a plurality of bi-lateral steps having a predetermined width and height tapering toward the distal end of the spine, a depth probe slidably attached longitudinally along the spine and including an indicator; and a scale aligned with the indicator. The depth probe may have a pointed or beveled distal tip which is useful for penetrating concrete or other aggregate materials. The stepped blade is provided into concrete and comes in contact with the top of the rebar grid, with the steps measuring the depth of the concrete cover over the rebar. The depth probe is plunged into the concrete until the tip reaches the bottom. The scale measures the distance between a distal tip of the depth probe and the leading edge of the blade.
    Type: Grant
    Filed: February 21, 2012
    Date of Patent: July 1, 2014
    Inventor: H. Houston Spear, IV
  • Patent number: 8474151
    Abstract: The invention relates to a method and a device for measuring the thickness of thin layers over large-area surfaces to be measured (12), in which at least one measuring probe (28), which comprises at least one sensor element (29) and at least one contact spherical cap (31) associated with the sensor element (29), is applied to the surface to be measured (12) in order to obtain a measured value, wherein the large-area surface to be measured (12) is subdivided into individual partial areas (14), a matrix of measurement points (16) is determined for each partial area (14) to be inspected, measured values are ascertained at equidistant measurement points (16) along at least one row (17) of the matrix of the partial area (14) using a device (21) carrying the at least one measuring probe (28), and the measured values are ascertained successively for all rows (17) in the matrix in the partial area (14) and evaluated for this partial area (14).
    Type: Grant
    Filed: May 10, 2011
    Date of Patent: July 2, 2013
    Assignee: Helmut Fischer GmbH Institut fuer Elektronik und Messtechnik
    Inventor: Helmut Fischer
  • Publication number: 20110134440
    Abstract: The monitoring apparatus for uniformity and residual thickness of nano-transfer printing process is installed at a specific location in the surrounding of a transfer printing unit, and, during any stage of the transfer printing process, performs monitoring or measuring the forming rate and forming profile of the forming material inside the transfer printing unit. The monitoring apparatus includes a detection unit, a measuring unit and an analysis unit. The detection unit emits a detection ray to the transfer printing unit. The measuring unit receives a reaction signal of the detection ray passing through the transfer printing unit. The analysis unit analyzes the reaction signal to determine transfer uniformity and the material residual thickness in the transfer print unit.
    Type: Application
    Filed: December 2, 2010
    Publication date: June 9, 2011
    Inventors: Hong Hocheng, Wei-Hsuan Hsu
  • Patent number: 7610690
    Abstract: A measurement stand for holding a measuring device (26), in particular a measuring arrangement (26) for measuring the thickness of thin layers, said measurement stand comprising a housing (18) in which a cam follower (23) is guided such that it can be moved up and down and the measuring device (26) is arranged at that end of said housing (18) that faces the measuring object (14), wherein a drive unit (29) with an electric drive (28) drives the lifting movement of the cam follower (23), wherein said drive unit (29) initiates in the down movement at least one first movement phase with a rapid motion and at least one further movement phase of the cam follower (23) with a creep motion until the measuring device (26) touches down on the measuring object (14).
    Type: Grant
    Filed: July 20, 2006
    Date of Patent: November 3, 2009
    Assignee: Immobiliengesellschaft Helmut Fischer GmbH & Co. KG
    Inventor: Helmut Fischer
  • Patent number: 6977498
    Abstract: The invention relates to a measurement probe, in particular for an apparatus for measurement of the thickness of thin layers, having a housing which has at least one printed circuit board and at least one sensor element which is associated with the printed circuit board, and having a contact cup which is arranged at the lower end of the housing, characterized in that a flexible strip, which has at least one connecting line, is provided on the at least one printed circuit board, and which is passed out of the housing.
    Type: Grant
    Filed: November 14, 2003
    Date of Patent: December 20, 2005
    Assignee: Immebiliengesellschaft Helmut Fischer GmbH & Co. KG
    Inventors: Bernhard Scherzinger, Wolfgang Kindler
  • Patent number: 6964115
    Abstract: A leveling device for leveling floor pavement layers comprises a rod (1) having a hollow (90) therethrough and a fixing flange (11) for fitting with a fixing member at a lower end, a fixing member (3) including an aperture (31) in the center thereof to be releasably coupled with the rod (1), fixing holes (33) on the outer periphery thereof, a finger stop (310) formed at an end of the aperture (31) to be fitted with the fixing flange (11) of the rod (1) and a cap (4) releasably coupled with the hollow (90) of the rod (1).
    Type: Grant
    Filed: June 12, 2002
    Date of Patent: November 15, 2005
    Inventor: Jin Sul Kim
  • Patent number: 6938355
    Abstract: An adhesive bead depth or height measuring system includes a base to which a bead of adhesive is applied by a production adhesive applying machine, and a slide gauge which slides over the base. The gauge member has a pair of rails which are separated by a slot, each rail having a bottom surface which slidably engages the base. The slot forms a planar ramp surface which extends in a longitudinal direction from a first end spaced apart from the bottom surfaces by a first larger distance to a second end spaced apart from the bottom surfaces by a second smaller distance. The gauge slides over the bead with the ramp surface facing the bead and with the first end of the ramp surface leading so that the bead engages and adheres to the ramp surface at a position between the first and second ends. This position is proportional to a height of the bead above a surface of the base. The base includes a guide slot which slidably receives and guides the gauge.
    Type: Grant
    Filed: July 9, 2004
    Date of Patent: September 6, 2005
    Assignee: Deere & Company
    Inventor: Antoine Pierre Duval
  • Patent number: 6575115
    Abstract: A gauge pin includes a round rod that extends perpendicularly from a top surface of a disc shaped base. A bottom surface of the base is coated with an adhesive.
    Type: Grant
    Filed: February 22, 1999
    Date of Patent: June 10, 2003
    Inventor: Ray Keith Lake
  • Patent number: 6538434
    Abstract: A device for measuring the thickness of films or coatings on bases wherein the film thickness is determined from the magnetic adhesive force of a permanent magnet on the surface of the film to be measured. The device includes a permanent magnet attached to an end of a lever arm mounted at its center of gravity, forming a rotary system which includes an electromagnet counterbalancing the permanent magnet. The magnetic adhesive force between the permanent magnet and film is overcome by the variable force of the magnetic field of the electromagnet acting on the lever arm of the rotary system, the value of which, as the permanent magnet is lifted off the film, is used as a measure of the film thickness. In the best mode of operation, this is accomplished by integrating the time required to raise the current applied to the electromagnet to the value which generates a magnetic field which overcomes the adhesive force between the film and permanent magnet.
    Type: Grant
    Filed: October 30, 2000
    Date of Patent: March 25, 2003
    Assignee: ElektroPhysik Dr. Steingroever GmbH KG
    Inventors: Erich Steingroever, Thomas Rohde
  • Publication number: 20020178602
    Abstract: A hand tool can be used for measuring the thickness of a carbon layer applied in a cathode ray tube funnel during manufacture of the tube. The hand tool includes a scribe with a cutting blade or point that extends under the control of the user relative to the rest of the tool. The extension of the scribe relative to the base of the tool, which may be a roller, rollers or a skid plate, indicates the thickness of the carbon layer. The tool can also be applied to measure the thickness of other material layers deposited on a substrate.
    Type: Application
    Filed: June 4, 2001
    Publication date: December 5, 2002
    Applicant: Sony Corporation and Sony Electronics Inc.
    Inventors: David Allen Murtishaw, Michael Gerald King, Marcio Antonio Chinn
  • Patent number: 6360447
    Abstract: An empty envelope assurance system is provided. The system includes a conveyor for conveying an opened envelope having a front face and a rear face along a path of movement. The conveyor is arranged such that any contents of the envelope rests against one of the front face or the rear face. A first sensor measures a thickness of the front face and any contents resting thereagainst, and generates a signal having a value indicative of the thickness. A second sensor measures a thickness of the rear face and any contents resting thereagainst, and generates a signal having a value indicative of the thickness. A signal processor receives the signals generated by the first sensor and the second sensor, and compares the values of the signals generated by the first sensor with the values of the signals generated by the second sensor to determine whether they correspond within a predetermined limit to determine whether the envelope contains any contents.
    Type: Grant
    Filed: April 20, 2000
    Date of Patent: March 26, 2002
    Assignee: Agissar Corporation
    Inventor: James E. Foley
  • Publication number: 20020000183
    Abstract: A gauge pin includes a round rod that extends perpendicularly from a top surface of a disc shaped base. A bottom surface of the base is coated with an adhesive.
    Type: Application
    Filed: February 22, 1999
    Publication date: January 3, 2002
    Inventor: RAY KEITH LAKE
  • Patent number: 6298574
    Abstract: A top reading bituminous paving depth gauge is used to determine the thickness of paving layers. The gauge comprises a depressible rod operatively associated when a rod support system comprising an upper portion having a graduated measuring gauge fixed on the rod support system and a bottom support devise fixed to the lower end of the rod support system. The bottom or the support device acts as a foot for the measuring gauge and also acts to receive the lower portion of the depressible rod. The top reading bituminous paving depth gauge operates without any washers on the measuring depressible rod to prevent false measurements due to the presence of large aggregates.
    Type: Grant
    Filed: April 13, 1998
    Date of Patent: October 9, 2001
    Assignee: APAC Inc.
    Inventor: Richard L. Baker
  • Patent number: 6138374
    Abstract: The invention is directed to a method and apparatus for determining coating thickness on a substrate. The apparatus comprises a jig and fixture combination where the jig includes a moveable stop that fixes a position for placing a substrate specimen in the fixture, and where the fixture includes an inclined plane for receiving the substrate specimen at a predetermined angle .theta. that slopes in a downward direction to engage the moveable stop. A clamp that holds the substrate specimen at a fixed position against moveable stop and inclined plane when said fixture is separated from said jig to determine coating thickness on the substrate.
    Type: Grant
    Filed: September 9, 1998
    Date of Patent: October 31, 2000
    Assignee: Bethlehem Steel Corporation
    Inventors: Fritz J. Friedersdorf, George E. Donchez
  • Patent number: 6026586
    Abstract: A detector for measuring a thickness of a powder on a surface includes a body; a device extending from the body for facilitating holding the body on the surface; and a plurality of teeth extending from the body and spaced from each other along the plane, each of the teeth being defined by two walls extending from the body so as to form a distinct line of intersection extending perpendicular to the plane at a point remote from the body, each of the teeth being of a different length.
    Type: Grant
    Filed: December 8, 1997
    Date of Patent: February 22, 2000
    Assignee: Defelsko Corporation
    Inventor: Charles Edward Waddles
  • Patent number: 6011391
    Abstract: Measurement probe (1) is used for measuring thin layers (19) on base material (20) using a magnetic or eddy current process. On probe housing (5) above a stop for guide means (3) with measurement sensor (12) and measurement pole (13) sliding element (2) for measurement sensor (12) is guided to move in the longitudinal axis of probe housing (5) as limited by a stop. Between sliding element (2) and stop (9) on guide means (3) there is first helical spring (4) by which sliding element (2) is elastically supported relative to measurement sensor (12). Between stop (9) on guide tube (3) and lower abutment (30) on probe housing (5) is second helical spring (10) which interacts with first helical spring (4) and elastically supports measurement sensor (12) in the rest state at a distance above opening (5a) for measurement pole (13) in probe housing (5).
    Type: Grant
    Filed: September 3, 1997
    Date of Patent: January 4, 2000
    Assignees: Elektro-Physik Hans Nix, E. Steingroever GmbH & Co KG
    Inventors: Hans F. Nix, Gang Zhang
  • Patent number: 5929633
    Abstract: The invention relates to a device for measuring the thickness of thin layers in the low micrometer range, having a measuring probe at an end region of a supporting arm, the measuring pole of which probe can be placed on the surface of the layer, having a damping device at the lower end region of the supporting arm, having a bearing device for the supporting arm and having a drive device, which operates using magnetic forces, for the supporting arm, the bearing device comprising a torsion-spring, the two ends of which are each fastened, transversely to the pivot plane, to their own bearing block (32, 33), and the pivoting movement lying at least essentially in the Hooke's range of the torsion-spring (31), and the damping device operating on the principle of eddy-current damping.
    Type: Grant
    Filed: November 29, 1997
    Date of Patent: July 27, 1999
    Inventor: Helmut Fischer
  • Patent number: 5806398
    Abstract: A method and apparatus are disclosed for determining the quantity of sheets of material in a stack containing an unknown quantity. The method can be practiced with existing machines which perform various operations on the sheets of material while they are stacked in the machine. An apparatus is disclosed which includes a position sensor in electrical communication with a counter. The position sensor includes a pulse generator to accurately estimate the thickness of a single sheet of material and the height of the stack of material containing an unknown quantity of sheets. The counter includes a processor to perform mathematical calculations using the values measured by the pulse generator and a display for displaying the results.
    Type: Grant
    Filed: May 23, 1996
    Date of Patent: September 15, 1998
    Inventors: Bradley Robert Emerson, Mahlon Taylor Hewitt
  • Patent number: 5575075
    Abstract: A sheet thickness sensing apparatus adapted to sense variations in thickness of sheet materials or documents such as printouts, invoices, and direct mails irrespective of dimensions of each document. The thickness sensing apparatus includes a main body, a sensor unit, a sheet light source, a photosensor, a douser or a light intercepting member, a crank, a motor, and a conveyor table. The main body is so supported on a slide rod as to move in one direction. The slide rod is in turn supported by support plates so as to move in a direction perpendicular to the direction of the main body. The sheet thickness of each document is optically and mechanically sensed.
    Type: Grant
    Filed: November 28, 1994
    Date of Patent: November 19, 1996
    Assignee: Juki Corporation
    Inventor: Yoshiyuki Sasaki
  • Patent number: 5335424
    Abstract: An apparatus for measuring radial distances relative to the surface of a cylinder includes a chassis supported on the cylinder by at least three wheels, at least one of which is rotatable about an axis different from the axes about which the remaining wheels rotate, and all of which are spaced from one another in a direction parallel to the longitudinal axis of the cylinder. A gauge is provided for measuring radial distances relative to the surface of the cylinder when the chassis is supported on the cylinder by the wheels, the gauge being supported on the chassis in such a way as to allow adjustment both of the height of the gauge relative to the chassis and of the position of the gauge relative to the chassis in a direction parallel to the axis of the cylinder.
    Type: Grant
    Filed: March 19, 1993
    Date of Patent: August 9, 1994
    Inventor: David Spangler
  • Patent number: 5327659
    Abstract: In order to achieve relative simplicity in a reliable measurement technique, an apparatus and method for measuring wet film thickness on a surface is disclosed. The apparatus includes a fixture adapted to be positioned in close proximity to the surface, a gauge supported by the fixture for movement toward and away from the surface, and a spacer for spacing the fixture at a selected distance from the surface. The gauge is moveable from a first position out of contact with the wet film to a second position in contact with the surface to create a measurable spot of the wet film on the gauge. The method includes providing a gauge supported for movement toward and away from the surface, moving the gauge into contact with the surface to create a measurable wet film spot, and moving the gauge out of contact with the wet film to measure the spot.
    Type: Grant
    Filed: December 3, 1992
    Date of Patent: July 12, 1994
    Assignee: R. R. Donnelley & Sons Co.
    Inventor: Ronald A. Banike
  • Patent number: 5311669
    Abstract: A printing press packing gauge is provided in the form of a channel member or saddle for lengthwise disposition along and support from a blanket cylinder with the open side of the channel member abutted and seated against the blanket cylinder and one end of the gauge including an elongated reciprocal sensor lengthwise shiftable relative to the channel member generally radially of the cylinder while an indicator spindle is mounted for lengthwise shifting longitudinally of the channel member and movement connecting structure in the form of a bellcrank pivotally supported from the channel member is provided and operatively connects the sensor with the spindle for simultaneous and equal shifting of the spindle relative to the channel member responsive to shifting of the sensor relative to the saddle member.
    Type: Grant
    Filed: October 27, 1992
    Date of Patent: May 17, 1994
    Inventor: John D. Proffit
  • Patent number: 5235756
    Abstract: A readily portable, hand-held coating thickness measuring device which utilizes a pin to penetrate a coating and a gauge to accurately determine the thickness of the coating based on the degree of penetration is disclosed. The pin is formed at a tip of an elongated rod that can reciprocate relative to the body of the device is response to manually pivoting a trigger member. The device is particularly adapted to determine the thickness of coatings applied to metal surfaces. For this purpose, the device includes a signalling assembly to visually indicate to the user when the coating has been fully penetrated and the gauge should be read.
    Type: Grant
    Filed: August 21, 1992
    Date of Patent: August 17, 1993
    Assignee: Grumman Aerospace Corporation
    Inventor: Thomas A. Wickenhaver
  • Patent number: 5193289
    Abstract: A long arm bears a probe at its end and is arranged in such a way that it can swivel by small angular amounts. This low-mass and slowly movable system is protected by a protective device from which it emerges only partly during the measuring operation. A lowering device which both decouples and entrains, interacts with a damping element. An article to be measured is pushed onto the protective device, an actuating device is pressed and the probe slowly emerges from the protective device and ultimately rests in a defined manner and with adequately low force on a layer of the article.
    Type: Grant
    Filed: April 23, 1992
    Date of Patent: March 16, 1993
    Inventor: Helmut Fischer
  • Patent number: 5134785
    Abstract: A method and apparatus to measure the loop height in a loop pile fabric by moving an apparatus across the surface of the fabric and allowing the loops to create a line on a powdered surface to which a finger is aligned with to cause the plunger of a gauge to automatically provide a read-out of the loop pile height.
    Type: Grant
    Filed: October 1, 1991
    Date of Patent: August 4, 1992
    Assignee: Milliken Research Corporation
    Inventor: Michael W. Gilpatrick
  • Patent number: 5094009
    Abstract: A gauge for measuring the thickness of a coating on a substrate includes a housing, an indicator rod movably positioned within the housing, a magnet mounted on the forward end of the indicator rod, and a spring connected to the rearward end of the indicator rod. The housing can have a slot extending along a portion thereof that communicates with the interior of the housing. According to one embodiment, a measurement scale can be positioned adjacent to and extending along the length of the slot and a plurality of indicating marks can be provided on the rod for permitting the thickness of the coating to be determined. The particular indicating mark that is used for determining the thickness of the coating is dependent upon the orientation of the gauge relative to the force of gravity. According to another aspect of the present invention, the magnet can be fabricated from a combination of at least one light rare earth element and at least one heavy rare earth element.
    Type: Grant
    Filed: October 17, 1990
    Date of Patent: March 10, 1992
    Assignee: DeFelsko Corporation
    Inventors: Frank J. Koch, Marlin S. Walmer
  • Patent number: 5084983
    Abstract: An elongated gauge support body plate is provided including opposite side longitudinal margins equipped with opposite end abutment blocks projecting outwardly from one side of the plate for seated engagement with a partial cylindrical surface. The plate defines a center longitudinal plane for containing the center axis of a cylindrical surface with which the abutment blocks are abuttingly engaged and along which probe-type indicators may be supported to indicate blanket cylinder height in relation to blanket cylinder end bearer height when the plate is supported adjacent one end of a press blanket cylinder.
    Type: Grant
    Filed: July 16, 1990
    Date of Patent: February 4, 1992
    Inventors: John D. Proffit, Jerry D. Morrison
  • Patent number: 5042160
    Abstract: A contacting caliper gauge for measuring the thickness of a moving sheet. The gauge has two extendible members located opposite one another on opposite sides of the sheet. Each extendible member forces a caliper pad into contact with the sheet. Each pad is connected to the extendible member so that the rear portion of the pad exerts greater pressure on the sheet than the front portion. Each pad is also preferably tapered so that the rear end surface and the sheet contacting surface form a sharp edge at the rear of the pad and an angle of 90 degrees or less. Both the shape of the pad and its positioning with respect to the extendible member act to limit build up of adhesive material on the sheet contacting surface of the pads.
    Type: Grant
    Filed: June 30, 1989
    Date of Patent: August 27, 1991
    Assignee: Measurex Corporation
    Inventors: Mark Kasten, James Foster, Gregory Weber
  • Patent number: 5006799
    Abstract: A low cost magnetic gauge that measures the thickness of non-ferrous coatings such as paint on ferrous materials such as auto bodies. Construction consists principally of two telescoping tubes, connected by a spring, with a permanent magnet at the end of one tube. In operation, the magnet tube is placed against the surface being tested, and the other tube is pulled away from the surface. In a first embodiment, indicia are exposed as the non-magnet tube is pulled away, the reading being the last number exposed before the magnet tube pulls off the surface. A second embodiment employs a ratchet to hold the tubes apart at their maximum extension to facilitate reading. A third embodiment uses a wedge for the same purpose. A fourth embodiment adds a member which is drawn along the non-magnet tube by the magnet tube, and stays at its furthest extension on the non-magnet tube, due to a slight frictional load, when the magnet tube pulls off the material being tested.
    Type: Grant
    Filed: December 1, 1988
    Date of Patent: April 9, 1991
    Inventor: John G. Pfanstiehl
  • Patent number: 4813147
    Abstract: A thickness monitoring system for measuring the thickness of layer disposed on both sides of a two sided strip includes a thickness measuring device, a first set of guide rollers mounted to guide the strip past the thickness measuring device along a first path, a set of guide pulleys mounted to invert the strip and to offset the strip laterally with respect to the first path, and a second set of guide rollers which guide the inverted strip past the thickness measuring device along the second path. The thickness measuring device is mounted for movement along a third path which is transverse to the first and second paths to allow the thickness measuring device to monitor either side of the strip by positioning the measuring device in alignment with the respective one of the first and second paths.
    Type: Grant
    Filed: March 27, 1987
    Date of Patent: March 21, 1989
    Assignee: AMP Incorporated
    Inventors: David M. Boyd, Daniel L. Barwick, Dennis H. Chestnut, Timothy W. Jones, Douglas M. Walburn, Larry J. Wilt