Abstract: A digital equalizer with a reduced number of multipliers for correction of the frequency responses of an interleaved ADC is disclosed. An exemplary interleaved analog to digital converter with digital equalization includes a composite ADC including M time interleaved sub-ADC, a demultiplexer, samples repositioning unit, a first PreFIRs transformer, a second PreFIRs transformer, K double buffer FIR filters, a PostFIRs transformer, a samples sequence restoration unit, and a multiplexer, coupled in series and providing an equalized, frequency response-corrected output.

Abstract: Provided is an analog digital converter (ADC). The ADC includes: a capacitor array generating a level voltage; a comparator outputting a compare signal by comparing the level voltage; and a logic circuit determining digital bits of an analog signal based on the compare signal, wherein the logic circuit determines at least one digital bit among digital bits of the analog signal while a sampling operation of the analog signal is performed in the capacitor array.

Abstract: Disclosed is a pipelined analog-to-digital converter which includes a digital correction circuit configured to measure and correct a pipelined conversion stage gain error and an offset error due to a finite voltage gain operational amplifier and capacitor mismatch. The pipelined analog-to-digital converter includes a pipelined conversion stage error measuring and correcting circuit measuring and correcting an error generated from an conversion stage, so that an error of a conversion stage is minimized and a chip realization area and power consumption are reduced.

Abstract: To provide a semiconductor device including an A/D converter circuit that is capable of performing A/D conversion with high accuracy and high resolution and that can be reduced in size. One loop resistance wiring is shared by a plurality of power supply switches and a plurality of output circuits, and a reference voltage having a triangular (step-like) wave generated using the resistance wiring and the plurality of power supply switches is utilized. Thus, high-accuracy digital signals can be obtained using such an A/D converter circuit that can be reduced in size as an output circuit, without using a complicated circuit structure. Further, the number of constituent elements of the A/D converter circuit is small, whereby in the case of providing A/D converter circuits in parallel, variation between the A/D converter circuits can be made small.

Abstract: A pipeline ADC is provided in which a DEM function and summation of sequences occur within a flash ADC. According to various aspects of the present disclosure, embedding the processing functions needed for DAC and amplifier error correction with the circuitry of a coarse ADC and rearranging the digital calibration blocks HDC and DNC ensures accurate estimation of the errors.

Abstract: A pipelined ADC includes a first, second, and third pairs of comparators. The first pair of comparators compare an input voltage to a first positive reference voltage and to a first negative reference voltage. The second pair of comparators compare the input voltage to a second positive reference voltage and to a second negative reference voltage. Each comparator of the first and second pairs of comparators outputs a digital signal to an encoder. A third pair of comparators compares the input voltage to a third positive reference voltage and to a third negative reference voltage, and a comparator compares the input voltage to ground. The comparator and each comparator of the third pair of comparators is configured to output respective digital signals to an encoder. A multiplying digital-to-analog converter outputs a voltage based on the input voltage, an output from the encoder, and an output of the random number generator.

Abstract: A pipelined analog-to-digital converter is provided that has advantages of both a high input sample rate as well as low power consumption due to having all but the first pipeline stage operate at a frequency that is a fraction of the input sample rate. The first stage of the pipelined ADC has an internal operating frequency that is the full ADC sample rate, and samples the input signal on the same clock edge for each sample. Subsequent pipeline stages have parallel input sampling circuitry that samples provided input signals at a reduced rate. Since the input sampling circuitry operates at a reduced frequency, power consumption is reduced by those stages. Further, by virtue of sampling the input signal on the same clock edge for each sample, frequency response image generation issues associated with ADC architectures that sample the input signal on more than one clock edge are avoided.

Abstract: Device for processing an analogue signal, comprising an analogue-digital converter with a pipelined architecture having an offset, and compensation means configured to compensate for the said offset, the said compensation means comprising digital correction means configured to correct the integer portion of the offset based on the digital signal delivered by the analogue-digital converter, and analogue correction means included in the last stage of the analogue-digital converter and configured to correct the decimal portion of the offset.

Abstract: A current providing system, for providing an output current, which comprises: a frequency detecting circuit, for receiving at least one input signal, and for detecting a frequency of the input signal; a frequency-controlled current providing circuit, for providing the output current according to the input signal frequency when the input signal frequency is in a first predetermined range; and a predetermined current providing circuit, for providing the output current with a first predetermined current value, when the input signal frequency is not in the first predetermined range.

Abstract: There is provided a successive-approximation A/D converter in which the binary weighted capacitive D/A converter generates a residual signal for each of cycles assigned to each bit of N bits on the basis of an analog input signal and a reference voltage, the first comparator compares a residual signal at a first time point within a cycle with a predetermined voltage to acquire a first comparison result, the register stores the first comparison result therein, the second comparator compares a residual signal at a second time point later than the first time point within the cycle with the predetermined voltage to acquire a second comparison result, the error determining circuit generates an error detection signal when they differ from each other, and the error-correcting circuit inverts and outputs the first comparison result from the register in a case that the error detection signal has been generated.

Abstract: A SAR ADC includes a DAC including a first set of capacitors each having a first end connected to a common node, and a second end, and a first set of switches each connecting the second end of a respective one of the capacitors to a first reference voltage. The SAR ADC further includes a second set of capacitors each having a first end connected to the common node and a second end that receives an input to be converted when the common node is connected to ground. The SAR ADC further includes a second set of switches that selectively connect the second end of a first capacitor of the second set of capacitors to ground when the input is disconnected from the second ends of the second set of capacitors and when the common node is disconnected from ground during a first of a plurality of successive approximations.

Abstract: One A/D converter and the other A/D converter have a common power supply voltage and sample an A/D conversion value at short time intervals and at a long time intervals, respectively. Both the A/D converter and the A/D converter are set in a constant active state (continuous conversion mode). This allows the total consumption current combining the consumption current of the A/D converter and the consumption current of the A/D converter to be constant, so that the power supply voltage is stabilized and a stable A/D conversion value can be obtained from each of the A/D converters.

Abstract: In pipeline analog-to-digital converters (ADCs) the third harmonic can degrade the performance of the ADC, and conventional circuits that attempt to cancel this third harmonic are oftentimes sensitive to process variation, temperature variation, and common mode variations. Here a correction circuit is provided that includes a compensator that adjusts control voltages for MOS capacitors to generally ensures that the difference between the gate-source voltages and threshold voltages of MOS capacitors is generally maintained across variations of process, temperature, and common mode.

Abstract: A pipeline stage of a pipelined analog-to-digital converter (ADC) circuit can include an ADC to convert an analog input to a digital output, a first plurality of digital-to-analog converters (DACs) sufficient in number to produce an analog output corresponding to the digital output, and a second plurality of DACs configured to have their output added into the analog output, where a succeeding pipeline portion can convert the amplified analog residue to at least one second digital output and a digitized residue. A mapping circuit can selectively exchange inputs between a selected one of the first plurality of DACs and one of the second plurality of DACs, and a calibration signal circuit can provide first and second calibration signals to inputs of the selected one of the first plurality of DACs and another of the second plurality of DACs.

Abstract: An analog-to-digital converter includes a plurality of sequentially cascaded stages, each stage including an amplifier and four copies of a circuit block including a flash and capacitors, in which the four copies of the circuit block operate interleavingly in a respective sample mode, pre-gain mode, gain mode, and reset mode of the circuit block, the copies of the circuit block in the sample mode, pre-gain mode, and reset mode are decoupled from the amplifier, and the copy of the circuit block in the gain mode is coupled to the amplifier to produce an output for a next following stage.

Abstract: In many applications, which use amplifiers that operate at less than 50% duty cycle, it would be advantageous to reduce the number amplifiers to reduce power consumption. Here, an amplifier is provided which is time multiplexed to accommodate multiple data paths. Additionally, reset circuitry or a reset mechanism is provided at the output terminals of this amplifier to briefly short the output terminals to generally prevent glitching that may result from switching between data paths.

Abstract: An analog-to-digital (A/D) converter circuit arranged for receiving an analog input signal and for outputting a digital representation of said analog input signal is described.

Abstract: An integrated circuit allows for the isolation of the input of an analog-to-digital converter (ADC) from a summing-node (SNS) algorithm. The integrated circuit contains a gating device that is controlled by bits of a flash analog-to-digital converter (ADC) to gate input samples to sub-ranges that are used by the SNS algorithm. A single sub-range is chosen to be used by the SNS algorithm.

Abstract: A pipelined recycling analog-to-digital converter (ADC), which converts a first analog input signal into a first digital output signal, including a first conversion stage and a second conversion stage is disclosed. The first conversion stage includes a first processing unit and a second processing unit. The first and the second processing units execute a number of conversion operations. For each conversion operation, an analog value and a digital code are generated by the first or the second processing unit. The first and the second processing units share an operational amplifier, and for each conversion operation. The second conversion stage includes a comparing unit which determines a specific analog value among the analog values generated by the first and the second processing units. When the specific analog value is not located within a predetermined range, the comparing unit generates a reset pulse to reset the operational amplifier.

Abstract: A switched-capacitor circuit which comprises a first sampling capacitor, a second sampling capacitor, an op-amp, a third capacitor, and a fourth capacitor is provided. The first sampling capacitor is disposed to sample an input signal in a sampling phase. The second sampling capacitor is disposed to sample the input signal in the sampling phase. Wherein, in a first amplify phase, the third capacitor stores an offset voltage of the op-amp, the fourth capacitor stores the electric charges which are flowed from the first sampling capacitor and the second sampling capacitor, and in a second amplify phase, the fourth capacitor gives the stored electric charges back to the first sampling capacitor and the second sampling capacitor.

Abstract: A successive approximation A/D converter, includes a reference voltage generation circuit, a sample/hold circuit, a D/A converter circuit, a comparator, and a control circuit. A potential difference between the comparison target voltage generated by the D/A converter circuit and the internal analog voltage is applied to one input terminal of the comparator through a first signal line, and the reference voltage generation circuit is connected to the other input terminal of the comparator through a second signal line and a switch. Capacitive elements are disposed between the high potential power supply and the second signal line, and between the second signal line and the low potential power supply, respectively. The control circuit turns ON the switch to charge the first and second capacitive elements during a period when the sample/hold circuit samples and holds the internal analog voltage and turns OFF the switch in response to end of the period.

Abstract: In conventional pipelined analog-to-digital converters (ADCs), it is common to employ digital-to-analog converters (DACs) in the ADC stages that use two-state switches or segments. A problem with this arrangement is that for each DAC state there is a noise contribution from each DAC switch, resulting from its current source. Here, however, a DAC is employed that uses three-state DAC switches, which reduces the noise contributions from the DAC switches' current sources and reduces the amount of area used.

Abstract: In many applications, which use amplifiers that operate at less than 50% duty cycle, it would be advantageous to reduce the number amplifiers to reduce power consumption. Here, an amplifier is provided which is time multiplexed to accommodate multiple data paths. Additionally, reset circuitry or a reset mechanism is provided at the output terminals of this amplifier to briefly short the output terminals to generally prevent glitching that may result from switching between data paths.

Abstract: Pipeline analog-to-digital converters (ADCs) are commonly used for high frequency applications; however, operating at high sampling rates will often result in high power consumption or tight timing constraints. Here, though, an ADC is provided that allows for relaxed timing (which enables a high sampling rate) with low power consumption. This is accomplished through the use of multiplexed, front-end track-and-hold (T/H) circuits that sample on non-overlapping portions of a clocking signal in conjunction with “re-used” or shared analog processing circuitry.

Abstract: A capacitor array circuit receives a plurality of input signals, generate a single output signal by combining the plurality of input signals, and output the single output signal. A comparator receives the output signal of the capacitor array circuit. A current source, which is disposed between a predetermined fixed voltage source and an output terminal of the switched-capacitor circuit, supplies the current to the output terminal until the output signal of the comparator changes. A plurality of input capacitors in the capacitor array circuit receives a plurality of input signals in parallel with each other. At least one additional regulating capacitor in the capacitor array circuit store the charge to compensate for an offset component caused by the delay in the comparator. The respective output terminals of the plurality of input capacitors and the at least one additional regulating capacitor are combined into one.

Abstract: The present invention is directed to a multiplying digital-to-analog converter (MDAC) and its method. First ends of capacitors are electrically coupled to an inverting input node of an amplifier, wherein two of the capacitors are alternatively configured as a feedback capacitor. Each capacitor is composed of at least two sub-capacitors. Second ends of capacitors are electrically coupled to an input signal via a number of sampling switches, and the second ends of the capacitors are electrically coupled to DAC voltages respectively via a number of amplifying switches. A sorting circuit is configured to sort the sub-capacitors, wherein the sorted sub-capacitors are then paired in a manner such that variance of mismatch among the sub-capacitors is thus averaged.

Abstract: An analog-to-digital converter timing circuit disclosed herein uses a clock generation circuit that makes the analog-to-digital converter insensitive to input clock duty cycle. Minimum clock jitter is added to the clock signal while propagating through the disclosed circuit. A method and system are also disclosed to clock an interleaved pipelined ADC such that the operation is insensitive to input clock duty cycle and such that the clock jitter on the sampling clock edges is minimized.

Abstract: An A/D converter including a folding stage and a plurality of conversion stages is described. The folding stage determines a sub-range in which an input analog voltage falls and adjusts the input analog voltage by a folding voltage offset corresponding to the determined sub-ranges to produce a residue voltage. Each following converter stage determines a voltage range in which the residue voltage falls. The converter stage multiplies the residue voltage by a factor of N to produce an intermediate voltage. The conversion stage selects a cyclic voltage offset corresponding to the sub-ranges in which the residue voltage falls and adjusts the intermediate voltage by the cyclic voltage offset to produce a new residue voltage.

Abstract: In each stage, a digital signal corresponding to a portion of bits is generated from an input analog signal, an analog reference signal is generated by a DA conversion portion (7, 8) based on the digital signal, and a remainder operation on the input analog signal is performed by a remainder operation portion (9). A test can be performed by supplying a test signal in place of the input analog signal. A control portion (14a) performs control, in a test mode, to stop supply of the input analog signal to the remainder operation portion and stop the reference voltage selection of the DA conversion portion based on the digital signal, while performing reference voltage selection based on a DA conversion control signal for use in testing, thereby supplying the remainder operation portion with the test signal composed of predetermined one of the reference voltages, in place of the input analog signal, and the analog reference signal.

Abstract: The present invention introduces a sub-converter stage used in a pipelined analog-to-digital converter. The sub-converter stage comprises an amplifier with a gain A, a sub analog-to-digital converter with comparators and a digital unit, a first capacitor with capacitance C, a second capacitor with capacitance C??C, and customized reference signal Vrefk, where ? ? ? C C = 4 A + 2 and V refk = V ref ? ( 1 - ? ? ? C 2 ? C ) . If the gain A of the amplifier is adjustable, the sub-converter stage needs an error detector to detect the difference between the output of the amplifier and reference signal Vref and adjust the gain A of the amplifier. The present invention also introduces a pipelined analog-to-digital converter employing the sub-converter stage.

Abstract: An image pickup device is provided, capable of complete correction with data of once analog-to-digital conversion, and prevention of excess use of switches and analog devices and/or erroneous correction, including: an image sensor having a plurality of analog-to-digital converters determining conversion results from a digital signal of higher order bit through separate steps of two or more times; a first correction unit which has a correction factor for correcting nonlinear errors of the plurality of analog-to-digital converters so as to adapt to the analog-to-digital converters and corrects a nonlinear error of a digital signal output from respective analog-to-digital converters based on a correction factor corresponding to respective analog-to-digital converters, characterized in that the first correction unit corrects the nonlinear errors after converting the digital signals from the plurality of analog-to-digital converters into a serial output.

Abstract: A conversion circuit for converting a differential input signal into an output signal includes an amplifier that has an input terminal and an output terminal; a first capacitor in which, in a first period, a difference voltage of the differential input signal is applied across first and second terminals, and in a second period the first terminal is coupled to the output terminal of the amplifier and the second terminal is coupled to the input terminal of the amplifier; and a second capacitor in which, in the second period, a reference voltage in accordance with the differential input signal is applied to a first terminal, and the second terminal of the first capacitor is coupled to a second terminal of the second capacitor.

Abstract: Multiple stages sequentially convert respective input analog signals to partial digital data. Each stage includes: a partial A/D converter; a partial D/A converter; an adder that adds/subtracts the analog signal from the previous stage and an output from the partial D/A converter; and a gain amplifier that amplifies an output of the adder and supplies to the next stage. The pipelined A/D converter further includes: a correction value adding unit that adds a correction value to the output from the decoder unit; a correction value calculating unit that, based on the output from the correction value adding unit, calculates an error between the median of the output data and an ideal median at two points in the stage input/output characteristics, saves the calculated value as the correction value and supplies it to the correction value adding unit; and a control unit that controls the above units so as to perform the correction operation.

Abstract: Provided are an analog digital converting device and a reference voltage controlling method thereof. The analog digital converting device includes: a first reference voltage generating circuit generating a first reference voltage; a second reference voltage generating circuit generating a second reference voltage; a first sub analog digital converter receiving an analog input signal and converting the analog input signal into a first digital signal by using the first reference voltage; an amplifier converting the first digital signal into a voltage corresponding to the first digital signal by using the first reference voltage and amplifying a difference between a voltage level of the analog input signal and a voltage level corresponding to the first digital signal to output a residual signal; and a second sub analog digital converter receiving the residual signal and converting the residual signal into a second digital signal by using the second reference voltage.

Abstract: An A/D conversion circuit includes: a sample-and-hold circuit adapted to sample and hold an input signal to output a sampled signal; a control circuit adapted to output successive approximation data; a first D/A conversion circuit adapted to perform D/A conversion on the successive approximation data to output a first D/A output signal; a second D/A conversion circuit adapted to perform D/A conversion on time-varying code data to output a second D/A output signal; and a comparison circuit adapted to perform a process of comparing the first D/A output signal, and an addition signal of the sampled signal and the second D/A output signal, and to output a comparison result signal, wherein the control circuit has a successive approximation register to which register values are set in accordance with the comparison result signal, outputs successive approximation result data after all of the register values of the successive approximation register have been determined, and subtracts the code data from the successive

Abstract: A successive approximation type A/D converter includes: a reference signal generating section generating a reference signal; a comparator comparing an analog signal input thereto with the reference signal and converting the analog signal into a digital signal; and a control section controlling the reference signal to perform oversampling by executing an A/D conversion process on the analog signal at the comparator plural times such that the analog signal is A/D-converted into a digital value of N bits at the first A/D conversion process and such that the second and subsequent A/D conversion processes are performed starting with a lower bit of the (N?n)-th or lower order with upper n bits of the N-bit digital value obtained at the first A/D conversion process fixed.

Abstract: A switched current source is provided. The switched current source is generally comprised of transistors and resistors, and the source has a high output impedance. Included with the switched current source is an error correction transistor and a resistor that cooperate to feed a current back through a bias transistor to correct an error that generally results from the current gains or ?'s of transistors within the switched current source. To accomplish this, however, the resistor is selected to have a value that is sufficiently large such that current from the error correction transistor flows back through the bias transistor.

Abstract: A system is configured and a method is provided for receiving an input ratio represented by a first input signal and a second input signal, and producing an output ratio represented by a first output signal and a second output signal. The system is constructed and the method is provided for alternately operating in at least two time periods, wherein in one time period the first input signal, a low accuracy amplifier, and the first output signal are selectively coupled, and in another time period the input signal, the low accuracy amplifier, a high accuracy attenuator, and the second output signal are selectively coupled so as to maintain the output ratio proportional to the input ratio.

Abstract: A multi-stage Successive Approximation Register Analog-to-Digital Converter (SAR ADC) and an analog-to-digital converting method using the same are provided. The multi-stage SAR ADC connects small-size and low-power SAR ADCs in multiple stages, thereby reducing a whole chip size and power consumption. The analog-to-digital converting method simultaneously performs analog-to-digital conversions in the SAR ADCs connected in the multiple stages, thereby reducing an analog-to-digital conversion time and maintaining an operating rate of several tens of MHz to several hundreds of MHz similar to that of a pipeline ADC.

Abstract: An analog-to-digital conversion unit (ADC unit) and an analog-to-digital converting method (ADC method) are provided. The ADC unit has a plurality of sub analog-to-digital converters and an encoding unit. Each of the employed sub analog-to-digital converters is coupled to two threshold voltages non-successive in terms of levels arrangement, compares the input voltage with the two threshold voltages and outputs two bits according to the comparison results. In this way, the difference between the two threshold voltages coupled by each of the sub analog-to-digital converters can be larger, which is advantageous in advancing the analog-to-digital converting accuracy.

Abstract: Apparatus and methods for pipelined analog-to-digital conversion are disclosed. In some embodiments, a pipeline analog-to-digital converter includes a plurality of multiplying digital-to-analog converter (MDAC) stages coupled in cascade. At least one of the MDAC stages includes two or more flash ADCs connected in parallel, operating alternately to generate digital signals from an analog input voltage. In one embodiment, the flash ADCs provide the digital signals in an alternating manner to a capacitor block that receives a delayed analog input voltage. In another embodiment, the at least one MDAC may include two or more capacitor blocks, each of which is associated with a respective one of the flash ADCs, forming two or more sets of a flash ADC and a capacitor block. In yet another embodiment, the at least one MDAC also include three or more capacitor blocks, each of which can be randomly selected for one of the flash ADCs.

Abstract: A method and apparatus for performing correlated double sampling to remove low frequency noise. The method and apparatus includes an active pixel of an array of active pixels comprising a sensor circuit for collecting radiation induced charges and transducing them to a measurement signal corresponding to the amount of charge collected, two memory elements for storing the measurement signal at the beginning and the end of a first integration period respectively, and at least one further memory element for storing at least the measurement signal at the beginning of a next integration period.

Abstract: An A/D converter device includes a zone identifying circuit configured to identify which one of a plurality of level zones a voltage level of an analog output signal is in; a shift voltage generating circuit configured to generate a shift voltage which corresponds to a relevant one of the level zones; an operational amplifier circuit configured to change the analog output signal by means of the shift voltage, the operational amplifier circuit being configured to amplify the changed analog output signal to suit an A/D conversion input range so as to generate an amplified and shifted analog signal; a first A/D converter circuit configured to A/D-convert the amplified and shifted analog signal so as to calculate a first A/D converted value; and a second A/D converted value calculating circuit configured to calculate a second A/D converted value from the first A/D converted value in accordance with the relevant level zone.

Abstract: Apparatus and methods for pipelined analog-to-digital conversion are disclosed. In some embodiments, a pipelined analog-to-digital converter includes a control and correction circuit; and a plurality of MDAC stages. At least one of the MDAC stages includes: an MDAC input to receive an analog input voltage; and a dual latch flash ADC comprising one or more dual latch comparators. At least one of the dual latch comparators includes: a pre-amplifier having an input coupled to the MDAC input, and an output; a demultiplexer having an input coupled to the output of the pre-amplifier, a first output, and a second output; a first latch having an input coupled to the first output of the demultiplexer, wherein the first latch may generate a first digital signal; and a second latch having an input coupled to the second output of the demultiplexer, wherein the second latch may generate a second digital signal.

Abstract: There is provided a switched capacitor circuit and a pipeline A/D converter which are capable of suppressing electric power from being increased by utilizing a level-shift capacitor, even in a case where the switched capacitor circuit and the pipeline A/D converter are configured by utilizing a CLS technique. In the estimate phase, the capacitor Cc1 (level shift capacitor) is connected between the output terminal of the operational amplifier AMP2 and the inverting input terminal of the operational amplifier AMP2, so as to sample the output from the operational amplifier AMP2, and also to compensate the phase of the operational amplifier AMP2. Additionally, in the level shift phase, the capacitor Cc1 is connected between the output terminal of the operational amplifier 4 and the output terminal Vb, so as to be used to level-shift the output of the operational amplifier AMP2.

Abstract: A system, apparatus and method for a folding analog-to-digital converter (ADC) are described. The general architecture of the folding ADC includes an array (1-N) of cascaded folding amplifier stages, a distributed array of fine comparators, and an encoder. Each folding amplifier stage includes folding amplifiers that are configured to receive inputs from a prior stage, and also generate output signals for the next stage. The folding amplifiers output signals for a given stage are evaluated by a corresponding comparator stage, which may include multiple comparators, and also optionally coupled to an interpolator. The outputs of the comparators from all stages are collectively evaluated by the encoder, which generates the output of the folding ADC. Unlike conventional folding ADCs that require fine and coarse channels, the presently described folding ADC provides conversion without the need for a coarse channel. The encoder can also be arranged to facilitate recursive error correction.

Abstract: Method and system for analog-to-digital conversion. According to an embodiment, the present invention provides an integrated circuit. The integrated circuit includes a different operational amplifier, which includes a first output, a second output, a first input, and a second input. The operational amplifier is associated with an amplification factor. The integrated circuit also includes a first voltage input. The first voltage input can be characterized by a first voltage. Additionally, the integrated circuit includes a second voltage input. The second voltage input can be characterized by a second voltage. Furthermore, the integrated circuit includes a first voltage source configured to provide a first reference voltage. In addition, the integrated circuit includes a second voltage source configured to provide a second reference voltage. Furthermore, the integrated circuit includes a first capacitor being electrically coupled to the first input and disengageably coupled to the first voltage input.

Abstract: A pipeline analog-to-digital converter (ADC) comprises a plurality of pipeline stages is disclosed. The first pipeline stage has programmable gain function. The first pipeline stage includes a sub-analog-to-digital converter (sub-ADC) and a multiplying digital-to-analog converter (MDAC) implemented by switched capacitor (SC) circuits. Different capacitances in the sub-ADC and MDAC are provided so as to provide different gains by controlling switches in the SC circuits.

Abstract: A pipelined AD converter (1) includes a plurality of conversion stages (11, 11, . . . ). In each of the conversion stages, an analog-to-digital conversion circuit (101) converts an input voltage (Vin) from the preceding stage to a digital code (Dout). A digital-to-analog conversion circuit (102) converts the digital code obtained by the analog-to-digital conversion circuit to an intermediate voltage (Vda). A charge operation circuit (103) has: a capacitor section (C1, C2) for sampling the input voltage; and an amplifier section (104) for amplifying a mixed voltage of the input voltage sampled by the capacitor section and the intermediate voltage obtained by the digital-to-analog conversion circuit. The amplifier section (104) includes a plurality of op-amps (amp1, amp1, . . . ) having the same configuration and connected in parallel with each other.

Abstract: A novel analog-to-digital converter (ADC) architecture using subranging successive approximation approach is disclosed. The ADC architecture is capable of achieving high sampling rate, low power consumption and low complexity. It is also able to advance the chip production yield and area utilization ratio. The new proposed ADC is formed by combining a flash converter having high sampling rate and low resolution with a successive approximation converter having low power consumption and low sampling rate.