Abstract: A test apparatus inspects an antenna element or a device including the antenna element as a DUT by OTA. A front-end unit includes a plurality of electric field detection elements provided to face a plurality of points on a radiation surface of the antenna element of the DUT. The plurality of electric field detection elements can simultaneously detect the electric fields formed at the corresponding points by the DUT, respectively. A tester body receives a plurality of detection signals from the front-end unit and evaluates the DUT.

Abstract: A successive approximation register (SAR) analog-to-digital converter (ADC) includes a comparator, a threshold generator and a controller. The comparator receives an analog signal and the SAR ADC outputs an output codeword. The comparator performs a plurality of first comparisons and a plurality of second comparisons. The controller determines a plurality of most significant bits of the output codeword according to a plurality of first comparison results corresponding to the first comparisons. The first comparisons are performed by comparing the analog signal with a plurality of first thresholds. The controller determines a plurality of least significant bits of the output codeword according to a plurality of second comparison results corresponding to the second comparisons. The second comparisons are performed by comparing the analog signal with a second threshold.

Abstract: An successive approximation register analog-to-digital converter is provided. The successive approximation register analog-to-digital converter includes a digital-to-analog converter, a successive approximation register, a comparator, and a threshold voltage determining unit. In this context, the threshold voltage determining unit is configured to dynamically determine the threshold voltage of the comparator on the basis of the input signal of the digital-to-analog converter or the output signal of the comparator.

Abstract: A time-interleaved noise-shaping successive-approximation analog-to-digital converter (TI NS-SAR ADC) is shown. A first successive-approximation channel has a first set of successive-approximation registers, and a first coarse comparator operative to coarsely adjust the first set of successive-approximation registers. A second successive-approximation channel has a second set of successive-approximation registers, and a second coarse comparator operative to coarsely adjust the second set of successive-approximation registers. A fine comparator is provided to finely adjust the first set of successive-approximation registers and the second set of successive-approximation registers alternately. A noise-shaping circuit is provided to sample residues of the first and second successive-approximation channels for the fine comparator to finely adjust the first and second sets of successive-approximation registers.

Abstract: A system has a digital-to-analog converter; a reference signal coupled to the digital-to-analog converter; a differential amplifier for applying gain, and for generating output signals as a function of sampled input signals, the reference signal, digital codes, and the gain applied by the differential amplifier coupled to the digital-to-analog converter; and a multi-bit successive-approximation register for determining the digital codes in successive stages coupled to the differential amplifier; and the gain applied by the differential amplifier is corrected based on previously determined digital codes.

Abstract: A capacitive analog-to-digital converter, an analog-to-digital conversion system, a chip, and a device. The capacitive analog-to-digital converter includes: a first capacitor array, including N first capacitor banks that include M first capacitors, where M is a positive integer greater than N; M first switches, respectively connected to first electrode plates of the M first capacitors in a one-to-one correspondence to enable a successive approximation logic controller to control connections of the first electrode plates of the M first capacitors with an output of a voltage generation circuit and with a first sampling voltage output by controlling the M first switches; a comparator, including a first input, a second input and an output; and the successive approximation logic controller, connected to the output of the comparator, and configured to control the M first switches according to comparison results output by the output of the comparator.

Abstract: An image sensor and an operating method of the image sensor are provided. An image sensor includes a pixel array including a plurality of pixels, a ramp signal generator configured to generate a first ramp signal, a buffer including an amplifier of a super source follower structure and outputting a second ramp signal obtained by buffering the first ramp signal, and an analog-to-digital conversion circuit configured to compare a pixel signal output from the pixel array with the second ramp signal and converting the pixel signal to a pixel value.

Abstract: A comparator circuit includes a differential input circuit, a load circuit, a first current source, a first bias voltage supplying circuit, a third connection circuit, and a fourth connection circuit. The differential input circuit includes a first transistor to which a first input signal is supplied and a second transistor to which a second input signal is supplied. The load circuit includes a third transistor connected to the first transistor through a first connection circuit and a fourth transistor connected to the second transistor through a second connection circuit, gates of the third and fourth transistors being connected to the first connection circuit through a third capacitor. The first bias voltage supplying circuit supplies a first bias voltage to the gates of the third and fourth transistors and the third capacitor.

Abstract: A successive approximation register analog-to-digital converter including a first capacitor group, a second capacitor group and a control circuit is provided. Each of the first and second capacitor groups includes a plurality of capacitors coupled to a common node. In a sampling mode, the control circuit provides an analog signal to the first capacitor group and provides a first voltage to the common node and the second capacitor group. In a sampling mode, the control circuit stops providing the first voltage to the common node and provides a second voltage to the second capacitor group. In a data converting mode, the control circuit reads voltage values of the capacitors of the first capacitor group in sequence. Each when the voltage of at least one specific capacitor in the first capacitor group is read, one capacitor of the second capacitor group is electrically floated.

Abstract: A system has a digital-to-analog converter; a reference signal coupled to the digital-to-analog converter; a differential amplifier for applying gain, and for generating output signals as a function of sampled input signals, the reference signal, digital codes, and the gain applied by the differential amplifier coupled to the digital-to-analog converter; and a multi-bit successive-approximation register for determining the digital codes in successive stages coupled to the differential amplifier; and the gain applied by the differential amplifier is corrected based on previously determined digital codes.

Abstract: A device and a method for digital to analog conversion are provided. The device contains a signal generation circuit and a conversion circuit. The signal generation circuit generates two reset signals which are a first reset signal and a second reset signal. The two reset signals are mutually inverted digital signals and contain the same number of bits. The conversion circuit converts a digital data signal into an analog data signal when a first clock signal is at a first level, and generates the analog data signal at two reset levels respectively according to the two reset signals when the first clock signal is at a second level.

Abstract: A terminal may obtain a parameter related to energy consumption of the terminal, determine a bit resolution value of an analog-to-digital converter (ADC) of the terminal for reducing the energy consumption of the terminal, and set the bit resolution value of the ADC as the determined bit resolution value.

Abstract: A configurable analog to digital converter (ADC) is provided. The configurable ADC includes a comparator receiving and comparing a first analog voltage signal to a second analog voltage signal V-DAC and outputting a signal C-OUT that is responsive to a result of the comparison, an integrator operating on C-OUT and outputting an N-bit value, a digital-to analog converter (DAC) converting the N-bit value to the second analog voltage signal V-DAC, and an integrator, the integrator including the N-bit memory, which is coupled to an arithmetic logic unit (ALU), the N-bit memory and ALU cooperating to perform operations using both the N-bit value and C-OUT. The configurable ADC is configured to operate in more than one mode selected from a plurality of selectable ADC modes.

Abstract: A method of performing analog-to-digital conversion using a successive approximation (SAR) analog-to-digital converter (ADC). A previous digital output is compared to a range based on the first M bits of the previous digital output. If the previous digital output is within that range, a digital-to-analog converter (DAC) of the SAR ADC is preloaded with the first M bits of the previous digital output, prior to commencing bit trials. If the previous digital output is outside of that range, an offset is applied to the first M bits of the previous digital output and the DAC is preloaded based on the M bits and the offset, prior to performing bit trials. This method reduces the possibility of the next input being outside of a further range defined by the preload.

Abstract: Various embodiments include apparatus and methods having a data receiver with a real time clock decoding decision feedback equalizer. In various embodiments, a digital decision feedback loop can be implemented in a data receiver circuit, while all analog signals involved are static relative to the input signal data rate. The implemented data receiver circuit can include a number of data latches with different, but static, analog unbalances and a decision-based clock decoder. In an example, the analog unbalances may be different reference voltages. The decision-based clock decoder can be structured to activate only one data latch, the one with the desired analog unbalance. The outputs of the latches attached to the same clock decoder can be combined such that only the active latch drives the final output. Additional apparatus, systems, and methods are disclosed.

Abstract: A comparator includes a differential input pair of transistors, a pair of cross coupled n-channel metal-oxide-semiconductor field-effect (NMOS) transistors, a pair of p-channel metal-oxide semiconductor field-effect (PMOS) transistors, a first inverter, and a second inverter. The differential input pair of transistors includes a first input transistor and a second input transistor. The pair of cross coupled NMOS transistors includes a first NMOS transistor and a second NMOS transistor. The pair of PMOS transistors includes a first PMOS transistor and a second PMOS transistor. The pair of PMOS transistors are coupled to the pair of cross coupled NMOS transistors. The first inverter is coupled in series with the first PMOS transistor. The second inverter is coupled in series with the second PMOS transistor.

Abstract: An analog-to-digital converter includes a comparator, a switch, and a counter circuit. The comparator is configured to generate a comparison signal by comparing an analog signal received through a first signal line and a reference signal received through a second signal line. The switch is coupled between the first signal line and the comparator. The switch is open before the analog signal is applied to the first signal line to disconnect the first signal line from the comparator, and is closed after the analog signal is applied to the first signal line to provide the analog signal to the comparator. The counter circuit is configured to generate a digital signal corresponding to the analog signal by performing a count operation in synchronization with a count clock signal based on the comparison signal.

Abstract: Multi-channel receiver circuits implemented with time-multiplexed successive approximation register (SAR) analog-to-digital converter (ADC) circuits and methods for operating such receiver circuits are disclosed. One example receiver circuit generally includes a first multiplexer having a plurality of inputs coupled to a plurality of in-phase (I) receive paths associated with different channels of the receiver circuit, a first SAR ADC circuit having an input coupled to an output of the first multiplexer, a second multiplexer having a plurality of inputs coupled to a plurality of quadrature (Q) receive paths associated with the different channels of the receiver circuit, and a second SAR ADC circuit having an input coupled to an output of the second multiplexer.

Abstract: Some embodiments include apparatuses and methods using capacitor circuitry to sample a value of an input signal; comparators to compare the value of the input signal with a range of voltage values and provide comparison results; successive approximation register (SAR) logic circuitry to generate first bits and second bits based on the comparison results; and circuitry to calculate an average value of a value of the second bits and a value of bits of a portion of the first bits, and to generate output bits representing the value of the input signal, the output bits including bits generated based on the average value.

Abstract: Systems and methods for management of scalable storage architectures are disclosed. The system includes one or more storage backplanes, each storage backplane configured to interface with one or more hard disk drives. The system includes a baseboard management controller, which includes an interface to communicate with one or more of the storage backplanes and programmable logic configured to detect the presence of one or more hard disk drives in an interfaced storage backplane and control one or more status indicators, wherein each status indicator is related to at least one of the hard disk drives in the interfaced storage backplane.

Abstract: A capacitor circuit includes: a capacitor array including a plurality of capacitors; a switch array including a plurality of switch circuits, the switch circuits being respectively connected to the capacitors of the capacitor array; a plurality of switch control signal lines supplied with a plurality of switch control signals; and a substrate having a major surface on which the switch circuits are formed. At least part of the capacitors of the capacitor array is formed of a first conductive layer. The switch control signal lines are formed of a second conductive layer provided between the major surface and the first conductive layer. The capacitor array and the switch array are disposed so as to overlap each other at least in part in a plan view when viewed in a normal direction of the major surface.

Abstract: A circuit can include a voltage comparator Vd having a first input, a second input, and an output; a first plurality of capacitors Cp[0:n] that each have a top plate and a bottom plate, wherein each top plate is electrically coupled with the first input of the voltage comparator Vd, wherein each top plate is also switchably electrically coupled with a common mode voltage Vcm, and wherein each bottom plate is switchably electrically coupled between a first input voltage Vinp, a reference voltage Vref, the common mode voltage Vcm, and ground; a second plurality of capacitors Cn[0:n] that each have a top plate and a bottom plate, wherein each top plate is electrically coupled with the second input of the voltage comparator Vd, wherein each top plate is also switchably electrically coupled with the common mode voltage Vcm, and wherein each bottom plate is switchably electrically coupled between a second input voltage Vinn, the reference voltage Vref, the common mode voltage Vcm, and ground; and a successive appro

Abstract: Systems and methods for management of scalable storage architectures are disclosed. The system includes one or more storage backplanes, each storage backplane configured to interface with one or more hard disk drives. The system includes a baseboard management controller, which includes an interface to communicate with one or more of the storage backplanes and programmable logic configured to detect the presence of one or more hard disk drives in an interfaced storage backplane and control one or more status indicators, wherein each status indicator is related to at least one of the hard disk drives in the interfaced storage backplane.

Abstract: Devices and methods for providing filtering for an analog-to-digital converter (ADC) are described. In one embodiment, a method for providing filtering for an ADC involves obtaining a filter coefficient of a post-filtering filter that is located after the ADC on a signal path and generating a filter coefficient of a pre-filtering filter that is located before the ADC on the signal path based on the filter coefficient of the post-filtering filter. Other embodiments are also described.

Abstract: An enhanced resolution successive-approximation register (SAR) analog-to-digital converter (ADC) is provided that includes a digital-to-analog converter (DAC), a comparator and enhanced resolution SAR control logic. The DAC includes analog circuitry that is configured to convert an M-bit digital input to an analog output. The comparator includes a plurality of coupling capacitors. The enhanced resolution SAR control logic is configured to generate an M-bit approximation of an input voltage and to store a residue voltage in at least one of the coupling capacitors. The residue voltage represents a difference between the input voltage and the M-bit approximation of the input voltage. The enhanced resolution SAR control logic is further configured to generate an N-bit approximation of the input voltage based on the stored residue voltage, where N>M.

Abstract: A medical device and associated method convert an analog signal using an adaptable bit number. The medical device includes an analog-to-digital (A/D) converter for receiving an analog signal. The A/D converter has a full scale range and a total number of bits spanning the full scale range. The A/D converter converts the analog signal to a digital signal over conversion cycles using an adaptable bit number so that on at least a portion of the conversion cycles an adapted number of bits spanning a portion of the full scale range less than the total number of bits is used by the A/D converter to convert the analog signal.

Abstract: To provide a semiconductor device capable of accurately controlling the cycle of an internal clock signal. This semiconductor device, by using signal that is output from a sequence register of an asynchronous successive approximation type ADC when N times of comparison are completed, detects whether or not the signal and its delay signal are output when the period transitions from a comparison period to a sampling period, and generates, on the basis of the detection result, a delay control signal for controlling the cycle of an internal clock signal by controlling the delay times of the delay circuits.

Abstract: In accordance with some embodiments, methods for controlling the second order intercept point in a receiver are provided, the methods comprising: generating an amplitude modulated test tone; causing the test tone to be received by a receiver; determining a characteristic of a second order intercept point of the receiver based on the received test tone; and based on the characteristic, adjusting a parameter of the receiver. In accordance with some embodiments, systems for controlling the second order intercept point in as receiver are provided, the systems comprising: a test tone generator that generates an amplitude modulated test tone; a receiver that receives the test tone; a correlator that determines a characteristic of a second order intercept point of the receiver based on the received test tone; and digital logic that, based on the characteristic, adjusts a parameter of the receiver.

Abstract: An encoder is provided for converting thermometer code data with bubbles to binary format. An integrated circuit may have circuitry such as digital phase-locked loop circuitry. A thermometer code data word may be used as a control signal for the circuitry. It may be desirable to monitor the thermometer code data word for testing or for downstream processing by control logic on the integrated circuit. The encoder performs thermometer code to binary encoding without requiring that the thermometer code be error corrected to remove bubbles. A bubble detection circuit may be used to detect when the thermometer code data contains bubbles. The encoder may use carry look-ahead adders and pipeline stages.

Abstract: An A/D conversion apparatus includes a signal processor, a quantizer, and a controller. The signal processor has circuit blocks connected in a loop to process an analog input signal. The quantizer generates a quantization value by quantizing an output of at least one of the circuit blocks including a final-stage circuit block. In each circuit block, one end of a first capacitor is connected through a switch to an input terminal of an operational amplifier, and one end of each of second and third capacitors is connected directly to the operational amplifier. The controller generates an A/D conversion result of the analog input signal according to the quantization value and changes connection conditions of the capacitors so that the signal processor and the quantizer function as a delta-sigma modulator or a cyclic A/D converter.

Abstract: An apparatus relating generally to an analog-to-digital converter (“ADC”) is disclosed. In such an apparatus, the ADC is configured for successive approximations. The ADC includes a digital-to-analog converter (“DAC”), a comparator, and a control block. The DAC is coupled to receive a reference input signal and coupled to provide an analog output signal. The analog output signal is capacitively coupled to an analog input node through a capacitor. The capacitor is coupled between the DAC and the comparator to provide capacitive coupling therebetween. The comparator is coupled to the analog input node. The comparator is further coupled to provide a comparator output signal to the control block. The control block is configured for successive approximations to provide a digital output signal to a digital output node. The DAC is coupled to the digital output node to receive the digital output signal as a feedback input signal.

Abstract: A method utilized in an analog-to-digital conversion apparatus, for converting an analog input signal into a digital output signal including a first portion and a second portion, includes: using a comparator circuit to compare the analog input signal with at least one first reference level to generate a preliminary comparison result, the at least one first reference level being used for determining the first portion; estimating the first portion according to the preliminary comparison result; based on the preliminary comparison result, performing the successive approximation procedure to obtain a posterior comparison result according to a plurality of second reference levels, the second reference levels being used for determining the second portion; and, estimating the second portion according to the posterior comparison result. The preliminary and posterior comparison results are generated by the comparator circuit.

Abstract: A method includes receiving a differential voltage signal at first and second inputs of a comparator and selectively providing the differential voltage signal to one of a first conversion path and a second conversion path of the comparator during a conversion phase to determine a digital value corresponding to the differential voltage signal. The first and second conversion paths including first and second pluralities of gain stages, respectively. The method further includes coupling the selected one of the first conversion path and the second conversion path to an output to provide the digital value.

Abstract: A successive approximation register (SAR) ADC includes an SAR comparator circuit including first and second inputs, a control input, and first and second outputs. The SAR comparator circuit further includes a plurality of capacitors coupled to the first and second inputs and includes a plurality of switches configured to couple the plurality of capacitors to one of a first voltage and a second voltage. The SAR ADC further includes a calibration circuit coupled to the first and second outputs and to the control input of the SAR comparator. The calibration circuit is configured to control the plurality of switches to selectively couple the plurality of capacitors to one of the first and second voltages to provide a calibration signal to the SAR comparator circuit. The calibration circuit is configured to calibrate the SAR comparator based on corresponding output signals at the first and second outputs.

Abstract: According to a method of Successive Approximation Register (SAR) analog to digital conversion, N+1 SAR cycles are performed to obtain an output digital code having N bits. An analog signal is sampled and obtained. After execution of the first N?1 SAR cycles, the Nth SAR cycle is performed by setting a Nth tentative analog signal corresponding to a provisional digital code and comparing the Nth tentative analog signal with the sampled analog signal to obtain a Nth comparison result. The (N+1)th SAR cycle is performed by setting a (N+1)th tentative analog signal based on the Nth comparison result, comparing the (N+1)th tentative analog signal with the sampled analog signal to obtain a second comparison result, and correcting the provisional digital code based on the (N+1)th comparison result to obtain the output digital code. The Nth and (N+1)th SAR cycles each comprise a plurality sub-comparisons and yield a set of sub-results.

Abstract: The objective of the invention is to provide an A/D converter that exhibits fewer malfunctions due to variations in manufacturing.

Abstract: According to the present invention, a successive approximation type analog-digital converter includes: a comparator outputting a result of comparing an analog signal and a reference voltage; a register storing a digital value corresponding to the result of comparison and outputting a digital signal; a detection unit detecting whether the comparator is in a stable state or not for each bit; and a bit determination unit storing, if the comparator is not stable, as a bit value of a bit which is one bit lower-order than a corresponding detection bit, a value obtained by inverting a final determined bit value of the detection bit in the register instead of the comparison result of the comparator.

Abstract: A fixed capacitor is coupled between a top plate of an attenuation capacitor and a variable voltage reference. The error in the attenuation capacitor may be calibrated out with the variable voltage reference and the fixed correction capacitor. The variable voltage reference varies the charge on the attenuation capacitor and thereby compensates for error(s) therein. A calibration digital-to-analog converter may be used in conjunction with or substituted for the variable voltage reference, and may be programmed for different charge compensation values from the SAR logic during an iterative SAR DAC capacitive switching process.

Abstract: A predictive successive approximation register analog-to-digital conversion device and method are provided. A difference between two input signals of a comparator is detected according to a threshold less than or equal to ½ of a voltage increment represented by one least significant bit (LSB). When a difference between a first analog signal and a second analog signal is less than a threshold, a detection circuit enables a bit in a digital signal corresponding to a comparison cycle to which the difference belongs to be forcedly decided to be a first value and predicts values of the remaining bits.

Abstract: A balanced signal processing circuit includes: a comparator; a first capacitor having a first end connected to a non-inverting input terminal of the comparator; a second capacitor having a first end connected to an inverting input terminal of the comparator; a first switch configured to apply a voltage signal to the first end of the first capacitor; a second switch configured to apply a voltage signal to the first end of the second capacitor; an operation state detection section configured to detect an operation state of the comparator; and an offset voltage correction section configured to apply a predetermined offset voltage to a second end of the first capacitor and a second end of the second capacitor when the operation state detection section detects an abnormal operation state of the comparator.

Abstract: A sample-and-hold circuit including an operational amplifier configured to output a result signal to the ADC; a feedback capacitor connected between an input terminal and an output terminal of the operational amplifier to form a feedback path; a plurality of sampling capacitor blocks each connected to one of a plurality of channels and configured to sample and hold an analog signal input to each of the channels; a plurality of controllers each connected between one of the sampling capacitor blocks and the operational amplifier; and a reset unit connected between a reference voltage source and the input terminal of the operational amplifier to reset the operational amplifier when the operational amplifier does not perform a holding operation. The plurality of controllers configured to switch the sampled signal so that held signals for the respective channels are sequentially input to the operational amplifier.

Abstract: An analog-to-digital converter (ADC) comprises a sample/hold (S/H) unit, a digital-to-analog converter (DAC), a comparing unit, and a control unit. The S/H unit samples a first analog signal. The control unit comprises a compensating unit. The compensating unit receives an indication signal, and compensates a current bit and all its less significant bits, such that the sum of the current bit and all its less significant bits approximates a bit weight of the current bit, when the indication signal indicates that the comparison result cannot be determined. The compensating unit then outputs the compensated current bit and all its less significant bits together with more significant bits of the current bit.

Abstract: A charge redistribution SAR analog-to-digital converter includes a source of a reference voltage, a digital-to-analog converter, and a reset circuit. The digital-to-analog converter includes converter stages that range in significance from most significant to least significant. Each converter stage includes respective capacitors and switches. The switches are controllable to selectively connect the capacitors to the reference voltage or to ground. The capacitors of the converter stages are weighted in capacitance in accordance with significance of the converter stage. The reset circuit is to control the switches to reset the converter stages with a temporal offset between at least two of the converter stages. The temporal offset between the at least two of the converter stages reduces the dependence of the charge drawn from the reference voltage source during each conversion cycle on the sample of an analog input signal converted to a digital value during the conversion cycle.

Abstract: An asynchronous successive approximation register analog-to-digital converter (SAR ADC), which utilizes one or more overlapping redundant bits in each digital-to-analog converter (DAC) code word, is operable to generate an indication signal that indicates completion of each comparison step and indicates that an output decision for each comparison step is valid. A timer may be initiated based on the generated indication signal. A timeout signal may be generated that preempts the indication signal and forces a preemptive decision, where the preemptive decision sets one or more remaining bits up to, but not including, the one or more overlapping redundant bits in a corresponding digital-to-analog converter code word for a current comparison step to a particular value. For example, the one or more remaining bits may be set to a value that is derived from a value of a bit that was determined in an immediately preceding decision.

Abstract: A SAR ADC and a method thereof are provided. Particularly, in each bit determining duration of last several bit determining durations, a comparer is used to consecutively compare a first potential with a second potential on a sampling and digital-to-analog converting circuit a plurality of times to obtain a plurality of comparison results, and then an SAR control circuit generates a corresponding output bit according to the obtained plurality of comparison results.

Abstract: A successive operation register (SAR) analog-to-digital converter (ADC) circuit includes a bit reliability circuit that detects a delay time of the voltage comparator and, if the detected delay time is greater than a delay threshold time ?MV, outputs a bit reliability decision signal; a digital noise reduction circuit that is selectively activated if the bit reliability decision signal indicates the detected delay time is greater than the delay threshold time ?MV and produces a noise-reduced decision output that supersedes the decision output of the voltage comparator. In a preferred embodiment, the digital noise reduction circuit uses a multiple voting logic to produce a majority vote value as the noise-reduced decision output.

Abstract: The present invention is directed to signal processing systems and methods thereof. In various embodiments, the present invention provides an analog-to-digital conversion (ADC) system that includes a flash ADC portion and a time-interleaved parallel SAR portion. For an n-bit ADC process, the flash ADC portion converts k MSBs of the n bits during a single cycle, and the SAR portion converts n?k LSBs in m number of cycles. The SAR portion includes a number of SAR channels that perform A/D conversion in parallel, and the k MSB from the course flash converter is verified for errors by the SAR portion and allows a net saving of the power consumption by reducing the number of fine resolution SARs. There are other embodiments as well.

Abstract: Method and apparatus for mapping the converted voltage value by electric charge value proportional to the converted voltage value and in accumulation of charge in the sampling capacitor until the voltage on this capacitor is equal to the converted voltage. Furthermore, realization of the process of that electric charge redistribution in the array of redistribution by changes of states of signals from relevant control outputs and in assignment of relevant values to bits in the digital word by means of the control module. As soon as accumulation of electric charge in the sampling capacitor is terminated, electric charge is accumulated in the additional sampling capacitor then the process of that electric charge redistribution is realized and relevant values are assigned to bits of the digital word. When a trigger signal is detected, next cycle begins and electric charge is accumulated in the sampling capacitor.

Abstract: Examples are provided for converting an analog signal to a digital output signal using serial-ripple analog-to-digital conversion (ADC). An ADC circuit may include conversion stages coupled in series. Each conversion stage may generate a bit for the digital output signal. A data latch may receive bits for the digital output signal from the conversion stages and to provide the digital output signal based on the bits. A conversion stage may include a comparator circuit and a multiplexer circuit. The comparator circuit may compare a sampled input signal with a reference signal and to generate the associated bit of the digital output signal based on a result of the comparison. The multiplexer circuit may provide an associated reference signal to a comparator circuit of a next conversion stage, where the next conversion stage is subsequent to the conversion stage.

Abstract: A system and method are described herein that provide for the calibration of the offset of a comparator on a per-comparator basis. An injection is made to the comparator at determined injection points using a low-power DAC, to calibrate the offset of the comparator. The DAC can be selectively controlled by a digital codeword that is generated based on an output of the comparator and the comparator's offset. Further embodiments of the invention present a system and method for calibrating the offset of a comparator of a flash ADC in each stage of a pipeline ADC. The system and method may provide for the calibration in a manner without affecting the speed of the pipeline ADC or adding significant power to the pipeline ADC.