Quality Inspection Patents (Class 348/92)
  • Patent number: 8854451
    Abstract: An automated hydrogen bubble detection apparatus includes a horizontal support surface on which a test coupon can be supported, a transparent tube having an open top and an open bottom and operable to contain a test solution when positioned on a test coupon, a camera arranged to view a test solution in the transparent tube, and a controller in communication with the camera and effective to operate the camera such that at least one video segment is recorded by the camera and analyzed to detect first bubble and continuous bubble generation. A method of evaluating corrosion resistance of coatings on aluminum and steel in acidic solution is also included.
    Type: Grant
    Filed: October 19, 2011
    Date of Patent: October 7, 2014
    Assignee: Lam Research Corporation
    Inventors: Josh Cormier, Fangli Hao, Hong Shih, Tuochuan Huang, John Daugherty, Allan Ronne, Fred Dennis Egley
  • Publication number: 20140253718
    Abstract: An apparatus for continuously reforming an open end of a metallic can body has a plurality of sequentially aligned necking stations and a flanging station. An inspection station is sequentially aligned with the flanging station and has a camera for capturing a plurality of images about a circumference of the metallic beverage container as the metallic beverage container completes one full rotation about a generally vertical axis during a dwell period. A plurality of transfer wheels are sequentially aligned with the plurality of necking stations, the flanging station, and the inspection station. The transfer wheels sequentially transfer the metallic container between each of the plurality of necking stations, the flanging station, and the inspection station.
    Type: Application
    Filed: March 11, 2013
    Publication date: September 11, 2014
    Applicant: REXAM BEVERAGE CAN COMPANY
    Inventors: Doug Leitzen, Andrea Bevill, Robert P. Perez
  • Publication number: 20140253719
    Abstract: A camera assembly for generating a high resolution image of an area of interest on a workpiece includes a sensor array and an optical lens that focuses light reflected from the workpiece onto the sensor array. The sensor array is inclined relative to an optical axis defined by the optical lens disposed in a fixed position relative to the optical lens. A galvanometer driven minor assembly directs a field of view of the optical lens toward the area of interest on the workpiece translating light reflected from the area of interest of the workpiece onto the sensor array. The inclination of the sensor array provides varying degrees of resolution relative to a distance of the workpiece area of interest from the camera assembly enabling the camera assembly to generate high resolution images at varying distances from the camera assembly without adjusting the optical lens relative to the sensor array.
    Type: Application
    Filed: March 7, 2014
    Publication date: September 11, 2014
    Applicant: Virtek Vision International Inc.
    Inventor: Kurt D. Rueb
  • Publication number: 20140247340
    Abstract: Computing resource and mobile test reader are disclosed. Computing resource receives from external entity related to test at least one parameter relating to test result generation of test belonging to certain manufacturing batch, and transmits at least one parameter to at least one mobile test reader. Mobile test reader receives from computing resource at least one parameter, configures test reader application with received at least one parameter, takes, with digital camera controlled by test reader application configured with at least one parameter, image data depicting output area test, and transmits test use feedback to computing resource.
    Type: Application
    Filed: February 26, 2014
    Publication date: September 4, 2014
    Applicant: iStoc Oy
    Inventors: Hannu KAUNISKANGAS, Jarmo JARVENPAA
  • Patent number: 8817091
    Abstract: Apparatus for monitoring a print result in a rotary printing press, includes a web monitoring system including a matrix camera (20) that is movable in transverse direction over a web printed in the printing press, the matrix camera being adapted to capture an excerpt of the printed image in synchronism with a repeat of the printed image during a print run, an inspection system for a complete inspection of the printed image, the inspection system including a line camera that extends over the entire widths of the web, and an integrated control desk for the web monitoring system and the inspection system.
    Type: Grant
    Filed: July 11, 2011
    Date of Patent: August 26, 2014
    Assignee: eltromat GmbH
    Inventors: Oliver Koltermann, Dirk Volkening
  • Publication number: 20140232850
    Abstract: The vision testing device with an enhanced image clarity for determining good or bad of a testing object by photographing a testing object assembled or mounted during the component assembly process and comparing the photographed image with a previously inputted target image, comprising: a stage part for fixing or transferring the testing object to a testing location; a lighting part for providing lighting to the testing object located on an upper portion of the stage part; a first camera part for obtaining a 2-dimensional image of the testing object located in a center of the lighting part; a plurality of second camera parts placed on a side section of the first camera part; a plurality of grid pattern irradiating parts placed between cameras of the second camera parts; a vision processing unit for reading the image photographed by the first camera part and the second camera parts and determining good or bad of the testing object; a control unit for controlling the stage part, the grid pattern irradiating par
    Type: Application
    Filed: March 8, 2012
    Publication date: August 21, 2014
    Applicant: MIRTEC CO., LTD.
    Inventors: Chan Wha Park, Sang Min Oh, Sung Hyun Kim, Ja Myoung Koo
  • Publication number: 20140226004
    Abstract: Disclosed is a method for inspecting a flat panel. The method for inspecting the flat panel includes the steps of: arranging a camera at a measurement location of the flat panel by horizontally moving at least one of the flat panel and the camera; automatically focusing the camera with respect to a measuring target of the flat panel at the measurement location; acquiring a plurality of images for the measuring target by vertically moving the focused camera within a set region on the basis of the present location of the camera when focusing the camera; selecting the image having the most definition for the measuring target among the acquired images; processing the selected image; and determining whether the measuring target is defective or not.
    Type: Application
    Filed: September 13, 2012
    Publication date: August 14, 2014
    Applicant: Intekplus CO., LTD
    Inventors: Jai-Ho Son, Hyun-Min Lee, Min-Gu Kang, Sang-Yoon Lee, Ssang-Gun Lim
  • Publication number: 20140218503
    Abstract: A metrology system is configured to provide visual inspection of a workpiece, three-dimensional magnetic field map, and height measurement. A stage is configured to bring points of interest at the workpiece under the desired tool for measurement. The optical field, magnetic field, and height information can be used independently or together in order to correlate defects in the manufacturing process of the workpiece. This abstract is provided to comply with rules requiring an abstract that will allow a searcher or other reader to quickly ascertain the subject matter of the technical disclosure. It is submitted with the understanding that it will not be used to interpret or limit the scope or meaning of the claims.
    Type: Application
    Filed: December 3, 2013
    Publication date: August 7, 2014
    Applicant: KLA-Tencor Corporation
    Inventors: John Gerling, Edward Wagner, Mehran Nasser-Ghodsi, Garrett Pickard, Tomas Plettner, Robert Haynes, Christopher Sears
  • Patent number: 8797399
    Abstract: An appearance inspection apparatus has conveying means for conveying an inspection object and surface shape inspecting means for inspecting the surface shape of the inspection object. The surface shape inspection means has a slit beam irradiating section for irradiating a band-shaped slit beam on the surface of the inspection object, an area sensor camera for capturing images of the slit beam, first and second optical mechanisms for receiving reflected lights of the slit beam on the downstream and upstream sides in a conveyance direction, respectively, and guiding them to the area sensor camera, and a shape judging section for judging appropriateness of the surface of the inspection object based on images captured by the area sensor camera. Optical paths of the first and second optical mechanisms allow images of the reflected lights to be formed on the area sensor camera in a state of being aligned laterally.
    Type: Grant
    Filed: May 16, 2011
    Date of Patent: August 5, 2014
    Assignee: Daiichi Jitsugyo Viswill Co., Ltd.
    Inventors: Shinya Matsuda, Hiroshi Aoki, Toshiaki Onoe
  • Patent number: 8797398
    Abstract: A method and system are provided for inspecting a plurality of target features arrayed in spaced arrangement on a surface of a target object, such as but not limited to inspection of the location of cooling air holes in the surface of a turbine blade or vane.
    Type: Grant
    Filed: May 3, 2010
    Date of Patent: August 5, 2014
    Assignee: United Technologies Corporation
    Inventors: Joseph D. Drescher, Jesse R. Boyer, Robert E. Erickson, Erik M. Pedersen
  • Patent number: 8797397
    Abstract: A method of operating a chip mounter is provided, comprising: preparing an electronic part on a part supply unit and a printed circuit board on a main body; gripping the electronic part using a part conveyor unit to move the electronic part along a part moving path on the part supply unit and the main body; photographing the electronic part when the electronic part is located at a part recognition region within the part moving path without stoppage and during the movement of the electronic part; transmitting a photographed image of the electronic part to a controller using the image processing unit; comparing the photographed image with a reference image using the controller; and displaying the photographed image to the exterior using the controller; wherein the part recognition region is set by at least one coordinate in the controller to be located on a light source of the processing unit.
    Type: Grant
    Filed: July 24, 2012
    Date of Patent: August 5, 2014
    Assignee: Samsung Techwin Co., Ltd.
    Inventor: Jae-Hyun Park
  • Publication number: 20140210995
    Abstract: An inspection method for a semiconductor light-emitting device includes an image capturing step for irradiating light to the semiconductor light emitting device so as to excite an active layer and capturing an image of photoluminescence released from the active layer, an inspection region extracting step for extracting an inspection region of the captured image, a luminance average determination step for, determining as defective when a luminance average is smaller than a predetermined threshold, a luminance variance determination step for determining as defective when a luminance variance is larger than a predetermined threshold, and a total determination step for totally determining the semiconductor light-emitting device as defective when determined the semiconductor light emitting device as defective in at least one of the two determination results.
    Type: Application
    Filed: January 30, 2014
    Publication date: July 31, 2014
    Applicant: NICHIA CORPORATION
    Inventor: Masatoshi ABE
  • Patent number: 8791998
    Abstract: An image processing apparatus includes a display section that displays a first image, which forms a streaming video obtained by capturing blades periodically arrayed in a jet engine, and also displays information indicating the position of a blade corresponding to the first image.
    Type: Grant
    Filed: July 30, 2010
    Date of Patent: July 29, 2014
    Assignee: Olympus Corporation
    Inventor: Fumio Hori
  • Publication number: 20140204200
    Abstract: This disclosure generally relates to spectral imaging and, more particularly, to methods and systems for speed calibration in spectral imaging systems. In one embodiment, a spectral imaging system is disclosed, comprising: an imaging sensor configured to acquire image data for an imaged object; a multi-band wavelength filter disposed to filter light detected by the imaging sensor; and a motion stage configured to cause relative motion between the imaged object and the multi-band wavelength filter at a motion rate that is based on a frame rate of the imaging sensor and a number of wavelength bands of the wavelength filter utilized to filter light detected by the imaging sensor; wherein the motion rate is set such that light detected by the imaging sensor corresponding to a portion of the imaged object is filtered by successive wavelength bands of the wavelength filter for successive frames capturing the portion of the imaged object.
    Type: Application
    Filed: March 11, 2013
    Publication date: July 24, 2014
    Applicant: Wipro Limited
    Inventors: Upendra Suddamalla, Anandaraj Thangappan
  • Patent number: 8786665
    Abstract: A videoconference may be initiated between a plurality of endpoints. At least one of the endpoints may be coupled to a recording server, which may be configured to record the videoconference. A configuration may be selected (e.g., automatically or manually) for performing the recording. The endpoint (e.g., acting as an MCU) may transmit information to endpoints and may transmit recording information to the recording server. The recording information may be different from the videoconference information. For example, it may be in a “streaming friendly” format, at a different bit rate, encoded differently, have different inputs, etc. The manner in which the videoconference is stored and/or recorded may be based on the selected configuration. Clients may be configured to receive and display the videoconference from the recording server and may be configured to change the provided layout to different layouts, e.g., based on user input.
    Type: Grant
    Filed: April 26, 2011
    Date of Patent: July 22, 2014
    Assignee: LifeSize Communications, Inc.
    Inventors: Binu Kaiparambil Shanmukhadas, Ashish Goyal, Raphael Anuar
  • Patent number: 8780097
    Abstract: A system for detecting newton ring mura on a display includes sensing an image of the display with an image capture device and determining a border boundary of an illuminated portion of the display. The image is spatially filtered as defined by the border boundary using a filter that reduces sensor noise and a grid pattern of the display. The spatially filtered image is processed to determine if a region proximate a pixel location is a potential newton ring mura defect and characterizing the potential newton ring mura defects to remove at least one of the potential newton ring mura defects.
    Type: Grant
    Filed: October 20, 2011
    Date of Patent: July 15, 2014
    Assignee: Sharp Laboratories of America, Inc.
    Inventors: Xinyu Xu, Xiao-fan Feng, Chang Yuan
  • Publication number: 20140184783
    Abstract: A device for determining the surface defects of a product includes a base, a support member, a platform, a lighting unit, an image capturing unit, and a processing unit. The lighting unit includes a driving unit, a frame and a number of light sources. The light sources are mounted along the frame. The driving unit drives the frame to move in six degrees of freedom, the light sources emitting light to illuminate the product in different directions. The image capturing unit captures images of the product on the base. The captured images of the product are analyzed and matched against similar views of a blemish-free model product, any discrepancies leading to a determination that the product has any surface defects.
    Type: Application
    Filed: December 5, 2013
    Publication date: July 3, 2014
    Applicant: HON HAI PRECISION INDUSTRY CO., LTD.
    Inventors: Hou-Hsien LEE, Chang-Jung LEE, Chih-Ping LO
  • Publication number: 20140184784
    Abstract: A defect inspection device of the present invention for detecting a position of a defect existing in a wire formed on a panel, includes: a probe which applies a voltage to a terminal section of the wire; probe moving means for moving the probe to the terminal section; a first infrared sensor which photographs an entire surface of the panel; a second infrared sensor which photographs a part of the panel; and sensor moving means for moving the second infrared sensor to each position on the panel, the first infrared sensor including a plurality of infrared cameras.
    Type: Application
    Filed: May 18, 2012
    Publication date: July 3, 2014
    Applicant: SHARP KABUSHIKI KAISHA
    Inventor: Masakazu Yanase
  • Patent number: 8768514
    Abstract: An image taking system including: (a) a lighting device capable of changing a light emission time to various time length values; (b) an image taking device configured to take an image of a subject portion while light is being emitted by the lighting device; (c) a subject-portion moving device configured to move the subject portion relative to the image taking device, and capable of changing a movement velocity of the subject portion relative to the image taking device, to various velocity values; and (d) a control device configured, during movement of the subject portion by the subject-portion moving device, to cause the lighting device to emit the light for one of the time length values as the light emission time and to cause the image taking device to take the image, and is configured to control the movement velocity, such that an amount of the movement of the subject portion for the above-described one of the time length values is not larger than a predetermined movement amount.
    Type: Grant
    Filed: April 26, 2010
    Date of Patent: July 1, 2014
    Assignee: Fuji Machine Mfg. Co., Ltd.
    Inventor: Kazumi Hoshikawa
  • Publication number: 20140176698
    Abstract: Systems and methods for imaging characteristics of a sample and for identifying regions of damage in the sample are generally described. Some example systems and methods for non-destructive evaluation of regions of material may operate in a direct current (DC) mode in which the system directly images regions of material where weak structural damage has occurred by imaging a self magnetic field generated by a DC electric current coupled through the material. Some example systems may operate in an alternating current (AC) mode to image regions of material where damage has occurred by generating a time varying magnetic field due to AC excitation coils inducing eddy currents in the sample, and imaging a magnetic field generated by the eddy currents around the regions of damage. The systems may use magneto-optical imaging techniques (MOI) to measure and map the magnetic field and channels of current flow in the material, for example.
    Type: Application
    Filed: November 29, 2010
    Publication date: June 26, 2014
    Applicant: INDIAN INSTITUTE OF TECHNOLOGY KANPUR
    Inventors: Satyajit Banerjee, Shyam Mohan, Jaivardhan Sinha
  • Publication number: 20140168414
    Abstract: Methods and systems for determining information about an object are described. In one aspect, a method includes illuminating an object with a plurality of lines of light, the lines being spaced-apart along an axis, and acquiring a sequence of images of the lines of light while rotating the object about the axis. The method further includes, for each image, determining a location of an extremum for each of the lines of light. Furthermore, the method includes establishing a reference line based on the location of the extrema for a first plurality of the lines, calculating a deviation between the extrema of a second plurality of the lines and the reference line, and determining information about the shape of the object based on the calculated deviations.
    Type: Application
    Filed: December 19, 2012
    Publication date: June 19, 2014
    Applicant: TENARIS CONNECTIONS LIMITED
    Inventor: TENARIS CONNECTIONS LIMITED
  • Publication number: 20140152804
    Abstract: Provided herein is an apparatus comprising a photon detecting array configured to take images of an article, and a mount configured to mount and translate the article in a direction by a sub-pixel distance. In some embodiments, the sub-pixel distance is based on a pixel size of the photon detecting array.
    Type: Application
    Filed: September 17, 2013
    Publication date: June 5, 2014
    Applicant: Seagate Technology LLC
    Inventors: Joachim Walter Ahner, Travis William Grodt, Florin Zavaliche, Maissarath Nassirou, David M. Tung, Tchernio T. Boytchev, Stephen Keith McLaurin, Henry Luis Lott
  • Patent number: 8743196
    Abstract: A system and method for performing an external inspection on a rotor blade of a wind turbine are disclosed. The system may generally include a frame configured to extend at least partially around an outer perimeter of the rotor blade and a sensing device coupled to the frame. Additionally, first and second spacer arms may extend from the frame. The first spacer arm may be configured to contact a pressure side surface of the rotor blade. The second spacer arm may be configured to contact a suction side surface of the rotor blade.
    Type: Grant
    Filed: December 16, 2010
    Date of Patent: June 3, 2014
    Assignee: General Electric Company
    Inventors: Peter James Fritz, Kevin George Harding, Bradley Graham Moore
  • Publication number: 20140146165
    Abstract: Optical inspection systems and methods for inspecting a glass sheet for defects are disclosed. The systems and methods employ a digital camera and a plurality of different types of illumination sources. The object plane of the digital camera moves through the glass sheet body while flash exposures from one or more of the illumination sources are performed. The movement occurs during a ready-to-acquire time of the digital camera. This allows the digital camera to capture a plurality of digital inspection images on the fly at different exposure positions within the glass sheet body without waiting for any digital image processing to occur. The digital inspection images are then reviewed to characterize any revealed defects.
    Type: Application
    Filed: November 29, 2012
    Publication date: May 29, 2014
    Inventor: William John Furnas
  • Patent number: 8736688
    Abstract: A device for analyzing a transparent surface of a substrate including a reference pattern facing a surface of the substrate to be measured. The reference pattern is formed on a support of short and long extents. A camera is provided for taking at least one image of the reference pattern distorted by the measured substrate. A reference pattern illumination system and a processor for processing the image and digital analysis are connected to the camera. The support is of oblong shape and the reference pattern is a one-directional pattern that extends along the shortest extent of the support. The pattern is transversely periodic to the short extent, and the camera is a linear camera.
    Type: Grant
    Filed: March 28, 2011
    Date of Patent: May 27, 2014
    Assignee: Saint-Gobain Glass France
    Inventors: Michel Pichon, Franc Davenne
  • Publication number: 20140139659
    Abstract: An inspection system for a vehicle includes a vision inspection device including a plurality of vision camera and a plurality of laser device which move along exterior and sides of a door, which will be inspected, and inspect segmented sections respectively, a hanger device clamping the hemmed door on a hanger frame, and a jig device which clamps the hanger frame of the hanger device, and moves the door toward the vision inspection device for the vision inspection device to inspect the door fixed to the hanger device.
    Type: Application
    Filed: November 5, 2013
    Publication date: May 22, 2014
    Applicants: Hyundai Motor Company, Daewoo Industry Co, Ltd., Dasannewtech Co., Ltd.
    Inventors: Young Soo LIM, Jin Cheol KIM, Kang Jae JO, Bum-Hun JUN
  • Publication number: 20140141680
    Abstract: A method for inspecting a spark plug that includes a tubular insulator having an axial hole, a center electrode inserted into the axial hole at a front end side thereof, a tubular metallic shell disposed around the insulator, an annular space defined by an outer circumferential surface of the insulator, and an inner circumferential surface of the metallic shell and opened frontward. The method includes steps of: inspecting insulation performance of the insulator based on whether dielectric breakdown is caused in the insulator when a voltage is applied to the center electrode; photographing an area including at least the center electrode, the insulator, and the annular space from a front end side in the direction of the axis when the voltage is applied to the center electrode; and determining whether the dielectric breakdown has occurred based on the photographed image.
    Type: Application
    Filed: November 14, 2013
    Publication date: May 22, 2014
    Applicant: NGK SPARK PLUG CO., LTD.
    Inventor: Jiro KYUNO
  • Patent number: 8730395
    Abstract: A history information recording device is provided to an image display equipment, for recording, as history information, information about operations that have been executed in the image display equipment up to a present time. The history information recording device includes a connection terminal to which an external storage medium is connected, in which the history information is transmitted to and recorded on the external storage medium connected to the connection terminal in response to a given instruction. Therefore, it is possible to check the history information of the image display equipment without displaying the history information on a screen of the image display equipment.
    Type: Grant
    Filed: April 27, 2010
    Date of Patent: May 20, 2014
    Assignee: SANYO Electric Co., Ltd.
    Inventors: Masayoshi Kojima, Shigenori Shimomura, Kazuhiko Ikazuchi
  • Patent number: 8730318
    Abstract: In order to obtain a quality image without deterioration owing to radiation noise in inspection using the optical video camera in high radiation environment, an inspection apparatus is formed of an image pick-up unit, an image obtaining unit which fetches a video image that contains a signal (noise) that is substantially independent of each frame obtained by the image pick-up unit, a local alignment unit which locally aligns frames with different time phases for forming the image fetched by the image obtaining unit, a frame synthesizing unit which synthesizes the plurality of frames aligned by the local alignment unit for generating a synthesis frame with an SN ratio higher than the SN ratio of the frame before frame synthesis, and an image output unit for displaying or recording the image formed of the synthesis frame generated by the frame synthesizing unit.
    Type: Grant
    Filed: June 14, 2011
    Date of Patent: May 20, 2014
    Assignee: Hitachi-GE Nuclear Energy, Ltd.
    Inventors: Kenji Nakahira, Atsushi Miyamoto, Naoki Hosoya, Minoru Yoshida
  • Patent number: 8723945
    Abstract: An optical apparatus and method for simultaneously scanning the profile of at least two adjacent surfaces of an article such as a wooden board moving along a travel path axis passing through an inspection area located at a central plane transverse to the travel path axis, involve first and second scanning zones sufficiently spaced one with another along the travel path axis to substantially prevent mutual scanning interference between the profile sensors used, while providing a compact arrangement of profile sensors. For so doing, one the first sensing field and the first laser beam of the first profile sensor is crossing the central plane toward the other one of the first sensing field and the first laser beam, and one the second sensing field and the second laser beam of the second profile sensor is crossing the central plane toward the other one of the second sensing field and the second laser beam.
    Type: Grant
    Filed: July 15, 2011
    Date of Patent: May 13, 2014
    Assignee: Centre de Recherche Industrielle du Quebec
    Inventor: Denis Lessard
  • Patent number: 8723947
    Abstract: An apparatus and a method for aligning containers, in particular bottles, in a labeler, the apparatus having rotatable holders for containers to be aligned, and a camera unit for imaging the containers as well as a proximity switch for triggering an imaging function of the camera unit. This allows a precise alignment in combination with a reduced expenditure of time and reduced space requirements.
    Type: Grant
    Filed: April 26, 2010
    Date of Patent: May 13, 2014
    Assignee: Krones AG
    Inventors: Anton Niedermeier, Karl Aichinger
  • Patent number: 8723946
    Abstract: A workpiece inspecting apparatus for rotating a workpiece having a shape portion containing a convex portion and a concave portion which are periodically and repetitively formed on the workpiece and picking up images of the shape portion of the workpiece to inspect the workpiece, including a workpiece rotating mechanism that outputs reference pulses at a fixed interval while rotating the workpiece at a fixed rotational speed, an image pickup mechanism that picks up images of the shape portions of the workpiece every image pickup timing based on the reference pulses, an image pickup controller that synchronizes each of the shape portions of the workpiece with the image pickup timing, and an inspection controller that executes image processing of taking a difference between a pickup k-th (k represents an integer) image and a pickup (k+1)-th image and detects a defect on the basis of differential data representing the difference.
    Type: Grant
    Filed: September 2, 2011
    Date of Patent: May 13, 2014
    Assignee: Honda Motor Co., Ltd.
    Inventors: Hisashi Takahashi, Ryo Obara, Koichi Imazu
  • Publication number: 20140125793
    Abstract: Inspection equipment for a screw part of a bottle-can having a mouth section provided with a curl portion in which an opening edge thereof is rolled up outward and the screw part for fitting a cap by threads below the curl portion for attaching the cap with a liner, the inspection equipment inspects a shape of the screw part of the mouth section by imaging an imaging area which is set so as to include a part of the mouth section while rotating the bottle-can around a can-axis, the inspection equipment including: a rotating device which holds and rotates the bottle-can around the can-axis; a thread-illumination device which irradiates illumination light toward the screw part of the bottle-can an imaging device which continuously obtains inspection images including reflected light of the illumination light at the imaging area; and an thread-inspection device which inspects the screw part.
    Type: Application
    Filed: June 4, 2012
    Publication date: May 8, 2014
    Applicants: UNIVERSAL CAN CORPORATION, KURASHIKI BOSEKI KABUSHIKI KAISHA
    Inventors: Akio Kurosawa, Tadayuki Sota
  • Publication number: 20140118530
    Abstract: A method and apparatus for inspecting a structure. Images of heat generated by an inconsistency in the structure are received. A final image is generated from the images using portions of the images having a greatest amount of heat.
    Type: Application
    Filed: October 31, 2012
    Publication date: May 1, 2014
    Applicant: THE BOEING COMPANY
    Inventor: The Boeing Company
  • Patent number: 8708582
    Abstract: An enclosure assembly for a camera is designed to be mounted on the frame of an optical inspection apparatus for scanning the profile of a surface of an article moving along a travel path axis, the profile being associated with a reference axis orthogonal to a reference plane parallel to the travel path axis. The camera is part of a profile sensor unit and has an optical sensing field directed toward the travel path axis to define a scanning zone associated with the surface as intersected by the optical sensing field, the profile unit further having a laser source directing at angle with the optical sensing field a fan-shaped laser beam toward the scanning zone to define an associated scanning plane transverse to the travel path axis, to generate sensor output data related the profile of the article surface.
    Type: Grant
    Filed: July 15, 2011
    Date of Patent: April 29, 2014
    Assignee: Centre de Recherche-Industrielle du Qubec
    Inventors: Richard Gagnon, Gaétan Sanschagrin, Denis Lépine
  • Patent number: 8711350
    Abstract: The invention relates to a test method for checking an inspection device, comprising at least the steps of: generating a prescribed number of faulty and/or correctly labelled containers or test containers; moving the faulty containers or test containers past the inspection device, which detects the faulty containers or test containers and generates a signal for ejecting the faulty containers or test containers, or indicates a value relative to the expected and the measured faulty and/or correctly labelled containers. The test method can be started or performed manually or automatically, and is suitable, for example, for checking a label seating inspection device for correct functionality, or optionally for confirming the faulty functioning thereof.
    Type: Grant
    Filed: October 7, 2009
    Date of Patent: April 29, 2014
    Assignee: KHS GmbH
    Inventors: Theo Motter, Frank Fischer
  • Publication number: 20140110314
    Abstract: The device for predicting crack generation in dry noodles is equipped with: a light source that irradiates polarized light on the dry noodles; an image pickup unit that acquires a phase difference image of the dry noodles based on the light passing through the dry noodles as a result of the polarized light irradiated from the light source; and a predicting unit that measures the birefringence phase difference of the dry noodles based on the phase difference image acquired by the image pickup unit and evaluates the residual stress in the dry noodles from the measured birefringence phase difference to predict whether or not cracks will occur in the dry noodles.
    Type: Application
    Filed: June 18, 2012
    Publication date: April 24, 2014
    Applicant: NISSHIN SEIFUN GROUP INC.
    Inventors: Masahiro Higuchi, Satoshi Yoshida
  • Publication number: 20140111636
    Abstract: An inspection apparatus comprising, a focal position detector that detects a reference focal position of an image plane of a sample from a variation of an output value in optical image data of the sample, the output value being acquired by changing a distance between a first lens and the sample, and detects an optimum focal position of an inspection from the reference focal position, an image processor that obtains at least one of either an average gradation value in each predetermined unit region or a variation of a gradation value in the unit region with respect to the optical image data obtained at the optimum focal position, and a defect detector that detects a defect of the sample based on at least one of either the average gradation value or the variation of the gradation value.
    Type: Application
    Filed: October 22, 2013
    Publication date: April 24, 2014
    Applicant: NuFlare Technology, Inc.
    Inventors: Hiromu Inoue, Riki Ogawa
  • Patent number: 8698891
    Abstract: Determining spatial information about a part includes positioning the part in a fixture having two reference surfaces, where the part is positioned between the two reference surfaces, imaging the two reference surfaces and opposing surfaces of the part to different locations of a multi-element detector, simultaneously acquiring images of the opposing sides of the part and the two reference surfaces using the multi-element detector, and determining spatial information about the part based on the simultaneously acquired images.
    Type: Grant
    Filed: March 9, 2011
    Date of Patent: April 15, 2014
    Assignee: Zygo Corporation
    Inventors: Justin Turner, Tyler Steele, Stephen L. Mielke, Xavier M. Colonna De Lega, Bruce E. Truax, Andrew D. Meigs
  • Publication number: 20140098217
    Abstract: Provided herein is an apparatus, including a reflective surface configured to reflect photons onto a surface of an article, a stage configured to support the article, and an assembly. In some embodiments, the assembly configured to radiate photons through the article to the reflective surface. The assembly is further configured to image the article with irradiance of the photons.
    Type: Application
    Filed: October 4, 2013
    Publication date: April 10, 2014
    Applicant: Seagate Technology LLC
    Inventors: Joachim Walter Ahner, David M. Tung, Samuel Kah Hean Wong, Henry Luis Lott, Stephen Keith McLaurin, Maissarath Nassirou, Florin Zavaliche
  • Patent number: 8692887
    Abstract: An apparatus is provided for determining variable thickness of a coating on a surface of a substrate using in part a flash-lamp source, capable of generating a thermal pulse at the coating surface, and a image capture and processing device capable of capture sequential image frames of the coating surface, whereas each sequential image frame corresponds to an elapsed time and comprises a pixel array, and wherein each pixel of the array corresponds to a location on the coating surface. A method of calculating coating thickness is also provided.
    Type: Grant
    Filed: August 27, 2010
    Date of Patent: April 8, 2014
    Assignee: General Electric Company
    Inventors: Harry Israel Ringermacher, Donald Robert Howard, Bryon Edward Knight
  • Patent number: 8687055
    Abstract: A spectral imaging system for collecting spectral information of a two dimensional heterogeneous objects while in motion relative to the imaging system without the use of a spectrograph, filters or any dispersive optics. The system includes a pulsed light source tunable in wavelength for producing short pulses of wavelength tuned light at a plurality of selected narrow band wavelengths within a spectral range and one or more optical components for conveying or directing the short pulses of light to a two dimensional region that is substantially stationary with respect to the imaging system and through which the two dimensional target is moving. The system also includes a many pixel camera synchronized with the tunable pulsed light source.
    Type: Grant
    Filed: March 16, 2010
    Date of Patent: April 1, 2014
    Inventor: Eli Margalith
  • Patent number: 8681211
    Abstract: An optical inspection system for inspecting a substrate is provided. The system includes an array of cameras configured to acquire a plurality of sets of images as the substrate and the array undergo relative motion with respect to each other. At least one focus actuator is operably coupled to each camera of the array of cameras to cause displacement of at least a portion of each camera that affects focus. A substrate range calculator is configured to receive at least portions of images from the array and to calculate range between the array of cameras and the substrate. A controller is coupled to the array of cameras and to the range calculator. The controller is configured to provide a control signal to each of the at least one focus actuator to adaptively focus each camera of the array during the relative motion.
    Type: Grant
    Filed: November 4, 2010
    Date of Patent: March 25, 2014
    Assignee: CyberOptics Corporation
    Inventors: Carl E. Haugan, Timothy A. Skunes, Beverly Caruso
  • Publication number: 20140078290
    Abstract: A dynamic imaging system is provided. The system includes an assembly line, for an object to be placed thereon and for moving the object in a moving direction; a sensor set, for sensing a moving speed and the width of the object on the assembly line; a photography device, for capturing images of the object; and a controller, coupled to the sensor set and the photography device, for controlling the photography device to move and capture images of the object according to the moving speed and the width of the object.
    Type: Application
    Filed: November 13, 2012
    Publication date: March 20, 2014
    Applicant: QUANTA COMPUTER INC.
    Inventor: Chin-Lin Lin
  • Patent number: 8670031
    Abstract: An optical inspection system is provided for inspecting a workpiece including a feature to be inspected. The system includes a workpiece transport configured to transport the workpiece in a nonstop manner. An illuminator is configured to provide a first strobed illumination field type and a second strobed illumination field type. The illuminator includes a light pipe having a first end proximate the feature, and a second end opposite the first end and spaced from the first end. The light pipe also has at least one reflective sidewall. The first end has an exit aperture and the second end has at least one second end aperture to provide a view of the feature therethrough. An array of cameras is configured to digitally image the feature. The array of cameras is configured to generate a first plurality of images of the feature with the first illumination field and a second plurality of images of the feature with the second illumination field.
    Type: Grant
    Filed: September 21, 2010
    Date of Patent: March 11, 2014
    Assignee: CyberOptics Corporation
    Inventors: Carl E. Haugan, Steven A. Rose, David M. Kranz, Beverly Caruso
  • Publication number: 20140055600
    Abstract: A method for in-line cosmetic inspection of at least a portion of a surface of a product includes identifying if at least one blemish exists on the portion of the surface, disturbing the portion of the surface based on the identifying, and determining if the at least one blemish is immobile based on the disturbing.
    Type: Application
    Filed: August 24, 2012
    Publication date: February 27, 2014
    Applicant: Apple Inc.
    Inventors: Brett C. ONG, Daniel O. Karraker, Joseph C. Rubin
  • Patent number: 8659653
    Abstract: A device for evaluating the appearance of the surface of a tire (P) comprising a color linear camera (1) comprising means (14, 15, 16) for separating the light beam (F) reflected by the surface of said tire (P) and entering the camera (1) into at least two base colors (R, G, B) of given wavelength, so as to direct the light beam to as many sensors (11, 12, 13) capable of obtaining a basic image in gray level (41, 42, 43) for each of the base colors, as many lighting means (21, 22, 23) as base colors, said lighting means being oriented so as to light the surface to be evaluated at different angles, characterized in that each of the lighting means (21, 22, 23) emits a colored light (R, G, B) that differs from that of the other lighting means, and the wavelength of which corresponds substantially to the wavelength of one of the base colors selected by the camera.
    Type: Grant
    Filed: December 16, 2008
    Date of Patent: February 25, 2014
    Assignees: Michelin Recherche et Technique S.A., Compagnie Generale des Etablissements Michelin
    Inventors: Alexandre Joly, Jean-Paul Zanella
  • Patent number: 8654191
    Abstract: A defect inspection device for a silicon wafer comprises: an infrared light illumination which illuminates the silicon wafer with a light power that has been adjusted in accordance with a specific resistance value of the silicon wafer; and an imaging unit constituted by a line sensor array that is sensitive to infrared light, which captures the silicon wafer.
    Type: Grant
    Filed: December 9, 2008
    Date of Patent: February 18, 2014
    Assignee: Nippon Electro-Sensory Devices Corporation
    Inventor: Manabu Nakamura
  • Publication number: 20140036061
    Abstract: Accordingly, systems and methods are disclosed herein for providing on-loom inspection of woven fabrics in order to identify weaving faults during manufacture. In one aspect, an on-loom fabric inspection system is disclosed comprising at least one imaging device configured to collect images of at least one section of a weaving area of a loom and to detect at least one fault in the weaving area; wherein the section of the weaving area comprises a shed region, a woven fabric region and a fell region. Optionally, the system further comprises at least one image processor configured to receive data pertaining to the images and to identify irregularities in the data.
    Type: Application
    Filed: April 2, 2012
    Publication date: February 6, 2014
    Inventor: Shmuel Cohen
  • Patent number: 8643714
    Abstract: A test device is for testing display parameters of an electronic product with a page browsing function. The electronic product stores display times of a number of standard frames which selected from a standard video file. The standard video file includes frames record the play process of a testing file being played by a standard electronic product. The test device controls a video capturing unit to capture an original video file which includes frames to records the playing process of the electronic product. The electronic product searches matching frames of the number of standard frames in the original video file. Thus the parameters of the electronic product can be determined by display times of the matching frames in the video file.
    Type: Grant
    Filed: October 11, 2011
    Date of Patent: February 4, 2014
    Assignees: Fu Tai Hua Industry (Shenzhen) Co. Ltd., Hon Hai Precision Industry Co., Ltd.
    Inventors: Yu-Kai Xiong, Xin Lu, Shih-Fang Wong, Dong-sheng Lv, Xin-Hua Li, Yu-Yong Zhang, Jian-Jian Zhu