Abstract: This invention pertains to fluorophoric compositions of a 7-amino-coumarin derivative and methods of their use for enhancing visualization of various constituents of ion selective electrodes.
Type:
Grant
Filed:
July 9, 1997
Date of Patent:
September 14, 1999
Assignee:
Dade Behring Inc.
Inventors:
Alan Robert Craig, James David Hamerslag
Abstract: A calibration system in which calibration target illuminates the IR sensor with at least two distinct inputs spaced apart in time approximately equal to the time it takes the IR sensor to scan an image of the target across the IR sensor field of response.
Abstract: Test system for viewing systems, such as CCD cameras, infrared viewers, or binoculars or telescopes, which test system is provided with a test object having various component test objects to be shown to the viewing system, which test object is to be placed at a distance from the viewing system and which is to be tendered displayable with the viewing system for an inspection unit (for example, a test operative), with which inspection unit the quality of the operation of the viewing system can be determined on the basis of said display, the test object comprising component test objects differing in appearance from one another and the test system being suitable for presenting said component test objects simultaneously or one after another to the inspection unit to determine a property of the displayed component test objects.
Type:
Grant
Filed:
March 21, 1997
Date of Patent:
July 20, 1999
Assignee:
Nederlandse Organisatie voor Toegepast-Natuurwetenschappelijk Onderzoek TNO
Abstract: A wiper control apparatus of the water drop sensitive type for detecting of the amount of water or water drops adhering to or present upon the front surface of a windshield and for driving a wiper, comprising: a light emitting means for introducing light into the inside of the windshield so that the light experiences total internal reflection upon interior surfaces of the windshield; a light receiving means for receiving the light reflected within the windshield; means for turning a first output D1, a second output D2, and a third output D3 to either an H level or an L level in response to the level of a signal output from the light receiving means, the outputs being preset in sequence of height of sensitivity thereof; means for outputting a drive signal WD for the wiper when outputs D1, D2, and D3 are switched into the H level; means for maintaining the drive signal as long as the second output signal D2 is in the H level even if the third output D3 turns to the L level; and means for stopping the drive sign
Abstract: Digital data, each piece of data corresponding to a different criterion associated with an impression on a projectile, is stored in a database. A number of images of a target projectile are processed to extract the data, where each datum corresponds to one of a different criterion. The different criteria include such features as shape, position, texture, and striation, center and shape of the percussion zone, caliber of the projectile, impressions of the stop, ejector, loading indicator, and feed mechanism et alia. The data from the target projectile is then compared to the data from the reference projectile for a possible match.
Type:
Grant
Filed:
January 9, 1997
Date of Patent:
January 5, 1999
Assignee:
Ministerie de L'Interieur - Direction de la Police Judicaire Sous-Direction de la Police Technique et Scientifique Service Central des Laboratoires
Abstract: Apparatus for distinguishing between genuine and counterfeit articles whereby a first optical filter is applied to genuine articles and suspect articles are scanned with the aid of a suitable second optical filter. Scanning of genuine articles incorporating first optical filter with the aid of suitable second optical filter gives rise to optical effects which would not otherwise be apparent.
Type:
Grant
Filed:
November 8, 1996
Date of Patent:
November 24, 1998
Assignee:
The Secretary of State for Defence in Her Britannic Majesty's Government of the United Kingdom of Great Britain and Northern Ireland
Abstract: A method of analyzing a failure of semiconductor device by using an emission microscope for easy analysis of current leakage is disclosed. Light emission information is stored in X/Y memory spaces (16), with a Z direction indicating an emitted light intensity. A light emission presence bit (17) in the light emission information means a bit for which light emission is judged as being present, and the number of light emission presence bits is determined on the basis of the emitted light intensity. An image memory (11) has a three-dimensional memory space including an X/Y space indicative of plane positions of light emitting portions and a Z space indicative of the emitted light intensity. The position and intensity of light emission are detected by searching the light emission information stored in the image memory (11) to analyze the failure.
Abstract: Disclosed is a method and an apparatus capable of easily and quickly testing an automatic inserting state of an electronic component in a printed circuit board using a slit light. The method and the apparatus makes use of a slit light type instead of using the conventional testing jig in order to test an automatic insertion state of an electronic component in a printed circuit board. Thus, the problem of a noise generated when applying a signal which indicates that the contacting pins of the electronic component contacting with pins of a jig are testing incorrect, can be solved. Also, the setup time of an apparatus for testing an automatic insertion state of an electronic component in a printed circuit board according to changing a design of the printed circuit board can be reduced.
Abstract: In an exposure apparatus, an alignment-detecting light component of a mask and that of a plate are spatially separated from each other, thereby enabling highly accurate alignment with little influence of the light from the plate on detection of the mask position.
Abstract: The apparatus has a fired cartridge mounting device for holding the cartridge substantially aligned with a longitudinal axis with a primer surface of the cartridge substantially perpendicular to the axis, a cartridge microscope mounted with its optical axis substantially parallel to the longitudinal axis, a focusing mechanism for focusing the microscope to image a breech face impression on the primer surface and a firing pin impression surface in the primer surface, and an axisymmetric light source mounted to project axially symmetric light onto the breech face impression and the firing pin impression surface about the longitudinal axis. Images of the breech face and the firing pin impressions can be used for comparative analysis independently of an angular orientation of the cartridge held by the mounting device.
Abstract: A striation monitor and display system (10) is provided which includes a positional location mechanism (20) for locating a substantially cylindrically contoured object such as a bullet (14). The bullet or object (14) is inserted within a collet mechanism (48) mounted above a cup member (44) containing a compliant matrix (46). A portion of the object (14) is inserted along an axis line (24) of the rotating cup (44). A line scan camera (62) is focused on a section of the object (14) and frame speed is synchronized with the rotation of the rotating cup (44). Synchronization is accomplished by a closed feedback loop between a motor/encoder integral combination (58/60) and a processor system (72) for maintaining synchronization between images photographed by line scan camera (62) and rotational speed of motor (58).
Type:
Grant
Filed:
June 5, 1995
Date of Patent:
March 18, 1997
Assignee:
Mnemonic Systems Incorporated
Inventors:
William B. Harvey, Leonard S. Haynes, Andrew J. Lavin, Ramgopal Nair
Abstract: A method and apparatus for checking the surface state of one face (2) of a solid (1) in order to locate shape defects which may be present therein. The observation of the face to be checked takes place by means of photography using a large field video camera (3) and a small field video camera (4). The size of the located defects is measured by an optoelectronic sensor or probe (11). The apparatus can be controlled by an operator or can have automatic control.
Type:
Grant
Filed:
July 26, 1995
Date of Patent:
February 25, 1997
Assignee:
Compagnie Generale des Matieres Nucleaires
Inventors:
Roger Peclier, Pierre Laurent, Jean-Fran.cedilla.ois Piquard
Abstract: The three-dimensional shape of the surface of a board (12) is measured, and the parallel degree between the board (12) and a semiconductor chip (10) is adjusted on the basis of the measurement result. A board mounting means (13) and a semiconductor chip holding means (11) are moved close to each other, and the semiconductor chip (10) is mounted on the board (12).
Abstract: First and second devices, such as a laser (11) and an optical fiber (12), are aligned by first positioning the laser on an x-y-z table (13) (such a table is capable of responding to electrical signals to make precise movements in mutually orthogonal x,y and z directions). The laser beam is imaged onto a machine vision camera (19) which develops signals representing the image of the laser beam and directs them to a computer (16). The computer analyzes the signal, calculates the center of the image, and determines from such calculation any deviations in the x and y directions of the position of the laser from its desired alignment position. Next, the optical fiber (12) is imaged on a machine vision camera (17). Signals from the camera representative of the image of the optical fiber end are directed to the computer (16) which calculates the center of the image and determines any deviation from its desired position.
Abstract: The three-dimensional shape of the surface of a board (12) is measured, and the parallel degree between the board (12) and a semiconductor chip (10) is adjusted on the basis of the measurement result. A board mounting means (13) and a semiconductor chip holding means (11) are moved close to each other, and the semiconductor chip (10) is mounted on the board (12).
Abstract: A multi-axis optical projector comprises an optical yoke having two spaced-apart primary objective lenses and optical paths for transmitting either backlight or front light from light sources to a target object disposed between the primary objective lenses and from the target object to a secondary objective lens focussing on an eyepiece which may be a video camera. The projector is used, for example in a tool presetting or tool measuring system, for viewing of a specimen, such as a cutting tool, to measure tool profile and to identify tool surface defects such as cracks, chips, wear patterns and coating abnormalities.
Abstract: A grazing incidence interferometer (1) includes a laser (10) and a beamsplitter (16) for splitting an output of the laser into a reference beam (B) and into a sample beam (A). A surface (18) to be examined is disposed at a first angle such that the sample beam is incident on and reflects from the surface at an angle of incidence other than normal, thereby providing a grazing incidence configuration. A beam combiner (22) combines the reference beam and the sample beam that reflects from the surface into a combined beam (C). An image plane (24) is disposed for receiving the combined beam such that an interference pattern is formed at the image plane. The image plane is disposed at a second angle to the combined beam, the second angle being selected to compensate for a reduction in an aspect ratio of the interference pattern that results from the surface being disposed at the first angle.
Abstract: An optical architecture is provided that can be used for generating high-speed input test vectors from low speed digital data and transferrring those test vectors to a device under test. The optical architecture employs gain-switched laser diodes or optical mixers to produce high-speed optical pulses from the low speed digital data. Optical multiplexing and variable delay devices process the high speed optical pulses to form a high-speed test vector. The architecture can generate test data with psec-type accuracy.
Type:
Grant
Filed:
December 14, 1990
Date of Patent:
January 5, 1993
Assignee:
Westinghouse Electric Corp.
Inventors:
Anastasios P. Goutzoulis, Peter J. Chantry, Tom Henningsen
Abstract: An arrangement for modifying an information carrying radiant energy beam array in which occurrences of a first prescribed pattern of radiant energy beams in the array are detected by producing images of said beam array and shifting the images relative to each other responsive to a first prescribed pattern. The shifted images are superimposed and a radiant energy beam array is formed that identifies the occurrences of first prescribed patterns in the superimposed images. A plurality of images of the identifying beam array are produced and shifted relative to each other in accordance with a second prescribed pattern. The shifted images of said occurrence identifying beam array are superimposed to form the modified beam array. The modifications may comprise arithmetic processing, pattern or image processing or Turing machine type processing.
Type:
Grant
Filed:
July 14, 1986
Date of Patent:
June 27, 1989
Assignee:
American Telephone and Telegraph Company, AT&T Bell Laboratories
Abstract: A method of inspecting a pattern of elements on a working plate includes producing a negative copy of the working plate and aligning the negative copy with a positive inspection plate having elements slightly larger than the elements of the working plate whereby flaws are revealed as light transmissive spots. The working plate and a negative inspection plate, having the elements slightly smaller than the elements of the working plate, are aligned and flaws are revealed as light transmissive spots.
Abstract: In a method of identifying or comparing compositions of material, the reflectivity of a material to be identified or compared is measured at index points distributed through the near infrared spectrum. A similar measurement is made for at least one standard or known material. From the reflectivity measurements, sets of values representing the first or higher order derivative curves are determined. These values mathematically define vectors by representing the coordinates of the end points of the vectors and multiple dimensional space. An index of a similarity between the composition of a test sample and a standard material is calculated by determining the cosine of the angle between the corresponding vectors.
Abstract: A method and apparatus are described for the automatic gauging of engineering components. The apparatus includes a clamp for holding a component to be gauged, probes for scanning a surface of the component, drives to provide relative motion between the component and the probes in three mutually perpendicular axes, measuring transducers associated with the drives and the probes to generate signals to measure the degree of movement between the component and the probes, computer memory for storing data relating to a reference profile having dimensions which it is desired to achieve, computer apparatus for comparing signals generated by the measuring transducers with the corresponding signals in the memory, computer apparatus for calculating any error between the stored data and signals generated by the measuring transducers to stack the component to maximize desired coincidence between the dimensions of the reference profile and the actual component.
Abstract: A system for learning a characterization of an object and thereafter identifying the presence and orientation of the object is capable of controlling a robotic system for grasping the object. In an off-line learning mode, a television camera produces a video signal from the object and a preprocessor develops a segmented line outline of the object in digital form. A computer is programmed to generate a mathematical "rubber band" or convex hull around the object outline formed from segmented lines and to store the x-y coordinates of the lines. The centroid of the hull is calculated and an R(.0.) function as the radius from the centroid to the hull with the maxima thereof is calculated for characterizing the orientation of the object. A truncated Fourier series of the R(.0.) function is generated and the coefficients stored. In an on-line characterization mode, the apparatus generates a characterization of an unknown object and compares it with the learned and stored values of R(.0.) and Fourier coefficients.
Abstract: A polyhedral ring mirror is manufactured by molding a synthetic resinous blank having in it a cavity in the form of a four-sided pyramid. The wall surfaces of the cavity are metallized to make them light reflective. The blank is then sliced through in a plane normal to the cavity axis to sever from the blank a minor portion, and to leave behind a major portion in which the form of the cavity has been converted into a truncated pyramid having opposite its original opening a smaller opening. The modified blank with the doubly open cavity is placed, smaller opening down, on a printed wire wiring board around a rectangular electrical component on the board to permit visual inspection from a single viewing point above the component, of all of its sides. The size of the large opening of the cavity can be adjusted by slicing away another portion of the blank.
Abstract: A hybrid integrated circuit (10), having a plurality of chip carriers (12) mounted thereon, is positioned on a nest (50) of an apparatus (30). An operator, while activating pneumatic switches (58), moves a selected one of the plurality of chip carriers (12) to an inspection site. A sensor plunger (62) detects the presence of the chip carrier (12) and enables a positioning assembly (34), which centers the chip carrier within the inspection site and locks the nest (50), to prevent further movement thereof. A viewing adaptor (70) is then lowered about the selected chip carrier (12) to enable the operator to simultaneously inspect all solder joints (22) positioned beneath the selected chip carrier. Thereafter, the operator releases switch actuator (60) which allows the viewing adaptor (70) to be raised and enables the positioning assembly (34) to unlock the nest (50) so that another chip carrier (12) may be moved to the inspection site for inspection by the operator.
Type:
Grant
Filed:
September 20, 1983
Date of Patent:
April 29, 1986
Assignee:
AT&T Technologies, Inc.
Inventors:
Fred J. Gronek, Raymond M. Taradejna, Ray A. Watkins
Abstract: A method and an apparatus are proposed for performing a comparison of patterns of invariable form, especially fingerprint pattern. By the application of a finger on a prism within a beam of light, a latent picture of fingerprint lines is obtained which is optically compared with a copy of the same fingerprint stored in memory or located on a card. After conversion into an electrical variable, an identification pulse results which is subjected to at least one test criterion and compared with a threshold value. Preferably the testing of a master symbol located on the inserted card is effected at the same time, comparing this with a copy of the same stored in memory within the appliance. If the test criteria show an agreement of the fingerprint with the fingerprint copy and/or of the master symbol with the copy of the master symbol then a positive assessment is effected, and access to a building, for instance, is furnished.
Abstract: A method of easily detecting a predetermined star pattern by directing imng means in the general direction of the pattern desired to be detected and imaging the star pattern onto a matched filter of a correlator to produce and output that is used to signal a computer to enable the computer to calculate the location of the predetermined star pattern in the field of view.
Type:
Grant
Filed:
August 3, 1988
Date of Patent:
November 7, 1989
Assignee:
The United States of America as represented by the Secretary of the Army