Having Schlieren Effect Patents (Class 356/518)
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Patent number: 8885174Abstract: Apparatus and method are provided for monitoring and measuring matter and energy fluxes by use of devices able to detect refractive index changes. In one aspect, apparatus use an interference between two electromagnetic radiations in order to provide high sensitivity, enabling fluxes monitoring at the microscopic scale, by measuring phase changes or Optical Path Length (OPL) changes. In one aspect, methods are provided for monitoring and measuring the electrical activity of a biological cells, simultaneously on several cells, without use of electrodes and contrast agents.Type: GrantFiled: February 19, 2010Date of Patent: November 11, 2014Assignee: Lyncee Tec S.A.Inventors: Pascal Jourdain, Etienne Cuche, Christian Depeursinge, Pierre Julius Magistretti, Pierre Marquet
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Publication number: 20120038931Abstract: Apparatus and method are provided for monitoring and measuring matter and energy fluxes by use of devices able to detect refractive index changes. In one aspect, apparatus use an interference between two electromagnetic radiations in order to provide high sensitivity, enabling fluxes monitoring at the microscopic scale, by measuring phase changes or Optical Path Length (OPL) changes. In one aspect, methods are provided for monitoring and measuring the electrical activity of a biological cells, simultaneously on several cells, without use of electrodes and contrast agents.Type: ApplicationFiled: February 19, 2010Publication date: February 16, 2012Inventors: Pascal Jourdain, Etienne Cuche, Christian Depeursinge, Pierre Julius Magistretti, Pierre Marquet
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Publication number: 20100195110Abstract: An optical property measurement apparatus 1 includes a light source unit 10, a first optical coupler 21, a second optical coupler 22, a lens 31, a lens 32, a phase modulation unit 40, a drive unit 41, an optical path length difference adjustment unit 50, a control unit 51, a light receiving unit 60, a synchronization detection unit 70, and a measurement unit 80. The phase modulation unit 40 carries out phase modulation with a frequency f. The synchronization detection unit 70 outputs a first signal having a value corresponding to a magnitude of a component of the frequency f included in an electrical signal output from the light receiving unit 60, and also outputs a second signal having a value corresponding to a magnitude of a component of the frequency 2f included in the electrical signal.Type: ApplicationFiled: June 3, 2008Publication date: August 5, 2010Applicant: HAMAMATSU PHOTONICS K.K.Inventors: Hidenao Iwai, Toyohiko Yamauchi
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Patent number: 7764385Abstract: A system for aligning a segmented mirror includes a source of radiation directed along a first axis to the segmented mirror and a beamsplitter removably inserted along the first axis for redirecting radiation from the first axis to a second axis, substantially perpendicular to the first axis. An imaging array is positioned along the second axis for imaging the redirected radiation, and a knife-edge configured for cutting the redirected radiation is serially positioned to occlude and not occlude the redirected radiation, effectively providing a variable radiation pattern detected by the imaging array for aligning the segmented mirror.Type: GrantFiled: August 21, 2007Date of Patent: July 27, 2010Assignee: ITT Manufacturing Enterprises, Inc.Inventor: Thomas William Dey
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Patent number: 7224824Abstract: Apparatus for computational adaptive imaging comprises the following: an image information acquirer, which provides information relating to the refractive characteristics in a three-dimensional imaged volume; a ray tracer, which uses the information relating to the refractive characteristics to trace a multiplicity of rays from a multiplicity of locations in the three-dimensional imaged volume through the three-dimensional imaged volume, thereby providing a location dependent point spread function, and a deconvolver, which uses the location dependent point spread function, to provide an output image corrected for distortions due to variations in the refractive characteristics in the three-dimensional imaged volume.Type: GrantFiled: November 30, 1999Date of Patent: May 29, 2007Assignees: Yeda Research and Development Co., Ltd., The Regents of the University of CaliforniaInventors: Zvi Kam, John W Sedat, David A Agard, Bridget M Hanser
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Patent number: 7206079Abstract: An apparatus and method for measuring by the Schlieren technique light beam deviations generated by a sample (EV) includes a source (S) of light beam for illuminating the sample (EV) therewith so as to have a transmitted beam. An imaging means is provided (L2, L3) for forming an image of the sample from the transmitted beam. A filtering means acts as a Schlieren filter (SF) for obtaining “Schlieren fringes” from the image. The Schlieren filter (SF) comprises a periodic structure (SFP) of a defined period. A detecting means (CCD) is provided for detecting the Schlieren fringes under operating conditions.Type: GrantFiled: June 4, 2004Date of Patent: April 17, 2007Assignee: Universite Libre De BruxellesInventor: Luc Joannes
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Patent number: 6692129Abstract: The optical system includes a plurality of light modulators, one or more combining filters, and an optical relay system including a filter. Each light modulator modulates a corresponding incident light beam. The one or more combining filters superimpose the modulated light beams from each of the plurality of light modulators. The optical relay system filters the superimposed light and relays the filtered light to an image plane.Type: GrantFiled: September 5, 2002Date of Patent: February 17, 2004Assignee: Silicon Light MachinesInventors: Kenneth P. Gross, Paul Manhart, Richard A. Buchroeder