Abstract: A novel device, method and systems disclosed managing the thermal challenges of LIBS laser components and a spectrometer in a handheld structure as well the use of simplified light signal collection which includes a bare fiber optic to collect the emitted light in close proximity to (or in contact with) the test material. In one example embodiment of the handheld LIBS device, a burst pulse frequency is 4 kHz is used resulting in a time between pulses of about 250 ?s which is a factor of 10 above that of other devices in the prior art. In a related embodiment, an active Q-switched laser module is used along with a compact spectrometer module using a transmission grating to improve LIBS measurement while substantially reducing the size of the handheld analyzer.

Abstract: An inspection method and an inspection device, or apparatus each capable of conducting composition analysis of a defect detected by elastic or stokes scattered light, an inspection surface or defect on the surface of the inspection surface, or a defect on the surface of the inspection object and its internal composition. A surface inspection method for optically detecting elastic or stokes scattering or inelastic or anti-stokes scattered light from inside the surface of the inspection object, for detecting existence of defects of the inspection object and features of the defects, for detecting positions of the detected defects on the surface of the inspection object, classifying and analyzing the detected defects in accordance with their features on the basis of the positions of the defects and the features of the defects or the classification result of the defects.

Abstract: An endoscope includes an insert section to be inserted into the body cavity, an illumination window for directing illumination light therethrough and an observation window for observing an illuminated internal portion of the body cavity, arranged at a distal end portion of the insert section, and a blood flow changing section for changing a blood flow of blood flowing through a vessel in a near-surface region of a living organ inside the body cavity by providing one of a temperature change and vibration energy.

Abstract: A method, apparatus, and a computer program is provided. The method comprises: determining an ambient light value from ambient light data provided by at least one ambient light sensor, in dependence upon the spectral distribution of the ambient light data provided by the at least one ambient light sensor and a manufacturer of the at least one ambient light sensor.

Abstract: The device described herein monitors air quality continuously using a plurality of sensors. The device continuously records the sensor measurements and makes the measurements available to a user though a server based platform. The device further analyzes the sensor data to detect hazards and uses the plurality of sensor measurements to further characterize the hazards and to decrease instances of false alarms.

Abstract: A method of determining auto-calibrating information of a test sensor includes providing an optical read head that includes a light source, a light guide and a detector. The read head forms an opening that is sized to receive a test sensor. The detector includes a linear-detector array or single detector. A test sensor is provided having apertures formed therein. The test sensor is placed in the opening of the optical read head. Light is transmitted from the light source through the apertures. The light transmitted through the apertures using the detector or detecting the absence of light being transmitted through the test sensor using the detector is detected. The detected light or the absence of detected light information from the detector is used to determine the auto-calibration information of the test sensor.

Abstract: A method of calculating, using a computer, a refractive index of at least a portion of a specimen by using electromagnetic wave measurement. The method includes measuring a first scattered waveform from a structure of the specimen, measuring a second scattered waveform from a structure, in which a material for calculating a refractive index is disposed on a surface of the specimen, and comparing intensities of peak positions at corresponding portions of the first scattered waveform and the second scattered waveform.

Abstract: A coordinate measuring device includes a carrier that can be rotated automatically about two axes and that can be directed toward a measuring aid. The following are arranged on the carrier so as to be able to move together: an optical distance measuring device for measuring the distance to the measuring aid; a light source for emitting light, directly or by means of optical elements, wherein said light is visible as a target point when reflected on the measuring aid; a target detecting unit for determining a position as the position of the imaging of the target point on a position detection sensor. The control apparatus is designed to direct the carrier at the measuring aid by rotating the carrier about the at least two axes of the carrier according to the fine position and the rough position; and the light source is a superluminescent diode (SLED).

Abstract: An apparatus for reflectivity measurement is provided. The apparatus generally measures reflectivity characteristics of a reflective surface, such as a reflective cavity of a light array. The apparatus generally comprises a body defining a volume and a light emitting element disposed outside the volume. A sensor coupled to the body detects light reflected from a reflective surface. Various embodiments provide positioning of the apparatus relative to a light array having a reflective cavity.

Abstract: A classification device (2) for identification of articles (3) in an automated checkout counter is presented. The device comprises a memory unit (5) capable of storing digital reference signatures, each of which digital reference signatures corresponds to an article identity, a processor (6) connected to the memory unit (5), and at least one sensor (4, 7, 14, 15, 16, 17, 18, 24) configured to determine a measured signature of an article (3) wherein said processor (6) is configured to compare said measured signature with the digital reference signatures, and to calculate a matching probability of a predetermined number of article identities.

Abstract: This system for measuring the propagation of a zone of separation between a first portion and a second portion of at least one substrate includes: a module for emitting at least two incident beams each of which illuminates a separate point on the substrate, the at least two incident beams being able to pass through the first portion and the zone of separation and meet the second portion in such a way that each of them generates at least one first emergent beam Fe originating from the interface between the first portion and the zone of separation, and at least one second emergent beam originating from the interface between the zone of separation and the second portion; a detecting module for detecting light intensity values resulting from interference between the first and second emergent beams; and a computer for determining the conditions of the propagation of the zone of separation.

Abstract: A rotatable compensator configured to transmit non-collimated light over a broad range of wavelengths, including ultraviolet, with a high degree of retardation uniformity across the aperture is presented. In one embodiment, a rotatable compensator includes a stack of four individual plates in optical contact. The two thin plates in the middle of the stack are made from a birefringent material and are arranged to form a compound, zeroth order bi-plate. The remaining two plates are relatively thick and are made from an optically isotropic material. These plates are disposed on either end of the compound, zeroth order bi-plate. The low order plates minimize the sensitivity of retardation across the aperture to non-collimated light. Materials are selected to ensure transmission of ultraviolet light. The optically isotropic end plates minimize coherence effects induced at the optical interfaces of the thin plates.

Abstract: A three-dimensional (3D) coordinate measurement system includes a communication device, a retroreflector, and a laser tracker. The communication device includes a first light source and an operator-controlled unit that controls emission from the first light source. The laser tracker includes a wide field-of-view (FOV) camera, a second light source, a narrow FOV camera next to the second light source, and a processor. The processor determines that a lock-in command has been given in response to the wide FOV camera capturing light emitted by the first light source. To lock onto the retroreflector, the processor captures with the narrow FOV camera light from the second light source reflected by the retroreflector and uses the image to lock onto the retroreflector with a beam of light from the tracker. It measures a distance and two angles with the tracker to get 3D coordinates of the retroreflector.

Abstract: A light module for a biochemical analyzing system includes a halogen light source emitting light beams, which are guided through a first light path and a second light path and then combined to go through a first beam splitter, so as to analyze a biochemical sample. The first light path includes a plurality of reflective mirrors and a first filter lens, and the first filter lens is used to attenuate an orange band light of the halogen light source. The second light path includes a second filter lens, and the second filter lens is used to attenuate the lights of the halogen light source except the ultraviolet light band.

Abstract: A method for characterizing a surface comprises rotating a carrier about an axis of rotation where the carrier has a top surface adapted to hold at least one semiconductor wafer with a major surface of the wafer extending generally transverse to the axis of rotation. A surface characterization tool is moved over a plurality of positions relative to the top surface of the carrier, where a measurement location over the top surface of the carrier is changed while said top surface of the carrier is heated to a predetermined temperature. Characterization signals over the plurality of positions with the surface characterization tool are produced and contain information about the heated top surface of the carrier, or when semiconductor wafers are held on the carrier, information about the semiconductor wafer can also be obtained.

Abstract: An image acquisition device based on photo-thermal imaging, including a support beam, a translational electric motor, an imaging probe, and a light emitter. The translational electric motor is fixed to the lower side of the beam, and the imaging probe is perpendicularly fixed to a moving block in the translational electric motor. The light emitter is connected to the moving block via an adjustable connection piece, and by adjusting the adjustable connection piece, light emitted by the light emitter enters the imaging probe after being reflected by a sample. The moving block in the translational electric motor is configured to move the light emitter and the imaging probe in the radial direction right above the sample. The light emitter is configured to emit light on the upper surface of the sample. The imaging probe is configured to image reflected light from the upper surface of the sample.

Abstract: Disclosed are methods and apparatus for performing inspection or metrology of a semiconductor device. The apparatus includes a plurality of laser diode arrays that are configurable to provide an incident beam having different wavelength ranges. At least some of the laser diode arrays form two dimensional stacks that have different wavelength ranges from each other. The apparatus also includes optics for directing the incident beam towards the sample, a detector for generating an output signal or image based on an output beam emanating from the sample in response to the incident beam, and optics for directing the output beam towards the detector. The apparatus further includes a controller for configuring the laser diode arrays to provide the incident beam at the different wavelength ranges and detecting defects or characterizing a feature of the sample based on the output signal or image.

Abstract: The invention relates to a method for measuring the scattered light (L2) of particles (P, PK) in a measuring medium (F), wherein a measuring container (1) is supplied with the measuring medium (F) and incident light (L1) is shone through the measuring medium (F) at least in some regions over a certain path length (1) and in a certain direction and the light (L2) scattered from the incident light (L1) is measured within a certain angle range (?). It is provided according to the invention that the incident light (L1) is guided parallel to a longitudinal axis (S) of the measuring container (1). By these measures, known methods can be improved and it is readily possible to use the invention even for very small measuring volumes of the measuring medium (F) with the associated small dimensions of the measuring container (1).

Abstract: The present invention provides a method and system of chemical identification by using a short wavelength range of near infrared (NIR) such as in the range of near infrared (NIR) of about 600 to about 1100 nm. A silicon-detector can be used to measure the short wavelength of NIR region. A detection signal from a detector is sent to a computer. The computer is programmed with software modules for data acquisition of the detection signal and data analysis to determine absorption spectrum. The computer can include memory or remote access to one or more databases for storing a library of absorption spectra. The absorption spectrum of the material which provides the highest match value is identified as the material under inspection.

Abstract: An apparatus includes (i) a bright light source for providing an illumination beam at multiple wavelengths selectable with a range from a deep ultraviolet wavelength to an infrared wavelength, (ii) illumination optics for directing the illumination beam towards a sample at selectable sets of angles of incidence (AOI's) or azimuth angles (AZ's) and polarization states to provide spectroscopic ellipsometry, wherein the illumination optics include an apodizer for controlling a spot size of the illumination beam on the sample at each of the selectable AOI/AZ sets, (iii) collection optics for directing an output beam from the sample in response to the illumination beam at each of the selectable AOI/AZ sets and polarization states towards a detector that generates an output signal or image based on the output beam, and (v) a controller for characterizing a feature of the sample based on the output signal or image.

Abstract: A differential mode delay (DMD) measurement system for an optical fiber is provided. The system includes an optical test fiber with a plurality of modes; a single mode light source that provides a continuous light wave signal to a modulator; and a pulse generator that provides an electrical pulse train signal to the modulator and a triggering signal to a receiver. The modulator is configured to generate a modulated optical test signal through the optical fiber based at least in part on the received light wave and pulse train signals, and the receiver is configured to receive the test signal transmitted through the fiber and evaluate the test signal based at least in part on the triggering signal. The system can be employed to create DMD waveform and centroid charts to obtain minEMBc bandwidth information for a fiber within a wavelength range.

Abstract: In a method for regulating coordinates of a probe measurement system using an electronic device, the method determines a first center of a reference object using a probe measurement system, and a second center of the reference object using an image measurement system. The method further determines regulation values between the probe measurement system and the image measurement system by calculating difference values between coordinates of the first center and the second center of the reference object, and stores the regulation values in a storage device of the electronic device.

Abstract: With an inspection instrument in which an optical window is disposed so as to enable optical detection in a sample holder, an analysis involving use of a three-order nonlinear Raman scattering microscope, a treatment with an agent, such as staining, and an analysis involving use of a normal optical microscope are serially carried out without opening and closing of the inspection instrument. Thus, in addition to reference information based on result of analysis of a stained sample, more multiple pieces of auxiliary information related to the morphological or functional characteristics of the sample can be obtained from the sample while the reliability of comparison thereof with the reference information is well maintained.

Abstract: Apparatus and techniques for measuring and managing plant growth with cell phones or similar devices are described.

Abstract: Provided are methods and apparatus for determining the crystal fraction of a casted-mono silicon wafer. A light source is directed at the wafer and the transmission or reflection is measured by a detector. An image of the wafer is generated by a processor and the crystal fraction is calculated from the generated image. The crystal fraction is correlated to the efficiency of the solar cell produced, allowing for the rejection of inferior wafers prior to processing.

Abstract: A score of each of multiple pieces of reflection spectrum information included in a population is calculated using a first second principal component loading acquired by a principal component analysis, and a first group is classified based on the calculated score. Then, a score of each of multiple pieces of reflection spectrum information included in the population is calculated using a second second principal component loading acquired by a principal component analysis on a second population in which the reflection spectrum information of the first group is not included, and a second group is classified based on the calculated score. By performing a second principal component analysis using the second population, the second group can be accurately classified based on minute characteristics of each type of material included in the reflection spectrum information and the classification can be performed with a high accuracy.

Abstract: An eyeglass support is adapted for pinch-holding the eyeglass (5) between three first contact portions (41-43) and three second contact portions (61-63). The first contact portions form a height reference for positioning the eyeglass whereas the second contact portions ensure application of the eyeglass against the first contact portions while conforming to any possible shape for the eyeglass. The support suits for being incorporated in a reflection measurement apparatus. In particular, it is useful for measuring reflection of eyeglasses provided with antireflecting coatings or for rating a protection against UV hazards which is provided by an eyeglass to a wearer of the eyeglass.

Abstract: Systems for analyzing fluids (e.g., gases) include a chamber structure with a reflective inner surface, emitters, a primary detector positioned to principally detect electromagnetic energy reflected numerous times through the gas(es) and a calibration detector positioned to detect electromagnetic energy not reflected numerous times through the gas(es). Calibration may be automatically performed. The primary detector relies principally on Raleigh scattering. An optional primary detector may be positioned to principally detect Raman scattered electromagnetic energy.

Abstract: System and method for identifying solar panels. In accordance with exemplary embodiments, an electrical signal within one or more solar cells of the solar panel is detected and processed to provide a detection signal corresponding to a distinguishing characteristic associated with the solar panel. In accordance with alternative exemplary embodiments, a light sensor is disposed along a sightline from the solar panel to detect a light emission produced by dissipation of electrical power by one or more solar cells of the solar panel. In accordance with further alternative exemplary embodiments, selective blocking of light to (e.g., shading of) portions of predetermined solar panels causes corresponding changes in output power that can be used to identify affected solar panels.

Abstract: An apparatus for detecting a crystallizing stain includes a support unit, a crystallized substrate disposed on the support unit, a light source which irradiates polarized light in a predetermined wavelength range to a portion of the crystallized substrate, and a detector which detects the crystallizing stain in the portion of the crystallized substrate, to which the polarized light is irradiated.

Abstract: An optical measuring device for a vehicle includes an optical transmitter that generates transmitter radiation and radiates it into a monitoring region, and a receiver that receives resulting receiver radiation from the region. An evaluation and control unit evaluates the receiver radiation for object recognition. A first transmitter generates a first light field on a surface in the region by emitting directed first transmitter radiation and a second transmitter generates a second light field in the adjacent surroundings of the first field by emitting directed second transmitter radiation. The unit receives and evaluates first receiver radiation reflected by the first field and second receiver radiation reflected by the second field via the receiver, wherein the unit generates an output signal when it detects change in the reflected second receiver radiation caused by a trigger object detected in the region and reflected first receiver radiation unchanged by the object.

Abstract: A set of parameters used in a model of a spectrometer includes free parameters and fixed parameters. A first set of values for the parameters is set and the model is used to generate a first spectrum. A value of one of the fixed parameters is changed and a second spectrum is generated. An inverse of the model of the spectrometer is then applied to the second spectrum to generate a set of values for the parameters, the values being the same as the first set of values except for one or more of the free parameters. If the free parameter has significantly changed the fixed parameter is designated a free parameter.

Abstract: A method for analyzing a sample with a light probe with a spatial resolution smaller than the wavelength of the light probe comprising the steps of: —illuminating the sample by a first light pulse saturating a vibrational and/or electronic transition, said light pulse presenting an intensity spatial distribution on the sample presenting at least one minimum wherein saturation does not occur, —measuring the local absorbance properties and/or the local second order non-linear susceptibility of the sample by using a second light pulse forming the light probe at a wavelength corresponding to said electronic and/or vibrational transition, wherein the second light pulse overlap said first light pulse intensity minimum.

Abstract: A sample inspection apparatus is provided. A sample inspection apparatus according to an exemplary embodiment of the present invention includes a base; a loading portion installed on the base so that a sample is placed thereon; a first light source radiating light on the sample, the sample being placed on the loading portion; a first light receiving portion located at a first position and receiving light reflected and scattered by the sample; and a support portion positioned on the loading portion so that the first light source and the first light receiving portion are movably installed on the support portion.

Abstract: The passivation of a nonlinear optical crystal for use in an inspection tool includes growing a nonlinear optical crystal in the presence of at least one of fluorine, a fluoride ion and a fluoride-containing compound, mechanically preparing the nonlinear optical crystal, performing an annealing process on the nonlinear optical crystal and exposing the nonlinear optical crystal to a hydrogen-containing or deuterium-containing passivating gas.

Abstract: Disclosed are methods and apparatus for inspecting a vertical semiconductor stack of a plurality of layers is disclosed. The method includes (a) on a confocal tool, repeatedly focusing an illumination beam at a plurality of focus planes at a plurality of different depths of a first vertical stack, wherein a defect is located at an unknown one of the different depths and the illumination beam has a wavelength range between about 700 nm and about 950 nm, (b) generating a plurality of in-focus images for the different depths based on in-focus output light detected from the first vertical stack at the different depths, wherein out-of-focus output light is inhibited from reaching the detector of the confocal system and inhibited from contributing to generation of the in-focus images, and (c) determining which one of the different depths at which the defect is located in the first vertical stack based on the in-focus images.

Abstract: A method detects the degree of spoilage of food by exposing a food sample to an excitation wave having a first wavelength of about 340 nm or about 380 nm, wherein the excitation wave has a bandwidth of 40 nm or less. The excitation wave is permitted to interact with the food sample and return emission spectra. A detector detects the emission spectra. A predetermined threshold value is established which defines when a food sample is or is not spoiled. The emission spectra is analyzed at a second wavelength of about 400 nm, about 450 nm or about 530 nm to provide a test or measured value of the emission spectra indicative of the degree of spoilage of the food sample. Whether or not a food sample is spoiled beyond the predetermined threshold is determined by comparing the measured value to the predetermined threshold value.

Abstract: In one aspect, an apparatus for determining a property of a fluid is disclosed that in one embodiment may include a transparent member having an axis and a first end substantially perpendicular to the axis and a second end having an outer surface at a first angle to the axis, a light source directing light at the first end, a detector placed spaced from the second end, the space between the second end and the detector containing a fluid, wherein the detector detects light exiting from the outer surface at a second angle to the axis and passing through the fluid, and a controller for determining the second angle from the light detected by the detector. A processor determines the bulk fluid refractive index from the light detected by the detector and a property of the fluid therefrom.

Abstract: A first location comprising an unknown material may be scanned using SWIR hyperspectral imaging in a dual polarization configuration. Surveying may also be applied to thereby determine whether or not a human is present. This surveying may be achieved my assessing LWIR data, data acquired from motion sensors, and combinations thereof. If no human is present, a second location may be interrogated using Raman spectroscopic techniques to thereby obtain a Raman data set representative of the region of interest. This Raman data set may be assessed to associate an unknown material with a known material. This assessment may be achieved by comparing the Raman data set to one or more reference data sets in a reference database, where each reference data set is associated with a known material.

Abstract: An assembly includes a hoist or a winch, a cable, and a fleet angle sensor. The fleet angle sensor includes a frame disposed around an opening. A first photodetector with multiple light-receiving zones is mounted on the frame. A first light source is mounted on the frame opposite the first photodetector. The first light source directs a first light beam across the opening to the multiple light-receiving zones of the first photodetector. The cable extends through the opening and into the first light beam, and the multiple light-receiving zones produce signals that vary based upon a fleet angle of the cable extending through the opening.

Abstract: Aspects of a tandem dispersive range monochromator are described herein. In one embodiment, the monochromator includes a light source that provides broadband light, a tandem diffraction grating including a first diffraction grating and a second diffraction grating, a grating drive motor that rotates the tandem diffraction grating to provide dispersed wavelengths of light, a detector that detects a portion of the dispersed wavelengths of light, and processing circuitry that controls a grating drive motor to regulate an angular velocity of the tandem grating based on an angular orientation of the tandem diffraction grating. By using a tandem diffraction grating having different dispersive surfaces, measurements of relatively high precision and quality may be taken throughout a wider spectral range. In another aspect, the processing circuitry controls a sample drive motor to vary an angle of incidence of the dispersed wavelengths of light onto a sample for evaluation.

Abstract: Disclosed herein is a system for determining information about one or more defects on or in a test object. The system includes a light source configured to illuminate a test object with spatially coherent light; a multi-element detector positioned to detect an interference pattern of light associated with one or more defects on or in the illuminated test object; and an electronic control module in communication with the multi-element detector and configured to process the interference pattern to determine information about the one or more defects on or in the test object.

Abstract: A light weight, portable spectroradiometer device has an optical system that directs incoming wavelengths of light to impinge upon a three-dimensional sensor comprised of a linear variable filter in direct contact with a photodiode array. The linear variable filter can be a specific band pass filter coating that has been geometrically wedged in one direction. The incoming wavelengths of light are transmitted through the three-dimensional sensor and differentiated into the pixels to be further processed into digital signals. A standard light source, either external or internal to the device, and emitting specified intensities over wavelengths may also be used to calibrate the spectroradiometer device, and samples of light with unknown intensities may be compared to the standard light source. The compact geometry of the optical system and sensor allows the device to be a compact, light weight three-dimensional spectroradiometer containing no moving parts and having a rapid measurement time.

Abstract: The present disclosure relates generally to systems and methods for determining the absorption coefficient and the optical density of a fluid as they relate to the wavelength of incident radiation. Specifically, ultraviolet light-emitting diodes (UV LEDs) or the like that emit ultraviolet (UV) radiation or the like are used as sources for irradiating the interior of an integrating chamber that is designed to increase the path length of the radiation through the fluid, thus enhancing the detection limits of the absorption coefficient and the optical density according to Beer's Law.

Abstract: A method and system to detect an improvised explosive device is disclosed. In a particular embodiment, the method includes dispersing a mixture containing a fluorescent material uniformly over a ground cover, illuminating the ground cover with wavelengths of visible light or ultraviolet (UV) light causing the fluorescent material to fluoresce in a visible light spectrum, and detecting where the mixture has been disturbed on the ground cover by visually observing inconsistencies in the fluorescent material on the ground cover that is fluorescing to indicate a location of the improvised explosive device. The method also includes that the mixture is adapted to cling to a person, clothes, or any combination thereof, upon contact.

Abstract: A portable, tabletop fluid sampling device simplifies spectral analysis to produce an accurate but inexpensive chromatic fingerprint for fluid samples. In one embodiment, the sampling device uses an array of variable wavelength LED emitters and photodiode detectors to measure Rayleigh scattering of electromagnetic energy from the fluid sample contained in a cuvette. Either the fluid itself, or particles suspended in the fluid can then be identified by performing spectral pattern matching to compare results of a spectral scan against a library of known spectra. A wide range of applications include substance identification, security screening, authentication, quality control, and medical diagnostics.

Abstract: An approach for IR-based metrology for detecting stress and/or defects around TSVs of semiconductor devices is provided. Specifically, in a typical embodiment, a beam of IR light will be emitted from an IR light source through the material around the TSV. Once the beam of IR light has passed through the material around the TSV, the beam will be analyzed using one or more algorithms to determine information about TSV stress and/or defects such as imbedded cracking, etc. In one embodiment, the beam of IR light may be split into a first portion and a second portion. The first portion will be passed through the material around the TSV while the second portion is routed around the TSV. After the first portion has passed through the material around the TSV, the two portions may then be recombined, and the resulting beam may be analyzed as indicated above.

Abstract: A system and method of measuring feature depth using a common path auto-correlation low coherence interferometer including a light source having an output directed toward a first beam splitter, the first beam splitter directing at least a portion of a light beam from the light source toward a sample having two reflective interfaces including a top surface reflective interface and a feature bottom reflective interface. The first beam splitter can also pass toward a second beam splitter each of a reference light beam reflected from the top surface interface and a measurement light beam reflected from the feature bottom reflective interface. The second beam splitter directs the reference light beam to a first mirror and the measurement light beam to a second mirror and combines a reflected measurement light beam from the second mirror and a reflected reference light beam from the first mirror to form an interference pattern.

Abstract: Embodiments of the present invention generally relate to the field of optical fiber splicing, and more specifically to apparatuses and methods directed to mechanical splice termination and evaluation of resulting splice joints. In an embodiment, the present invention is an apparatus for evaluating the integrity of a mechanical splice joint comprising a light source, a circulator, a photo detector, and an analysis circuit, wherein the apparatus connects to a test connector and evaluates signals representative of light pulses passing through at least a portion of the test connector.

Abstract: An optical spectral sensing device for determining at least one property of a fluid. The device has an elongated porous body, a first end and a second end, a solid-state optical emitter at the first end of the body oriented to emit radiation toward the second end of the body, and a solid-state optical detector at the second end of the body oriented to detect radiation emitted by the optical emitter. A package for detecting properties of a fluid includes a body defining a cavity, with a movable and biased carrier for an optical detector or emitter mounted in the cavity for increased reliability. A system for determining relative concentrations of fluids in a sample includes emitter/detector pairs operating at reference wavelength and wavelengths corresponding to absorption peaks of at least two fluids, and a processor for determining concentration based on measured data and calibration data.