Projection Of Structured Light Pattern Patents (Class 356/603)
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Patent number: 7436525Abstract: An operation of projecting slit light onto an object to be measured and receiving light reflected thereon, and an operation of acquiring a two-dimensional image concerning the object to be measured are repeated a certain number of times by changing a focal length. An imaging contrast is calculated with respect to each of areas on the two-dimensional images acquired at the different focal lengths. A high contrast area where the imaging contrast exceeds a predetermined threshold value is extracted with respect to each of the two-dimensional images acquired at the different focal lengths. Distance information concerning the respective areas is acquired by performing triangulation with respect to each of the high contrast areas. Position adjustment of measurement dimensions is performed in such a manner that the areas are included in the measurement dimensions having the predetermined measurement depth, based on the distance information.Type: GrantFiled: June 7, 2007Date of Patent: October 14, 2008Assignee: Konica Minolta Sensing, Inc.Inventors: Takayuki Mukai, Yoshihisa Abe
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Patent number: 7428061Abstract: An optical probe for measuring features of an object comprises two or more viewing directions and two or more projection directions. A method of measuring the features of an object comprises configuring an optical probe into two or more optical groups, wherein an optical group comprises one or more viewing directions and one or more projection directions, wherein at least one viewing direction and at least one projection direction is different between the optical groups, and wherein data obtained by the viewing directions is generated only from patterns projected by the projection directions of the same optical group. The method further comprises collecting data from each optical group while scanning the object.Type: GrantFiled: January 6, 2006Date of Patent: September 23, 2008Assignee: Metris IPR N.V.Inventors: Bart Van Coppenolle, Lieven De Jonge, Kris Vallons, Frank Thys
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Patent number: 7394552Abstract: Method and device for determining one or more Z distances from an object surface to a reference plane, for example the primary plane of the primary objective of a microscope. By projecting an optical pattern onto an object, and subsequently detecting and computationally evaluating the object's reflection of this pattern by means of an image processing unit, it is possible to obtain relief-like imaging of the object and to identify the individual Z distances, irrespective of the object's contouring.Type: GrantFiled: May 29, 2002Date of Patent: July 1, 2008Assignee: Leica Microsystems AGInventor: Roger Spink
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Patent number: 7391522Abstract: A three-dimensional shape detecting means includes a projecting device which projects pattern light; an image capturing device which captures a pattern light projection image; a pattern light position extracting device which extracts a position of the pattern light projected on the subject; a three-dimensional shape calculation device which calculates three-dimensional shape of the subject; a storage device which stores color value data of the pattern light projection image; a hue parameter calculation device which calculates hue parameters corresponding to a main hue; a luminance parameter calculation device which calculates luminance parameters in units of pixels; and a pattern light detecting device which detects pixels representing the pattern light. The pattern light position extracting device extracts the position of the pattern light based on the pixels representing the pattern light detected by the pattern light detecting device.Type: GrantFiled: March 28, 2006Date of Patent: June 24, 2008Assignee: Brother Kogyo Kabushiki KaishaInventor: Hiroyuki Sasaki
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Patent number: 7388678Abstract: In order to determine three-dimensional coordinates of a surface (2) of an object (3) to be detected, the changes in color of a color pattern (5), which is projected by a projector (4) onto the surface (2), are to be encoded by using a redundant code. An analyzing method, which analyzes the changes in color occurring in an image (7) recorded by a camera (6), is insensitive to changes on the surface (2). In addition, the contour of the object (3) can be determined with a single recording. The method is thereby also suited for moving objects.Type: GrantFiled: July 17, 2003Date of Patent: June 17, 2008Assignee: Siemens AktiengesellschaftInventors: Frank Forster, Christian Hoffmann, Peter Rummel
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Patent number: 7388679Abstract: A light irradiation device for irradiating light having a pattern onto a physical object, includes a pattern forming plate provided with a plurality of opening portions; a light irradiation unit for irradiating light towards the pattern forming plate; and a projection lens irradiated by the light irradiation unit, for integrally condensing light passed through an opening of the pattern forming plate and guiding the condensed light to the physical object, wherein the projection lens is arranged such that an image of the pattern forming plate is not focused onto the physical object, but is projected as a sinusoidal wave pattern.Type: GrantFiled: September 21, 2006Date of Patent: June 17, 2008Assignee: OMRON CorporationInventors: Masanao Yoshino, Yoshiro Murata, Yoshinobu Asokawa
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Patent number: 7385709Abstract: A method and a microscopy imaging apparatus for generating an optically sectioned image of a specimen are provided. The method comprises the steps of: illuminating the specimen with a modulating, spatially periodic illumination pattern; imaging said specimen on a conjugate image plane; acquiring a plurality of signals at respective positions on said image plane, each signal corresponding to the incident light intensity at that position and having an oscillatory component caused by the modulation of the illumination pattern; and measuring a characteristic of the oscillatory component of each of the signals, whereby the measured characteristics when combined in their relative positions generate an optically sectioned image of the specimen.Type: GrantFiled: January 15, 2003Date of Patent: June 10, 2008Assignee: Ecole Polytechnique Federale de LausanneInventors: Karsten Plamann, Stéphane Bourquin, Mathieu Ducros, Jelena Mitic, Francois Vuille, Theo Lasser, Tiemo Anhut
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Patent number: 7385708Abstract: Laser-based methods and systems for real-time structured light depth extraction are disclosed. A laser light source (100) produces a collimated beam of laser light. A pattern generator (102) generates structured light patterns including a plurality of pixels. The beam of laser light emanating from the laser light source (100) interacts with the patterns to project the patterns onto the object of interest (118). The patterns are reflected from the object of interest (118) and detected using a high-speed, low-resolution detector (106). A broadband light source (111) illuminates the object with broadband/light, and a separate high-resolution, low-speed detector (108) detects broadband light reflected from the object (118). A real-time structured light depth extraction engine/controller (110) based on the transmitted and reflected patterns and the reflected broadband light.Type: GrantFiled: June 9, 2003Date of Patent: June 10, 2008Assignee: The University of North Carolina at Chapel HillInventors: Jeremy D. Ackerman, Kurtis P. Keller
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Patent number: 7379193Abstract: The present invention discloses a sensing device for measuring the three dimension shape and its measuring method. The said sensing device includes a projecting device, an observing device, a projecting localizer, an observing localizer and a computer for data processing. The optic axis of the projecting device and the optic axis of the observing device are crossed on the surface of the object by the relative motion and the focusing of the projecting device and the observing device, such that the viewing field of the whole field measurement and the position of the zero-order fringe are determined. The projecting device and the observing device are focused automatically by means of the object distance and the image distance of the projecting device in this viewing field, and the object distance and the image distance of the observing device in this viewing field.Type: GrantFiled: February 9, 2002Date of Patent: May 27, 2008Inventor: Lang Liu
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Patent number: 7372580Abstract: In a three-dimensional shape detecting system comprising a three-dimensional shape detecting device and an external calculating device, the three-dimensional shape detecting device includes: projection means which projects pattern light onto a subject; image data obtaining means which captures a pattern light projection image of the subject and thereby obtains image data of the pattern light projection image while capturing a pattern light non-projection image of the subject and thereby obtaining image data of the pattern light non-projection image; pattern light position extraction means which extracts a position of the pattern light projected on the subject based on the obtained image data; and three-dimensional shape calculation means which figures out three-dimensional shape data of the subject based on the position of the pattern light extracted by the pattern light position extraction means.Type: GrantFiled: March 22, 2006Date of Patent: May 13, 2008Assignee: Brother Kogyo Kabushiki KaishaInventor: Takeo Iwasaki
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Patent number: 7349104Abstract: A method for acquiring a surface profile 3D data set of an object includes illuminating a surface of the object with a sequence of multiple rainbow projection (MRP) structural light patterns, capturing light reflected from the object, and calculating 3D data (X, Y, Z) for each visible point on the object based upon triangulation mathematical principles of the captured reflected light.Type: GrantFiled: October 25, 2004Date of Patent: March 25, 2008Assignee: Technest Holdings, Inc.Inventor: Z. Jason Geng
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Patent number: 7342668Abstract: A system provides high-speed multiple line digitization for three-dimensional imaging of a physical object. A full frame of three-dimensional data may be acquired in the same order as the frame rate of a digital camera.Type: GrantFiled: September 17, 2004Date of Patent: March 11, 2008Assignee: D4D Technologies, LLCInventors: Mark Quadling, Henley Quadling
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Publication number: 20080037032Abstract: A method and apparatus is described for contact-free 3 dimensional-measuring of a moving object with periodic motion. The method and apparatus makes use of the projection of a defined intensity pattern onto the moving object and the recording and analysis of a reflected pattern from the object wherein the intensity pattern projection is synchronized to a characteristic periodic frequency period or sub-period of the moving object.Type: ApplicationFiled: August 8, 2006Publication date: February 14, 2008Inventors: James Scogin, Brian Crowell, Ron Lutz
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Patent number: 7330577Abstract: A method for creating three-dimensional models of intra-oral scenes and features. The intra-oral scene is illuminated by a two-dimensional array of structured illumination points, with anti-aliasing achieved by using stored two-dimensional patterns of pixels for anti-aliasing. Using a single camera to form images reduces the amount of apparatus necessary to introduce into the patient's mouth. Three-dimensional models are obtained from the single image by triangulation with a stored image of the structured illumination onto a reference surface such as a plane. Alternative methods include the use of “bar-coded” one-dimensional patterns.Type: GrantFiled: January 12, 2005Date of Patent: February 12, 2008Assignee: Densys Ltd.Inventors: Maurice Moshe Ernst, Micha Geffen, Uri Neta, Carmi Cohen
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Publication number: 20080024793Abstract: A probe control interface is provided for a structured light non-contact coordinate measuring machine probe. Portions of a video control signal for controlling the grey level of selected rows of pixels of a spatial light modulator of the probe can be decoded into control signals for additional probe components or functions that have been added to increase the measuring capabilities or versatility of the non-contact probe. By providing the additional probe component control signals in this manner, a versatile structured light non-contact probe system can be made compatible with a standard probe head autojoint system (e.g. a Renishaw™ type system), thus allowing the probe to be automatically exchanged with other standard probes and allowing existing systems to use the non-contact probe more easily. Various aspects of the probe control interface allow for relatively simple, compact, lightweight and robust implementation.Type: ApplicationFiled: July 28, 2006Publication date: January 31, 2008Applicant: Mitutoyo CorporationInventor: Paul Gladnick
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Patent number: 7317542Abstract: The invention relates to a method and a device for optically measuring the surface shape and for the optical surface inspection of moving elongated bodies, according to which surface shape measurement and surface inspection are integrated. A projector applies a line pattern to the object to be measured. A camera registers the surface of the object to be measured and compares the image information with a reference pattern. Two high-resolution cameras additionally detect surface defects on the object to be measured. The inventive measuring technique is especially suitable for a combined planarity and surface measurement of metal strips in rolling installations.Type: GrantFiled: February 6, 2003Date of Patent: January 8, 2008Assignee: Betriebsforschungsinstitut VDEh-Institut für angewandte Forschung GmbHInventors: Hagen Krambeer, Ulrich Müller, Gustav Peuker, Harald Peters, Detlef Sonnenschein
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Patent number: 7310154Abstract: An image capturing apparatus for capturing an image of an object. The image capturing apparatus includes a correspondence detector which detects a correspondence of characteristic points of an object based upon captured images of the object. A motion detector detects a motion of the image capturing device. The motion detector includes magnetic sensors. Further, a shape calculator calculates a shape of the object based upon the captured image data, captured attitude information, a translation component, and the correspondence of the characteristic points. The motion detector may further include acceleration sensors and angle speed sensors. A disturbance detector may further be provided to detect a disturbance in acceleration signals output by the acceleration sensors and a disturbance in magnetic signals output by the magnetic sensors.Type: GrantFiled: August 3, 2001Date of Patent: December 18, 2007Assignee: Ricoh Company, Ltd.Inventors: Takashi Kitaguchi, Norihiko Murata
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Publication number: 20070285672Abstract: An operation of projecting slit light onto an object to be measured and receiving light reflected thereon, and an operation of acquiring a two-dimensional image concerning the object to be measured are repeated a certain number of times by changing a focal length. An imaging contrast is calculated with respect to each of areas on the two-dimensional images acquired at the different focal lengths. A high contrast area where the imaging contrast exceeds a predetermined threshold value is extracted with respect to each of the two-dimensional images acquired at the different focal lengths. Distance information concerning the respective areas is acquired by performing triangulation with respect to each of the high contrast areas. Position adjustment of measurement dimensions is performed in such a manner that the areas are included in the measurement dimensions having the predetermined measurement depth, based on the distance information.Type: ApplicationFiled: June 7, 2007Publication date: December 13, 2007Inventors: Takayuki Mukai, Yoshihisa Abe
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Patent number: 7306341Abstract: In one aspect, a first sequence of patterns of light symbols that spatio-temporally encode two-dimensional position information in a first projection plane is projected onto a scene. A second sequence of patterns of light symbols that spatio-temporally encode two-dimensional position information in a second projection plane is projected onto the scene. Light patterns corresponding to the first and second sequences of patterns of light symbols reflected from the scene are captured at a capture plane. Captured light symbol sequence codes are determined from the captured light patterns. A correspondence mapping of the first projector plane and the second projector plane with respect to a reference coordinate system is generated based at least in part on correspondence between the captured light symbol sequence codes and the first and second sequences of light symbol patterns.Type: GrantFiled: February 28, 2005Date of Patent: December 11, 2007Assignee: Hewlett-Packard Development Company, L.P.Inventor: Nelson Liang An Chang
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Patent number: 7286698Abstract: A calibration pattern unit which obtains correction information of an imaging system by imaging at the imaging system comprises a calibration pattern which has a known geometric pattern formed on a plurality of three-dimensionally arranged planes, and a relative position and posture fixing section which fixes relative position and posture between the calibration pattern and the imaging system.Type: GrantFiled: August 28, 2003Date of Patent: October 23, 2007Assignee: Olympus CorporationInventors: Kazuhiko Arai, Akio Kosaka, Takashi Miyoshi, Kazuhiko Takahashi, Hidekazu Iwaki
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Patent number: 7276380Abstract: The present invention provides a transparent liquid inspection apparatus capable of identifying a boundary between a transparent liquid applied on a base material which provides a multi-piece product and the base material, and automatically inspecting an applied condition of the transparent liquid without influence of a background of the base material. A projected image of an illumination source (2) is reflected on a surface of the transparent liquid as a mirror, the projected image is picked up by cameras (41 to 44), and the image is analyzed by an image processing unit (8), thereby inspecting an amount of displacement of the transparent liquid from a predetermined application position and expansion of the surface of the transparent liquid.Type: GrantFiled: July 30, 2001Date of Patent: October 2, 2007Assignee: Matsushita Electric Industrial Co., Ltd.Inventor: Teruaki Fukuyama
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Patent number: 7259871Abstract: This invention relates to an apparatus and a method for rapid and precise scanning of the three-dimensional (3-D) profile of a dental cast. Disclosed is a measurement apparatus comprising two symmetrically arranged optical projection units and plural image capturing units each including optical components and optical lenses. The geometrical relationship between the optical projection units and the plaster dental cast are such arranged to ensure precise projection of laser beams and comprehensive measurement. The plural image capturing units serve to capture the reflected, structured light patterns, based on which patterns a 3-D occlusal profile is rapidly and precisely calculated through the triangulation principle, thereby allowing efficient and precise measurement of the 3-D occlusal profile of the plaster dental cast.Type: GrantFiled: February 5, 2004Date of Patent: August 21, 2007Assignee: National Taipei University of TechnologyInventor: Liang-Chia Chen
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Publication number: 20070165245Abstract: The device 1 is described for three-dimensional optical measurement of objects 2 using a topometric measurement method, in which images of projection patterns which have been projected onto an object 2 are recorded and evaluated. The device 1 has a projector 3 with a light source, an image recording unit 5 and an image evaluation unit 6. The light source for the projector 3 is an arc lamp 4, and the image recording unit 5 is designed for synchronization of image recording with the light intensity of the arc lamp 4.Type: ApplicationFiled: December 27, 2006Publication date: July 19, 2007Inventors: Mladen Gomercic, Detlef Winter, Sebastian Reiss
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Patent number: 7236256Abstract: A linearly polarized light projector system projects linearly polarized light onto a subject. While polarizing filters are used for removing light specular-reflected on the subject, a reflected image after removal of the specular-reflected light is captured by image input systems different in view point. Even in the case where the subject is glossy, the number of points for measuring the shape of the subject is increased and range images improved in measurement accuracy can be acquired collectively.Type: GrantFiled: November 26, 2003Date of Patent: June 26, 2007Assignee: Fuji Xerox Co. Ltd.Inventor: Yoshinori Yamaguchi
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Patent number: 7202956Abstract: An apparatus is disclosed for moving an optical component of an opto-mechanical inspection system relative to an object to be inspected using a linear actuator comprising a coil located in a magnetic field created by a magnet assembly. A translation stage is coupled to either of said coil and magnet assembly whereby the translation stage is configured for motion relative to the other of said coil and magnet assembly. Movement of the translation stage is configured along a plane that is substantially perpendicular to a direction of incident light projected from a light source through the optical component onto the object.Type: GrantFiled: October 8, 2004Date of Patent: April 10, 2007Assignee: ASM Technology Singapore Pte Ltd.Inventors: Ajit S. Gaunekar, Gary Peter Widdowson
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Patent number: 7202957Abstract: A three-dimensional visual sensor is disclosed. A two-dimensional image of a two-dimensional feature portion including a point determined on a work is acquired, and N points are determined. A slit of light is projected by a projector, an image of a projected portion is obtained, and M points are determined. The three-dimensional position of the intersection point between each straight line connecting the N points and a point in a camera and the slit of light plane is determined on the sensor coordinate system, and transformed to the data on the reference coordinate system. The three-dimensional positions of M points are similarly subjected to coordinate transform to the data on the reference coordinate system. Straight lines defined by the M and N points are determined. The intersection point between the two straight lines is determined and returned to the data on the sensor coordinate system by inverse transform.Type: GrantFiled: January 19, 2005Date of Patent: April 10, 2007Assignee: Fanuc LtdInventors: Kazunori Ban, Ichiro Kanno
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Patent number: 7184150Abstract: A intra-oral laser digitizer system provides a three-dimensional visual image of a real-world object such as a dental item through a laser digitization. The laser digitizer captures an image of the object by scanning multiple portions of the object in an exposure period. The intra-oral digitizer may be inserted into an oral cavity (in vivo) to capture an image of a dental item such as a tooth, multiple teeth or dentition. The captured image is processed to generate the three-dimension visual image.Type: GrantFiled: March 19, 2004Date of Patent: February 27, 2007Assignee: D4D Technologies, LLCInventors: Henley Quadling, Mark Quadling, Alan Blair
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Patent number: 7164118Abstract: A method and system for detecting the presence of an object or the distance between the system and an object supports the provision of rapid and reliable obstacle detection. A transmitter emits generally linear beams of electromagnetic radiation with a transmitted radiation pattern within a defined spatial zone. A camera collects an image of the defined spatial zone. A data processor detects a presence of an object in the collected image based on an observed illumination radiation pattern on an object formed by at least one of the generally linear beams. A distance estimator estimates a distance between the object and the optical device based on a change (e.g., an observed shift in one or more positions of generally linear beams) from the transmitted radiation pattern to the observed illumination radiation pattern.Type: GrantFiled: October 29, 2004Date of Patent: January 16, 2007Assignee: Deere & CompanyInventors: Noel Wayne Anderson, Jeffrey Scott Puhalla
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Patent number: 7154613Abstract: A method and apparatus for using a plurality of regions of colored light to index and locate discrete targets in photogrammetry systems. The colored regions of light are used to determine a unique location on the surface of a three-dimensional object. Multiple projections of colored regions may be used to determine precise locations on the surface of the object. Each colored region may be assigned a color-numeric identified to assist in the indexing process. The process is suitable for determining the shape of aircraft, watercraft and automotive parts.Type: GrantFiled: March 15, 2004Date of Patent: December 26, 2006Assignee: Northrop Grumman CorporationInventors: Robert J. Christ, Jr., John M. Papazian
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Patent number: 7149337Abstract: The invention relates to a method of detecting flaws in the surface of a test object relative to the surface of a flawless master part by constructing in an artificial neuronal net a virtual master part for comparison with characteristic numbers derived from the grey values of sequential images of the test object recorded by a digital camera.Type: GrantFiled: November 21, 2001Date of Patent: December 12, 2006Assignee: INB Vision AGInventors: Bernd Michaelis, Peter Albrecht, Tilo Lilienblum
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Patent number: 7142312Abstract: A laser digitizer system provides a visual three-dimensional image of a real-world object such as a dental item through a laser digitization. The laser digitizer captures an image of the object by scanning multiple portions of the object in an exposure period.Type: GrantFiled: December 30, 2003Date of Patent: November 28, 2006Assignee: D4D Technologies, LLCInventors: Henley Quadling, Mark Quadling, Alan Blair
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Patent number: 7136170Abstract: The invention relates to a method for determining the spatial co-ordinates of an object, whereby the object is illuminated with patterns of light from at least two directions by means of a projection device. A calibrating camera and at least one measuring camera at least partially record the patterns of light projected onto the object, the calibrating camera being fixed in relation to the object. The projection device is calibrated by means of at least four phase measuring values, the measuring camera is calibrated using at least two phase measuring values, the three-dimensional co-ordinates of the object are calculated using at least one phase measuring value. The projection device and the measuring camera are thus transferred together into the desired positions.Type: GrantFiled: April 23, 2003Date of Patent: November 14, 2006Assignee: Fraunhofer-Gesellschaft zur Foerderung der angewandten Forschung e.v.Inventors: Gunther Notni, Mathias Heinze, Peter Kuehmstedt
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Patent number: 7127098Abstract: The present invention provides an image detection system capable of picking up a high resolution image of the surface condition of a circuit pattern-formed wafer without being affected by steep pattern steps, discontinuous reflectance distributions and optically transparent substances which are formed after resist patterns are formed and removed. A defect detection apparatus using such an image detection apparatus is also provided by the invention.Type: GrantFiled: September 13, 2002Date of Patent: October 24, 2006Assignee: Hitachi, Ltd.Inventors: Atsushi Shimoda, Masahiro Watanabe, Syunji Maeda, Hiroshi Goto, Tadashi Suzuki
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Patent number: 7119911Abstract: A Moiré deflectometer includes at least three non-mechanical, transparent, spatial light modulators for demonstrating two sets of patterns on two parallel planes on two of the modulators thereby creating a Moiré fringe pattern and a method for using the same. More particularly, each of the spatial light modulators may be a liquid crystal display, an electrochromic device, a micromirror array, a microlouvre array, an electro-optic device, or a holographic device.Type: GrantFiled: March 7, 2003Date of Patent: October 10, 2006Assignee: LSA, Inc.Inventors: Dale R. Tyczka, John G. Lehman, Jr., Alvin B. Cabato, Daniel Stern
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Patent number: 7103212Abstract: A system and method for acquiring three-dimensional (3-D) images of a scene. The system includes a projection device for projecting a locally unique pattern (LUP) onto a scene, and sensors for imaging the scene containing the LUP at two or more viewpoints. A computing device matches corresponding pixels in the images by using the local uniqueness of the pattern to produce a disparity map. A range map can then be generated by triangulating points in the imaged scene.Type: GrantFiled: November 7, 2003Date of Patent: September 5, 2006Assignee: Strider Labs, Inc.Inventors: Gregory D. Hager, Eliot Leonard Wegbreit
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Patent number: 7095886Abstract: In the automatic photogrammetric 3D digitization of a body or body part marked e.g. by an envelope provided with photogrammetric target markers, the camera employed for image recording has additional light pattern projectors added thereon which are fastened to the camera body and project geometrically simple structures such as points or lines onto the body. These structures, which are visible optically without the viewing image, facilitate the manual alignment of the camera and the positioning of the camera at the correct distance from the body in obtaining the numerous overlapping individual images required for photogrammetric evaluation. This manually predefined alignment facilitates the automatic association of the photogrammetric markers in the individual image pairs with the aid of image processing methods and allows it to be carried out more reliably on an automated basis. According to a preferred embodiment, the projectors are turned off in the actual image recording process.Type: GrantFiled: October 5, 2001Date of Patent: August 22, 2006Assignee: corpus.e AGInventor: Robert Massen
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Patent number: 7092563Abstract: There are performed three types of object shooting, i.e., a projection pattern shooting using a pattern including both characterization of a stripe based on a color and characterization based on a gradation of the same component, a flash shooting without a pattern and a non-flash shooting without a pattern. A two-dimensional image information generation portion corrects the influence of a surface reflectivity of an object or external light from the three types of images, and estimates a pattern structure using the characteristic based on a color with respect to an object having a white-based color or a low-saturation color and based on a gradation with respect to an object having a high-saturation color. A depth calculation portion specifies the correspondence relationship between the estimated pattern structure and information of the projected pattern, and calculates a depth of each part of the object based on a result of specification.Type: GrantFiled: June 24, 2002Date of Patent: August 15, 2006Assignee: Olympus Optical Co., Ltd.Inventor: Fumiyuki Shiratani
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Patent number: 7075661Abstract: Methods and apparatus for introducing a plurality of optical markers to a field of view, capturing a two-dimensional image of said field of view on an image plate comprising a pixel array, determining a set of marker origin offset values and using said offset values to establish a set of orientation values describing the relationship between the field of view and the image plate are disclosed. These orientation values are used to relate the area of image captured by each pixel in the image plate to the real world. By applying projective geometry, vector analysis and trigonometrical surveys an image analysis is conducted to establish a three-dimensional positional data set describing the three-dimensional position of regions of reflectivity in the captured two-dimensional image. From this data set a three-dimensional model of the field of view can be reconstructed.Type: GrantFiled: February 22, 2002Date of Patent: July 11, 2006Assignee: Industrial Control Systems LimitedInventors: John Michael Petty, Phillip Stephen Petty
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Patent number: 7046348Abstract: The invention relates to a device for measuring color, luster and undulations on lacquered freeform surfaces at a predetermined target distance and symmetrically in relation to the measuring point normal lines at a measuring point. Said device is characterized by the provision of a measuring head that can be displaced in three dimensions by at least one motor and that comprises a measuring-head axis, a light emitter and a video camera. The light emitter is provided with a planar light pattern that is to be emitted along its illumination axis. An evaluation unit is provided for the light pattern (reproduction pattern) of the light emitter that is reproduced in the video camera, said evaluation unit emitting a control signal which is dependent on and formed from the distortion produced or the migration of the reproduction pattern.Type: GrantFiled: July 28, 2001Date of Patent: May 16, 2006Assignee: X-Rite GmbHInventor: Johannes Fleischer
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Patent number: 7039228Abstract: An optical inspection system and method for inspecting a component on a printed circuit board (PCB) which determines three-dimensional information in a single scan. A first visual light source illuminates the PCB surface and component with a green light while a second visual light source illuminates the PCB and component with a blue light. At least one laser light source simultaneously illuminates the surface of the PCB with a narrow coherent red-light laser beam. The laser light source is mounted off vertical on a movable mount which enables the laser beam to be directed over an area of interest on the surface of the PCB. The system also includes a color scan camera mounted vertically above the PCB. The camera has red, green, and blue channels. The green and blue channels capture an image of the illuminated surface of the PCB which is used by a computer to determine two-dimensional information about the component.Type: GrantFiled: November 19, 1999Date of Patent: May 2, 2006Assignee: Rudolph Technologies, Inc.Inventors: Ramakrishna Pattikonda, Youling Lin
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Patent number: 7013040Abstract: A 3D image acquisition apparatus comprises a pattern projection section which projects a pattern on an object to be measured, an imaging section which is disposed at a distance from the pattern projection section and images the object on which the pattern has been projected, and a depth calculation section which detects the projection pattern projected on the object on the basis of an image acquired by the imaging section, collates the detected pattern and the projected pattern, and calculates a depth of respective parts of the object on the basis of the correspondency of the collation. The projected pattern is stripes/matrix formed by alternately arranging areas with local maximum/minimum luminance values. Thus, stripes/matrix boundaries can be exactly extracted from the pattern projection image, and correct decoding is performed from the encoded projection image even where the object is not a white-based color one or a low-saturation color one.Type: GrantFiled: December 18, 2001Date of Patent: March 14, 2006Assignee: Olympus Optical Co., Ltd.Inventor: Fumiyuki Shiratani
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Patent number: 7009717Abstract: An optical probe for measuring features of an object comprises two or more viewing directions and two or more projection directions. A method of measuring the features of an object comprises configuring an optical probe into two or more optical groups, wherein an optical group comprises one or more viewing directions and one or more projection directions, wherein at least one viewing direction and at least one projection direction is different between the optical groups, and wherein data obtained by the viewing directions is generated only from patterns projected by the projection directions of the same optical group. The method further comprises collecting data from each optical group while scanning the object.Type: GrantFiled: August 13, 2003Date of Patent: March 7, 2006Assignee: Metris N.V.Inventors: Bart Van Coppenolle, Lieven De Jonge, Kris Vallons, Frank Thys
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Patent number: 7002699Abstract: A technique for identifying beam images of a beam matrix includes a number of steps. Initially, a plurality of light beams of a beam matrix, which are arranged in rows and columns, are received after reflection from a surface of a target. Next, a reference light beam is located in the beam matrix. Then, a row pivot beam is located in the beam matrix based on the reference beam. Next, remaining reference row beams of a reference row that includes the row pivot beam and the reference beam are located. Then, a column pivot beam in the beam matrix is located based on the reference beam. Next, remaining reference column beams of a reference column that includes the column pivot beam and the reference beam are located. Finally, remaining ones of the light beams in the beam matrix are located.Type: GrantFiled: February 23, 2004Date of Patent: February 21, 2006Assignee: Delphi Technologies, Inc.Inventors: Hongzhi Kong, Qin Sun, Stephen J. Kiselewich
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Patent number: 6987531Abstract: An imaging system in which a two-dimensional photographing device and a unit for three-dimensional measurement are removably attached to each other is provided. The system can be easily used for taking a two-dimensional image and for measuring three-dimensional data. The imaging system is used for conducting three-dimensional measurement of an object and taking a two-dimensional image of the object. The system includes a photographing device and a three-dimensional measurement auxiliary unit formed in a housing provided independently of the photographing device to be removably attached to the photographing device. The photographing device can take a two-dimensional image without the unit and can function as a light receiving portion in three-dimensional measurement to conduct three-dimensional measurement in cooperation with the attached three-dimensional measurement auxiliary unit.Type: GrantFiled: September 4, 2002Date of Patent: January 17, 2006Assignee: Minolta Co., Ltd.Inventor: Koichi Kamon
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Patent number: 6987560Abstract: A method, apparatus, and computer readable medium are provided for creating a quantitative, three-dimensional representation of a surface of a human subject. Data representing a physical appearance of a human subject is gathered using inverse synthetic aperture radar. A source signal is directed toward the human subject as the target rotates through a range of motion and a return signal is collected. The returned signal is transformed into a quantitative representation of the surface data. The quantitative representation can be added to an archive or can be checked against an archive to determine if the human target is indexed in the archive.Type: GrantFiled: May 30, 2003Date of Patent: January 17, 2006Assignee: The Boeing CompanyInventors: Douglas P. Morgan, William P. Green
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Patent number: 6977732Abstract: A miniature three-dimensional contour scanner is provided, which integrates the optical element and the set of optical lens of the optical projection module and the image capture module into a miniature measurement device. The device utilizes the optical fiber to guide in the light of outside light source and applies the digital micromirror device (DMD) chip to produce structured light pattern and project it onto the object's surface to be measured. The image sensor element is then used to capture the deformed structured fringe image, and by utilizing this information it is able to obtain the colored two-dimensional image and the three-dimensional contour size of the object. The miniature three-dimensional contour scanner can thus be applied in the measurement of miniature objects in the narrow space.Type: GrantFiled: December 26, 2002Date of Patent: December 20, 2005Assignees: National Taiwan University, National Taipei University TechnologyInventors: Liang-Chia Chen, Kuang-Chao Fan
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Patent number: 6970590Abstract: Apparatus and a method for locating edges of a part for acceptance testing of the part. A white light source (12) illuminates the part which is mounted on a support (14) and rotated relative to the light source. Light reflected by the part creates an outline of the part along the edge thereof. The part is viewed by a camera (16) to obtain an image of the part including its edge. A processor (18) analyzes the image to locate the edge of the part in three dimensional space. Analysis of the image includes determining the number of pixels comprising the viewed image, at the edge thereof, as the part is rotated relative to the light source. The part has more than one edge, and each edge is located using the method. The locations of the edges of the part are now used in a co-ordinate system to locate other surface features of the part.Type: GrantFiled: March 28, 2002Date of Patent: November 29, 2005Assignee: General Electric CompanyInventor: Kevin George Harding
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Patent number: 6952270Abstract: Apparatus and methods of measuring three-dimensional position information of a point on the surface of an object. The invention also relates to an apparatus for projecting fringes onto a surface of an object including two sources of radiation separated by a distance, each source having a spectral distribution, and being coherent with respect to the other of the sources, a control system moving each of the sources relative to the other of the sources, and a detector positioned to receive radiation scattered from the point on the surface of the object. In another embodiment, the two sources of radiation include, an initial source of a beam of radiation having a spectral width, a beam separator in optical communication with the initial source of a beam of radiation generating a first optical beam and a second optical beam, and an imaging system optically connected to the beam separator.Type: GrantFiled: November 25, 2003Date of Patent: October 4, 2005Assignee: Massachusetts Institute of TechnologyInventor: Lyle Shirley
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Patent number: 6943337Abstract: A method and system for monitoring a region of interest are presented. Incident radiation is transmitted towards the region of interest with a certain transmitting angle and with a predetermined angular intensity distribution of the incident radiation. The transmitting angle defines a plane of propagation of the incident radiation, the region of interest being located within this plane. Reflections of the incident radiation are collected with a solid angle of collection intersecting with said plane. A region of intersection presents a detecting window of a predetermined geometry containing at least a portion of the region of interest. The collected radiation coming from within the detecting window is detected, and output signals indicative thereof are generated.Type: GrantFiled: March 4, 2002Date of Patent: September 13, 2005Assignee: Rafael Armament Development Authority Ltd.Inventors: Evgeny Frumker, Eliezer Rosenblum, Ezra Shamay
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Patent number: 6937348Abstract: A three-dimensional imaging method and system illuminates an object to be imaged with a light pattern that is formed from two or more light sub-patterns. The sub-patterns can each encompass the visible light spectrum or can be spatially varying intensity sub-patterns that each correspond to a red, green, or blue component. The light pattern is generated by a slotted planar member or an optical filter.Type: GrantFiled: April 28, 2003Date of Patent: August 30, 2005Assignee: Genex Technologies, Inc.Inventor: Z. Jason Geng