Using Polarized Light Patents (Class 359/386)
  • Publication number: 20090195869
    Abstract: Provided is an optical microscope system for detecting nanowires that is designed with a rotational polarizer and Fast Fourier Transform (FFT) to allow for use of an existing optical microscope in fabricating an electronic device having the nanowires. The optical microscope system includes: a light source for emitting light to provide the light to a nanowire sample; a rotational polarizer provided on a path of the light emitted from the light source for polarizing the light; an optical microscope for detecting a nanowire image using light that is polarized by the rotational polarizer and incident on the nanowire sample; a CCD camera provided in a region of the optical microscope for photographing and storing the nanowire image detected by the optical microscope; and a data processor for performing Fast Fourier Transform (FFT) on the nanowire image stored in the CCD camera.
    Type: Application
    Filed: November 15, 2007
    Publication date: August 6, 2009
    Applicants: Electronics and Telecommunications Research Institute, Korea University Industrial & Academic Collaboration Foundation
    Inventors: Eun Kyoung Kim, Seung Eon Moon, Hong Yeol Lee, Jong Hyurk Park, Kang Ho Park, Jong Dae Kim, Gyu Tae Kim, Do Young Jang, Eung Seok Park, Hyun Jin Ji
  • Publication number: 20090122397
    Abstract: The present invention is low cost, does not exert a negative influence on the surroundings, has a small group-velocity delay dispersion, efficiently blocks reflected return light such that the laser light does not return to the laser light source, and allows properly polarized laser light to enter a polarization-dependent element in a subsequent stage. An optical device is provided which includes a laser light source, an optical system that transmits laser light emitted from the laser light source, and a polarization-dependent element into which the laser light transmitted by the optical system enters. The characteristics of outgoing light are changed according to a polarization state of the incident light. The optical system includes a reflected-light generator that reflects a part of the transmitted laser light, and ?/4 wave plates are disposed such that the reflected-light generator is disposed therebetween.
    Type: Application
    Filed: October 21, 2008
    Publication date: May 14, 2009
    Applicant: Olympus Corporation
    Inventors: Hirokazu Kubo, Makio Ueno
  • Publication number: 20090097110
    Abstract: A system and method of generating and acquiring phase contrast microscope images while minimizing interference with the intensity and optical quality of other microscopy modalities employing polarization and attenuation strategies for phase microscopy applications. A plane polarizing objective phase ring may be used in conjunction with a phase microscopy apparatus. Attenuated light may be controlled such that transparency may be selectively provided with respect to light in a predetermined plane. Illumination outside of the predetermined plane may be selected for phase microscopy applications. Accordingly, a polarizing objective phase ring effective for enabling polarized phase microscopy may reduce interfere with normal usage of the microscope for other applications such as, for example, fluorescence microscopy.
    Type: Application
    Filed: December 16, 2008
    Publication date: April 16, 2009
    Applicant: Applied Precision, Inc.
    Inventor: PAUL C. GOODWIN
  • Publication number: 20090040602
    Abstract: A stress-induced polarization converter in the form of a zero power optical window or, alternatively, a single element, positive or negative power optical lens, that is subject to a controlled amount of symmetric, peripheral stress. The stress may be provided by appropriate mechanical, thermal, hydraulic, electromagnetic/piezo, annealing/molding, or other known techniques. The applied symmetric stress will advantageously be trigonal or four-fold, but is not so limited. Advantageously, the polarization converter will be exhibit greater than about one wave of retardation and, in a particular advantageous aspect, will exhibit at least two waves of phase retardation. The stressed lens or window will be characterized by a smoothly varying birefringence that, near center, will exhibit substantially circular contours of equal birefringence. When illuminated by circularly polarized light, the polarization converter will produce concentric rings of alternating right and left circular polarization.
    Type: Application
    Filed: June 20, 2008
    Publication date: February 12, 2009
    Applicant: University of Rochester
    Inventors: Alexis K. Spilman, Thomas G. Brown
  • Publication number: 20090040601
    Abstract: It in an object to acquire a high-precision polarization image.
    Type: Application
    Filed: May 17, 2006
    Publication date: February 12, 2009
    Applicant: OLYMPUS CORPORATION
    Inventors: Yoshiharu Saito, Hirofumi Takatsuka, Eiji Nakasho
  • Publication number: 20090009859
    Abstract: According to a circular dichroism fluorescent microscope 100, in one embodiment of the present invention, it is possible to analyze, by using a small amount of a sample and directly in a living organism, a high-order structure of the sample such as a biomolecule, for example, protein and the like. The circular dichroism fluorescent microscope includes a confocal section. In the circular dichroism fluorescent microscope, a circularly polarizing/modulating section converts, into right and left circularly polarized lights, a light beam emitted from a light source. Thus obtained right and left circularly polarized light is focused on the sample so that the sample is irradiated with the right and left circularly polarized lights. Then, an optical lens focuses fluorescence emitted from the sample. Further, a wavelength selecting section transmits only fluorescence having a predetermined wavelength. Subsequently, the fluorescence having passed through the wavelength selecting section is detected.
    Type: Application
    Filed: February 1, 2007
    Publication date: January 8, 2009
    Inventors: Tsuyoshi Kawai, Kensuke Kawamura
  • Patent number: 7405875
    Abstract: A system microscope has a specimen mounting part which mounts a specimen, an inverted microscope including an illumination path which radiates illumination light from under the specimen mounting part, and an observation optical path which acquires detection light emitted from the specimen to which the illumination light is radiated, a microscope with upright frame including an illumination path which radiates illumination light from above the specimen mounting part, and an observation optical path which acquires detection light emitted from the specimen to which the illumination light is radiated, and a driving unit which moves at least one of the inverted microscope and the microscope with upright frame in a plane perpendicular to the observation optical path of the inverted microscope or the microscope with upright frame.
    Type: Grant
    Filed: April 12, 2005
    Date of Patent: July 29, 2008
    Assignee: Olympus Corporation
    Inventors: Susumu Honda, Yasushi Aono
  • Publication number: 20080062513
    Abstract: The present invention relates to an illumination system that use rotatable, polarized illumination optics to detect the direction of highly efficient excitation of fluorescent dyes coupled to a sample, or the absorption transition moment, using information on the direction of maximal fluorescence intensity. The present invention also makes it possible to detect individual dynamic changes in the internal structure or orientation of an entire protein molecule by coupling a single fluorescent dye molecule to the protein molecule.
    Type: Application
    Filed: September 18, 2003
    Publication date: March 13, 2008
    Inventors: Masasuke Yoshida, Toshiharu Suzuki, Megumi Shio, Ryota Iino
  • Patent number: 7335874
    Abstract: A method and apparatus for illuminating a subject with deep UV light and detecting 2-dimensional image information, e.g., a transmission image, fluorescence image, reflected light image, etc. The subject may be illuminated with a light pulse having a duration of 2 seconds or less and one or more components with a wavelength of between about 150 nm to about 300 nm. The light pulse may be arranged so as to minimize or eliminate any detrimental effect on the functioning of the subject, e.g., on a living cell. A concentration, mass, quantum yield, absorbance or other characteristics of one or more compounds in the subject may be determined based on one or more 2-dimensional images obtained of the subject. An illumination beam having left and right circularly polarized components may be generated, e.g., for circular dichroism analysis of a subject.
    Type: Grant
    Filed: January 13, 2006
    Date of Patent: February 26, 2008
    Assignees: Whitehead Institute for Biomedical Research, Massachusetts Institute of Technology
    Inventors: Benjamin J. Zeskind, Paul Matsudaira, Daniel Ehrlich
  • Patent number: 7324273
    Abstract: The present invention relates to confocal self-interference microscopy. The confocal self-interference microscopy further includes a first polarizer for polarizing reflected or fluorescent light from a specimen, a first birefringence wave plate for separating the light from the first polarizer into two beams along a polarizing direction, a second polarizer for polarizing the two beams from the first birefringence wave plate, a second birefringence wave plate for separating the two beams from the second polarizer into four beams along the polarizing direction, and a third polarizer for polarizing the four beams from the second birefringence wave plate, in the existing confocal microscopy.
    Type: Grant
    Filed: June 1, 2006
    Date of Patent: January 29, 2008
    Assignee: Eun Jin Sohn Patent & Law Office
    Inventors: Dae Gab Gweon, Dong Kyun Kang
  • Patent number: 7304791
    Abstract: The optical microscope apparatus comprises an illuminating element for emitting as illumination light a convergent beam converging at a point in space; a sample mounting table for mounting a sample in front of the converging point of illumination light; and an objective lens disposed such that the illumination light is incident thereon after light transmitted through or reflected by the sample is once converged at the converging point. The texture and state of orientation of the sample can easily be analyzed by use of the optical microscope apparatus in accordance with the present invention.
    Type: Grant
    Filed: March 19, 2001
    Date of Patent: December 4, 2007
    Assignee: Sumitomo Chemical Company, Limited
    Inventors: Masao Minobe, Noboru Shiraga, Shinya Utsumi
  • Patent number: 7301697
    Abstract: Specularly reflected light from a convergence position on an object surface 31 enters a second critical-angle prism 14, another prism 15, and a first critical-angle prism 13 of a parallel beam selection optical system 20 in this order as a parallel beam traveling along the optical axis. The critical-angle prisms 13, 14 have critical angles of 45 degrees with respect to the wavelength of the light beam. Light beams other than the parallel light beam are removed at oblique surfaces 13a, 14a of the critical-angle prisms 13, 14, thereby allowing only the parallel light beam to exit as a regular light beam. This parallel beam is formed into a convergent light by a collimator lens 12, reflected by a half prism 11 and converged on an image pickup surface of an image pickup device 52. In this way, unnecessary noise light can be removed without placing a pin hole plate such as that placed before the image pickup plane in a confocal microscope.
    Type: Grant
    Filed: December 6, 2004
    Date of Patent: November 27, 2007
    Assignee: Fujinon Corporation
    Inventor: Shinichi Kohno
  • Patent number: 7298551
    Abstract: Method and arrangement for changing the spectral composition and/or intensity of illumination light and/or specimen light in an adjustable manner, wherein a spatial separation into radiation components of different polarization is carried out with a first polarizing device, a spectral, spatial splitting of at least one radiation component is carried out with first dispersion device, the polarization state of at least one part of the spectrally spatially split radiation component is changed, and a spatial separation and/or combination of radiation components of different polarization are/is carried out by a second polarizing device, wherein a spatial combination of radiation components which are changed and not changed with respect to their polarization state is advantageously carried out by a second dispersion device.
    Type: Grant
    Filed: September 4, 2003
    Date of Patent: November 20, 2007
    Assignee: Carl Zeiss Jena GmbH
    Inventor: Ralf Wolleschensky
  • Patent number: 7292389
    Abstract: Systems and methods for producing circular extinction (CE) contrast images of anisotropic samples. Microscope systems for determining circular extinction (CE), the differential transmission of left and right circularly polarized light resulting from circular dichroism (CD) of an anisotropic sample, include mechanically driven optical components and an image detector such as a monochromatic CCD camera to detect light intensities. In one aspect, optical components include a tunable filter, a rotatable linear polarizer and a variable retarder. The tunable filter is adjustable to provide light at a specific desired wavelength. The linear polarizer is adjustable to provide linearly polarized light with a specific wave vector, and the variable retarder is adjustable to produce near perfect circular polarized light at every selected wavelength.
    Type: Grant
    Filed: October 18, 2004
    Date of Patent: November 6, 2007
    Assignee: University of Washington
    Inventors: Werner Kaminsky, Bart Kahr
  • Publication number: 20070146870
    Abstract: In a known method for particle analysis, at least part of a particle accumulation is illuminated on a substantially planar substrate and imaged, a measurement area of the particle accumulation being displaced grid by grid, and imaging data obtained on the measurement area being evaluated with respect to particle characteristics.
    Type: Application
    Filed: October 18, 2006
    Publication date: June 28, 2007
    Applicant: JOMESA Messsysteme GmbH
    Inventor: Johann Metzger
  • Patent number: 7236298
    Abstract: An illumination apparatus for a microscope and an image processing apparatus using the illumination apparatus include a light source, a semi-transmissive mirror splitting a light beam from the light source into two beams of the first and second irradiation light, two excitation filters selecting the wavelengths of the first and second irradiation light, a semi-transmissive mirror synthesizing individual beams of the first and second irradiation light whose wavelengths are selected, into a single beam, a dichroic mirror directing a light beam synthesized by the semi-transmissive mirror toward a specimen and transmitting light from the specimen, an objective lens, cameras imaging fluorescent light from the specimen after being separated into fluorescent light excited by the first and second wavelengths, and an image processing section processing fluorescent images formed by imaging elements.
    Type: Grant
    Filed: September 13, 2006
    Date of Patent: June 26, 2007
    Assignees: The Institute of Physical & Chemical Research, Olympus Corporation
    Inventors: Atsushi Miyawaki, Takashi Fukano, Yasushi Aono
  • Patent number: 7215468
    Abstract: A confocal microscope comprises a light source unit having at least two light sources which generate lights having different wavelengths, an objective lens which condenses light from the light source unit on a sample, a light scanning unit which scans the light form the light source unit on the sample two-dimensionally, and a photonic crystal fiber which is disposed between the light source unit and the light scanning unit, and which propagates the light led from the light source unit to the light scanning unit side, wherein the photonic crystal fiber has a plurality of air holes arranged at a clad provided at a periphery of a core.
    Type: Grant
    Filed: July 26, 2004
    Date of Patent: May 8, 2007
    Assignee: Olympus Corporation
    Inventor: Tatsuo Nakata
  • Patent number: 7215469
    Abstract: A confocal microscope comprises a light source emitting a polarized light beam, an objective lens irradiating the polarized light beam, which is deflected and scanned by the optical scanner, to the sample as an excitation light beam, a wavelength separator detecting a necessary wavelength band from a polarized fluorescence emitted from the sample which is excited by the polarized light beam, and a photodetector unit having a polarization property extractor extracting a fluorescence with a predetermined polarization property from the fluorescence detected with the wavelength separator, a wavelength selector selecting a wavelength of the fluorescence extracted by the polarization property extractor, and a photodetector detecting the fluorescence selected by the wavelength selector.
    Type: Grant
    Filed: February 24, 2006
    Date of Patent: May 8, 2007
    Assignee: Olympus Optical Co., Ltd.
    Inventors: Tatsuo Nakata, Masahiro Aoki
  • Patent number: 7193774
    Abstract: A method and apparatus for visualizing sub-micron size particles employs a polarizing microscope wherein a focused beam of polarized light is projected onto a target, and a portion of the illuminating light is blocked from reaching the specimen, whereby to produce a shadow region, and projecting diffracted light from the target onto the shadow region.
    Type: Grant
    Filed: December 1, 2004
    Date of Patent: March 20, 2007
    Assignee: The Arizona Board of Regents on Behalf of the University of Arizona
    Inventors: Ming Cheng, Weinong Chen
  • Patent number: 7151632
    Abstract: An apparatus for producing an inhomogeneously polarized optical beam from a homogeneously polarized input optical beam includes a first phase shifter, a second phase shifter, and one or more polarization beam splitters. The first phase shifter shifts at least one portion of a first part of the input optical beam by a first phase. The second phase shifter shifts at least one portion of a second part of the input optical beam by substantially the first phase. The one or more polarization beam splitters split the input optical beam into the first part and the second part and combine the phase shifted portion and substantially all other portions of the first part of the input optical beam with the phase shifted portion and substantially all other portions of the second part of the input optical beam to produce the inhomogeneously polarized optical beam.
    Type: Grant
    Filed: January 12, 2001
    Date of Patent: December 19, 2006
    Assignee: University of Rochester
    Inventors: David P. Biss, Thomas G. Brown, Kathleen S. Youngworth
  • Patent number: 7142371
    Abstract: The invention aims at thoroughly slimming down video cameras or digital cameras using a zoom system that is composed of a reduced number of lens elements, diminished in size and simplified in construction, and has high image-formation capability. A zoom lens for use on an electronic imaging system comprises a negative first lens group G1, an aperture stop S, a positive second lens group G2 and a positive third lens group G3. Upon zooming from the wide-angle end to the telephoto end of the zoom lens, the second lens group moves only toward the object side of the zoom lens and the third lens group moves in a locus different from that of the second lens group. The first lens group is composed of a negative lens element having an aspheric surface and a positive lens element. The second lens group comprises an object side-lens component and an image side-lens component.
    Type: Grant
    Filed: November 5, 2002
    Date of Patent: November 28, 2006
    Assignee: Olympus Corporation
    Inventor: Shinichi Mihara
  • Patent number: 7139122
    Abstract: A system using cross polarization effects and an enhancement agent having citric or other similar alpha hydroxy acid to enhance confocal microscope reflectance images and particularly images of the nuclei of BCCs (basal cell carcinomas) and SCCs (squamous cell carcinomas) in the confocal reflectance images of excised tumor slices obtained during Mohs surgery by illuminating the tissue being imaged (a tumor slice) using polarized light. The reflected illumination is passed to a polarization analyzer, which passes the polarization component which is crossed with respect to the polarization of the illuminating light. The light from the analyzer is passed through the confocal aperture and detected. The section of the tissue either at the surface or within the tissue is scanned and the reflectance image is produced with enhanced visualization of the cellular or nuclear structure thereof thereby enabling determination of the extent of the tumor (cancerous cells) in the section.
    Type: Grant
    Filed: October 16, 2001
    Date of Patent: November 21, 2006
    Assignee: Lucid, Inc.
    Inventors: Jay M. Eastman, Milind Rajadhyaksha, James M. Zavislan
  • Patent number: 7079316
    Abstract: A microscope includes an interference contrast transmitted-light device having an analyzer disposed in the microscope imaging beam path, the analyzer causing a beam deflection. A fluorescence device is provided, the fluorescence device and the interference contrast transmitted-light device being selectably and alternatively insertable into the imaging beam path. A pair of glass wedge plates are arranged behind the analyzer in the imaging direction so as to compensate to zero for the beam deflection caused by the analyzer.
    Type: Grant
    Filed: May 6, 2004
    Date of Patent: July 18, 2006
    Assignee: Leica Microsystems CMS GmbH
    Inventors: Albrecht Weiss, Michael Ganser
  • Patent number: 7046436
    Abstract: The invention is directed to a method of differential interference contrast in which the object is illuminated by natural light and the light coming from the object is first polarized after passing through the objective. The observation is carried out with a shearing interferometer which is known per se.
    Type: Grant
    Filed: April 29, 2003
    Date of Patent: May 16, 2006
    Assignee: Carl Zeiss Jena GmbH
    Inventors: Rainer Danz, Peter Dietrich, Alexander Soell, Carsten Hoyer, Michael Wagener
  • Patent number: 7038848
    Abstract: A confocal microscope comprises a light source emitting a polarized light beam, an objective lens irradiating the polarized light beam, which is deflected and scanned by the optical scanner, to the sample as an excitation light beam, a wavelength separator detecting a necessary wavelength band from a polarized fluorescence emitted from the sample which is excited by the polarized light beam, and a photodetector unit having a polarization property extractor extracting a fluorescence with a predetermined polarization property from the fluorescence detected with the wavelength separator, a wavelength selector selecting a wavelength of the fluorescence extracted by the polarization property extractor, and a photodetector detecting the fluorescence selected by the wavelength selector.
    Type: Grant
    Filed: December 18, 2003
    Date of Patent: May 2, 2006
    Assignee: Olympus Corporation
    Inventors: Tatsuo Nakata, Masahiro Aoki
  • Patent number: 7034271
    Abstract: A full-field imaging, long working distance, incoherent interference microscope suitable for three-dimensional imaging and metrology of MEMS devices and test structures on a standard microelectronics probe station. A long working distance greater than 10 mm allows standard probes or probe cards to be used. This enables nanometer-scale 3-dimensional height profiles of MEMS test structures to be acquired across an entire wafer while being actively probed, and, optionally, through a transparent window. An optically identical pair of sample and reference arm objectives is not required, which reduces the overall system cost, and also the cost and time required to change sample magnifications. Using a LED source, high magnification (e.g., 50×) can be obtained having excellent image quality, straight fringes, and high fringe contrast.
    Type: Grant
    Filed: May 27, 2004
    Date of Patent: April 25, 2006
    Assignee: Sandia Corporation
    Inventors: Michael B. Sinclair, Maarten P. De Boer
  • Patent number: 6943943
    Abstract: An illuminating apparatus for a microscope comprises a condenser lens for condensing beams of illumination light from a light source and a pin-hole stop. The pin-hole stop has a pin-hole, provided on an optical axis, for transmitting only strong light beams from a central portion of the light source among the illumination light beams condensed by the condenser lens. The pin-hole stop also has a light reducing/illumination area, disposed around the pin-hole in symmetry with respect to the optical axis, for illuminating the periphery of an on-specimen portion illuminated with the light beams passing through the pin-hole with a quantity of light exhibiting a predetermined ratio to a quantity of the light passing through the pin-hole. The same apparatus also comprises an objective lens for converging the illumination light beams passing through this pin-hole stop on a specimen. The pin-hole stop is located in a position substantially conjugate to a pupil plane of the objective lens.
    Type: Grant
    Filed: May 31, 1996
    Date of Patent: September 13, 2005
    Assignee: Nikon Corporation
    Inventor: Hidehiko Furuhashi
  • Patent number: 6900935
    Abstract: An optical arrangement, in particular a microscope, having a light source (1) for illuminating an object, and a glass fiber (3), arranged between the light source (1) and the object, for transporting light along a prescribable distance between the light source (1) and the object, is configured with regard to the avoidance of fluctuations in the illuminating light power without a handicap in the optical adjustment of the arrangement in such a way that the glass fiber (3) is a polarizing glass fiber (3).
    Type: Grant
    Filed: July 16, 2001
    Date of Patent: May 31, 2005
    Assignee: Leica Microsystems Heidelberg GmbH
    Inventors: Johann Engelhardt, Juergen Hoffmann
  • Patent number: 6867915
    Abstract: A microscope is disclosed in which a specimen is arranged between two objectives and can be observed with reflected light as well as with transmitted light. In a microscope with field transmission, two objectives have substantially identical optical characteristics and at least one of the two objectives is followed by a mirror which reflects the light transmitted through the specimen back into itself exactly. In this way, there is twofold transmission through the specimen with optimum illumination of the solid angle. In a laser scanning microscope, there are likewise two objectives with substantially identical optical characteristics and at least one of the objectives is followed by a phase-conjugating or adaptive mirror.
    Type: Grant
    Filed: February 6, 2003
    Date of Patent: March 15, 2005
    Assignee: Carl Zeiss Jena GbmH
    Inventors: Gerhard J. Mueller, Ralf Wolleschensky
  • Publication number: 20040223215
    Abstract: A microscope includes an interference contrast transmitted-light device having an analyzer disposed in the microscope imaging beam path, the analyzer causing a beam deflection. A fluorescence device is provided, the fluorescence device and the interference contrast transmitted-light device being selectably and alternatively insertable into the imaging beam path. A pair of glass wedge plates are arranged behind the analyzer in the imaging direction so as to compensate to zero for the beam deflection caused by the analyzer.
    Type: Application
    Filed: May 6, 2004
    Publication date: November 11, 2004
    Applicant: Leica Microsystems Wetzlar GmbH
    Inventors: Albrecht Weiss, Michael Ganser
  • Patent number: 6813071
    Abstract: There is disclosed an inverted microscope comprising an objective lens disposed under a sample, a tube lens which is disposed in a light path of an observation light emitted from the objective lens and which forms the observation light into an image, an incident light illumination optical device which is disposed between the objective lens and the tube lens, and which introduces incident light illumination into the light path of the observation light, and an input/output port which is disposed between the incident light illumination optical device and the tube lens, and which splits a light flux from the light path of the observation light or introduces the light flux into the light path of the observation light.
    Type: Grant
    Filed: March 19, 2002
    Date of Patent: November 2, 2004
    Assignee: Olympus Optical Co., Ltd.
    Inventor: Yasuteru Takahama
  • Publication number: 20040190134
    Abstract: A time-resolved fluorescence microscope having high spatial and time resolution. Fluorescence from a sample 26 mounted on a confocal inverted optical microscope 19 and excitation laser light are simultaneously incident on a non-linear optical element 32 to produce sum-frequency light 34. Time-resolved fluorescence from the sample is measured by varying the amount of delay in an optical delay line 33.
    Type: Application
    Filed: September 26, 2003
    Publication date: September 30, 2004
    Applicant: RIKEN
    Inventors: Tahei Tahara, Tatsuya Fujino
  • Publication number: 20040184144
    Abstract: A system and method of generating and acquiring phase contrast microscope images without interfering with the intensity and optical quality of other microscopy modalities employ wavelength-specific illumination and attenuation strategies for phase microscopy applications. A wavelength-specific objective phase ring that is opaque only at specific wavelengths may be used in conjunction with a phase microscopy apparatus. Attenuated wavelengths may be controlled such that opacity may be selectively provided only with respect to wavelengths that are outside of the desired range for the fluorescence signals being monitored. Illumination within the opaque wavelength range for the objective phase ring may be selected for phase microscopy applications. Accordingly, an objective phase ring effective for enabling wavelength-specific phase microscopy may not interfere with normal usage of the microscope for other applications such as, for example, fluorescence microscopy.
    Type: Application
    Filed: December 19, 2003
    Publication date: September 23, 2004
    Inventor: Paul C. Goodwin
  • Publication number: 20040150880
    Abstract: A confocal microscope comprises a light source emitting a polarized light beam, an objective lens irradiating the polarized light beam, which is deflected and scanned by the optical scanner, to the sample as an excitation light beam, a wavelength separator detecting a necessary wavelength band from a polarized fluorescence emitted from the sample which is excited by the polarized light beam, and a photodetector unit having a polarization property extractor extracting a fluorescence with a predetermined polarization property from the fluorescence detected with the wavelength separator, a wavelength selector selecting a wavelength of the fluorescence extracted by the polarization property extractor, and a photodetector detecting the fluorescence selected by the wavelength selector.
    Type: Application
    Filed: December 18, 2003
    Publication date: August 5, 2004
    Applicant: Olympus Corporation
    Inventors: Tatsuo Nakata, Masahiro Aoki
  • Publication number: 20040125442
    Abstract: A phase contrast x-ray microscope has a phase plate that is placed in proximity of and attached rigidly to the objective to form a composite optic. This enables easier initial and long-term maintenance of alignment of the microscope. In one example, they are fabricated on the same high-transmissive substrate. The use of this composite optic allows for lithographic-based alignment that will not change over the lifetime of the instrument. Also, in one configuration, the phase plate is located between the test object and the objective.
    Type: Application
    Filed: December 27, 2002
    Publication date: July 1, 2004
    Applicant: Xradia, Inc.
    Inventors: Wenbing Yun, Yuxin Wang
  • Patent number: 6721094
    Abstract: Disclosed is a long working distance interference microscope suitable for three-dimensional imaging and metrology of MEMS devices and test structures on a standard microelectronics probe station. The long working distance of 10-30 mm allows standard probes or probe cards to be used. This enables nanometer-scale 3-D height profiles of MEMS test structures to be acquired across an entire wafer. A well-matched pair of reference/sample objectives is not required, significantly reducing the cost of this microscope, as compared to a Linnik microinterferometer.
    Type: Grant
    Filed: March 5, 2001
    Date of Patent: April 13, 2004
    Assignee: Sandia Corporation
    Inventors: Michael B. Sinclair, Maarten P. DeBoer, Norman F. Smith
  • Publication number: 20030227674
    Abstract: An epi-illumination apparatus for fluorescent observation, adjusting light intensities of a plurality of illuminations on a sample over a wide wavelength band continuously and being configured inexpensively, and a fluorescence microscope having the same are provided. A light source, extracting means, an aperture stop, and a filter are arranged on a predetermined optical axis. The aperture stop is arranged on a plane generally conjugated with a pupil plane of an objective. The filter is placed near the aperture stop. The extracting means extracts a plurality of narrow wavelength bands from the wavelength band of the illumination emitted from the light source. The filter has regions of different spectral transmission characteristics to the narrow wavelength bands. The adjusting means for adjusting light intensities of transmitted light from the filter in the narrow wavelength bands independently by moving the filter in a direction orthogonal to the optical axis is provided.
    Type: Application
    Filed: June 4, 2003
    Publication date: December 11, 2003
    Applicant: NIKON CORPORATION
    Inventors: Toshiaki Nihoshi, Hisashi Okugawa
  • Patent number: 6654165
    Abstract: An optical arrangement in the beam path of a light source suitable for fluorescence excitation, preferably in the beam path of a confocal laser scanning microscope, with at least one spectrally selective element (4) to inject the excitation light (3) of at least one light source (2) in the microscope and to extract the excitation light (3) scattered and reflected on the object (10) or the excitation wavelength from the light (13) coming from the object (10) through the detection beam path (12) is characterized for variable configurations with the simplest construction in that excitation light (3, 9) of different wavelengths can be extracted by the spectrally selective element (4). Alternatively, an optical arrangement like this is characterized in that the spectrally selective element (4) can be adjusted to the excitation wavelength to be extracted.
    Type: Grant
    Filed: January 15, 2003
    Date of Patent: November 25, 2003
    Assignee: Leica Microsystems Heidelberg GmbH
    Inventors: Johann Engelhardt, Joachim Bradl, Heinrich Ulrich
  • Patent number: 6633432
    Abstract: An optical device and microscope of simple construction are provided that are capable of readily attaining super resolution with good focusing performance. This comprises a light source means (2, 3, 4, 6, 8) that generates light of multiple different wavelengths, a light condensation means to focus lights of these multiple wavelengths on an object 1, and an emitted light detector means 17 for detection of light emitted from said object 1. Among said multiple lights of different wavelengths generated from said light source means, at least one light forms a condensed light pattern of multiple spatial modes. These multiple lights are condensed upon said object 1 such that part of the region of the condensed light pattern of said multiple spatial modes is made to spatially overlap with the condensed light pattern of the other light.
    Type: Grant
    Filed: August 21, 2001
    Date of Patent: October 14, 2003
    Assignee: Olympus Optical Co., Ltd.
    Inventor: Yoshinori Iketaki
  • Publication number: 20030161038
    Abstract: The invention relates to a microscope and a method for measuring the surface topography of a workpiece in a quantitative and optical manner. The invention includes a differential interference contrast microscope embodiment according to Nomarski, comprising a light source, a polariser, a changeable Nomarski prism and an analyser. The light source has a narrow frequency spectrum and/or is provided with a special filter having a narrow frequency spectrum; and the microscope is provided with a phase displacement interferometry evaluation unit.
    Type: Application
    Filed: February 19, 2003
    Publication date: August 28, 2003
    Inventors: Helmut Tobben, Dirk-Roger Schmitt, Gabriele Ringel
  • Publication number: 20030137725
    Abstract: The invention is directed to A microscope is disclosed in which a specimen is arranged between two objectives and can be observed with reflected light as well as with transmitted light. In a microscope with field transmission, two objectives have substantially identical optical characteristics and at least one of the two objectives is followed by a mirror which reflects the light transmitted through the specimen back into itself exactly. In this way, there is twofold transmission through the specimen with optimum illumination of the solid angle. In a laser scanning microscope, there are likewise two objectives with identical optical characteristics and at least one of the objectives is followed by a phase-conjugating or adaptive mirror.
    Type: Application
    Filed: February 6, 2003
    Publication date: July 24, 2003
    Inventors: Gerhard J. Mueller, Ralf Wolleschensky
  • Publication number: 20030112504
    Abstract: The invention is directed to an arrangement for confocal autofocusing of optical devices, preferably for fine focusing of microscopes, in which an illumination beam path is directed onto an observed object, and image information from the surface of the observed object as well as information about the focus position is obtained from the light that is reflected in an objective by the observed object and, based on this information, a correction of the focus position is carried out by means of an evaluating and adjusting unit. In a device of the type described herein, the image information and the information about the focus position are guided in different, spatially separated optical branches.
    Type: Application
    Filed: November 18, 2002
    Publication date: June 19, 2003
    Inventors: Norbert Czarnetzki, Thomas Scheruebl
  • Patent number: 6549334
    Abstract: In the transmission illumination type differential interference microscope, light in a given polarized state is separated by a first birefringent optical member 1 into two linearly polarized light components L1 and L2 and both of the polarized light components are converted into parallel light by means of a condenser lens 13. The object being examined 15 is illuminated by the polarized light components which are then converted into convergent light by an objective 16. Both of the polarized light components are then synthesized into a single light beam by a second birefringent optical element 2 and both of the polarized light components of the synthesized light beam are caused to undergo polarization interference by an analyzer 17 so that an enlarged image 18 of the object being examined 15, is formed.
    Type: Grant
    Filed: September 4, 1997
    Date of Patent: April 15, 2003
    Assignee: Nikon Corporation
    Inventors: Tatsuro Otaki, Kumiko Otaki
  • Publication number: 20030048529
    Abstract: An optical circulator comprises a first birefringent element for separation and synthesis; a first polarization rotation block; a circulator function block; a second polarization rotation block; and a second birefringent element for separation and synthesis; the circulator function block includes a first birefringent element for optical path control; a second birefringent element for optical path control which shifts the optical paths depending on the polarization directions and which has twice the optical path shifting amount of the first birefringent element for optical path control; and a ¼ wave plate and a reflector allowing light beams along peripheral optical paths to bypass and acting on only light beams along central optical paths.
    Type: Application
    Filed: September 11, 2002
    Publication date: March 13, 2003
    Inventors: Shusuke Wada, Shohei Abe, Hideo Takeshita, Hiroaki Ono, Yuko Ota
  • Publication number: 20030043459
    Abstract: In a differential interference microscope, polarized light having a predetermined direction of oscillation is incident on a birefringent optical member so as to be separated into two linearly polarized light components having directions of oscillation orthogonal to each other, and the two linearly polarized light components thus separated are directed via an objective lens to a sample to be observed, and the two linearly polarized light components reflected from the sample are guided via the objective to the birefringent optical member so as to be synthesized into single light, and two linearly polarized light components of the synthesized light flux are caused to interfere so that an image of the sample is formed by the objective lens from the light flux that have interfered.
    Type: Application
    Filed: June 26, 2002
    Publication date: March 6, 2003
    Inventor: Kumiko Matsui
  • Publication number: 20030043458
    Abstract: The optical microscope apparatus comprises illuminating means for emitting as illumination light a convergent beam converging at a point in a space; a sample mounting table for mounting a sample in front of the converging point of illumination light; and an objective lens disposed such that the illumination light is incident thereon after light transmitted through or reflected by the sample is once converged at the converging point. The texture and state of orientation of the sample can easily be analyzed by use of the optical microscope apparatus in accordance with the present invention.
    Type: Application
    Filed: March 19, 2001
    Publication date: March 6, 2003
    Inventors: Masao Minobe, Noboru Shiraga, Shinya Utsumi
  • Patent number: 6525875
    Abstract: A microscope is disclosed which determines a complex three-dimensional representation of an object based on a series of recordings of the light wave diffracted by the object, wherein the direction of the wave lighting of the object varies between two succesive recordings. The diffracted wave interferes with a reference wave on a receiving surface and a frequency representation of the diffracted wave is computed from interference patterns received on the receiving surface. A plurality of frequency representations of diffracted waves are then superimposed yielding a frequency representation of the object. The phase of each frequency representation of a diffracted wave is shifted in order to compensate for variations of the phase difference between the reference wave and the wave lighting of the object.
    Type: Grant
    Filed: December 1, 2000
    Date of Patent: February 25, 2003
    Inventor: Vincent Lauer
  • Publication number: 20030030902
    Abstract: An illuminating light modulating device modulates at least one of wavelength, phase, intensity, polarization, and coherency of the light emitted to an object by an illuminating device. A pupil modulating device is disposed near a pupil plane of an objective lens, and modulates at least one of phase, intensity and direction of polarization of the luminous flux including the information of the object. An image pickup device is disposed on a plane on which the image of the object is formed by the objective lens and an imaging lens, and picks up the image of the object. An image analysis device analyzes the image of the object picked up by the image pickup device. A parameter decision device adjusts the modulation amounts of the illuminating light modulating device and the pupil modulating device by using the image information of the object analyzed by the image analysis device.
    Type: Application
    Filed: August 7, 2002
    Publication date: February 13, 2003
    Applicant: Olympus Optical Co., Ltd.
    Inventors: Ikutoshi Fukushima, Takeshi Hashimoto, Mitsuru Namiki, Hiroyuki Minakata, Kimiaki Yamamoto
  • Patent number: 6510001
    Abstract: An optical arrangement in the beam path of a light source suitable for fluorescence excitation, preferably in the beam path of a confocal laser scanning microscope, with at least one spectrally selective element (4) to inject the excitation light (3) of at least one light source (2) in the microscope and to extract the excitation light (3) scattered and reflected on the object or the excitation wavelength from the light (13) coming from the object (10) through the detection beam path(12) is characterized for variable configuration with the simplest construction in that excitation light (3, 9) of different wavelengths can be extracted by the spectrally selective element (4). Alternatively, an optical arrangement like this is characterized in that the spectrally selective element (4) can be adjusted to the excitation wavelength to be extracted.
    Type: Grant
    Filed: August 17, 2000
    Date of Patent: January 21, 2003
    Assignee: Leica Microsystems Heidelberg GmbH
    Inventors: Johann Engelhardt, Joachim Bradl, Heinrich Ulrich
  • Publication number: 20020141052
    Abstract: An optical device and microscope of simple construction and which is capable of readily attaining super resolution with good focusing performance, includes a light source that generates light of multiple different wavelengths, a focusing optical device that focuses lights of these multiple wavelengths on an object, and an emitted light detector that detects light emitted from the object. Among the multiple lights of different wavelengths generated from the light source, at least one light forms a condensed light pattern of multiple spatial modes. These multiple lights are condensed upon the object such that part of the region of the condensed light pattern of the multiple spatial modes is made to spatially overlap with the condensed light pattern of the other light.
    Type: Application
    Filed: August 21, 2001
    Publication date: October 3, 2002
    Applicant: Olympus Optical Co., Ltd.
    Inventor: Yoshinori Iketaki