Abstract: A memory device includes: a memory cell array including a plurality of memory cells; and a page buffer circuit provided in a page buffer region including a main region and a cache region provided in a first horizontal direction, and including a first page buffer unit and a second page buffer unit adjacent to each other in a second horizontal direction in the main region. A first sensing node of the first page buffer unit includes a first lower metal pattern, and a first upper metal pattern, and electrically connected to the first lower metal pattern. A second sensing node of the second page buffer unit includes a second lower metal pattern, and a second upper metal pattern, electrically connected to the second lower metal pattern, and not adjacent to the first upper metal pattern in the second horizontal direction.

Abstract: An apparatus can include a touch-up component. The touch-up component can detect that at least one memory cell of a page of memory cells has lost a portion of a charge. The touch-up component can set touch-up parameters for the page of memory cells. The touch-up component can cause a transfer of data from the page of memory cells to a cache. The touch-up component can reprogram the at least one memory cell using the set touch-up parameters.

Abstract: A semiconductor memory device includes: a memory cell array including a plurality of NAND strings, each of the plurality of NAND strings including a plurality of memory cell transistors connected to each other in series; a plurality of word lines commonly connected to the plurality of memory strings and connected to the plurality of memory cell transistors, respectively; and a row decoder configured to supply a predetermined voltage higher than a ground voltage to each of the plurality of word lines after a program operation for writing data to a selected word line is completed.

Abstract: A method for operating a memory device is provided. The method includes providing a high voltage signal to a memory cell array including a plurality of memory cells using a first wiring, providing a logic signal to the memory cell array using a second wiring, and providing a shielding signal to the memory cell array using a third wiring arranged between the first wiring and the second wiring. A highest voltage level of the logic signal is lower than a highest voltage level of the high voltage signal, and the shielding signal includes a negative first voltage level in a first mode and a positive second voltage level in a second mode.

Abstract: A storage device performing a secure erase and an operating method thereof are provided. The storage device may include a controller configured to control a non-volatile memory device including a plurality of blocks. The controller includes a secure erase control logic configured to control a secure erase operation on the plurality of blocks and perform a control operation in response to a secure erase request from a host with respect to a first block among the plurality of blocks such that the secure erase operation on the first block is skipped based on a result of determining at least one selected from a secure erase state and/or a deterioration state of the first block.

Abstract: A storage controller communicates with a non-volatile memory device, and an operation method of the storage controller includes determining whether a first read voltage is registered at a history table, when it is determined that the first read voltage is registered at the history table, performing a first direct memory access (DMA) read operation on data stored in the non-volatile memory device, based on the first read voltage, obtaining a page count value, based on the first DMA read operation, determining a second read voltage different from the first read voltage based on a difference between the page count value and an idle count value, without an additional read operation for the data stored in the non-volatile memory device, and updating the first read voltage of the history table based on the second read voltage.

Abstract: A memory device includes a memory array of memory cells and control logic operatively coupled with the memory array. The control logic is to perform operations including: initiating a true erase sub-operation by causing an erase pulse to be applied to one or more sub-blocks of the memory array; tracking, a number of suspend commands received from a processing device during time periods that a memory line of the memory array is caused to ramp towards an erase voltage of the erase pulse; causing, in response to receiving each suspend command, the true erase sub-operation to be suspended to enable performing a non-erase memory operation; and in response to the number of suspend commands satisfying a threshold criterion, alerting the processing device to terminate sending suspend commands until after completion of the true erase sub-operation.

Abstract: Memory devices might include a first storage element, a second storage element, a data line, and a controller. The first storage element is to store a first data bit. The second storage element is to store a second data bit. The data line is selectively connected to the first storage element, the second storage element, and a memory cell. The controller is configured to apply one of four voltage levels to the data line based on the first data bit and the second data bit.

Abstract: Apparatuses and techniques are described for controlling a bit line pre-charge voltage in a program operation based on a number of bits per cell, with a goal to reduce peak current consumption. In one aspect, the ramp up of a bit line voltage to an inhibit level is optimized according to the number of bits per cell. The ramp up can involve increasing the bit line voltage from an initial level to a target voltage at a regulated rate, then increasing the bit line voltage from the target voltage to a final voltage at an unregulated rate. In one approach, the regulated ramp rate is less for single-level cell programming compared to multi-level cell programming. The target voltage can also be optimized based on the number of bis per cell.

Abstract: Numerous embodiments of analog neural memory arrays are disclosed. Certain embodiments comprise an adaptive bias decoder for providing additional bias to array input lines to compensate for instances where ground floats above 0V. This is useful, for example, to minimize the voltage drop for a read, program, or erase operation while maintaining accuracy in the operation.

Abstract: There are provided a memory controller and a storage device including the same. The memory controller includes: a command storage including a first read command queue and a second read command queue; a command generation controller for storing a first read command generated in response to a read request and a first physical address in the first read command queue; and a command schedule controller for searching for a first physical address group including at least one second physical address including a page number equal to that of the physical address among the physical addresses stored in the first read command queue and the first physical address, in response to a scheduling event signal provided from the command generation controller.

Abstract: In a method of writing data in a nonvolatile memory device, a write command, a write address and write data to be programmed are received. Offset information representing a verification level is received. The offset information is provided when the write data corresponds to a distribution deterioration pattern by checking an input/output (I/O) pattern of the write data. When the offset information is received, the write data is programmed based on the offset information such that at least one state among a plurality of states included in a distribution of threshold voltages of memory cells in which the write data is stored is changed.

Abstract: A non-volatile storage apparatus that comprises a plurality of planes of non-volatile memory cells is capable of concurrently programming memory cells in multiple planes. In order to screen for failure of the programming process in a subset of planes, the completion of programming of a fastest plane to a particular data state is used as a trigger to test for program failure of other planes to a different data state. In one embodiment, the test for program failure of other planes to the different data state comprises determining if the memory cells of the other planes that are targeted for programming to the different data state have successfully completed verification of programming for the different data state. The programming process is stopped for those planes that fail the test.

Abstract: Aspects of the disclosure are directed to a storage device including a memory and a controller. The memory may include a plurality of flash memory blocks such as single level cell (SLC) blocks and multi-level cell (MLC) blocks. The controller may maintain a read count of each of the SLC blocks to determine which of the blocks contains data associated with the highest number of read commands. Based on the read commands, the controller may relocate the associated data into pages of MLC blocks that have a lower number of senses required to read the data stored in those blocks.

Abstract: An enhanced TL-TCAM lookup-table hardware search engine includes a plurality of enhanced TL-TCAM cell circuits. There are m enhanced TL-TCAM cells circuits connected in parallel to form a sub-segment circuit. The word line WL, match line ML and ML_x of each enhanced TL-TCAM cell circuit in the sub-segment circuit are respectively short-connected together, the match line ML is connected to the drain electrode of an N-type transistor N15, ML_x is connected to the gate electrode of the N-type transistor N15, and the source electrode of the N-type transistor N15 is connected to ground, ML_x is connected to the drain electrode of an N-type transistor N14, the source electrode of the N-type transistor N14 is connected to ground, and the gate electrode of the N-type transistor N14 is connected to the signal line OneX_in-Sement_b, a plurality of sub-segment circuits are connected in parallel to form a word circuit.

Abstract: A storage device is provided that allows a controller to directly access bytes of data in data latches connected to memory, as opposed to through controller RAM. The storage device may include a memory, a plurality of data latches connected to the memory, and a controller coupled to each of the data latches. The controller is configured to access one or more bytes of decoded data in one or more of the data latches. For instance, the controller may provide a command including an address for data in the memory, and may process one or more bytes of the data in at least one of the data latches in response to the command. The controller may also store a mapping of addresses for each of the word lines, including the address provided in the command. As a result, operation latency may be reduced and controller RAM savings achieved.

Abstract: Stochastic or near-stochastic physical characteristics of resistive switching devices are utilized for generating data distinct to those resistive switching devices. The distinct data can be utilized for applications related to electronic identification. As one example, data generated from physical characteristics of resistive switching devices on a semiconductor chip can be utilized to form a distinct identifier sequence for that semiconductor chip, utilized for verification applications for communications with the semiconductor chip or utilized for generating cryptographic keys or the like for cryptographic applications.

Abstract: A number of circuits for use in an output block coupled to a non-volatile memory array in a neural network are disclosed. The embodiments include a circuit for converting an output current from a neuron in a neural network into an output voltage, a circuit for converting a voltage received on an input node into an output current, a circuit for summing current received from a plurality of neurons in a neural network, and a circuit for summing current received from a plurality of neurons in a neural network.

Abstract: A memory system includes a nonvolatile memory configured to execute one of a plurality of read operations, including a first read operation and a second read operation, and a memory controller configured to issue a read command to the nonvolatile memory to cause the nonvolatile memory to execute one of the plurality of read operations. The memory controller is configured to receive a read request, estimate a reliability level of a result of a read operation to be executed by the nonvolatile memory to read data from a physical address specified in the read request, select one of the first and second read operations to be executed first in a read sequence corresponding to the read request by the nonvolatile memory based on the estimated reliability level, and instruct the nonvolatile memory to execute the selected read operation.

Abstract: A memory device includes a memory array comprising a plurality of planes and a plurality of independent plane driver circuits. The memory device further includes control logic to detect an occurrence of a high noise event associated with a first independent plane driver circuit of the plurality of independent plane driver circuits. The control logic is further to determine whether a quiet event associated with a second independent plane driver circuit of the plurality of independent plane driver circuits is concurrently occurring. Responsive to determining that the quiet event associated with the second independent plane driver circuit is concurrently occurring, the control logic is to manage execution of the high noise event and the quiet event based on respective priorities of the first and second independent plane driver circuits.

Abstract: Stochastic or near-stochastic physical characteristics of resistive switching devices are utilized for generating data distinct to those resistive switching devices. The distinct data can be utilized for applications related to electronic identification. As one example, data generated from physical characteristics of resistive switching devices on a semiconductor chip can be utilized to form a distinct identifier sequence for that semiconductor chip, utilized for verification applications for communications with the semiconductor chip or utilized for generating cryptographic keys or the like for cryptographic applications.

Abstract: A memory device includes a plurality of pins, a controller die coupled to the isolation pin, and a memory die. The plurality of pins include an isolation pin, a test mode select pin configured to switch an operation mode of the memory die, a test clock pin configured to receive a test clock, and a test data pin configured to perform a data transmission. The controller die is coupled to the isolation pin. The memory die is coupled to the test mode select pin, the test clock pin, and the test data pin.

Abstract: A memory cell includes a select device and a capacitor electrically coupled in series with the select device. The capacitor includes two conductive capacitor electrodes having ferroelectric material there-between. The capacitor has an intrinsic current leakage path from one of the capacitor electrodes to the other through the ferroelectric material. There is a parallel current leakage path from the one capacitor electrode to the other. The parallel current leakage path is circuit-parallel the intrinsic path and of lower total resistance than the intrinsic path. Other aspects are disclosed.

Abstract: The present technology relates to an electronic device. More specifically, the present technology relates to a memory device, a storage device, and a method of operating a memory controller. According to an embodiment, a memory device that outputs read data in response to a read enable signal provided from a memory controller includes a plurality of memory cells configured to store data, a plurality of page buffers configured to sense the data stored in the plurality of memory cells through a plurality of bit lines, and a data output controller configured to select a target page buffer to output data from among the plurality of page buffers according to a page buffer address control signal provided from the memory controller and control the selected target page buffer to output data stored in the selected target page buffer according to the read enable signal, while the read enable signal is input.

Abstract: Apparatuses, methods, and systems for sensing two memory cells to determine one data value are described herein. An embodiment includes a memory having a plurality of memory cells and circuitry configured to sense memory states of each of two memory cells to determine one data value. One data value is determined by sensing the memory state of a first one of the two memory cells using a first sensing voltage in a sense window between a first threshold voltage distribution corresponding to a first memory state and a second threshold voltage distribution corresponding to a second memory state and sensing the memory state of a second one of the two memory cells using a second sensing voltage in the sense window. The first and second sensing voltages are selectably closer in the sense window to the first threshold voltage distribution or the second threshold voltage distribution.

Abstract: Exemplary methods, apparatuses, and systems include determining that data in a group of memory cells of a first memory device is to be moved to a spare group of memory cells. The group of memory cells spans a first dimension and a second dimension that is orthogonal to the first dimension and the spare group of memory cells also spans the first dimension and the second dimension. The data is read from the group of memory cells along the first dimension of the group of memory cells. The data is written to the spare group of memory cells along the second dimension of the spare group of memory cells.

Abstract: An operating method of a memory system that includes a memory device including a plurality of planes and a plurality of page buffers for the plurality of planes, respectively, and a controller suitable for controlling the memory device, the operating method includes: providing, by the controller, the memory device with page read commands for respective target planes among the plurality of planes; simultaneously reading, by the memory device, data from the target planes and buffering the data in target page buffers corresponding to the respective target planes in response to the page read commands; selectively providing, by the controller, the memory device with an all-plane data output command or respective-plane data output commands from which target page addresses are omitted; and sequentially outputting, by the memory device, the data buffered in the target page buffers, in response to the all-plane data output command or the respective-plane data output commands.

Abstract: A memory device having an improved operation speed includes: a memory cell; a page buffer connected to the memory cell through a bit line; and a program operation controller for controlling an operation of the page buffer. The page buffer includes: a bit line voltage supply for providing a precharge voltage to the bit line; a sensing node voltage supply for providing a sensing node precharge voltage to a sensing node connected to the bit line; a first latch for storing first verify data; a sensing node connector for releasing connection between the bit line and the sensing node, after the first verify data is stored; and a second latch for storing second verify data determined according to the voltage of the sensing node, after the connection between the bit line and the sensing node is released.

Abstract: A data storage system includes a storage medium including a plurality of strings of single-level cell (SLC) memory cells connected to a plurality of word lines; and a storage controller in communication with the storage medium, the storage controller including write circuitry configured to write data to the storage medium by: selecting a first word line of the plurality of word lines, the first word line being connected to a first plurality of strings; consecutively programming a first group of memory cells of the first plurality of strings connected to the first word line; and subsequent to programming the first group of memory cells, consecutively verifying respective programming results of the first group of memory cells.

Abstract: Aspects of the disclosure provide a memory device. For example, the memory device can include a memory array, a bitline and a buffer. The memory array can include a plurality of memory strings. The memory strings can be divided into a first memory string group and a second memory string group. The bitline can include a first bitline segment coupled to the first memory string group and a second bitline segment coupled to the second memory string group. The first bitline segment can be disposed between the first memory string group and the buffer and be connected to the buffer through a first conduction path. The second bitline segment can be disposed between the second memory string group and the buffer and be connected to the buffer through a second conduction path.

Abstract: Apparatus and methods are described to reduce program disturb for a memory string with a partial select gate drain, which is partially cut by a shallow trench. The memory string with a partial select gate drain is linked with a neighboring full select gate drain that during its programming can cause a program disturb in the memory string with a partial select gate drain. The bias voltage applied to the selected full select gate drain can be controlled from a high state for low memory program states to a lower state for the high memory program states. The high data states may cause program disturb. The reduction in the bias voltage can match a reduction in the bias voltage applied to the bit lines to reduce the program disturb while providing adequate signal to program the high states on the memory string of the full select gate drain.

Abstract: A memory system includes a nonvolatile memory configured to execute one of a plurality of read operations, including a first read operation and a second read operation, and a memory controller configured to issue a read command to the nonvolatile memory to cause the nonvolatile memory to execute one of the plurality of read operations. The memory controller is configured to receive a read request, estimate a reliability level of a result of a read operation to be executed by the nonvolatile memory to read data from a physical address specified in the read request, select one of the first and second read operations to be executed first in a read sequence corresponding to the read request by the nonvolatile memory based on the estimated reliability level, and instruct the nonvolatile memory to execute the selected read operation.

Abstract: A wireless controller (200) is configured to send commands to a mini-split HVAC unit (100) that thermostatically controls a temperature in a space (50) using the temperature sensed and a programmable set point. The wireless controller (212) may include an infrared (IR) transmitter (208), a temperature sensor (210), a user interface (214), a non-volatile memory (202), and a controller (212). The wireless controller (200) may store an IR database in the non-volatile memory (202) for each of a wide variety of mini-split HVAC unit (100). The wireless controller (200) may then allow a user to select a particular mini-split HVAC unit (100), and from the selection may identify a corresponding IR protocol in the IR database. During subsequent use, the wireless controller (200) may use the corresponding IR protocol during subsequent communication with the mini-split HVAC unit (100).

Abstract: Provided herein may be a memory device capable of completing a foggy-fine program operation in one ready/busy period. The memory device may include a plurality of memory cells configured to form a plurality of pages, a peripheral circuit configured to perform a first program operation on a page adjacent to a selected page among the plurality of pages, and perform a second program operation on the selected page and control logic configured to control the peripheral circuit, during the first program operation, to successively receive least significant bit (LSB) page data, center significant bit (CSB) page data, and most significant bit (MSB) page data from a memory controller, and program the LSB page data to the page adjacent to the selected page and during the second program operation, to program the LSB page data programmed to the page adjacent to the selected page, the CSB page data and the MSB page data to the selected page.

Abstract: A memory device according to one embodiment includes a memory cell array, bit lines, amplifier units, a controller, and a register. The memory cell array includes a memory cell that stores data nonvolatilely. The bit lines are connected to the memory cell array. The sense amplifier units are connected to the bit lines, respectively. The controller performs a write operation. The register stores status information of the write operation. The memory cell array includes a first storage region specified by a first address. The plurality of sense amplifier modules include a buffer region capable of storing data.

Abstract: The present invention relates to a single-layer polysilicon nonvolatile memory cell, a group structure thereof and a memory including the same. The memory cell includes a selection transistor and a storage transistor, wherein the selection transistor is connected in series with the storage transistor; and the selection transistor and the storage transistor are arranged on a substrate in a mutually perpendicular manner. A memory cell group includes four memory cells, arranged in a center-symmetrical array of two rows×two columns. The memory comprises at least one memory cell group. The memory cell and the memory thereof are used as a one-time programming memory cell and memory, and have the advantages of small area, high programming efficiency and capability, and strong data retention capability.

Abstract: A non-volatile memory device, a method of operating the non-volatile memory device, and a memory system including the non-volatile memory device are provided. A non-volatile memory device includes a memory cell array including a plurality of memory cells configured to be each programmed to one state of a plurality of states, a page buffer circuit including a plurality of page buffers configured to each store received data as state data indicating a target state of a corresponding one of the plurality of memory cells, the page buffer circuit being configured to perform a state data reordering operation of changing a first state data order into a second state data order during performance of a program operation on selected memory cells of the plurality of memory cells, and a reordering control circuit configured to control the page buffer circuit to perform the state data reordering operation simultaneously with the program operation.

Abstract: A semiconductor device having a three-dimensional (3D) structure is disclosed. The semiconductor device includes a first substrate layer including a logic circuit, and a plurality of second substrate layers stacked on the first substrate layer, the plurality of second substrate layers including a memory cell array. Each of the plurality of second substrate layers includes, a transfer circuit, coupled to a row line of the memory cell array, that is disposed over the second substrate layer and selectively coupled to a global row line.

Abstract: The present technology relates to an electronic device. A memory device that reduces noise generated during a sensing operation includes a plurality of pages, each including a plurality of memory cells, a peripheral circuit configured to sense a selected page among the plurality of pages, the selected page including a selected memory cell and a sensing node controller configured to control, based on a result of a first sensing operation among a plurality of sensing operations that are performed to sense a logical page among a plurality of logical pages in the selected page, a sensing node in a page buffer coupled to the selected memory cell through a bit line during a second sensing operation.

Abstract: A memory device having improved performance includes: a plurality of memory cells programmed to one of a plurality of program states divided based on a threshold voltage; and a plurality of page buffers coupled to the plurality of memory cells through a plurality of bit lines. Each of the plurality of page buffers includes a latch for storing data sensed from a corresponding bit line among the plurality of bit lines, and discharges the corresponding bit line while performing a latch setting operation including setting data stored in the latch in a verify operation on the plurality of program states.

Abstract: Embodiments herein disclose a method for managing seed value for data scrambling in a NAND memory. The method includes detecting, by a NAND controller, a first scrambling of the data of a word line in the NAND memory. The method further includes caching, by the NAND controller, at least one of a last written data of the word line post the first scrambling for each open block in a Dynamic Random Access Memory (DRAM) for programming the word line, and a super page of the last written data of the word line in the DRAM for programming the super page. The method can be used to manage the seed value which is used for NAND page scrambling, which can reduce retention effect. As a result, the retention recycles for the NAND cells may be reduced, which may improve endurance.

Abstract: The present technology relates to an electronic device. A driver for generating a signal that satisfies a characteristic required according to a type of a signal includes a current controller configured to control total current flowing through the driver based on a selected signal, among a plurality of signals, applied to a page buffer that stores data, a load controller configured to control a magnitude of a load of an output terminal of the driver based on the selected signal and a cap compensator configured to control the magnitude of the load of the output terminal by increasing or decreasing a capacitance of the load of the output terminal based on the selected signal.

Abstract: A negative level shifter includes a shifting circuit and a latch circuit. The shifting circuit shifts levels of a first input signal and a second input signal to provide a first output signal and a second output signal having complementary levels at a first output node and a second output node, respectively, using low voltage transistors and high voltage transistors having different characteristics. The latch circuit, connected to the shifting circuit at the first output node and the second output node, latches the first output signal and the second output signal, receives a negative voltage having a level smaller than a ground voltage, and drives the second output signal and the first output signal complementarily to either a level of a power supply voltage or a level of the negative voltage, based on voltage levels at the first output node and the second output node, respectively.

Abstract: A memory array includes a plurality of memory cells stacked up along a first direction. Each of the memory cells include a memory stack, connecting lines, and insulating layers. The memory stack includes a first dielectric layer, a channel layer disposed on the first dielectric layer, a charge trapping layer disposed on the channel layer, a second dielectric layer disposed on the charge trapping layer, and a gate layer disposed in between the channel layer and the second dielectric layer. The connecting lines are extending along the first direction and covering side surfaces of the memory stack. The insulating layers are extending along the first direction, wherein the insulating layers are located aside the connecting lines and covering the side surfaces of the memory stack.

Abstract: A nonvolatile memory device includes a peripheral circuit including a first active region and a memory block including a second active region on the peripheral circuit. The memory block includes a vertical structure including pairs of a first insulating layer and a first conductive layer, a second insulating layer on the vertical structure, a second conductive layer and a third conductive layer spaced apart from each other on the second insulating layer, first vertical channels and second vertical channels. The second conductive layer and the third conductive layer are connected with a first through via penetrating the vertical structure, the second active region, and a region of the second insulating layer that is exposed between the second conductive layer and the third conductive layer.

Abstract: A storage device having an improved operation speed includes memory blocks and a sudden power-off manager. The memory blocks connected to word lines as part of a super block. The sudden power-off manager in communication with the memory blocks and configured to, in response to a sudden power off, 1) select reference word lines among the word lines to group the word lines into word line zones defined using the reference word lines, 2) perform read operations on pages connected to the reference word lines to determine states of the pages connected to the reference word lines, 3) select a first erase page search zone among the word line zones based on results of the read operations, and 4) determine a first erase page located at a boundary between a program page and an erase page in the first erase page search zone.

Abstract: A semiconductor storage device includes first and second memory strings, a word line, first and second select gate lines, and a control circuit. The first memory string includes a first memory transistor and a first select transistor. The second memory string includes a second memory transistor and a second select transistor. The word line is connected to the first and second memory transistors. The control circuit is connected to the word line and the first and second select gate lines. The control circuit is configured to perform, during a write sequence, a program operation on each of the first and second memory transistors in turn and a verify operation on only one of the first and second memory transistors.

Abstract: Provided herein is a semiconductor memory device and a method of operating the same. The semiconductor memory device includes a memory block, a peripheral circuit, and a control logic. The memory block includes a plurality of sub-blocks coupled to a plurality of source select lines, respectively. The peripheral circuit performs a program operation on the memory block. The control logic is configured to control the peripheral circuit to increase a voltage of a common source line that is coupled to the memory block, increase a voltage of at least one source select line, among the plurality of source select lines, to a first voltage level, and set a voltage of a bit line that is coupled to the memory block and increase the voltage of at least one source select line from the first voltage level to a second voltage level.

Abstract: Systems and methods for reducing the size of sub-blocks within a physical memory block for a three-dimensional non-volatile memory using buried source lines are described. The physical memory block may be fabricated using dual buried source lines such that sub-blocks within the physical memory block may be individually selected in both a horizontal word line direction and a vertical NAND string direction. The physical memory block may include a plurality of sub-blocks that are individually selectable and that share bit lines and/or source-side select gate lines. The plurality of sub-blocks that are individually selectable may correspond with different portions of the same NAND string in which a first sub-block of the plurality of sub-blocks connects to a drain-side select gate for the NAND string and a second sub-block of the plurality of sub-blocks connects to a source-side select gate for the NAND string.

Abstract: There are provided a semiconductor memory and an operating method thereof. The semiconductor memory includes a memory block including a plurality of pages, a peripheral circuit for performing a program operation and an erase operation on a selected page among the plurality of pages, and a control logic for controlling the peripheral circuit to perform the program operation and the erase operation. The control logic decreases threshold voltages of memory cells corresponding to an erase state among a plurality of memory cells included in the selected page in the erase operation.