Abstract: A multi-layer memory and method for operation is disclosed. The memory includes an interface, at least one flash memory die having a plurality of layers and a controller. The controller is configured to select an appropriate one of a predetermined number of program cycles for programming a fixed amount of host data, and for carrying out maintenance operations in one or more of the layers sufficient to permit a next host data write operation. The controller calculates an interleave ratio of maintenance operations to host data programming operations in each of the layers used in the determined programming cycle so that creation of free space is interspersed with host data writes in a steady manner during execution of the determined programming cycle.

Abstract: A memory module that is couplable to a memory controller hub (MCH) of a host system includes a non-volatile memory subsystem, a data manager coupled to the non-volatile memory subsystem, a volatile memory subsystem coupled to the data manager and operable to exchange data with the non-volatile memory subsystem by way of the data manager, and a controller operable to receive read/write commands from the MCH and to direct transfer of data between any two or more of the MCH, the volatile memory subsystem, and the non-volatile memory subsystem based on the commands.

Abstract: A data storage device and methods of performing memory operations using location-based parameters are disclosed. A method includes identifying a set of parameter values associated with a physical block of a memory array on a memory die. The set of parameter values is identified based on a physical location of the physical block. A physical location may include an edge or a central region of the memory array or the memory die. The memory die may comprise a nonvolatile semiconductor memory (e.g., flash memory). Parameter values may include a size or a number of programming steps, pulse widths, maximum programming or erase voltages, reading or verify reference voltages, and parameters relating to error correction, among others, including time dependent parameters. A memory access operation, such as a reading, programming, or erasing operation, is initiated with respect to the physical block in accordance with the set of parameter values.

Abstract: An array of memory cells, in which one or more memory cells have a common doped region. Each memory cell includes a transistor with a floating gate, source and drain regions, and separate gate and drain voltage controls. Each memory cell also includes a coupling capacitor electrically coupled to and located laterally from the floating gate. In the array, first bit lines are oriented in a first direction, wherein a first bit line is coupled to drain regions of transistors that are arranged in a column. The array includes second bit lines also oriented in the first direction, wherein a second bit line is coupled to source regions of transistors that are arranged in a column. The array also includes word lines oriented in a second direction, wherein each word line is coupled to control gates of coupling capacitors that are arranged in a row.

Abstract: Provided are erase methods for a memory device which includes a substrate and multiple cell strings provided on the substrate, each cell string including multiple cell transistors stacked in a direction perpendicular to the substrate. The erase method includes applying a ground voltage to a ground selection line connected with ground selection transistors of the cell strings; applying a ground voltage to string selection lines connected with selection transistors of the cell strings; applying a word line erase voltage to word lines connected with memory cells of the cell strings; applying an erase voltage to the substrate; controlling a voltage of the ground selection line in response to applying of the erase voltage; and controlling voltages of the string selection lines in response to the applying of the erase voltage.

Abstract: Apparatuses, systems, and methods are disclosed to manage non-volatile media. A method includes determining a configuration parameter for a set of storage cells of a non-volatile recording medium. A method includes reading data from a set of storage cells using a determined configuration parameter. A method includes adjusting a configuration parameter based on read data.

Abstract: Provided are a method and apparatus for programming a buffer cache in a Solid State Disk (SSD) system. The buffer cache programming apparatus in the SSD system may include a buffer cache unit to store pages, a memory unit including a plurality of memory chips, and a control unit to select at least one of the page as a victim page, based on a delay occurring when a page is stored in at least one target memory chip among the plurality of memory chips.

Abstract: A hybrid charge pump and control circuit for use in a memory device is disclosed.

Abstract: Subject matter disclosed herein relates to a memory device, and more particularly to a nonvolatile memory device having a recess structure and methods of fabricating same.

Abstract: A data storage device and fabrication and control methods thereof are disclosed. The data storage device includes a first-first sub-block of memory cells, a second-first sub-block of memory cells, a first well switch, a second well switch and a first group of word lines. The first well switch is operative to convey a first well bias to bias the first-first sub-block of memory cells. The second well switch is operative to convey a second well bias to bias the second-first sub-block of memory cells. Further, the first-first and the second-first sub-blocks both are activated according to the first group of word lines.

Abstract: A method of programming a nonvolatile memory device including multi-level cells that store multi-bit data, includes performing a pre-programming operation that programs at least some of the multi-level cells to a plurality of intermediate states which are different from an erased state, and performing a main programming operation that programs the multi-level cells to a plurality of target states corresponding to the multi-bit data. At least some of the intermediate program states have threshold voltage distributions that partially overlap each other.

Abstract: Apparatuses, systems, methods, and computer program products are disclosed for configuring storage cells. A method includes detecting a shift in a read voltage level past a read voltage threshold for a set of memory cells of a non-volatile memory medium. A method includes adjusting a read voltage threshold for the set of memory cells by an amount based at least in part on one or more characteristics of the set of memory cells in response to the shift in the read voltage level. A method includes configuring the set of memory cells to use the adjusted read voltage threshold.

Abstract: A controller for a nonvolatile memory includes an encoder and a decoder. The memory includes memory cells that each store data using more than two levels. The encoder generates first data for storage in first memory cells. For first and second subsets of cells of the first memory cells, the first data is stored at first and second levels, respectively. Measurable values of the first subset of cells are characterized by a first probability density function having a first width. Measurable values of the second subset of cells are characterized by a second probability density function having a second width. The first width is greater than the second width. The encoder generates the first data such that a size of the first subset of cells is less than a size of the second subset of cells. The decoder decodes encoded data from the memory.

Abstract: Embodiments of the invention relate generally to semiconductors and memory technology, and more particularly, to systems, integrated circuits, and methods to implement circuits configured to compensate for parameter variations in layers of memory by adjusting access signals during memory operations. In some embodiments, memory cells are based on third dimensional memory technology. In at least some embodiments, an integrated circuit includes multiple layers of memory, a layer including sub-layers of semiconductor material. The integrated circuit also includes an access signal generator configured to generate an access signal to facilitate an access operation, and a characteristic adjuster configured to adjust the access signal for each layer in the multiple layers of memory.

Abstract: A cell array portion of a single-layer gate EEPROM device includes a plurality of unit cells formed over a substrate to share a first well region in the substrate. Each of the plurality of unit cells includes a floating gate having a first part disposed over the first well region and a second part extending from the first part to have a strip shape, a selection gate spaced apart from the floating gate and disposed to be parallel with the second part of the floating gate, and an active region disposed in the substrate to intersect the floating gate and the selection gate.

Abstract: A system, a method and a non-transitory computer readable medium are disclosed. The non-transitory computer readable medium may store instructions for: (I) interleaving at least two portions of a first codeword of a group of codewords between at least two flash memory planes while violating at least one ordering rule out of (a) an even odd ordering rule, (b) a programming type ordering rule, and (c) a codeword portions ordering rule; and (II) interleaving different portions of other codewords of the group of codewords between multiple flash memory planes while maintaining the even odd ordering rule, the programming type ordering rule and the codeword portions ordering rule. The at least two portions may be programmed to rows in different flash memory blocks, and the flash memory planes may belong to the same or multiple flash memory dies. The programming type ordering may define different decoupling sequence steps with sizes set for different programming types according to sensitivity to noise.

Abstract: Embodiments described herein generally relate to verifying that a FLASH memory has been erased. In an embodiment, a method of erase verifying a memory column of a FLASH memory includes applying a pass gate voltage to even numbered memory transistors while applying an erase verify voltage to the odd numbered memory transistors. Applying a string current to the memory column allows a probe to determine if the string current is successfully traversing the memory column, and thus verifying that the odd numbered memory transistors were erased. The even numbered memory transistors are verified in the following cycle.

Abstract: A signal transmission system is provided which connects a memory controller and a plurality of semiconductor memories. The signal transmission system comprises a semiconductor device arranged between the memory controller and the plurality of memories, in which: the semi-conductor device comprises a control circuit; and the control circuit receives a signal from the semiconductor memory and outputs a control signal to the memory controller in response to the signal from the semiconductor memory.

Abstract: A semiconductor memory device and a method of operating same includes reading a number of program/erase operations stored in a program/erase number storage unit, setting a pulse width of a program voltage based on the read number of program/erase operations, and performing a program operation on memory cells using the program voltage having the set pulse width. Setting of the pulse width of the program voltage includes decreasing the pulse width of the program voltage as the number of program/erase operations increases.

Abstract: Described embodiments provide enhanced read accuracy of a multi-level cell (MLC) flash memory. A read request for desired cells is received by a media controller of the memory. The media controller sets m thresholds to initial values, each threshold corresponding to a cell voltage level of the memory, and measures the cell voltage level of a given cell. For each of the desired cells of the memory, the media controller iteratively, until the measured cell voltage level converges on one of the thresholds, compares the measured cell voltage level to the thresholds. If the measured cell voltage level does not converge on one of the thresholds, the media controller updates the thresholds, remeasures the cell voltage level and compares the remeasured cell voltage level to the updated thresholds. Once the measured cell voltage level converges on a threshold, the media controller determines a binary level of the cell.

Abstract: A flash memory apparatus that may include a plurality of memory portions, and a controller operative to reserve for data retention purposes, for at least a first duration of time, only certain memory portions; allocate data, during said first duration of time, only to said certain memory portions, thereby to define a retired memory portion for said first duration of time; determine to copy data from a certain memory portion to a retired memory portion based upon a relationship between effective cycle counts of the certain memory portion and the retired memory portion, an effective cycle count of any memory portion is responsive to a number of erase-write cycles and to an effective duration of time the memory portion had available to recover from erase-write cycles; and copy the data from the certain memory portion to the retired memory portion.

Abstract: A method and system for increasing the lifespan of a flash memory device by selectively erasing sub-blocks of a memory block. Each physical memory block of the flash memory device is dividable into at least two logical sub-blocks, where each of the at least two logical sub-blocks is erasable. Therefore, only the data of the logical sub-block is erased and reprogrammed while unmodified data in the other logical sub-block avoids unnecessary program/erase cycles. The logical sub-blocks to be erased are dynamically configurable in size and location within the block. A wear leveling algorithm is used for distributing data throughout the physical and logical sub-blocks of the memory array to maximize the lifespan of the physical blocks during programming and data modification operations.

Abstract: A data storage device includes a memory and a controller and may perform a method that includes updating, in a controller of the data storage device, a value of a particular write/erase (W/E) counter of a set of counters in response to an erase operation to a particular region of the non-volatile memory that is tracked by the particular W/E counter and that includes a storage element that is tracked by a particular cell erase counter of the set of counters. The method includes, in response to the value of the particular W/E counter indicating that a count of erase operations to the particular region satisfies a first threshold, initiating a remedial action to the particular region of the non-volatile memory at least partially based on the value of the particular cell erase counter.

Abstract: A data storage device includes a memory and a controller and may perform a method that includes updating, in the controller, a value of a particular counter of a set of counters in response to an erase operation to a particular region of the non-volatile memory that is tracked by the particular counter. The method includes, in response to the value of the particular counter indicating that a count of erase operations to the particular region satisfies a first threshold, initiating a remedial action to the particular region of the non-volatile memory.

Abstract: A hybrid charge pump and control circuit for use in a memory device is disclosed.

Abstract: In a method of reading data in a nonvolatile memory device including data cells and monitoring cells. A first read operation applies a first read voltage to the data cells and monitoring cells. If a read fail occurs, a second read operation is performed using a read voltage level determined according to a number of ON-cells among the monitoring cells.

Abstract: A method of operating a non-volatile memory device includes storing one or more addresses of word lines (WLs), but not the entire addresses of the WLs, into a latch, the WLs disposed between a string selection line (SSL) and a ground selection line (GSL), selecting a first WL from the latch, performing an erasing operation on memory cells associated with the string selection line (SSL), the memory cells associated with the SSL constituting a memory block, and verifying the erasing operation on memory cells associated with the selected first WL.

Abstract: A method for data storage includes, in a memory that includes multiple memory blocks, specifying at a first time a first over-provisioning overhead, and storing data in the memory while retaining in the memory blocks memory areas, which do not hold valid data and whose aggregated size is at least commensurate with the specified first over-provisioning overhead. Portions of the data from one or more previously-programmed memory blocks containing one or more of the retained memory areas are compacted. At a second time subsequent to the first time, a second over-provisioning overhead, different from the first over-provisioning overhead, is specified, and data storage and data portion compaction is continued while complying with the second over-provisioning overhead.

Abstract: In a programming operation that includes repeated bitscan, program, and verify steps, the bitscan steps may be hidden by performing bitscan in parallel with program preparation and program steps. The effect of a program step may be predicted from previous observation so that when a bitscan indicates that the memory cells are close to being programmed, a last programming step may be completed without subsequent verification or bitscan steps.

Abstract: A data writing method for writing data into a physical block of a rewritable non-volatile memory module is provided. The method includes setting danger distance respectively corresponding to each of the physical pages of the physical block, and setting a secure writing flag in an enable state in response to a secure write command. The method also includes determining whether the secure writing flag is set in the enable state when receiving a write command and updated data thereof; if no, writing the updated data into a predetermined physical page of the physical block; if yes, writing the updated data into a secure physical page of the physical block and re-setting the secure writing flag in a disable state, and the distance between the secure physical page and the predetermined physical page is equal to the danger distance corresponding to the predetermined physical page.

Abstract: A control circuit is configured to set a drain-side select transistor and a source-side select transistor connected to a selected memory string to non-conductive states. The control circuit is configured to apply a first voltage to a non-selected word line connected to a gate of a non-selected memory cell in the selected memory string. The control circuit is configured to apply a second voltage to a selected word line connected to a gate of a selected memory cell in the selected memory string. The second voltage is smaller than the first voltage in an erasing operation.

Abstract: A nonvolatile semiconductor memory device according to the embodiment comprises a memory cell array including plural memory cells operative to store data nonvolatilely in accordance with plural different threshold voltages; and a control unit operative to, in data write to the memory cell, execute write loops having a program operation for changing the threshold voltage of the memory cell and a verify operation for detecting the threshold voltage of the memory cell after the program operation, the control unit, in data write for changing one threshold voltage of the plural threshold voltages, executing the verify operation, when the number of write loops to the memory cell becomes more than a certain defined number, using a condition that can pass the verify operation easier than that when the number of write loops is equal to or less than the certain defined number.

Abstract: In a semiconductor memory device in which each memory cell is constituted by one transistor, in a memory cell pattern, two adjacent bits form one diffusion pattern, two adjacent transistors share a source region, and two drain regions are separated from each other. A plurality of arrays in each of which at least a column of the diffusion patterns is disposed include bit lines, and the bit lines of the first array are independent of the bit lines of the second array. In an interface between the arrays, ends at one side of the bit lines of each of the arrays are located on an associated one of two drain regions which are separated from each other with the source region which is shared on one diffusion pattern sandwiched therebetween. This configuration can provide a sufficient bit-line separation width, and reduce the area.

Abstract: A memory system includes a nonvolatile memory device and a memory controller configured to control the nonvolatile memory device and configured to provide the nonvolatile memory device with error flag information including error location information of an error of data read from the nonvolatile memory device.

Abstract: To store a plurality of input bits, the bits are mapped to a corresponding programmed state of one or more memory cells and the cell(s) is/are programmed to that corresponding programmed state. The mapping may be many-to-one or may be an “into” generalized Gray mapping. The cell(s) is/are read to provide a read state value that is transformed into a plurality of output bits, for example by maximum likelihood decoding or by mapping the read state value into a plurality of soft bits and then decoding the soft bits.

Abstract: A semiconductor storage apparatus including a flash memory which provides a storage area, and a memory controller which controls the reading and writing of data from and to the flash memory, wherein the storage area of the flash memory is configured from a plurality of write areas, and wherein the memory controller divides the data into a size corresponding to the write area, and changes the starting location of writing the data each time the divided data is written into the write area.

Abstract: A method in a data storage device including a memory and an error correction coding (ECC) engine. A first ECC page including a data block and first main ECC data is stored to the memory. The first main ECC data is usable by the ECC engine to correct errors in the first ECC page. A second ECC page including first additional ECC data is also stored to the memory. The first additional ECC data is usable by the ECC engine to correct errors in a single sub-block of multiple sub-blocks within the data block.

Abstract: A single virtualized ECC NAND controller executes an ECC algorithm and manages a stack of NAND flash memories. The virtualized ECC NAND controller allows the host processor to drive the stack of flash memory devices as a single NAND chip while the controller redirects the data to the selected NAND memory device in the stack.

Abstract: A power circuit configured to supply an operating voltage to a memory controller configured to control a flash memory and an access to the flash memory, comprises an input side charging unit that is a charging unit configured to be charged by an input voltage that is supplied from the outside, a voltage regulation unit configured to regulate any higher one of the input voltage and a charging voltage of the input side charging unit to be the operating voltage and to output the voltage, an output side charging unit that is a charging unit configured to be charged by the operating voltage, and a discharging unit configured to discharge electricity that has been charged to the output side charging unit in the case in which any higher one of the input voltage and the charging voltage becomes lower than the setting value.

Abstract: A data erasing method of a solid state drive is provided. The solid state drive includes a memory module. The memory module includes a block. A data to be erased is stored in the block. The data erasing method includes steps of performing a first erasing operation to erase the block, programming the block after the first erasing operation, and performing a second erasing operation to erase the block.

Abstract: A semiconductor memory device comprises: a semiconductor substrate; a plurality of memory units provided on the semiconductor substrate and each including a plurality of memory cells that are stacked; and a plurality of bit lines formed above each of a plurality of the memory units aligned in a column direction, an alignment pitch in a row direction of the plurality of bit lines being less than an alignment pitch in the row direction of the memory units, and an end of each of the memory units aligned in the column direction being connected to one of the plurality of bit lines formed above the plurality of the memory units aligned in the column direction.

Abstract: Methods of performing an internal diagnostic for a NAND configured memory device include storing data in a data cache coupled to an array of memory cells arranged in a NAND configuration, wherein the data stored in the data cache corresponds to at least one diagnostic function; performing a decode operation on the data stored in the data cache, wherein the decode operation generates a diagnostic function command for testing internal functions of the NAND configured memory device; and providing the decoded diagnostic function command to a state machine of the NAND configured memory device adapted to perform the decoded diagnostic function command.

Abstract: A method for garbage collection in a solid state drive (SSD) includes determining whether the SSD is idle by a garbage collection module of the SSD; based on determining that the SSD is idle, determining a victim block from a plurality of memory blocks of the SSD; determining a number of valid pages in the victim block; comparing the determined number of valid pages in the victim block to a valid page threshold; and based on the number of valid pages in the victim block being less than the valid page threshold, issuing a garbage collection request for the victim block.

Abstract: Some embodiments include apparatuses and methods having a first set of data lines, a second set of data lines, and memory cells located in different levels of the apparatus. In at least one of such embodiments, the memory cells can be arranged in memory cell strings between the first and second set of data lines. Other embodiments including additional apparatuses and methods are described.

Abstract: Apparatus and methods provide relatively low uncorrectable bit error rates, low write amplification, long life, fast and efficient retrieval, and efficient storage density such that a solid-state drive (SSD) can be implemented using relatively inexpensive MLC Flash for an enterprise storage application.

Abstract: A memory device may include two or more memory cells in an integrated circuit, at least one flash cell acting as a select gate coupled to the two or more memory cells, and an interface to accept a select gate erase command and a select gate program command during normal operation of the integrated circuit. The integrated circuit may be capable to perform operations to erase the at least one select gate in response to the select gate erase command, and program the at least one select gate in response to the select gate program command.

Abstract: A method of operation of a data storage system includes: providing a power monitor module for detecting a loss of host power; interrupting a unit controller by the power monitor module; configuring a memory controller by the unit controller; and writing a non-volatile memory array for storing in-flight data and contents of a system control random access memory in a multi-level cell NAND flash device in response to detecting the loss of the host power.

Abstract: An ECC controller for a flash memory device storing M-bit data (M: a positive integer equal to or greater than 2) includes an encoder and a decoder. The encoder generates first ECC data for input data to be stored in the flash memory device using a first error correction scheme and generates second ECC data for the input data using a second error correction scheme. The input data, the first ECC data, and the second ECC data are stored in the flash memory device. The decoder calculates the number of errors in data read from the flash memory device and corrects the errors in the read data using one of the first ECC data and the second ECC data selectively based on the number of the errors.

Abstract: Embodiments of the present disclosure provide methods, devices, modules, and systems for programming memory cells. One method includes determining a quantity of erase pulses used to place a group of memory cells of the array in an erased state, and adjusting at least one operating parameter associated with programming the group of memory cells at least partially based on the determined quantity of erase pulses.

Abstract: A system and methodology that can prevent errors during data commit on multicycle pass complete associated with a memory is provided. The system employs a transaction buffer component in the memory that receives and temporarily stores information associated with a transaction. A controller component programs subsets of data to respective memory locations once the entire transaction is completed based on the information stored in the transaction buffer component. Thus, if the transaction is interrupted during the transfer of the user data into the buffer, the data stored in the memory is not affected and can still contain the original data when power is regained. If the data transfer between the transaction buffer component and memory array is interrupted, the controller component can complete the transfer from the point of interruption on regaining power and can avoid partial storage of data.