Abstract: It is an object to provide a signal processing circuit for which a complex manufacturing process is not necessary and whose power consumption can be suppressed. In particular, it is an object to provide a signal processing circuit whose power consumption can be suppressed by stopping the power supply for a short time. The signal processing circuit includes a control circuit, an arithmetic unit, and a buffer memory device. The buffer memory device stores data sent from the main memory device or the arithmetic unit in accordance with an instruction from the control unit; the buffer memory device comprises a plurality of memory cells; and the memory cells each include a transistor including an oxide semiconductor in a channel formation region and a memory element to which charge whose amount depends on a value of the data is supplied via the transistor.

Abstract: A sacrificial memory bank is added to a block of regular banks in a memory to reduce dynamic power consumption of the memory. The sacrificial bank is accessed by a set of bit lines that is substantially shorter than corresponding bit lines extending through all of the regular memory banks. Memory read and write operations, which are addressed to one of the regular banks, are deliberately redirected to the sacrificial bank having the short bit lines. Tracking circuitry identifies the regular bank that was addressed for each location in the sacrificial bank. Data is moved from the sacrificial bank to a regular bank only when a new write operation does not match the bank of the previous write operation. Dynamic power is reduced because locality of reference causes access to the sacrificial bank without having to access a regular bank for most memory read and write operations.

Abstract: A memory device comprises a memory array and associated control circuitry. The control circuitry comprises a clock generator configured to generate a clock signal for controlling timing of at least one of a read operation and a write operation directed to the memory array. The clock generator comprises a plurality of sets of address change detection circuits. The sets are configured to generate respective output signals as a function of respective subsets of address bits of an address signal identifying an address in the memory array. The clock generator further comprises logic circuitry coupled to the sets of address change detection circuits and configured to receive the respective output signals therefrom and to generate the clock signal as a function of said output signals.

Abstract: A semiconductor memory apparatus includes a reset pad configured to receive and transfer an external reset signal and an external control signal; a first input buffer configured to buffer the external reset signal in response to a buffer control signal and output an internal reset signal; a second input buffer configured to buffer the external control signal in response to the buffer control signal and output an internal control signal; and an input buffer control unit configured to generate the buffer control signal in response to an external command.

Abstract: A column of a memory includes a first edge cell and at least one memory cell. The first edge cell is located at a first edge of the column and includes a first edge cell reference node and a second edge cell reference node. Each of the at least one memory cells includes a first memory reference node. The first edge cell reference node is coupled to respective first memory reference nodes of the at least one memory cell. The second edge cell reference node serves as second memory reference nodes of the at least one memory cell. Front-end layers of the first edge cell are the same as front-end layers of a memory cell of the at least one memory cell.

Abstract: A memory device, system and method for allowing an early read operation after one or more write operations is provided according to an embodiment of the present invention. The memory device comprises an interface for providing a first write address, a first write data, and a read address. A memory core is coupled to the interface and includes a first memory section having a first data path and a first address path and a second memory section having a second data path and a second address path. In an embodiment of the present invention, the first data and first address path is independent of the second data and second address path. The first write data is provided on the first data path responsive to the first write address being provided on the first address path while a read data is provided on the second data path responsive to the read address being provided on the second address path.

Abstract: Memories, memory repair logic, and methods for repairing a memory having redundant memory are disclosed. One such memory includes programmable elements associated with respective redundant memory configured to have memory addresses mapped thereto, the programmable elements configured to be programmed with at least portions of the memory addresses. Such a memory further includes repair logic coupled to the programmable elements and configured to identify programmable elements available for programming to map memory addresses to respective redundant memory. One method for remapping a memory address of a memory to redundant memory includes receiving at least a portion of a memory address to be remapped to redundant memory, determining whether a programmable element associated with the redundant memory is available for programming, and when a programmable element is available, programming the programmable element such that the memory address will be mapped to the associated redundant memory.

Abstract: An apparatus, system, and method for controlling data transfer to an output port of a serial data link interface in a semiconductor memory is disclosed. In one example, a flash memory device may have multiple serial data links, multiple memory banks and control input ports that enable the memory device to transfer the serial data to a serial data output port of the memory device. In another example, a flash memory device may have a single serial data link, a single memory bank, a serial data input port, a control input port for receiving output enable signals. The flash memory devices may be cascaded in a daisy-chain configuration using echo signal lines to serially communicate between memory devices.

Abstract: A nonvolatile memory device is provided relating to a test operation for a Low Power Double-Data-Rate (LPDDR) nonvolatile memory device. The nonvolatile memory device comprises a command decoder configured to decode a test mode signal in a test mode to output program and erasure signals into a memory, an address decoder configured to decode a command address inputted through an address pin in the test mode to output a cell array address into the memory, and an overlay window configured to store a data inputted through a data pin in the test mode.

Abstract: A circuit made on a semiconductor-on-insulator substrate. The circuit includes a first transistor having a first channel, a second transistor having a second channel, with the transistors provided in serial association between first and second terminals for applying a power supply potential, each of the transistors comprising a drain region and a source region in the thin layer, a channel extending between the source region and the drain region, and a front control gate located above the channel. Each transistor has a back control gate formed in the base substrate below the channel of the transistor and capable of being biased in order to modulate the threshold voltage of the transistor. At least one of the transistors is configured for operating in a depletion mode under the action of a back gate signal which will sufficiently modulate its threshold voltage.

Abstract: A control circuit for a read operation of a SERDES (SERializer and DESeriallizer) type semiconductor memory apparatus is disclosed that includes a first line driver configured to output a portion of a output signals from sense amplifier according to a first delay signal; a second line driver configured to output a rest of the output signals from the sense amplifier according to a second delay signal; and a first delay unit configured to output a second delay signal synchronized with a clock to the second line driver.

Abstract: Methods of increasing the speed of random read and write operations of a memory device are provided for improving the performance of volatile and non-volatile memory devices. In contrast to the conventional approach that latches the current memory address right before the currently accessed memory data are outputted, the methods latch the next memory address before the currently accessed memory data are read out. The flow, timing waveforms and control sequences of applying the methods to parallel NOR flash, parallel pSRAM, serial SQI NOR flash and NAND flash are described in detail. The NOR flash device designed with the method can be integrated with a NAND flash device on a same die in a combo flash device packaged in either an ONFI compatible NAND flash package or other standard NAND flash package.

Abstract: Methods and systems for calibrating parameters for communication between a controller and a memory device. A memory controller may be configured to calibrate one or more of the write latency and/or the latency window of a memory device such that a data signal and a data strobe signal are received by the memory device within the latency window of the memory device.

Abstract: A memory system is provided. In the system, there are first and second sets of dynamic random access memories (DRAMs) and a system register. Each DRAM has at least a first and a second addressable mode register, where the binary address of the second mode register is the inverted binary address of the first mode register. The system register has an input configured to be coupled to a controller, an output coupled to the first set of DRAMs via first address lines and an inverted output coupled to the second set of DRAMs via second address lines. The system register is configured to receive mode register set commands including address bits and configuration bits at the input and to output the mode register set commands non-inverted via the output to the first set of DRAMs and in inverted form via the inverted output to the second set of DRAMs.

Abstract: An apparatus comprises a clock generator, first and second memory drivers and a multiple-port memory device having at least first and second ports configured to receive input signals from and supply output signals to respective ones of the first and second memory drivers, the multiple-port memory device further comprising a single-port memory device and control circuitry coupled between the first and second ports and the single port of the single-port memory device. The clock generator generates first and second clock signals having respective first and second clock rates, the clock rate of the second clock signal being an integer multiple of the clock rate of the first clock signal. The first and second memory drivers are configured to operate using the first clock signal at the first clock rate, and the single-port memory device is configured to operate using the second clock signal at the second clock rate.

Abstract: A non-volatile memory device for measuring a read current of a unit cell is provided. The non-volatile memory device includes a unit cell configured to read or write data, a column switching unit configured to select the unit cell in response to a column selection signal, a sense amplifier controlled by a sense-amplifier enable signal, configured to sense and amplify data that is received from the unit cell through the column switching unit, a first latch unit configured to latch the sense-amplifier enable signal for a predetermined time when a test code signal received from an external part is activated, a column controller configured to output a latch control signal in response to a combination of a column switch-off signal and a column control signal, and a second latch unit configured to control whether or not the column selection signal is latched in response to an activation state of the latch control signal.

Abstract: Described herein are embodiments of dynamic command slot realignment after clock stop exit. An apparatus configured for dynamic command slot realignment after clock stop exit may include memory including a first memory module configured to receive commands over a first channel via a first command slot and a second memory module configured to receive commands over a second channel via a second command slot, and a memory buffer configured to receive a clock sync command targeting the first command slot, and perform a write pointer exchange in response to detecting the clock sync command in the second command slot to realign the first command slot and the second command slot. Other embodiments may be described and/or claimed.

Abstract: An address decoding device may include a supply terminal for a supply voltage, a conductive path configured to provide an electric signal, associated with an address of at least one memory cell, and an address terminal connected to the conductive path and structured to receive the electric signal. An address decoder may be connected to the address terminal to receive the electric signal. The decoder may have a decoding operative voltage associated therewith. A switch circuit may be structured to electrically connect the address terminal to the supply terminal when the address terminal takes a threshold voltage imposed by the electric signal, and may bring the address terminal to the decoding operative voltage.

Abstract: This description relates to a circuit including a bit line. The circuit further includes at least one memory bank. The at least one memory bank includes at least one memory cell, a first device configured to provide a current path between the bit line and the at least one memory cell when the at least one memory cell is activated, and a second device configured to reduce current leakage between the bit line and the at least one memory cell when the at least one memory cell is deactivated. The circuit further includes a tracking device configured to receive a mirror current substantially equal to a current along the current path, the tracking device configured to have a resistance substantially equal to a cumulative resistance of all memory cells of the at least one memory cell.

Abstract: A semiconductor storage apparatus provides a large capacity phase-change memory possessing high speed operation, low electrical current, and high-reliability. During the period that a read-out start signal is activated in the memory region control circuit, and the block of pairs of sense-latch and write driver is performing the verify read in the upper section memory region, the write enable signals in the memory region control circuit are activated and the block of pairs of sense-latch and write driver performs rewrite operation of the data in the lower section memory region. This type of operation allows cancelling out the time required for the verify read and the time required for the time-division write operation by performing the verify read in one memory region, while performing time-division rewrite in other memory region, to achieve both higher reliability rewrite operation along with suppressing the rewrite operation peak electrical current.

Abstract: Integrated circuits with first-in-first-out (FIFO) buffer circuits are provided. A FIFO may be implemented using multiport memory elements arranged in an array. The array may be coupled to first and second row address decoders and column multiplexers. The first and second row address decoders may be respectively controlled using first and second row address signals, whereas the column multiplexers may be controlled using column address signals. A FIFO control circuit may generate the row and column address signals. In one suitable arrangement, the FIFO control circuit may be configured to compare the first and second row address signals to determine whether read and write access requests can be simultaneously performed. In another suitable arrangement, the FIFO control circuit may be configured to monitor a count value reflective of the number of data words the FIFO is currently storing to determine whether simultaneous read and write access requests are permitted.

Abstract: Embodiments of the invention are related to sense amplifiers. In an embodiment involving a sense amplifier used with a memory cell, signals BL, ZBL, SN and SP are pre-charged and equalized to a voltage reference, e.g., Vref, using an equalizing signal. A compensation signal, e.g., SAC, is applied to compensate for the mismatch between transistors in the sense amplifier. The word line WL is activated to connect the memory cell to a bit line, e.g., bit line ZBL. Because the memory cell shares the charge with the connected bit line ZBL, it causes a differential signal to be developed between bit lines BL and ZBL. When enough split between bit lines BL and ZBL is developed, signals SP and SAE are raised to VDD (while signal SN has been lowered to VSS) to turn on the sense amplifier and allow it to function as desire. Other embodiments and exemplary applications are also disclosed.

Abstract: Each of the core chips includes a data output circuit that outputs read data to the interface chip in response to a read command, and an output timing adjustment circuit that equalizes the periods of time required between the reception of the read command and the outputting of the read data from the data output circuit among the core chips. With this arrangement, a sufficient latch margin for read data to be input can be secured on the interface chip side. Furthermore, as the output timing is adjusted on each core chip side, there is no need to prepare the same number of latch timing control circuits as the number of core chips on the interface chip side.

Abstract: A static memory system with multiple memory cell that, in response to a reset signal, simultaneously resets or clears a segment of the memory cells in the memory. Clearing the entire memory or a portion thereof is accomplished by sequencing though a subset of address bits while asserting the reset signal.

Abstract: A semiconductor memory device includes: a strobe clock generator configured to generate a strobe clock signal having a delay time controlled according to a plurality of test mode signals which are selectively enabled in response to a read signal or write signal; an internal address generator configured to latch an address in response to a first level of the strobe clock signal, and generate an internal address by decoding the address in response to a second level of the strobe clock signal; and an output enable signal generator configured to decode the internal address and generate output enable signals which are selectively enabled.

Abstract: A new address transition detection (ATD) circuit for use on an address bus having a plurality of address signal lines comprises a first circuit for each address signal line and a second circuit. The first circuit has a first input, a second input and an output. The first input is coupled to an address signal line. The second input is coupled to an ATD signal. The first circuit saves the current level of the first input in response to an ATD pulse on the ATD signal and generates a change signal at its output by comparing the current level and the saved level of the first input. The second circuit has an input and an output. The second circuit receives on its input the change signal from the first circuit. In response, the second circuit generates the ATD pulse on the ATD signal at its output.

Abstract: A semiconductor memory device includes a latch address generation unit configured to latch row addresses to generate first and second latch addresses when at least one of memory cells coupled to sub word lines is faulty, wherein the first and second latch addresses select different main word lines, and a repair unit configured to perform a repair operation on memory cells coupled to the main word lines selected by the first and second latch addresses.

Abstract: In an embodiment related to a sense amplifier, the sense amplifier includes a pair of transistors (e.g., transistors P2 and P3) that, when appropriate, enables data on input lines DL and DLB to be preset directly to the internal nodes (e.g., nodes S and SB) of the sense amplifier, from which the data can be read out. In addition, this pair of transistors P2 and P3 also allows the internal nodes S and SB to share the pre-charge mechanisms of lines DL and DLB.

Abstract: A pseudo-dual port memory address multiplexing system includes a control circuit operative to identify a read request and a write request to be accomplished during a single clock cycle. A self time tracking circuit monitors a read operation and generates a switching signal when the read operation is determined to be complete. A multiplexer is responsive to the switching signal for selectively providing a read address and a write address to a memory address unit at the proper time.

Abstract: A pipe register circuit includes an address storage section configured to temporarily and sequentially store address signals input from an external in correspondence with a read command signal input together with the address signals, and an address output control section configured to generate an address output control signal for allowing the address signals stored in the address storage section to be output in correspondence with CAS latency, and output the address output control signal to the address storage section.

Abstract: A data receiver includes a first buffer circuit and a second buffer circuit. The first buffer circuit varies a resistance of a data path and a resistance of a reference voltage path based on a plurality of control signals, and adjusts a voltage level of an input data signal and a level of a reference voltage to generate an internal data signal and an internal reference voltage based on the varied resistance of the data path and the varied resistance of the reference voltage path. The second buffer circuit compares the internal data signal with the internal reference voltage to generate a data signal.

Abstract: A first embodiment of the present invention is a system for generating a voltage comprising a comparator operable to compare an operation voltage to a reference voltage, control logic operable to selectively output as a control signal an incremented signal or a decremented signal based on a comparison of the operation voltage to the reference voltage by the comparator, and a device module operable to increase or decrease the operation voltage based on the control signal.

Abstract: A memory includes a shared I/O unit that is shared between multiple storage arrays provides output data from the arrays. The shared I/O includes an output latch with an integrated output clamp. The I/O unit may be configured to provide output data from the storage arrays via data output signal paths. The I/O unit includes an output latch configured to force a valid logic level on the data output signal paths in response to a power down condition.

Abstract: A method of and apparatus for arbitrating a memory access conflict to a memory array. The apparatus may include selection logic coupled with a plurality of ports and a memory array to arbitrate among a plurality of contending memory access requests and to conditionally block write data from accessing the memory array when write data arrives late in time.

Abstract: To provide a semiconductor device including a temperature detection circuit that detects a temperature of the semiconductor device and outputs temperature information, a counter circuit that takes a count of repeated inputs of a refresh command and outputs count information, a comparison circuit that activates a match signal when the temperature information matches the count information, and a refresh control circuit that controls whether to perform a refresh operation according to activation of the refresh command based on the match signal. According to the present invention, a refresh cycle can be finely adjusted because the repeated inputs of the refresh command are thinned out based on the temperature information. With this configuration, power consumption caused by the refresh operation can be reduced.

Abstract: A tri-state NAND circuit includes a first input connected to receive a first input signal and a second input connected to receive a second input signal. The tri-state NAND circuit is connected to operate in accordance with a first clock signal and a second clock signal. A logic state of the second clock signal is opposite a logic state of the first clock signal. The tri-state NAND circuit is connected to transmit an output signal to a first node. A tri-state latch circuit is connected to hold a signal present at the first node in accordance with the first clock signal and the second clock signal. A pulse generating NAND circuit includes a first input connected to the first node and a second input connected to receive the first clock signal. The pulse generating NAND circuit is connected to transmit an output signal to a second node.

Abstract: Systems and processes may use a first memory, a second memory, and a memory controller. The second memory is at least as large as a block of the first memory. Data is received and stored in the second memory for further writing to the second memory.

Abstract: An on-die termination circuit includes a termination resistor unit connected to an external pin, and a termination control unit connected to the termination resistor unit. The termination resistor unit provides termination impedance to a transmission line connected to the external pin. The termination control unit varies the termination impedance in response to a plurality of bits of strength code associated with a data rate.

Abstract: An address delay circuit of a semiconductor memory apparatus includes a first group control pulse generation unit configured to generate a first control pulse after input of a first group column address strobe pulse and passage of a time corresponding to a first set multiple of one cycle of a clock, a second group control pulse generation unit configured to generate a second control pulse after input of a second group column strobe address pulse and passage of a time corresponding to a second set multiple of the one cycle of the clock, a first address storage unit configured to receive and store a first group external address in response to the first control pulse, and output a first group internal address, and a second address storage unit configured to receive and store a second group external address in response to the second control pulse, and output a second group internal address.

Abstract: A multi-port memory, comprising: a plurality of ports, each port including port input logic that generates a write enable value from received control signals, and a delay stage coupled to store the write enable value from the input stage, and configured to force the write enable value to a disable state in response to an asserted busy signal of the port; and an arbitration circuit coupled to the ports that arbitrates contending accesses to the ports by de-asserting a busy signal to one port, and asserting a busy signal for all other ports.

Abstract: According to one embodiment, a semiconductor storage device includes a cell array, an even line, an odd line, and sense amplifiers. The cell array includes memory cells holding data. The even line connects to the memory cells. The odd line connects to the memory cells. The memory cells connect to an odd column or the even column. Each the sense amplifiers selectively connect to the odd line or the even line. Each the sense amplifiers includes a latch circuit, a first transistor, a second transistor, and a third transistor. The latch circuit includes a first node and a second node, and holds the data supplied to the first node. The first transistor supplies read data to the latch circuit. The second transistor transfers the data held by the latch circuit to the wiring. The third transistor transfers the data held by the latch circuit to the wiring.

Abstract: A multiple-port memory device having at least first and second ports each configured to support read and write operations. The multiple-port memory device further comprises a single-port memory device and control circuitry coupled between the first and second ports and the single-port memory device. The control circuitry is configured to multiplex input signals received over the first and second ports of the multiple-port memory device into respective input time slots of the single port of the single-port memory device, and to demultiplex output time slots of the single port of the single-port memory device into output signals that are supplied over the first and second ports of the multiple-port memory device.

Abstract: A non-volatile memory device includes a memory cell array including a plurality of multi-level cells each storing data corresponding to one of a plurality of states of a first group of states, and a control circuit. The control circuit is configured to program data corresponding to one of the plurality of states in a first multi-level cell according to a first verify voltage level of a first group of verify voltage levels, and to control the first multi-level cell to be re-programmed to one of a plurality of states of a second group of states according to a first verify voltage level of a second group of verify voltage levels. Each voltage level of the second group of verify voltage levels has a higher level than the verify voltage levels of the first group of verify voltage levels.

Abstract: Circuits and methods are described for decoding exemplary memory arrays of programmable and, in some embodiments, re-writable passive element memory cells, which are particularly useful for extremely dense three-dimensional memory arrays having more than one memory plane. In addition, circuits and methods are described for selecting one or more array blocks of such a memory array, for selecting one or more word lines and bit lines within selected array blocks, for conveying data information to and from selected memory cells within selected array blocks, and for conveying unselected bias conditions to unselected array blocks.

Abstract: An apparatus, system, method, and machine-readable medium are disclosed. In one embodiment the apparatus includes an address swap cache. The apparatus also includes memory segment swap logic that is capable of detecting a reproducible fault at a first address targeting a memory segment. Once detected, the logic remaps the first address targeting the faulty memory segment with a second address targeting another memory segment. The logic stores the two addresses in an entry in the address swap cache. Then the memory segment swap logic receives a memory transaction that is targeting the first physical address and use the address to perform a lookup process in the address swap cache to determine if an entry exists that has the faulty address. If an entry does exist for that address, the logic then swaps the second address into the memory transaction for the first address.

Abstract: In a conventional image pickup apparatus, a plurality of reset methods for resetting a photodiode cannot be set. A row selection unit is provided with a first storage unit for storing an address of a read row, a second storage unit for storing an address of a shutter row, and further a third storage unit for storing an address of a row in which potential of photodiode is fixed.

Abstract: A semiconductor device is disclosed which comprises a clock generating circuit generating first and second divided clocks by dividing an input clock by first and second division number, respectively, and a counter circuit including a shift register having a plurality of stages that sequentially shifts an input signal and outputs an output signal delayed based on setting information. The counter circuit individually controls operation timings of the stages of the shift register by selectively supplying either of the first and second divided clocks to each stage of the shift register, and either of signals from the stages of the shift register is extracted and outputted as the output signal.

Abstract: A memory chip includes: a memory region; a chip determining unit configured to perform a chip determination, in writing operation, to determine whether or not the memory region is a writing target on the basis of an inputted address of writing destination, and to output a determination result of the chip determination; an address-cycle identifying unit configured to detect a final cycle of the address of writing destination, and to output a detection result at a timing before the output of the determination result; and a buffer controller configured to switch an input buffer from one state to another on the basis of the determination result, wherein the buffer controller keeps the input buffer in an active state irrespective of the determination result of the chip determination while the address-cycle identifying unit is outputting the detection result.

Abstract: A semiconductor memory device includes a memory cell array including a plurality of memory cells, circuits configured to receive program data when a program operation is performed and output a random signal in response to the program data, and a page buffer configured to logically combine the program data and the random signal and to store the logically combined data in the memory cells.

Abstract: A clock control device includes a set circuit for triggering an input address in response to an internal command signal to output a first address, a shift register including a plurality of flip-flops connected in series wherein some of the flip-flops perform a flip-flop operation of the first address in synchronism with an internal clock to provide a second address and the remaining flip-flops sequentially conduct a flip-flop operation of the second address in synchronism with a synchronous clock to produce an internal address, an active signal generator for outputting an active signal based on state of an active control signal indicating whether or not each bank is activated and a precharge control signal, and a clock generator for generating the synchronous clock depending on the internal clock and the active signal.