Abstract: A magnetic memory device includes a magnetic tunnel junction having a free magnetic layer having a magnetization orientation that is switchable between a high resistance state magnetization orientation and a low resistance state magnetization orientation and a memristor solid state element electrically coupled to the magnetic tunnel junction. The memristor has a device response that is an integrated voltage versus an integrated current.

Abstract: A magnetic memory device includes a magnetic tunnel junction having a free magnetic layer having a magnetization orientation that is switchable between a high resistance state magnetization orientation and a low resistance state magnetization orientation and a memristor solid state element electrically coupled to the magnetic tunnel junction. The memristor has a device response that is an integrated voltage versus an integrated current.

Abstract: Magnetic or magnetoresistive random access memories (MRAMs) are implemented in a variety of arrangements and methods. Using one such arrangement, a matrix is implemented with magnetoresistive memory cells logically organized in rows and columns, each memory cell including a magnetoresistive element. The matrix has a set of column lines, a column line being a continuous conductive strip which is magnetically coupled to the magnetoresistive element of each of the memory cells of a column, wherein each column line has a forward column line and a return column line arranged on opposite sides of the magnetoresistive element and offset from one another for forming a return path for current in that column line.

Abstract: A circuit and system for improving signal integrity in a memory system. The circuit has a transmission line having a dampening impedance between a driver and a branch point of the transmission line. The circuit also has a termination impedance having one end coupled to the transmission line between the dampening impedance and the branch point. The transmission line has branches coupled to memory module interfaces. The branches have respective lengths between the branch point and the memory module interfaces to be configured symmetrically, wherein the branch point is at a point to balance signal transmission on the branches.

Abstract: A three-dimensional memory array includes a plurality of rail-stacks on each of several levels forming alternating levels of X-lines and Y-lines for the array. Memory cells are formed at the intersection of each X-line and Y-line. The memory cells of each memory plane are all oriented in the same direction relative to the substrate, forming a serial chain diode stack. In certain embodiments, row and column circuits for the array are arranged to interchange function depending upon the directionality of memory cells in the selected memory plane. High-voltage drivers for the X-lines and Y-lines are each capable of passing a write current in either direction depending on the direction of the selected memory cell. A preferred bias arrangement reverse biases only unselected memory cells within the selected memory plane, totaling approximately N2 memory cells, rather than approximately 3N2 memory cells as with prior arrays.

Abstract: Various module structures are disclosed which may be used to implement modules having 1 to N channels. Bus systems may be formed by the interconnection of such modules.

Abstract: A disk drive system including a write circuit for controlling current through a magnetic write head includes an H-switch circuit and a charge-pumping circuit. The H-switch circuit controls direction of current through the magnetic write head. The charge-pumping circuit is connected to the H-switch circuit for storing energy during a first state of the H-switch circuit, and delivering energy upon switching from the first state to a second state of the H-switch circuit to accelerate a change in direction of current through the write head.

Abstract: A VBL generation circuit which normally outputs an equalizing potential outputs a potential corresponding to writing data in the test mode and this potential is collectively supplied to the bit lines by an equalizing circuit. In the test mode, a row decoder collectively activates the selected word lines by setting the pre-decode signals RX0 to RX3 to the active condition and by controlling the pre-decode signals X0 to X3 in accordance with the test signal. Accordingly, a writing in of a test pattern, wherein the detection of a short circuit between the storage nodes of memory cells is possible, can be carried out rapidly.

Abstract: A circuit is designed with a first lower conductor (500) having two ends. One end of the first lower conductor is coupled to a first signal source (386). A first upper conductor (544) has two ends and is spaced apart from the first lower conductor by a distance less than an allowable spacing between adjacent lower conductors. One end of the first upper conductor is coupled to a second signal source (384). A second upper conductor (508) has two ends. One end of the second upper conductor is coupled to another end of the first lower conductor for receiving a signal from the first signal source. A second lower conductor (552) has two ends and is spaced apart from the second upper conductor by a distance less than the allowable spacing between adjacent lower conductors. One end of the second lower conductor is coupled to another end of the first upper conductor for receiving a signal from the second signal source.