Uranium Patents (Class 376/164)
  • Patent number: 7599463
    Abstract: A remote sensing device for detecting materials of varying atomic numbers and systems and methods relating thereto. A system for identifying a material includes a photon beam flux monitor for resolving a high-energy beam. A method for identifying a material includes casting an incident photon beam on the material and detecting an emerging photon beam with an array of fission-fragment detectors, a first set of scintillator paddles, and a second set of scintillator paddles.
    Type: Grant
    Filed: October 27, 2003
    Date of Patent: October 6, 2009
    Inventor: Philip L. Cole
  • Patent number: 5838005
    Abstract: Nanometer holes can be reliably and repeatedly defined in the tips of cantilevered probes and used in various types of scanning multiprobe microscopy by defining the hole within a layer disposed on the tip using focused electron or ion beams. The drilling of the hole on the apex of the tip and is stopped just as soon as the hole is defined through an overlying insulating layer under which lies a metallic or semiconductor layer at the apex. The hole is then backfilled with another metallic or semiconductor layer so that an active electrical junction is formed between the two layers through the hole in the insulating layer. The hole may be defined in conductive layers in various combinations with oxide layers, other metal layers and semiconductor materials to define Schottky diodes, thermocouple junctions, near-field optical detectors, and atomic force tips.
    Type: Grant
    Filed: October 16, 1996
    Date of Patent: November 17, 1998
    Assignee: The Regents of the University of California
    Inventors: Arunava Majumdar, Jie Lai, Ke Luo
  • Patent number: 5581083
    Abstract: Nanometer holes can be reliably and repeatedly defined in the tips of cantilevered probes and used in various types of scanning microscopy by voltaicly defining the hole within a conductive layer disposed on the tip. The field strengths of the apex of the tip are sufficient to cause evaporation of the metal or conductive material from the apex onto an opposing sample substrate. The hole opens on the apex of the tip and is self-limited by the inherent threshold voltage strength required for vaporization, which voltage strength falls off rapidly from the tip. The hole may be defined in conductive layers in various combinations with oxide layers, other metal layers and semiconductor materials to define Schottky diodes, thermocouple junctions, near-field optical detectors, and atomic force tips. As a result, two or more physical interactions may be simultaneously exploited between the fabricated tip and the scanned sample from which a scanned image may be produced.
    Type: Grant
    Filed: May 11, 1995
    Date of Patent: December 3, 1996
    Assignee: The Regents of the University of California
    Inventors: Arunava Majumdar, Jie Lai, Ke Luo
  • Patent number: 5267274
    Abstract: A method of analysis of rock samples taken from the bore of a well being drilled or from the Earth's surface and performed upon the apatite grains contained within the samples. The apatite grains are separated from the surrounding rock, polished to expose internal surfaces, and etched with acid to reveal the presence and characteristics of fission tracks within the apatite to determine the geological characteristics of the apatite. The grains containing the apatite are viewed under an optical microscope or other imaging apparatus and apatite crystals or crystal fragments which contain etched fission tracks are selected for analysis. If selected for analysis, measurements may be taken to determine the size and shape of the etched pits intersecting the apatite grain surface. The measurements are taken using a digitizing apparatus interconnected to a computer and containing a point light source superimposed upon the apatite grains viewed through the microscope.
    Type: Grant
    Filed: May 29, 1992
    Date of Patent: November 30, 1993
    Inventor: Raymond A. Donelick
  • Patent number: 4568510
    Abstract: A portable uranium analyzer employs a neutron source and a neutron detector for carrying out an uranium assay along the surface of the earth and a gamma ray detector for carrying out a natural gamma radiation assay along the surface of the earth. The neutron source irradiates the underlying earth formation along an exploration line in either a continuous scan mode or in a plurality of fixed assay points. Prompt or delayed neutrons resulting from neutron fission of any uranium present in the formation are detected and recorded during assaying. The uranium assay and the natural gamma radiation assay are correlated to identify formations suspected of containing uranium.
    Type: Grant
    Filed: April 12, 1983
    Date of Patent: February 4, 1986
    Assignee: Mobil Oil Corporation
    Inventor: Richard L. Caldwell
  • Patent number: 4388266
    Abstract: A method and system for monitoring the ore grade of an uranium bearing fluid mixture. A sample of the fluid mixture is irradiated with neutrons. Delayed fission neutrons resulting from the fission of uranium present in the sample are counted as an indication of uranium ore grade.
    Type: Grant
    Filed: September 17, 1980
    Date of Patent: June 14, 1983
    Assignee: Mobil Oil Corporation
    Inventor: Wyatt W. Givens