Abstract: Some embodiments include a radiographic inspection system, comprising: a detector; a support configured to attach the detector to a structure such that the detector is movable around the structure; a radioisotope collimator; and a collimator support arm coupling the detector to the radioisotope collimator such that the radioisotope collimator moves with the detector.

Abstract: A system and method are provided including an inclusion module to receive a powder sample from a powder source; a computed tomography equipment; a memory for storing program instructions; an inclusion processor, coupled to the memory, and in communication with the inclusion module, and operative to execute program instructions to: receive the powder sample; execute a computed tomography (CT) scan process of the received sample to generate a first dataset including one or more images; identify inclusions in the one or more images, via a segmentation process; reconstruct, via a reconstruction process, the identified inclusion into a 3D representation; measure the identified inclusion; mark the inclusions on one or more image slices from the 3D representations; and determine whether the powder source is contaminated based on the one or more marked images. Numerous other aspects are provided.

Abstract: A ceramic honeycomb filter including a ceramic honeycomb structure having large numbers of flow paths partitioned by porous cell walls, and plugs disposed in the flow paths alternately on the exhaust gas inlet or outlet side, to remove particulate matter from an exhaust gas passing through the porous cell walls; the porous cell walls having porosity of 45-75%, the median pore diameter A (?m) of the cell walls measured by mercury porosimetry, and the median pore diameter B (?m) of the cell walls measured by a bubble point method meeting the formula of 35<(A?B)/B×100?70, and the maximum pore diameter of the cell walls measured by a bubble point method being 100 ?m or less.

Abstract: An imaging system may include a main enclosure having at least one access door that defines a substantially light-tight imaging compartment when the access door is in a closed position. An object platform provided within the main enclosure holds an object to be imaged. A camera system positioned on a first side of the object platform is operable to capture a visible light image of the object. A radiation detector positioned on the first side of the object platform is moveable from a first position to a second position across a field of view of the camera system. The radiation detector is operable to capture a radiographic image of the object by moving the radiation detector from the first position to the second position while detecting radiation from the object.

Abstract: Provided is an optical axis adjustment device for an X-ray analyzer comprising an incident-side arm, a receiving-side arm, an X-ray source, an incident-side slit, and an X-ray detector, wherein the device comprises a shielding strip disposed at a position blocking X-rays received by the X-ray detector from the X-ray source, and a shielding strip-moving device that rotates the shielding strip around the sample axis relative to the optical axis of X-rays reaching the X-ray detector from the X-ray source to two angle positions, and the amount of deviation in parallelism of the surface of a sample with respect to the optical axis of the X-rays is found on the basis of X-ray intensity values found by the X-ray detector for the two angle positions.

Abstract: An optical axis adjustment method for an X-ray analyzer. In a 2?-adjustment step, a 0° position of the rotation of a receiving-side arm and a 0° position of the angle of diffraction 2? are aligned. In a Zs-axis adjustment step, the position of an incident-side slit along a direction orthogonal to the centerline of the X-rays incident upon a sample from an X-ray source is adjusted. In a ?-adjustment step, the centerline of X-rays incident upon the sample from the X-ray source and the surface of the sample are adjusted so as to be parallel. In the 2?-adjustment step, the Zs-axis adjustment step, and the ?-adjustment step, the capability for X-ray intensity positional resolution upon a straight line possessed by a one-dimensional X-ray detector is used to perform 2?-adjustment, Zs-axis adjustment, and ?-adjustment.

Abstract: A microcrystal structure analysis apparatus, a microcrystal structure analysis method, and an X-ray shielding device are provided which allow a favorable X-ray diffraction image to be obtained even when X rays are applied to a pseudo-single-crystallized sample while the sample is rotated.

Abstract: A method for the measurement of pressure in high temperature and high pressure processes includes the steps of providing at least a first material compound and at least a second material compound. The at least first and second compounds are mixed to form a material sample. The material sample is loaded into a device and the device and material sample are subjected to a high pressure of up to about 10 GPa and a high temperature of up to about 2000° C. to form the material sample into a solid crystalline solution. The material sample is recovered for analysis and the composition of the crystalline solid solution is measured to determine the pressure ex situ.

Abstract: The methods of the invention determine the unit cell parameters of a crystalline solid form using diffraction data and applying an algorithm. Using the algorithm, the unit cell parameters may be determined, which may allow one to distinguish between different crystalline solid forms of a substance.

Abstract: A method for automatic determination of the quantitative composition of a powder sample, comprises the following steps: (a) predetermining a list of phases; (b) calculating a theoretical diffraction diagram or theoretical energy-dispersive spectrum; (c) fitting the theoretical diffraction diagram or theoretical energy-dispersive spectrum. In step (a), a list is predetermined which is composed of phases that are actually contained in the powder sample and also phases that are possibly not contained in the powder sample, a threshold value for the phase content is predetermined for each phase, and the following further steps are carried out: (d) elimination of all phases, having phase contents which are below the threshold value, from the list in step (a); (e) repeating steps (b), (c) and (d) with the new list until all phase contents are above their predetermined threshold values; and (f) outputting the composition of the powder sample.

Abstract: A calibration technique is provided that utilizes a standard sample that allows for calibration in the wavelengths of interest even when the standard sample may exhibit significant reflectance variations at those wavelengths for subtle variations in the properties of the standard sample. A second sample, a reference sample may have a relatively featureless reflectance spectrum over the same spectral region and is used in combination with the calibration sample to achieve the calibration. In one embodiment the spectral region may include the VUV spectral region.

Abstract: A sample is supported on a flat rotary specimen stage and irradiated at an incidence angle ? via a divergence slit with an x-ray beam emitted by an x-ray source, the diffraction beam from the sample is received via a divergence slit and the light-receiving slit by an x-ray detector placed at the position of a diffraction angle 2? to generate diffraction beam intensity data, the x-ray incidence angle ? and diffraction angle 2? are fixed at intrinsic values on the sample, the sample is rotated within a plane at designated step angles by the flat rotary specimen stage, the diffraction beam intensity is measured by the x-ray detector in each in-plane rotation step, the variance induced by particle statistics is calculated from the calculated diffraction beam intensities, and the size of the crystallites in the sample is calculated based on the variance induced by the particle statistics.

Abstract: A method for automatic determination of the quantitative composition of a powder sample, comprises the following steps: (a) predetermining a list of phases; (b) calculating a theoretical diffraction diagram or theoretical energy-dispersive spectrum; (c) fitting the theoretical diffraction diagram or theoretical energy-dispersive spectrum. In step (a), a list is predetermined which is composed of phases that are actually contained in the powder sample and also phases that are possibly not contained in the powder sample, a threshold value for the phase content is predetermined for each phase, and the following further steps are carried out: (d) elimination of all phases, having phase contents which are below the threshold value, from the list in step (a); (e) repeating steps (b), (c) and (d) with the new list until all phase contents are above their predetermined threshold values; and (f) outputting the composition of the powder sample.

Abstract: A sample is supported on a flat rotary specimen stage and irradiated at an incidence angle ? via a divergence slit with an x-ray beam emitted by an x-ray source, the diffraction beam from the sample is received via a divergence slit and the light-receiving slit by an x-ray detector placed at the position of a diffraction angle 2? to generate diffraction beam intensity data, the x-ray incidence angle ? and diffraction angle 2? are fixed at intrinsic values on the sample, the sample is rotated within a plane at designated step angles by the flat rotary specimen stage, the diffraction beam intensity is measured by the x-ray detector in each in-plane rotation step, the variance induced by particle statistics is calculated from the calculated diffraction beam intensities, and the size of the crystallites in the sample is calculated based on the variance induced by the particle statistics.

Abstract: The methods of the invention determine the unit cell parameters of a crystalline solid form using diffraction data and applying an algorithm. Using the algorithm, the unit cell parameters may be determined, which may allow one to distinguish between different crystalline solid forms of a substance.

Abstract: An X-ray diffraction measuring apparatus equipped with Debye-Scherrer optical system therein, comprises a generator for generating a characteristic X-ray to be irradiated upon a sample to be measured; an X-ray detector being disposed to surround that sample around; and a focusing arrangement, being disposed between the sample and the X-ray detector, for collecting an X-ray scattering from the sample covering over a predetermined angle, in a peripheral direction, around the sample, and for focusing and irradiating it upon the X-ray detector.

Abstract: A method for successively performing a powder diffraction analysis of at least two powder samples being contained in sample holding means. Use is made of an apparatus comprising:—a source of radiation being adapted to direct a radiation beam to a power sample,—a detector for detecting diffraction radiation of a powder sample,—a drive means associated with said sample holding means for effecting a movement of an irradiated powder sample during irradiation and detection. The method comprises the steps of irradiating a powder sample and detecting the diffraction radiation of the powder sample, arranging a further powder sample such that said radiation beam is directed to said further powder sample, and irradiating said further powder sample and detecting the diffraction radiation of said further sample. During irradiation and detecting of each sample the drive means effect a movement of the irradiated sample with respect to the radiation beam for the purpose of improving particle statistics.

Abstract: The present invention discloses an XRD means for identifying the content of a volume of interest (VOI) and a method thereof. A remote XRD means is comprised inter alia of a plurality of x-ray sources target toward the VOI. A plurality of x-ray detectors adapted to receive diffracted X-rays. A processor adapted to measure the diffracted x-ray patterns. A database comprising records of patterns parameters; and, an alerting means adapted for identifying material as one of the predetermined groups in the record. This invention also discloses a method of acquiring XRD image of a material in a VOI, comprised of receiving VOI coordinates; irradiating the material in the VOI; acquiring, extracting and converting of XRD patterns of the VOI to standard powder X-ray diffraction spectrum; matching records in a database for material identification; and alerting when the material is in a matching predetermined record.

Abstract: An X-ray detection and inspection system is disclosed. The system includes an X-ray source configured to generate an interrogating X-ray beam, wherein the X-ray beam is directed towards a probe volume in a sample, one or more two-dimensional area detectors, wherein the one or more detectors are positioned at angles other than 90 degrees with respect to the direction of the interrogating beam and are configured to receive and detect non-circular conic sections of diffracted X rays from the probe volume, and an acquisition and analysis system configured to generate position and intensity data of the non-circular conic sections such that the corresponding mathematical equations of the conic sections could be generated, to identify one of a quasi-monochromatic or monochromatic XRD pattern from the non-circular conic sections, and to determine a position of the probe volume and at least two Bragg diffraction angles from said XRD pattern.

Abstract: An X-ray diffraction measuring apparatus equipped with Debye-Scherrer optical system therein, comprises a means for generating a characteristic X-ray to be irradiated upon a sample to be measured; an X-ray detector means being disposed to surround that sample around; and a focusing means, being disposed between the sample and the X-ray detector means, for collecting an X-ray scattering from the sample covering over a predetermined angle, in a peripheral direction, around the sample, and thereby irradiating it upon the X-ray detector means.

Abstract: A method for determining atomic level structures of macromolecule-ligand complexes through high-resolution powder diffraction analysis and a method for providing suitable microcrystalline powder for diffraction analysis are provided. In one embodiment, powder diffraction data is collected from samples of polycrystalline macromolecule and macromolecule-ligand complex and the refined structure of the macromolecule is used as an approximate model for a combined Rietveld and stereochemical restraint refinement of the macromolecule-ligand complex. A difference Fourier map is calculated and the ligand position and points of interaction between the atoms of the macromolecule and the atoms of the ligand can be deduced and visualized. A suitable polycrystalline sample of macromolecule-ligand complex can be produced by physically agitating a mixture of lyophilized macromolecule, ligand and a solvent.

Abstract: A method and system for indexing powder diffraction data are disclosed comprising choosing a maximum impurity peak tolerance level for a crystallography data search, choosing a range of number of calculated peaks for possible indexing solutions having a minimum number of peaks and a maximum number of peaks, selecting a crystal system to search, selecting powder extinction classes to search for indexing solutions, performing an exhaustive unit cell search of each of the selected powder extinction classes using a successive dichotomy approach to determine a set of indexing results, and ranking the obtained solutions according to likelihood.

Abstract: High-resolution powder diffraction is performed using high-energy synchrotron radiation as an x-ray source in such a way that a detector mounted on a measuring instrument such as a diffractometer is moved by smaller distances than the distance between adjacent x-ray detection units (pixels) in order to measure data for interpolation between pixels and the obtained interpolating data are put together to thereby improve the spatial resolution in measurement that has been limited by the detection unit in the detector.

Abstract: An apparatus and process for forming an array of powder samples arranged in predefined locations where all samples have a flat surface in a common plane has been developed. A monolithic block having a main support section having at least N perforations from a first surface of the main support through a second surface of the main support in predefined locations, where N is the number of samples in the array is provided. The monolithic block also has a flat support section covering the perforations of the main support section. All N samples are loaded simultaneously with sample X in perforation X of the main support where X is an integer from 1 to N. A flat surface of each sample where the flat surfaces are a common plane is formed by forcing the samples within the perforations against the flat support.

Abstract: The invention provides for the making of <200 nm wavelength fluoride crystal optical elements from selected fluoride single crystals of determined quality. The invention relates to a method of determining the optical quality of a fluoride single crystal. The method according to the invention is characterised in that it comprises the following steps: (a) irradiating at least one volume element of the fluoride single crystal, along at least one given family of crystalline planes with a hard X-ray beam, in order to obtain a picture of the diffraction in transmission mode of the hard X-rays across this at least one volume element along this at least one family of crystalline planes, (b) studying the picture obtained in step (a), and (c) calculating the mosaicity of the at least one volume element along the at least one family of crystalline planes, from the study of step (b). The invention finds application in the field of the optical industry.

Abstract: The apparatus comprises an X-ray source (112), a monochromator (118), a goniometer (170), a position sensitive detector (150), a mechanism to rock or rotate the sample or the X-ray source and computer means (160) for interpreting the data obtained at the position sensitive detector. The method of the present invention includes the steps of generating an X-ray; narrowing the wavelength of the X-ray beam; allowing the particles to diffract the beam; detecting the diffracted beam with a position sensitive detector, collecting the diffraction data from individual particles; rocking or rotating the specimen or the X-ray source for successive times to cover the angular range of reflection of the particles; compilation of the diffraction data in the computer memory to construct the intensity profile for the individual particles; and interpreting the data to determine particle size and particle size distribution.

Abstract: A method for quantitatively determining the phase composition of a sample mixture that comprises two or more textured polycrystalline materials, based on corrected and integrated x-ray diffraction intensities. The effect of texture has been analytically eliminated from such corrected and integrated x-ray diffraction intensities, based on the texture information obtained from the sample mixture.

Abstract: A process of forming an array of powder samples arranged in predefined locations where all samples have a flat surface in a common plane has been developed. A main support having at least N perforations from a first surface of the main support through a second surface of the main support in predefined locations, where N is the number of samples in the array is provided. The main support is equipped with a flat support temporarily attached to its first surface. All N samples are loaded simultaneously with sample X in perforation X of the main support where X is an integer from 1 to N. A flat surface of each sample where the flat surfaces are a common plane is formed by forcing the samples within the perforations against the flat support. The samples are retained in position within the perforations against the flat support, and are made ready for analysis by exposing the flat surfaces of the samples by removing the flat support.

Abstract: A method and apparatus for continuously presenting a sample from a stream of particulate material which contains crystalline substances and for effectively continuously analysing the sample by X-ray diffraction are provided. An extracted sample flow is fed onto a continuously moving carrier and its surface smoothed and flattened for X-ray diffraction patterns to be detected and analysed to provide a compositional analysis for the crystalline substances. The sample is continuously removed from the carrier prior to further sample being fed onto the carrier. The invention is particularly applicable for phase composition analysis of cement and cement clinker and provides an effectively continuous analysis substantially in real time in contrast to prior art laboratory analyses of discrete samples.

Abstract: A method for rapidly screening multiple X-ray powder diffraction patterns, such as those generated through combinatorial chemistry, has been developed. The method is directed toward measuring X-ray powder diffraction patterns of a set of samples, factoring the patterns using a suitable statistical technique into a small number of discrete components or factors, determining the scores corresponding to the factors for each X-ray powder diffraction pattern, and plotting the scores. The graphs of the scores are then inspected for clusters, trends, or outliers, which may represent new material or, perhaps, faulty data.

Abstract: Evolutionary algorithms are used to find a global solution to the fitting of experimental X-ray scattering data to simulated models. A recombination operator combines two or more parameter vectors from one iteration of simulated scattering data to form a new parameter vector for the next iteration, in a manner such that there is a high probability that the new parameter will better fit the experimental data than any of the parent parameters. A mutation operator perturbs the value of a parent vector, to permit new regions of the error function to be examined, and thereby avoid settling on local minima. The natural selection guarantees that the parameter vectors with the best fitness will be propagated into future iterations.

Abstract: The present invention relates to a sample holder to be used with an x-ray powder diffractometer. One of the novel features resides in the fact that the sample holder is made of single crystal silicon grown in the [100] direction. This sample holder may have a cavity therein for holding a powder sample.

Abstract: In a stimulable phosphor powder diffraction apparatus, a circularly symmetric diffraction pattern is recorded in the stimulable phosphor. The 2-D diffraction pattern is read out, and the resulting signal is processed to produce a 1-D signal representing the average of the 2-D diffraction pattern at points equidistant from the center of the diffraction pattern.

Abstract: A method for quantitatively analyzing solid mixtures of a crystalline ingredient and an excipient component in commercial pharmaceutical tablets by x-ray powder diffractometry using the intact tablet as is, without special sample preparation.The method comprises the steps of:irradiating the table with x-rays in a powder x-ray diffraction device and determining the integrated intensity of diffracted x-rays, I, at an angular range producing at least one x-ray diffraction line characteristic of said crystalline ingredient;determining the ratio of said value I to a diffracted x-ray intensity value, I.sub.o, obtained on a second compressed tablet consisting of said crystalline ingredient at said angular range; andcomparing the determined ratio I/I.sub.o to a set of predetermined standard values of said ratio for known mixtures of said crystalline ingredient and said excipient component to quantitate said crystalline ingredient in said first compressed tablet.

Abstract: A system and method is disclosed for minimizing residual vibration of a radiographic system due to rapid movement of a radiographic film cassette between a park and expose position. The cassette is moved by a servo system including a servo motor which is responsive to a voltage input waveform to drive the cassette. A waveform is chosen for the voltage input such that no impulse derivatives appear until the waveform has been differentiated at least three times. The primary natural resonant frequency of the system is determined and noted. The duration of the selected input waveform is adjusted such that the frequency spectrum of the adjusted input waveform defines a relative null which approximately coincides with the primary resonant frequency. The amplitude of the voltage input waveform is then further adjusted as a function of the distance to be traveled by the cassette between the park and expose positions.

Abstract: A wavelength dispersive X-ray spectrometer is provided with a polycrystalline analyzer for analyzing characteristic spectra of a sample. The polycrystalline analyzer provides a multiple spectrum of characteristic lines which are separated by appropriate pulse height analysis. Each of these sets of characteristic lines of the elements of the sample are provided at different dispersion and wavelength ranges.

Abstract: A sample changer for powder X-ray diffractometry includes a cylindrical dispensing container for holding a stack of pre-test sample holders, a cylindrical receiving container for holding a stack of post-test sample holders and a changer arm which automatically picks up the topmost sample disk in the dispensing container and rotatably positions the sample disk on the sample holder stage of an X-ray diffractometer for analysis. After analysis, the changer arm removes the sample holder and releases it into the receving container. The sample holders have a circumferential groove which coacts with semi-circular rotatable cams positioned on the distal end of the changer arm to enable the changer arm to lift and place the sample holders.

Abstract: An apparatus for performing extend X-ray absorption fine structure (EXAFS) measurements on materials. The EXAFS apparatus is constructed using a conventional X-ray powder diffractometer assembly with a rotating anode X-ray source affixed to the diffractometer assembly, a monochromator crystal rotatably positioned at the center of the assembly and a specimen stage and detectors slidingly mounted on a receiving track of the assembly. The monochromator crystal is automatically and elastically distorted to provide a monochromatic X-ray beam flux from the crystal. The angle of incidence of the source X-ray beam with the crystal surface is changed to provide a different monochromatic X-ray wavelength with changing energy, which enables measurement of the desired EXAFS spectra for the material.

Abstract: An external standard intensity ratio method is used for quantitatively determining mineralogic compositions of samples by x-ray diffraction. The method uses ratios of x-ray intensity peaks from a single run. Constants are previously determined for each mineral which is to be quantitatively measured. Ratios of the highest intensity peak of each mineral to be quantified in the sample and the highest intensity peak of a reference mineral contained in the sample are used to calculate sample composition.

Abstract: An X-ray diffraction camera which rotates a sample about two generally normal axes while simultaneously rotating the sample about a third axis which changes in angular relationship relative to the two normal axes, said camera further providing linear reciprocation of the sample along said third axis.

Abstract: An X-ray diffraction camera having a hypocycloidal gear train adapted to cause rotation of the sample within the camera about two generally normal axes.