Manufacturing Or Product Inspection Patents (Class 382/141)
  • Patent number: 9702827
    Abstract: Methods and systems for selecting one or more modes of an inspection subsystem or system for inspection of a specimen are provided. The systems described herein are configured to acquire output for all of the modes to be considered at a location of a known defect on the specimen by aligning output, which is generated at the location with a mode known to generate output in which patterned features on the specimen are resolved to a degree that allows the output to be aligned to design data, with the design data for the specimen to identify the location with substantially high accuracy and then without moving the field of view of the inspection subsystem or system from that location, acquiring the output for all other modes. All of the acquired output can then be used to select mode(s) for inspection of the specimen or another specimen of the same type.
    Type: Grant
    Filed: November 19, 2015
    Date of Patent: July 11, 2017
    Assignee: KLA-Tencor Corp.
    Inventors: Bjorn Brauer, Ravikumar Sanapala
  • Patent number: 9691156
    Abstract: The invention relates to a labeling apparatus (1) for labeling structures of an object shown in an object image. A probability map providing unit (3) provides a probability map, the probability map indicating for different labels, which are indicative of different structures of the object, and for different positions in the probability map the probability that the respective structure, which is indicated by the respective label, is present at the respective position, wherein the probability depends on the position in the probability map. The probability map is mapped to the object image by a mapping unit (4), wherein a label assigning unit (5) assigns to a provided contour, which represents a structure in the object image, a label based on the mapped probability map. This allows automatically labeling structures of the object, which are indicated by provided contours in the object image, with relatively low computational efforts.
    Type: Grant
    Filed: January 28, 2013
    Date of Patent: June 27, 2017
    Assignee: KONINKLIJKE PHILIPS N.V.
    Inventors: Torbjørn Vik, Daniel Bystrov, Heinrich Schulz, Nicole Schadewaldt, Jochen Peters
  • Patent number: 9678187
    Abstract: An object of the present invention is to suppress artifacts generated by correction of spectral distortion induced by eddy currents in MRI devices with a simple method, and thereby improve accuracy of the correction.
    Type: Grant
    Filed: July 27, 2012
    Date of Patent: June 13, 2017
    Assignee: Hitachi, Ltd.
    Inventors: Toru Shirai, Yoshitaka Bito, Satoshi Hirata, Yoshihisa Soutome
  • Patent number: 9664624
    Abstract: A device for testing an application state of a plurality of strips of fiber reinforced plastic tape affixed in rows on a surface of a structure, the device includes an illumination component emits observation-use illuminating light beams toward a test region of the fiber reinforced plastic tape, an observation component observes reflected light from the test region, and a testing component tests the application state of the fiber reinforced plastic tape based on an image observed by the observation component. The illumination component includes a plurality of irradiation units that light simultaneously and are disposed such that a pair of the observation-use illuminating light beams are emitted from directions that are mutually symmetrical with respect to a normal line of the test region, and an illumination direction change component that changes the directions of the pair of observation-use illuminating light beams emitted from the illumination component about the normal line.
    Type: Grant
    Filed: May 27, 2013
    Date of Patent: May 30, 2017
    Assignee: TORAY ENGINEERING CO., LTD.
    Inventors: Hiromichi Sasamoto, Hisashi Kobayashi, Yoshio Nogami
  • Patent number: 9646425
    Abstract: A system is provided for programming workpiece feature inspection operations for a coordinate measuring machine. The system includes a computer-aided design (CAD) file processing portion and a user interface comprising a 3D view, and editable plan representation. Both the 3D view and the editable plan representation are configure to be automatically responsive to operations in a first set of editing operations, regardless of whether the operations are performed in the 3D view or the editable plan representation of the user interface. The first set of editing operations may comprise deleting (or adding) at least one workpiece feature in the 3D view or the editable plan representation of the user interface, for example. Various other portions of the system (e.g. other user interface windows) may also be automatically responsive to the first set of editing operations, regardless of where the editing operations are performed in the user interface.
    Type: Grant
    Filed: May 4, 2015
    Date of Patent: May 9, 2017
    Assignees: Mitutoyo Corporation, Mitutoro Europe GMBH
    Inventors: Dahai Yu, Eric Yeh-Wei Tseo
  • Patent number: 9645012
    Abstract: Systems and methods for infrared thermographic inspection of large-scale composite structures such as sections of an aircraft fuselage. Optical metrology is used to precisely locate the infrared images relative to a three-dimensional coordinate system of the composite structure. The optical metrology may comprise laser tracking or photogrammetry or both. In some embodiments, the optical metrology comprises laser tracking merged with photogrammetry. Once the infrared images have been precisely located relative to the coordinate system of the composite structure, structural data about the composite structure (e.g., thickness data) can be retrieved from a database containing a three-dimensional model of the composite structure. In the case of thermographic porosity measurements, the infrared imaging data can be correlated with thickness data to determine the porosity of the composite structure in the inspection area.
    Type: Grant
    Filed: August 17, 2015
    Date of Patent: May 9, 2017
    Assignee: The Boeing Company
    Inventors: Bobby J. Marsh, Gary E. Georgeson, Jeffrey R. Thompson
  • Patent number: 9646374
    Abstract: Optical image data is acquired by irradiating a pattern with light emitted from a light source. A threshold value is specified by internally dividing a minimum value and a maximum value of a signal amount of reference image data by a division ratio. A position corresponding to a signal amount of a threshold value is determined as an edge of a pattern of the reference image data. A position of a signal amount equal to the threshold value is determined as an edge of the pattern of the optical image data. A line width error is obtained as a difference between a first line width of the optical image data and a second line width of the reference image data. A new threshold value is specified in the case of fluctuation of a light quantity of the light source or decrease of a contrast value of the optical image data.
    Type: Grant
    Filed: February 24, 2016
    Date of Patent: May 9, 2017
    Assignee: NuFlare Technology, Inc.
    Inventors: Hideaki Hashimoto, Hideki Nukada, Kazuhiko Inoue
  • Patent number: 9638648
    Abstract: A method and system for inspecting an object is provided. In accordance with embodiments of the method, a thermal excitation pulse is applied to an object undergoing evaluation. A transient thermal signal from the object is detected in response to the thermal excitation pulse. Two or more orthogonal functions are applied to the transient thermal signal based on a defined time interval to generate two or more orthogonal components. The object is assessed for defects at different depths using the two or more orthogonal components.
    Type: Grant
    Filed: March 29, 2012
    Date of Patent: May 2, 2017
    Assignee: General Electric Company
    Inventors: Yuri Alexeyevich Plotnikov, Harry Israel Ringermacher
  • Patent number: 9630212
    Abstract: A method of forming a multi-layer paint film comprising coating an aqueous first colored base paint (A) on an electro-deposition paint cured paint film to form a first colored base paint film, coating an aqueous second colored base paint (B) on the first colored base paint film without preliminary heating of the first colored base paint film to form a second colored base paint film, coating a clear paint (C) coated on the second colored base paint film after preliminary heating of the first paint film and second paint film to form a clear paint film, and heating and curing the three paint films at the same time, wherein a talc pigment is included in each of paint (A) and paint (B) in an amount of from 1 to 5 mass % with respect to the total resin solid fraction of each of paint (A) and paint (B).
    Type: Grant
    Filed: March 31, 2010
    Date of Patent: April 25, 2017
    Assignees: BASF Japan Ltd., Mazda Motor Corporation
    Inventors: Eishi Tsukamoto, Masazumi Maekawa, Shigeyuki Mizuno, Takakazu Yamane, Kazuhi Koga, Sakura Nakano
  • Patent number: 9626731
    Abstract: Input amount calculation processing and output amount calculation processing corresponding to each processing module are defined. The input amount calculation processing and the output amount calculation processing are performed in a processing order (a reverse order to the processing order) to obtain a favorable peripheral pixel amount.
    Type: Grant
    Filed: August 28, 2013
    Date of Patent: April 18, 2017
    Assignee: Canon Kabushiki Kaisha
    Inventor: Michiaki Takasaka
  • Patent number: 9613258
    Abstract: This disclosure concerns image quality assessment. In particular, there is described a computer implemented method, software, and computer for assessing the quality of an image. For example but not limited to, quality of the image of a face indicates the suitability of the image for use in face recognition. The invention comprises determining (112) a similarity of features of two or more sub-images of the image (608) to a model (412) of the object which is based on multiple training images (612) of multiple different objects of that type. The model (412) is comprised of sub-models (406) and each sub-model (406) corresponds to a sub-image of the image (608). Determining similarity is based on the similarity of features of each sub-image to features modelled by the corresponding sub-model. It is an advantage that no input parameters are required for quality assessment since the quality of the image can be determined from only the similarity between the image and the same, therefore single generic, model.
    Type: Grant
    Filed: February 20, 2012
    Date of Patent: April 4, 2017
    Assignee: iOmniscient Pty Ltd
    Inventors: Shaokang Chen, Yong Kang Wong
  • Patent number: 9609473
    Abstract: The embodiments of the present invention disclose a service processing method and apparatus based on location information. The method comprises: acquiring, by an application server, a positioning signal sent by a positioning terminal; determining, by the application server, location information about the positioning terminal according to the positioning signal; and sending, by the application server, service processing information to an application client and/or a positioning terminal according to a service processing rule and based on the location information about the positioning terminal. The present invention achieves the technical effect of the application server sending adaptive service processing information to the application client and/or the positioning terminal according to different service processing rules, optimizes the existing location-based service technology, and meets the growing demand of people for individual and customized location-based services.
    Type: Grant
    Filed: December 31, 2014
    Date of Patent: March 28, 2017
    Assignee: Baidu Online Network Technology (Beijing) Co., Ltd.
    Inventor: Baolong Zhang
  • Patent number: 9589346
    Abstract: Disclosed herein are systems and method for segmentation and identification of structured features in images. According to an aspect, a method may include representing an image as a graph of nodes connected together by edges. For example, the image may be an ocular image showing layered structures or other features of the retina. The method may also include adding, to the graph, nodes adjacent to nodes along first and second sides of the graph. The added nodes may have edge weights less than the nodes along the first and second sides of the graph. Further, the method may include assigning start and end points to any of the added nodes along the first and second sides, respectively. The method may also include graph cutting between the start and end points for identifying a feature in the image.
    Type: Grant
    Filed: February 21, 2016
    Date of Patent: March 7, 2017
    Assignee: Duke University
    Inventors: Sina Farsiu, Stephanie J. Chiu, Cynthia A. Toth, Josheph A. Izatt, Xiao T. Li, Peter Christopher Nicholas
  • Patent number: 9589079
    Abstract: A method for designing a photovoltaic (PV) system is implemented by a design automation computer system. The method includes receiving a set of site data, receiving a system type selection, receiving a plurality of system component selections, receiving a plurality of PV layout preferences, determining a PV module layout by iteratively applying a first layout algorithm to the set of site data and the plurality of PV layout preferences, the PV module layout defining a placement of a plurality of PV modules of a PV system, determining a structural layout, an electrical design, and an electrical layout based on the PV module layout, determining a bill of materials based on the PV module layout, the structural layout, and the electrical layout, and designing the PV system using the structural layout, the electrical design, the electrical layout, the PV module layout, and the bill of materials.
    Type: Grant
    Filed: November 17, 2014
    Date of Patent: March 7, 2017
    Assignee: SunEdison, Inc.
    Inventors: Andrew Joseph Morse, Nagendra Srinivas Cherukupalli, Ravi Ranganathan, Krishnan Ramagopal
  • Patent number: 9552634
    Abstract: Automated systems, methods and tools that automatically extract and select portions of an image to automatically generate a premium finish mask specific to the image which require little or no human intervention are presented. Graphical user interface tools allowing a user to provide an image and to indicate regions of the image for application of premium finish are also presented.
    Type: Grant
    Filed: February 2, 2016
    Date of Patent: January 24, 2017
    Assignee: Cimpress Schweiz GmbH
    Inventor: Vyacheslav Nykyforov
  • Patent number: 9549125
    Abstract: An imaging device may be configured to monitor a field of view for various objects or events occurring therein. The imaging device may capture a plurality of images at various focal lengths, identify a region of interest including one or more semantic objects therein, and determine measures of the levels of blur or sharpness within the regions of interest of the images. Based on their respective focal lengths and measures of their respective levels of blur or sharpness, a focal length for capturing subsequent images with sufficient clarity may be predicted. The imaging device may be adjusted to capture images at the predicted focal length, and such images may be captured. Feedback for further adjustments to the imaging device may be identified by determining measures of the levels of blur or sharpness within the subsequently captured images.
    Type: Grant
    Filed: September 1, 2015
    Date of Patent: January 17, 2017
    Assignee: Amazon Technologies, Inc.
    Inventors: Dushyant Goyal, Pragyana K. Mishra
  • Patent number: 9542605
    Abstract: It is provided a state recognition system configured to recognize a state of a traveling road on which a vehicle travels, the state recognition system being configured to: select a substance adhered on a lens of a camera mounted on the vehicle in an image captured by the camera; and determine whether the traveling road is on-road or off-road by determining a type and an amount of the selected adhered substance.
    Type: Grant
    Filed: July 3, 2013
    Date of Patent: January 10, 2017
    Assignees: CLARION CO., LTD., NISSAN MOTOR CO., LTD.
    Inventors: Katsuyuki Nakamura, Kota Irie, Masahiro Kiyohara, Osamu Fukata, Yasuhisa Hayakawa
  • Patent number: 9535809
    Abstract: A collaboration system may include a first computing device that may communicate with at least one other computing device via a computing network. The computing network may communicatively couple to a number of computing devices and the first computing device may receive inspection data acquired by one or more non-destructive testing (NDT) devices. After receiving the inspection data, the first computing device may determine at least one of a workflow for analyzing the inspection data based on the inspection data, a layout configured to display the inspection data, or a set of tools configured to analyze the inspection data. The first computing device may then implement the workflow, display the inspection data according to the layout, and/or display the set of tools. The workflow may include one or more processes that may be used to analyze the inspection data.
    Type: Grant
    Filed: January 22, 2013
    Date of Patent: January 3, 2017
    Assignee: General Electric Company
    Inventors: Sekhar Soorianarayanan, Michael Christopher Domke, Jason Howard Messinger, Thomas Eldred Lambdin, Charles Burton Theurer, Robert Carroll Ward, Susan Montagna, Scott Leo Sbihli
  • Patent number: 9529279
    Abstract: A method and apparatus for inspection and review of defects is disclosed wherein data gathering is improved. In one embodiment, multiple or segmented detectors are used in a particle beam system.
    Type: Grant
    Filed: October 4, 2006
    Date of Patent: December 27, 2016
    Assignee: KLA-Tencor Corporation
    Inventors: David Adler, Kirk Bertsche, Mark McCord, Stuart Friedman
  • Patent number: 9530114
    Abstract: Methods and several apparatus embodiments are disclosed operating Optical Characteristic Systems (OCS) in a container storage and/or transfer yard supporting the automated recognition of container codes displayed on various sides of the containers being stored and/or transferred. At least one processor may initiate an operational process by an OCS mounted on a container handler to create an operational result, select the operational process based upon an operational schedule and communicate with at least one OCS to receive an image of a container being handled by the container handler to at least partly create a container code estimate for a container inventory management system. A program system directing at least one computer implementing these operations, and may reside in computer readable memory, an installation package and/or a download server. The computer readable memory may or may not be accessibly coupled to the computer.
    Type: Grant
    Filed: July 16, 2013
    Date of Patent: December 27, 2016
    Assignee: HKI Systems and Service, LLC
    Inventors: Henry King, Toru Takehara
  • Patent number: 9524545
    Abstract: An apparatus for verifying an inspection result includes an inspection result obtaining unit to obtain inspection result indicating defect amount and defect position in a scanned image, from an inspection result of defect judgment of the scanned image with respect to an inspection reference image, the defect judgment being performed through dividing at least one of the scanned image and the inspection reference image and conducting position matching of the scanned image and inspection reference image; and a verification unit to count defect amount occurring to the scanned image, to determine whether a defect pattern occurring to the scanned image matches a pre-set condition corresponding to a false detection condition causable by failure of the position matching, and to determine that defect occurring to the scanned image is a false detection when the counted defect amount is a threshold or more, and the defect pattern matches the false detection condition.
    Type: Grant
    Filed: September 15, 2014
    Date of Patent: December 20, 2016
    Assignee: Ricoh Company, Ltd.
    Inventor: Takahiro Fukase
  • Patent number: 9519963
    Abstract: A product testing apparatus is described as having one or more imager configured to capture one or more images of a sample having a substrate coating applied to a substrate, a processor in communication with the imager, and a non-transitory processor readable medium, in communication with the processor. The non-transitory processor readable medium stores processor executable instructions that when executed cause the processor to receive the one or more images from the one or more imager. The processor then processes the one or more image by filtering lighting variations in the pixels of the one or more images to identify one or more objects of interest in the one or more images of the cured/uncured substrate coating. The processor quantifies one or more property of the one or more objects of interest. The processor executable instructions then cause the processor to generate one or more signal indicative of the quantification of the one or more objects of interest.
    Type: Grant
    Filed: May 2, 2014
    Date of Patent: December 13, 2016
    Assignee: HERCULES LLC
    Inventors: Bruce K Fillipo, Sowmitri Tarimala
  • Patent number: 9519960
    Abstract: A method for estimating a number of objects is to be implemented by a processing module, and is utilized to estimate a number of a plurality of objects having elongated shapes based on an image of the objects that contains substantially-circular end faces of the objects. The method includes steps of generating a characteristic image based on the image of the objects, the characteristic image containing a plurality of characteristic patterns which are associated with the end faces of the objects, calculating a number of the characteristic patterns based on the characteristic image, and obtaining an estimated number of the objects based on at least the number of the characteristic patterns thus calculated.
    Type: Grant
    Filed: June 15, 2015
    Date of Patent: December 13, 2016
    Assignee: National Applied Research Laboratories
    Inventors: Chung-I Huang, Chien-Hao Tseng, Fang-Pang Lin
  • Patent number: 9508139
    Abstract: An inspection apparatus includes an imaging unit producing image signals; a processing unit for receiving the image signal; the imaging unit producing a stack of images of an article at different focal lengths in response to the processing unit; the processing unit generating a depth map from the stack of images; the processing unit analyzing the depth map to derive a depth profile of an object of interest; the processing unit determining a surface mean for the article from the stack of images; and the processing unit characterizing the article as degraded or contaminated in response to the depth profile and the surface mean.
    Type: Grant
    Filed: June 15, 2012
    Date of Patent: November 29, 2016
    Assignee: SIKORSKY AIRCRAFT CORPORATION
    Inventors: Myra A. Torres, Abhijit Bhoite, Nikhil Beke, Kevin Patrick McCormick, Timothy Duffy, Jeremy W. Sheaffer, Maksim Bobrov, Michael Moore
  • Patent number: 9506840
    Abstract: A marking device of the present invention includes a sequence of two belt conveyers for conveying a tire after undergoing a test by a tire testing machine, a pair of laser sensors each installed in a predetermined position in a conveyance direction of the tire by the belt conveyer, and adapted to detect an edge of the tire, and a controller for controlling a motor for driving the belt conveyer based on an output from the laser sensor. The controller is operable to convey the tire by a conveyance distance calculated based on a distance from an installing position of the laser sensor to a print position, an outer diameter of the tire and a predetermined mark position when the edge of the tire is detected by the laser sensor, and then to stop the tire, whereby the mark position of the tire is aligned with the print position.
    Type: Grant
    Filed: May 12, 2014
    Date of Patent: November 29, 2016
    Assignee: Kobe Steel, Ltd.
    Inventor: Takehiko Wakazono
  • Patent number: 9501498
    Abstract: An object recognition ingestion system is presented. The object ingestion system captures image data of objects, possibly in an uncontrolled setting. The image data is analyzed to determine if one or more a priori know canonical shape objects match the object represented in the image data. The canonical shape object also includes one or more reference PoVs indicating perspectives from which to analyze objects having the corresponding shape. An object ingestion engine combines the canonical shape object along with the image data to create a model of the object. The engine generates a desirable set of model PoVs from the reference PoVs, and then generates recognition descriptors from each of the model PoVs. The descriptors, image data, model PoVs, or other contextually relevant information are combined into key frame bundles having sufficient information to allow other computing devices to recognize the object at a later time.
    Type: Grant
    Filed: February 16, 2015
    Date of Patent: November 22, 2016
    Assignee: Nant Holdings IP, LLC
    Inventors: Kamil Wnuk, David McKinnon, Jeremi Sudol, Bing Song, Matheen Siddiqui
  • Patent number: 9501388
    Abstract: A method for updating a test description for an automated computer test. The method includes comparing a received image from the system under test with one or more existing reference images to identify an expected image. If the expected image is not identified, the method further includes obtaining metadata for the expected image, using a processing device to create a new reference image using, at least, the said metadata, storing the new reference image using a storage device, updating the test description using the new reference image, and utilizing the updated test description in a further automated computer test.
    Type: Grant
    Filed: March 6, 2015
    Date of Patent: November 22, 2016
    Assignee: TESTPLANT EUROPE LIMITED
    Inventors: Jonathan D. Gillaspie, Antony Edwards, Robert McDougall
  • Patent number: 9488815
    Abstract: An pattern evaluation method includes a step of estimating imaging deviation allowed to evaluate an overlay position on one or more evaluation point candidates based on pattern layout information, a step of deciding one or more evaluation points from among the evaluation point candidates based on the allowed imaging deviation, a step of deciding an imaging sequence for imaging the selected evaluation point, and a step of evaluating an overlay position between first and second patterns based on an image obtained by imaging the evaluation point according to the imaging sequence.
    Type: Grant
    Filed: January 30, 2013
    Date of Patent: November 8, 2016
    Assignee: Hitachi High-Technologies Corporation
    Inventors: Atsushi Miyamoto, Mayuka Osaki, Maki Kimura, Chie Shishido
  • Patent number: 9466012
    Abstract: A computing device uses image metadata to perform a first sub-classification of an image, wherein the first sub-classification is deterministic, then uses a combination of image data and the image metadata to perform a second sub-classification, further in a third sub-classification, uses image data to make a probabilistic classification of an image according to a likely phantom type. Alternatively or additionally, a computing device receives a set of image analysis data, identifies an image analysis model to be trained, using the image analysis data, determines that the image analysis model can include an image permutation, and trains a new image analysis model including the image permutation.
    Type: Grant
    Filed: July 26, 2013
    Date of Patent: October 11, 2016
    Assignee: Radiological Imaging Technology, Inc.
    Inventors: Daniel M. Ritt, Logan Flewellen, Matthew L. Whitaker, Ryan Young
  • Patent number: 9446434
    Abstract: Inspection apparatus comprises a feed system for delivering a stream of articles to an imaging zone. A camera generates image data from the stream at the imaging zone for processing by a computer. The computer comprises a pattern recognition system for identifying defects in areas from the image data, and for ranking identified defects. The pattern recognition system is programmed to operate according to multiple defect criteria. The computer is also coupled to a graphical user interface to display the areas identified from the image data as thumbnails on the interface arranged according to rank of the identified defects in the areas, in each of at least two defect criteria. The areas from the generated image data will normally be defined around each identified defect with the defect central therein. These areas, or thumbnails, can overlap.
    Type: Grant
    Filed: July 5, 2010
    Date of Patent: September 20, 2016
    Assignee: BUHLER SORTEX LTD.
    Inventors: Gabriel Hamid, Charles Dean Mallah
  • Patent number: 9449325
    Abstract: A system for authenticity verification includes: a unique product identity generation system (UPIDGS) configured for generating a unique product identity (UPID) code corresponding to a product; an anomaly generation and identification system (AGIS) connected with the UPIDGS and configured for generating an anomaly to be inserted into a standard pattern attached to the product; a database and information management system (DBIMS) connected with the UPIDGS and the AGIS; and a unique product identity verification system (UPIDVS) connected with the DBIMS and configured for receiving information from the DBIMS and verifying the authenticity of the product based on the authenticity of the 2D codes and the anomaly. The 2D codes are attached to the product and captured by the DBIMS. The AGIS is configured to locate and identify the anomaly from the product. The DBIMS is configured to determine the authenticity of the 2D codes and the anomaly.
    Type: Grant
    Filed: April 22, 2015
    Date of Patent: September 20, 2016
    Assignee: Play Ventures Limited
    Inventor: Farn Fan Ching
  • Patent number: 9438863
    Abstract: A position recognition apparatus and method for determining the position of an object by using a camera are provided. The object may include a controllable light source, and the position recognition apparatus may store identification information of the object. The position recognition apparatus may obtain a spatial image by capturing an image of a place where the object is located, may extract the position of the object by processing the spatial image, and may correlate the extracted position with the object, thereby completing a position map.
    Type: Grant
    Filed: October 5, 2012
    Date of Patent: September 6, 2016
    Assignee: NULSOM INC.
    Inventor: Chang-Hoon Lee
  • Patent number: 9424068
    Abstract: Described herein are techniques for automatically batching GUI-based (Graphical User Interface) tasks. The described techniques include automatically determining whether a user is performing batchable tasks in a GUI-based environment. Once detected, the described techniques include predicting the next tasks of a batch based upon those detected batchable tasks. With the described techniques, the user may be asked to verify and/or correct the predicted next tasks. Furthermore, the described techniques may include performing a batch and doing so without user interaction.
    Type: Grant
    Filed: December 22, 2014
    Date of Patent: August 23, 2016
    Assignee: Microsoft Technology Licensing, LLC
    Inventors: Qingwei Lin, Fan Li, Jiang Li
  • Patent number: 9403325
    Abstract: A winding machine for winding a fiber texture onto an impregnation mandrel, includes: a take-up mandrel for storing and unwinding a fiber texture, the take-up mandrel having a substantially horizontal axis of rotation; an impregnation mandrel for receiving superposed layers of the fiber texture unwound from the take-up mandrel, the impregnation mandrel having an axis of rotation that is substantially horizontal and parallel to the axis of rotation of the take-up mandrel; a camera directed towards the fiber texture and the impregnation mandrel to examine the passage of warp tracer yarns and weft tracer yarns present in the fiber texture; an image-analysis module for determining the positions of the intersections of warp tracer yarns with the successive weft tracer yarns and comparing these determined positions with corresponding positions for the intersections of reference warp and weft tracer yarns, and determining an offset value for the fiber texture for each of these intersections; electric motors for driv
    Type: Grant
    Filed: September 11, 2013
    Date of Patent: August 2, 2016
    Assignee: SNECMA
    Inventors: Sylvain Corradini, Richard Mathon, Jean-François Durand, Bertrand Pierre Martin Leroyer, Antoine Phelippeau
  • Patent number: 9392990
    Abstract: An apparatus and method for estimating object information is provided. The object information estimating apparatus includes a database which stores phantom information obtained by projecting a first energy X-ray on a phantom, an input unit which receives first object information obtained by projecting the first energy X-ray on an analysis object, and which receives information on a thickness of the analysis object, and an estimating unit which estimates second object information based on the phantom information, the first object information, and the information on the thickness.
    Type: Grant
    Filed: August 20, 2013
    Date of Patent: July 19, 2016
    Assignee: SAMSUNG ELECTRONICS CO., LTD.
    Inventors: Seok Min Han, Dong Goo Kang, Sung Su Kim, Young Hun Sung
  • Patent number: 9396411
    Abstract: An automated, computerized method is provided for processing an image. The method includes the steps of providing an image file depicting an image, in a computer memory, identifying a dominant region of single reflectance in the image and segregating the image into intrinsic images as a function of the dominant region of single reflectance.
    Type: Grant
    Filed: January 22, 2013
    Date of Patent: July 19, 2016
    Assignee: Tandent Vision Science, Inc
    Inventors: Casey Arthur Smith, Youngrock Yoon
  • Patent number: 9389187
    Abstract: Optical inspection systems and methods for inspecting a glass sheet for defects are disclosed. The systems and methods employ a digital camera and a plurality of different types of illumination sources. The object plane of the digital camera moves through the glass sheet body while flash exposures from one or more of the illumination sources are performed. The movement occurs during a ready-to-acquire time of the digital camera. This allows the digital camera to capture a plurality of digital inspection images on the fly at different exposure positions within the glass sheet body without waiting for any digital image processing to occur. The digital inspection images are then reviewed to characterize any revealed defects.
    Type: Grant
    Filed: November 29, 2012
    Date of Patent: July 12, 2016
    Assignee: CORNING INCORPORATED
    Inventor: William John Furnas
  • Patent number: 9372073
    Abstract: The invention relates to an inner diameter measuring device, having a non-contact measuring unit (3) and a contact measuring unit (4) arranged along the same center line, wherein the non-contact measuring unit comprises an image pickup unit (6) arranged on the center line, a laser beam emitting unit (7), and a laser beam diffusing unit (9) having a cone mirror, wherein a laser beam projected from the laser beam emitting unit to the cone mirror is reflected over a total circumference by the cone mirror, the image pickup unit takes an optical ring which is formed by projecting the reflected laser beam to an inner surface of a hollow portion, at least one of an inner diameter or a shape of the inner surface is measured based on an image picked up, and wherein the contact measuring unit comprises a contact measuring head (42) and a circulation unit (41) for circulating the contact measuring head around the center line, wherein the contact measuring head has a contact measuring unit having a contact at a forward e
    Type: Grant
    Filed: February 7, 2013
    Date of Patent: June 21, 2016
    Assignee: IHI Corporation
    Inventors: Michiko Baba, Kouzou Hasegawa, Norimasa Taga, Tooru Fujii
  • Patent number: 9355443
    Abstract: A system for location based wafer analysis, the system comprising: (i) a first input interface; (ii) a second input interface; (iii) a correlator; and (iv) a processor, configured to generate inspection results for the inspected wafer, with the help of at least one frame run-time displacement.
    Type: Grant
    Filed: September 5, 2014
    Date of Patent: May 31, 2016
    Assignee: Applied Materials Israel, Ltd.
    Inventors: Zvi Goren, Nir Ben-David Dodzin
  • Patent number: 9336611
    Abstract: A method for reconstructing multiple images of a subject depicting multiple different contrast characteristics from medical image data acquired with a medical imaging system is provided. Multiple image data sets are acquired with one or more medical imaging systems and the image data sets used to estimate hyperparameters drawn from a prior distribution, such as a prior distribution of image gradient coefficients. These hyperparameters and the acquired image data sets are utilized to produce a posterior distribution, such as a posterior distribution of image gradients. From this posterior distribution, multiple images with the different contrast characteristics are reconstructed. The medical imaging system may be a magnetic resonance imaging system, an x-ray computed tomography imaging system, an ultrasound system, and so on.
    Type: Grant
    Filed: September 13, 2011
    Date of Patent: May 10, 2016
    Assignee: Massachusetts Institute of Technology
    Inventors: Berkin Bilgic, Elfar Adalsteinsson
  • Patent number: 9329024
    Abstract: A dimension measuring apparatus is configured of: an imaging section that photographs a workpiece on the movable stage; a depth extending section that performs depth extension on a plurality of the workpiece images in different Z-directional positions in the movable stage, to generate a depth extended image; a master image displaying section that screen-displays as a master image the depth extended image obtained by photographing a master workpiece; a measured position information generating section that designates a position to be measured and a measuring method with respect to the master image, to generate measured position information; an edge extracting section that extracts an edge of the position to be measured from the depth extended image, obtained by photographing the workpiece, based on the measured position information; and a dimension value calculating section that obtains a dimension value of the position to be measured based on the extracted edge.
    Type: Grant
    Filed: January 10, 2012
    Date of Patent: May 3, 2016
    Assignee: Keyence Corporation
    Inventor: Yasutaka Kawa
  • Patent number: 9305346
    Abstract: A method of inspecting fabricated articles includes receiving a fabricated article to be inspected for defects, the fabricated article having a pattern thereon, and the pattern being based on a pattern design and creating a rule set for defining critical regions of the pattern as represented in the pattern design, the critical regions being regions in which defects are more likely to be found during inspection. The method also includes applying the rule set to the pattern design to identify a critical region of the pattern on the fabricated article and a non-critical region of the pattern on the fabricated article. Further, the method includes inspecting the non-critical region of the pattern on the fabricated article for defects at first resolution and inspecting the critical region of the pattern on the fabricated article for defects at a second resolution higher than the first resolution.
    Type: Grant
    Filed: May 31, 2012
    Date of Patent: April 5, 2016
    Assignee: Taiwan Semiconductor Manufacturing Company, Ltd.
    Inventors: Ching-Fang Yu, Ting-Hao Hsu
  • Patent number: 9298972
    Abstract: In a case where detecting a face contained in an image, the face is detected in all directions of the image by combining the rotation of a detector in the face detecting direction, and the rotation of the image itself. If the angle made by the image direction and the detecting direction of the detector is an angle at which image deterioration readily occurs, the detection range of the detector is made narrower than that for an angle at which image deterioration hardly occurs.
    Type: Grant
    Filed: December 13, 2010
    Date of Patent: March 29, 2016
    Assignee: CANON KABUSHIKI KAISHA
    Inventor: Hiroyasu Kunieda
  • Patent number: 9275568
    Abstract: A detection circuit and a detection method for liquid crystal display are provided. The detection circuit comprises gate driver for providing row scan signal to liquid crystal cell to be detected; signal source for providing polarity inversion signal to source driver, polarity inversion signal comprises continuous high level signal and continuous low level signal; source driver for performing digital-analog conversion on received display data signal according to preset reference voltage and polarity inversion signal, generating pixel voltage signal, and sending pixel voltage signal to liquid crystal cell to be detected, polarity inversion mode formed by pixel voltage signal is column inversion mode. The polarity inversion mode of column inversion, formed by pixel voltage signal in technical solution makes white dot of damaged area of alignment film is more prominent during detection process, so it would be easy for the operator to recognize it and avoid the issue of missing detection.
    Type: Grant
    Filed: February 23, 2010
    Date of Patent: March 1, 2016
    Assignee: BEIJING BOE OPTOELECTRONICS TECHNOLOGY CO., LTD.
    Inventors: Zhilong Peng, Xiangfei He, Wei Wang
  • Patent number: 9248965
    Abstract: This disclosure describes systems and methods for automatically verifying the processing of items within a materials handling facility. In many instances one or more items are processed in a materials handling facility and an agent processing the item must place the item in a designated container so that the item can be routed to the appropriate destination. By using image capture and analysis, the placement of the item in the appropriate container can be verified without requiring the agent to scan or otherwise identify the container into which the item was placed.
    Type: Grant
    Filed: February 19, 2014
    Date of Patent: February 2, 2016
    Assignee: Amazon Technologies, Inc.
    Inventor: Alexander Jacob Kritchevsky
  • Patent number: 9240040
    Abstract: Computer-based detection of damage on machine components, such as misalignments and mechanical damage on bearings and clutches, is achieved using mathematical linkage of the temperatures of selected regions of thermography pictures. Photographs from the visible spectral range can be consulted in the computed-based detection.
    Type: Grant
    Filed: July 12, 2011
    Date of Patent: January 19, 2016
    Assignee: Prüftechnik Dieter Busch AG
    Inventor: Roland Hoelzl
  • Patent number: 9240133
    Abstract: A detection circuit and a detection method for liquid crystal display are provided. The detection circuit comprises gate driver for providing row scan signal to liquid crystal cell to be detected; signal source for providing polarity inversion signal to source driver, polarity inversion signal comprises continuous high level signal and continuous low level signal; source driver for performing digital-analog conversion on received display data signal according to preset reference voltage and polarity inversion signal, generating pixel voltage signal, and sending pixel voltage signal to liquid crystal cell to be detected, polarity inversion mode formed by pixel voltage signal is column inversion mode. The polarity inversion mode of column inversion, formed by pixel voltage signal in technical solution makes white dot of damaged area of alignment film is more prominent during detection process, so it would be easy for the operator to recognize it and avoid the issue of missing detection.
    Type: Grant
    Filed: February 23, 2010
    Date of Patent: January 19, 2016
    Assignee: BEIJING BOE OPTOELECTRONICS TECHNOLOGY CO., LTD.
    Inventors: Zhilong Peng, Xiangfei He, Wei Wang
  • Patent number: 9235902
    Abstract: Contact-less remote-sensing crack detection and/quantification methodologies are described, which are based on three-dimensional (3D) scene reconstruction, image processing, and pattern recognition. The systems and methodologies can utilize depth perception for detecting and/or quantifying cracks. These methodologies can provide the ability to analyze images captured from any distance and using any focal length or resolution. This adaptive feature may be especially useful for incorporation into mobile systems, such as unmanned aerial vehicles (UAV) or mobile autonomous or semi-autonomous robotic systems such as wheel-based or track-based radio controlled robots, as utilizing such structural inspection methods onto those mobile platforms may allow inaccessible regions to be properly inspected for cracks.
    Type: Grant
    Filed: August 6, 2012
    Date of Patent: January 12, 2016
    Assignee: UNIVERSITY OF SOUTHERN CALIFORNIA
    Inventors: Mohammad R. Jahanshahi, Sami Masri
  • Patent number: 9235884
    Abstract: An inspecting apparatus is provided which inspects whether or not a liquid absorbent particulate is deposited with a predetermined deposition pattern on an absorbent sheet-like member, the absorbent sheet-like member having a continuous web and a plurality of absorbent bodies, the continuous web being transported along a transport direction, the absorbent bodies being formed on one surface of the continuous web in a spaced apart manner in the transport direction, each absorbent body including the liquid absorbent particulate as a main material.
    Type: Grant
    Filed: August 22, 2012
    Date of Patent: January 12, 2016
    Assignee: Unicharm Corporation
    Inventors: Yoshikazu Ogasawara, Miwa Iida
  • Patent number: 9236003
    Abstract: A user terminal apparatus is disclosed. A user terminal apparatus according to various exemplary embodiments includes a communication unit which communicates with an external apparatus, an image sensor unit which photographs an image being displayed on the display apparatus at a photographing speed above a frame rate of the display apparatus, and a control unit which controls to identify pattern information based on a placement of a pattern frame included in the image photographed by the image sensor unit, and to receive data related to the display apparatus from the external apparatus based on the identified pattern information.
    Type: Grant
    Filed: October 4, 2013
    Date of Patent: January 12, 2016
    Assignee: SAMSUNG ELECTRONICS CO., LTD.
    Inventor: Tae-min Yoon