Signal Frequency Or Phase Correction Patents (Class 702/106)
  • Patent number: 8781777
    Abstract: A bridge circuit includes a plurality of half-bridges formed of sensor elements, which change impedance in accordance with a rotation angle of a detection target. A control circuit acquires output signals of the half-bridges and calculates a phase correction value for correcting a phase deviation. A memory circuit stores the phase correction value. The control circuit corrects a pre-correction rotation angle by the phase correction value. Since the pre-correction rotation angle is corrected by the phase correction value, a rotation angle of the detection target is detected with high accuracy even if the sensor elements are assembled with some positional deviations.
    Type: Grant
    Filed: September 13, 2011
    Date of Patent: July 15, 2014
    Assignee: Denso Corporation
    Inventors: Takafumi Satou, Nobuhiko Uryu
  • Patent number: 8742713
    Abstract: Motor control circuits and associated methods to control an electric motor provide a plurality of drive signal channels at the same phase, resulting in reduced jitter in the rotational speed of the electric motor.
    Type: Grant
    Filed: October 21, 2011
    Date of Patent: June 3, 2014
    Assignee: Allegro Microsystems, LLC
    Inventor: Chee-Kiong Ng
  • Patent number: 8742791
    Abstract: An embodiment of a technique to determine an expected occurrence of a signal is disclosed. The technique includes receiving first and second signals, and storing delay information representing an expected time delay from an occurrence of the first signal to a point in time corresponding approximately to an expected occurrence of the second signal. The technique further includes responding to an occurrence of the first signal by: waiting for a time interval equivalent to the expected time delay, evaluating the second signal at approximately the end of the time interval, and adjusting the stored delay information if the second signal occurred outside a time window associated with the end of the time interval.
    Type: Grant
    Filed: January 19, 2010
    Date of Patent: June 3, 2014
    Assignee: Xilinx, Inc.
    Inventors: Schuyler E. Shimanek, Mikhail A. Wolf
  • Patent number: 8744020
    Abstract: A frequency offset of a received signal comprising a number of subsequently received data symbols is estimated. A first estimate is determined from a calculated change in phase of the received signal between two received symbols having a first time distance between them. At least one further estimate is determined from a calculated change in phase of the received signal between two received symbols having a different time distance. A frequency periodicity is determined for each estimate from the distance between the two received symbols from which the estimate was determined. A set of integer values is determined for each estimate so that frequency values calculated for each estimate as the frequency periodicity multiplied by the integer value added to the estimate are at least approximately equal to each other, and a corrected estimate of the frequency offset is determined from the integer values.
    Type: Grant
    Filed: October 30, 2009
    Date of Patent: June 3, 2014
    Assignee: Telefonaktiebolaget L M Ericsson (publ)
    Inventors: Niklas Andgart, Fredrik Nordström
  • Patent number: 8731837
    Abstract: A system and a method for associating measurements from a wellbore with times and depths is provided. Tools located in a wellbore obtain the measurements and provide time data used to determine the times. The tools and a surface clock may be synchronized. The times may be used to associate the measurements with corresponding depths of the wellbore.
    Type: Grant
    Filed: June 11, 2010
    Date of Patent: May 20, 2014
    Assignee: Schlumberger Technology Corporation
    Inventors: Shyam Mehta, Sachin Bammi, Keith Ray, Hiroshi Nomura
  • Patent number: 8725447
    Abstract: A method for correcting a wave front analyzer, in which the analyzer detects a signal from an incident wave front to be analyzed (FO), the detected signal providing phase and intensity local information. The method includes correcting the phase computation according to intensity space variations. A wave front analyzer for implementing the method is also described.
    Type: Grant
    Filed: October 16, 2007
    Date of Patent: May 13, 2014
    Assignee: Imagine Optic
    Inventors: Xavier Levecq, Guillaume Dovillaire
  • Patent number: 8712716
    Abstract: Disclosed are a method and an NDT/NDI inspection device deploying digital circuitry to conduct detection and compensation of phase and amplitude shift in responding signals. A digital waveform generator, such as a direct digital synthesizer (DDS) is used to generate a digital sine-wave of a specific frequency and amplitude, mimicking the pulser frequency and amplitude. The sine-wave is converted to analog signal through a DAC and transmitted to the transducer. The received analog sine-wave from the transducer is converted back to a digital signal through an ADC. The transmitted and received digital signals are then compared for phase and amplitude differences. A null circuit involving another waveform generating component is employed to compensate the detected phase and amplitude differences. As a result the phase and amplitude differences are effectively eliminated before being further processed and analyzed for defects information.
    Type: Grant
    Filed: July 29, 2011
    Date of Patent: April 29, 2014
    Assignee: Olympus NDT inc.
    Inventors: Andrew Thomas, Marc Dulac
  • Patent number: 8688399
    Abstract: A method of operation in a memory controller is disclosed. The method includes receiving a strobe signal having a first phase relationship with respect to first data propagating on a first data line, and a second phase relationship with respect to second data propagating on a second data line. A first sample signal is generated based on the first phase relationship and a second sample signal is generated based on the second phase relationship. The first data signal is received using a first receiver clocked by the first sample signal. The second data signal is received using a second receiver clocked by the second sample signal.
    Type: Grant
    Filed: October 19, 2012
    Date of Patent: April 1, 2014
    Assignee: Rambus Inc.
    Inventor: Scott C. Best
  • Patent number: 8661285
    Abstract: A DDR memory controller is described wherein a core domain capture clock is created by programmably delaying the core clock of the memory controller. The delay of this capture clock is typically calibrated during a power on the initialization sequence in concert with a DDR memory in a system environment, thereby minimizing the effects of system delays and increasing both device and system yield. An additional embodiment also includes programmably delaying the incoming dqs signal. To compensate for voltage and temperature variations over time during normal operation, a runtime dynamic calibration mechanism and procedure is also provided.
    Type: Grant
    Filed: June 29, 2011
    Date of Patent: February 25, 2014
    Assignee: Uniquify, Incorporated
    Inventors: Jung Lee, Mahesh Goplan
  • Patent number: 8660812
    Abstract: Calibration equipment for calibrating multiple test stations in a test system is provided. Each test station may include a test unit, a test chamber with an over-the-air antenna, and a radio-frequency (RF) cable that connects the test unit to the test chamber. Reference devices under test (DUTs) may be used to calibrate uplink and downlink path loss (e.g., OTA path loss, RF cable path loss, and variations of the test unit) associated with each test station. The reference DUTs may calibrate each test station at desired frequencies to generate a path loss table. Once calibrated, the test chambers may be used during production testing to test factory DUTs. During production testing, the transmit/receive power efficiency of each factory DUT may be calculated based on values in the path loss table to determine whether a particular production DUT is a passing or failing DUT according to pass/fail criteria.
    Type: Grant
    Filed: February 25, 2011
    Date of Patent: February 25, 2014
    Assignee: Apple Inc.
    Inventors: Justin Gregg, Tomoki Takeya, David A. Donovan
  • Publication number: 20140039824
    Abstract: A patient monitoring device and method that determines and monitors at least one patient parameter is provided. A configuration processor generates configuration information in response to a first input signal and an adaptive notch filter receives a second input signal. The second input signal includes a signal of interest and an interference signal in a predetermined frequency range. The adaptive notch filter automatically estimates the interference signal within the second input signal based on a filter parameter and removes the estimated interference signal from the second input signal to generate a target signal. A step processor is electrically coupled between the configuration processor and the adaptive notch filter and sets a value of the filter parameter based on the configuration information, wherein the adaptive notch filter uses the filter parameter to reduce a ringing artifact on the target signal below a threshold level.
    Type: Application
    Filed: April 20, 2012
    Publication date: February 6, 2014
    Inventors: Ling Zheng, Yu Chen
  • Patent number: 8600694
    Abstract: A method for processing a noisy digital time signal yk of digital pitch k, corresponding to an initial analogue signal st after being conditioned by a conditioning chain. The initial analogue signal st includes at least one pulse representing information concerning at least one radiation from a radiation source, the radiation and the pulse having an energy distribution. The method includes the determination of a non-noisy digital estimation signal sk from the noisy time signal yk by using a state model representing the conditioning imposed by the conditioning chain and in that the state model includes a Markovian variable rk to be estimated whereof at least two values are associated with physical characteristics of at least two typical pulses constituting a possible representation, at least approximate, of the pulse in the signal st.
    Type: Grant
    Filed: July 12, 2006
    Date of Patent: December 3, 2013
    Assignee: Commissariat a l'Energie Atomique
    Inventors: Luc Eglin, Eric Barat
  • Patent number: 8589104
    Abstract: A color value for an optical fiber of a fiberscope can be generated on the basis of the intensity values of a plurality of sensor elements of a sensor element arrangement that are sensitive to one spectral region each from a set of sensor spectral regions, if calibration values are provided for each of the spectral regions associated with the optical fiber. The intensity values of all sensor elements of the respective spectral region that are illuminated by the light guide can be combined with the provided calibration values, in order to obtain the color value associated with the optical fiber, which reproduces the color of the light transported by the optical fiber.
    Type: Grant
    Filed: April 21, 2008
    Date of Patent: November 19, 2013
    Assignees: Fraunhofer-Gesellschaft zur Foerderung der Angewandten Forschung E.V., Friedrich-Alexander Universitaet Erlangen-Nuernberg
    Inventors: Christian Winer, Thorsten Zerfass
  • Patent number: 8583394
    Abstract: Objects such as manufactured goods or articles, works of art, media such as identity documents, legal documents, financial instruments, transaction cards, other documents, and/or biological tissue are sampled via sequential illumination in various bands of the electromagnetic spectrum, a test response to the illumination is analyzed with respect to reference responses of reference objects. The sequence may be varied. The sequence may define an activation order, a drive level and/or temperature for operating one or more sources. Illumination may be in visible, infrared, ultraviolet, or other portions of the electromagnetic spectrum. Elements of the evaluation system may be remote from one another, for example coupled by a network.
    Type: Grant
    Filed: September 11, 2012
    Date of Patent: November 12, 2013
    Assignee: Visualant, Inc.
    Inventors: Brian T. Schowengerdt, Thomas A. Furness, III, Nicholas E. Walker
  • Patent number: 8552739
    Abstract: In an electronic device and a method of correcting time-domain reflectometers, two channels of a time-domain reflectometer are connected to a corrector using cables, and the two channels are enabled to transmit pulses. Parameters Step Deskew and Channel Deskew of the two channels are zeroed. Resistance values of the two channels are measured simultaneously, and the value of the parameter Step Deskew of one of the two channels is adjusted according to the Resistance values of the two channels. Times of achieving the same resistance value of the two channels are measured after the cables and the connector have been disconnected, and the value of the parameter Channel Deskew of one of the two channels is adjusted according to the times of achieving the same resistance value. The adjusted values of the parameters Step Deskew and Channel Deskew are displayed through a display unit.
    Type: Grant
    Filed: March 4, 2011
    Date of Patent: October 8, 2013
    Assignee: Hon Hai Precision Industry Co., Ltd.
    Inventors: Hsien-Chuan Liang, Shen-Chun Li, Shou-Kuo Hsu
  • Patent number: 8554504
    Abstract: Disclosed is a positioning apparatus including: an autonomous navigation sensor which is held by a pedestrian and which outputs periodic oscillation and direction information; a step length data storage section which stores step length data; a movement distance calculating section which calculates movement distance; a traveling direction calculating section which calculates a traveling direction; and a movement direction calculating section which calculates a movement direction for each step, wherein the movement distance calculating section includes a taken step angle calculating section which calculates a taken step angle from the movement direction for each step with respect to the traveling direction; and the movement distance calculating section corrects a value of the step length data so that the step length is larger as the taken step angle becomes larger to calculate a movement distance for each step.
    Type: Grant
    Filed: October 21, 2011
    Date of Patent: October 8, 2013
    Assignee: Casio Computer Co., Ltd.
    Inventor: Masao Sambongi
  • Patent number: 8542127
    Abstract: A device and method for discovering, identification and monitoring of mechanical flaws in metallic structures is disclosed, based on magneto-graphic/magnetic tomography technique to identify stress-related defects. The technique is specifically optimized for extended, not-accessible underground and underwater metallic structures quality control, emergency alarms as well as timeline planning for structural repairs and maintenance work. Examples of the technique implementation include pipes for oil and gas industry, detection of flaws in rolled products in metallurgical industry, welding quality of heavy duty equipment such as ships, reservoirs, etc. It is especially important for loaded constructions, such as pressured pipes, infrastructure maintenance, nuclear power plant monitoring, bridges, corrosion prevention and environment protection.
    Type: Grant
    Filed: November 12, 2012
    Date of Patent: September 24, 2013
    Inventors: Valerian Goroshevskiy, Svetlana Kamaeva, Igor Kolesnikov, Leonid Ivlev
  • Patent number: 8503593
    Abstract: In one aspect, an integrated circuit (IC) system includes a receiver IC configured to receive a first clock signal and includes a feedback circuit configured to provide a feedback signal to a driver IC. The IC system also includes the driver IC configured to receive a second clock signal and includes a waveform generator configured to provide synthesized waveforms from DC to K-band, a serializer/deserializer (SERDES) to receive data from the waveform generator and to provide the signal to the receiver IC and a phase selection circuit to provide a phase selection signal to the first integrated circuit based on the feedback signal. The phase selection signal calibrates the signal from the SERDES and provides phase correction to the SERDES.
    Type: Grant
    Filed: June 23, 2010
    Date of Patent: August 6, 2013
    Assignee: Raytheon Company
    Inventors: David J. Katz, Stephen R. Reid
  • Patent number: 8494796
    Abstract: The counting device includes: a signal counter that counts the number of half cycles of input signals during given counting periods; a signal half cycle measurement unit that measures the half cycles; a frequency distribution generator that generates a frequency distribution of the half cycles; a representative value calculator configured to calculate a representative value of a distribution of the half cycles; a correction value calculator configured to calculate a total number Ns and a total number Nwn so as to correct the number of the half cycles, wherein Ns represents the total of the number of the half cycles that are less than 0.5 times the represent value, and Nwn represents the total of the number of the half cycles that are equal to or greater than 2n and less than (2n+2) times the representative value.
    Type: Grant
    Filed: August 3, 2010
    Date of Patent: July 23, 2013
    Assignee: Azbil Corporation
    Inventor: Tatsuya Ueno
  • Patent number: 8494786
    Abstract: Methods and systems are provided that include sampling a light intensity signal at different frequencies based on the waveform of the signal to produce a more accurate digitized signal. The light intensity signal is an analog signal proportional to the intensity of light received at a detector of a pulse oximetry system. In one embodiment, the signal may be sampled exponentially during pulse width periods, such that the end of the pulse width periods where the signal reaches a maximum amplitude may be sampled more frequently. The signal may also be exponentially sampled or oversampled during periods when the signal is expected to near maximum amplitude. Further, the signal may be sampled less frequently during low amplitude periods of the signal, and during dark periods, such that processing power may be conserved.
    Type: Grant
    Filed: July 30, 2009
    Date of Patent: July 23, 2013
    Assignee: Covidien LP
    Inventor: Raghunath Mammulli Kalathil
  • Patent number: 8494795
    Abstract: An apparatus and method estimates a plurality of synchronized phasors at predetermined times referenced to a common time standard in an electrical power system. The method includes acquiring and determining a frequency of a power system signal, sampling the power system signal at a sampling interval rate based on a frequency of the power system signal to form signal samples, and generating a plurality of acquisition time values based on an occurrence of each of the signal samples at a corresponding plurality of different times referenced to the common time standard. The method further includes adjusting a phasor of each of the signal samples based on a time difference between a corresponding selected acquisition time value and a predetermined time referenced to a common time standard to form the plurality of synchronized phasors.
    Type: Grant
    Filed: December 8, 2010
    Date of Patent: July 23, 2013
    Assignee: Schweitzer Engineering Laboratories Inc
    Inventors: Gregary C. Zweigle, Armando Guzman-Casillas, Luther S. Anderson
  • Patent number: 8473234
    Abstract: A method for detecting changes in a building structure of a first wind turbine is provided. A reference value representing the eigenfrequency of the first wind turbine is monitored over time, whereby substantial changes in the reference value are used as an indication of changes in the building structure. Further, a detection assembly for such detections is provided.
    Type: Grant
    Filed: October 7, 2010
    Date of Patent: June 25, 2013
    Assignee: Siemens Aktiengesellschaft
    Inventors: Dan Frederiksen, Hans Laurberg
  • Patent number: 8452565
    Abstract: A method for calibrating a high frequency measurement device having N measurement ports, where N is an integer ?1, in particular a vector network analyzer, for determining scattering parameters of a measurement object with an n-port measurement, where n is an integer ?1, wherein a high frequency test signal is fed into a first electrical lead connected to the measurement object or to a circuit having the measurement object, wherein for each port, an HF signal running on a second electrical lead, connected to the measurement object is coupled out from the second electrical lead at a first coupling position and at a second coupling position placed at a distance from the first coupling position, wherein from the two HF signals coupled out, in each port, for each measuring site or coupling site, an amplitude and/or a phase, relative to the HF test signal, of an HF signal running on the second electrical lead to the measurement object and of an HF signal running on the second electrical lead away from the measurem
    Type: Grant
    Filed: June 19, 2007
    Date of Patent: May 28, 2013
    Assignee: Rosenberger Hochfrequenztechnik GmbH & Co. KG
    Inventor: Thomas Zelder
  • Patent number: 8452561
    Abstract: A time differential is estimated between a plurality of signals by determining a filter response of a first electrical signal with a first filter array, determining a filter response of a second electrical signal with a second filter array, and determining, based at least on the filter response of the first electrical signal and the filter response of the second electrical signal, a time differential between the first electrical signal and the second electrical signal. A first optical signal is converted into the first electrical signal and a second optical signal is converted into the second electrical signal. The filter response of the first electrical signal and the filter response of the second electrical signal are sampled and the time differential between the first electrical signal and the second electrical signal is determined based at least on the sampled filter response of the first electrical signal and the sampled filter response of the second electrical signal.
    Type: Grant
    Filed: January 31, 2011
    Date of Patent: May 28, 2013
    Assignee: Voxis, Inc.
    Inventors: Jerry Samuel Dimsdale, Joseph Newhall West, Andrew Philip Lewis, Thomas Rahjit Singh Gill
  • Patent number: 8436626
    Abstract: An embodiment is a method for de-embedding. The method comprises forming a primary structure in a semiconductor chip and forming an auxiliary structure in the semiconductor chip. The auxiliary structure replicates a first portion of the primary structure. The method further comprises determining a transmission matrix for each of the primary structure and the auxiliary structure based on measurements and extracting a transmission matrix of a first component of the primary structure by determining a product of the transmission matrix of the primary structure and an inverse of the transmission matrix of the auxiliary structure.
    Type: Grant
    Filed: December 17, 2009
    Date of Patent: May 7, 2013
    Assignee: Taiwan Semiconductor Manfacturing Company, Ltd.
    Inventor: Hsiu-Ying Cho
  • Publication number: 20130110442
    Abstract: A method of calibrating a reconstructed signal from a plurality of sub-signals is provided. The method includes injecting a calibration signal having multiple tones into a received input signal; dividing the input signal into a first and second sub-signal, including an overlapping frequency band; performing a first frequency translation by converting frequency components of the second sub-signal; digitizing the first sub-signal and the frequency converted second sub-signal; performing a second frequency translation to reverse the first frequency translation to obtain a reconstructed second sub-signal; and quantifying impairments to the digital first sub-signal and reconstructed second sub-signal caused by differences in magnitude and phase of frequency components within the overlapping frequency band.
    Type: Application
    Filed: October 27, 2011
    Publication date: May 2, 2013
    Applicant: AGILENT TECHNOLOGIES, INC.
    Inventors: Ken A. NISHIMURA, Kenneth RUSH
  • Patent number: 8428898
    Abstract: A method of filtering a signal sampled by a sampler, for example, in an equivalent time oscilloscope includes applying a correction to an actual frequency response of the sampler, with respect to a reference frequency response, to a first frequency range of the sampled signal, and transitioning across a second frequency range of the sampled signal from the correction applied to the first frequency range to no correction of the actual frequency response of the sampler, the second frequency range being higher than the first frequency range. The method further includes compensating in a third frequency range of the sampled signal for excess gain incurred while applying the correction and transitioning from the correction to no correction in the first and second frequency ranges, respectively, so that statistics of asynchronous components of the sampled signal are preserved, the third frequency range being higher than the second frequency range.
    Type: Grant
    Filed: November 12, 2010
    Date of Patent: April 23, 2013
    Assignee: Agilent Technologies, Inc.
    Inventor: Marlin E. Viss
  • Patent number: 8412962
    Abstract: A microprocessor including a temperature sensor that monitors a temperature of core logic of the microprocessor during operation thereof, and operating point information from which may be determined N operating points at which the microprocessor core may reliably operate at a first temperature. Each of the N operating points has a different combination of operating frequency and voltage. The N operating points comprise a highest operating point, a lowest operating point, and a plurality of operating points intermediate the highest and lowest operating points. The microprocessor also includes a control circuit that transitions operation of the core logic among the N operating points to attempt to keep the operating temperature of the core logic provided by the temperature sensor within a temperature range whose upper bound is the first temperature.
    Type: Grant
    Filed: September 1, 2010
    Date of Patent: April 2, 2013
    Assignee: VIA Technologies, Inc.
    Inventors: Darius D. Gaskins, Charles John Holthaus
  • Publication number: 20130060501
    Abstract: A calibration method for radio frequency scattering parameter measurement applying three calibrators and measurement structure thereof, comprising a transmission line segment calibrator, an offset series device calibrator, an offset shunt device calibrator and a tested object measuring instrument, wherein the length of the transmission lines for the offset series device calibrator and the offset shunt device calibrator is equal to the one of the transmission line for the tested object measuring instrument such that the offset series device calibrator, the offset shunt device calibrator and the tested object measuring instrument have the identical error boxes, and after having acquired the scattering parameter matrix of the error box by means of the calibration method, it is possible to connect the tested electronic device onto the tested object measuring instrument and perform operations on uncorrected measurement data thereof thereby obtaining the radio frequency scattering parameter of the tested object.
    Type: Application
    Filed: September 1, 2011
    Publication date: March 7, 2013
    Inventor: Chien-Chang HUANG
  • Publication number: 20130030708
    Abstract: A method for correcting a measurement of a property of a subsurface material includes: selecting an instrument having a test circuit and a separate sensor, the test circuit configured for generating a test signal having a characteristic that mimics a downhole measurement environment to generate correction information. The sensor is configured for: transmitting a signal into the subsurface material; and receiving a data signal from the subsurface material; wherein the test circuit and the sensor are switchably coupled to an electronics unit of the instrument. The sensor is further configured for: receiving the test signal from the test circuit in the electronics unit; using the electronics unit, measuring at least one output characteristic of the instrument; and applying the correction information to the data signal according to the measured output characteristic.
    Type: Application
    Filed: September 26, 2012
    Publication date: January 31, 2013
    Inventors: Stanislav Wihelm Forgang, Randy Gold
  • Patent number: 8332176
    Abstract: What is disclosed is a novel system and method for detecting and correcting for In-Line-Spectrophotometer (ILS) measurements of constant value patches in the presence of banding in multi-function document reproduction systems. The present system analyzes the ILS data stream to identify structured noise components due to banding. An FFT is performed on each L*a*b* component in the ILS stream for a single test page. The peak frequencies from the FFT of the L* a* and b* channels are compared. Common frequencies in all 3 channels indicate a banding component. Once the banding frequencies and the banding wavelength are known, the color patch target can be adjusted to ensure the color patches are synchronized to the banding wavelength. By running a series of synchronized patches and averaging results, structured noise can be eliminated. In such a manner, a reduction of banding effects on color calibration can be effectuated.
    Type: Grant
    Filed: June 21, 2010
    Date of Patent: December 11, 2012
    Assignee: Xerox Corporation
    Inventors: Beatriz Cristina Custode, Stuart Alan Schweid, James Edward Baxter, III
  • Patent number: 8311761
    Abstract: A method of operation in a memory controller is disclosed. The method includes receiving a strobe signal having a first phase relationship with respect to first data propagating on a first data line, and a second phase relationship with respect to second data propagating on a second data line. A first sample signal is generated based on the first phase relationship and a second sample signal is generated based on the second phase relationship. The first data signal is received using a first receiver clocked by the first sample signal. The second data signal is received using a second receiver clocked by the second sample signal.
    Type: Grant
    Filed: October 19, 2011
    Date of Patent: November 13, 2012
    Assignee: Rambus Inc.
    Inventor: Scott C. Best
  • Patent number: 8306767
    Abstract: A sensor output correcting device includes: a sensor element for detecting a variation in an object to be measured, and for outputting this variation as a signal; an A/D converter for converting the analog signal outputted from the sensor element into a digital signal; a zero reference value calculating unit for calculating a zero reference value which is a drift amount of the sensor element from the signal outputted from the sensor element; a zero point correcting unit for correcting a zero point of the signal outputted from the A/D converter on the basis of the zero reference value calculated by the zero criterion calculating unit; an output limiting unit for limiting a value of an output signal inputted from the zero point correcting unit on the basis of a correction amount provided by the zero point correcting unit, and a high frequency removing unit for removing a high frequency component.
    Type: Grant
    Filed: June 16, 2008
    Date of Patent: November 6, 2012
    Assignee: Mitsubishi Electric Corporation
    Inventor: Toshiyuki Yamashita
  • Publication number: 20120271584
    Abstract: A computer is programmed to acquire calibration data from a calibration scan, the calibration data configured to characterize high order eddy current (HOEC) generated magnetic field error of an imaging system. The computer is also programmed to process the calibration data to generate a plurality of basis coefficients and a plurality of time constants and to calculate a plurality of basis correction coefficients based on the plurality of basis coefficients, the plurality of time constants, and gradient waveforms in a given pulse sequence. The computer is further programmed to execute a diffusion-weighted imaging scan that comprises application of a DW-EPI pulse sequence to acquire MR data from an imaging subject and reconstruction of an image based on the acquired MR data. The computer is also programmed to apply HOEC-generated magnetic field error correction during application of the DW-EPI pulse sequence configured to reduce HOEC-induced distortion in the reconstructed image.
    Type: Application
    Filed: February 1, 2012
    Publication date: October 25, 2012
    Inventors: Dan Xu, Joseph K. Maier, Kevin F. King, Bruce David Collick
  • Patent number: 8294397
    Abstract: A sensorless starting control method for a brushless direct current (BLDC) motor, comprising a first rotor-positioning step configured to position a rotor in a first position by operating a coil unit in a first excitation state, a second rotor-positioning step configured to operate the coil unit in a second excitation state such that the rotor rotates from the first position to a second position, and an open-looped starting step configured to excite a plurality of coils of the coil unit in sequence so as to drive the rotor to rotate in a predetermined direction, wherein the coil unit generates a back electromotive force (EMF) when the rotor rotates in the predetermined direction. The method further comprises a close-looped operation step configured to control the BLDC motor to attain a predetermined rotational speed via a feedback of the back EMF.
    Type: Grant
    Filed: March 17, 2010
    Date of Patent: October 23, 2012
    Assignee: Sunonwealth Electronic Machine Industry Co., Ltd.
    Inventors: Alex Horng, Chieh-Feng Lee, Tsung-Hsien Yeh
  • Patent number: 8296106
    Abstract: A method is provided that includes receiving and processing a sample signal scan. Processing the sample signal scan includes applying an inner-product operation on the sample signal scan and each of a plurality of eigenvectors to generate a plurality of corresponding coefficients, and subtracting the sample signal scan from a linear combination of the eigenvectors and corresponding coefficients to thereby produce a corrected sample signal scan. In this regard, the eigenvectors have been generated by decomposing a plurality of background reference signal scans according to a singular value decomposition technique. The signal scans include a plurality of electromagnetic signal measurements at a discrete set of frequencies, where each measurement has been taken by a spectrometer system passing an electromagnetic signal through a sample cell including just a base medium (for the background reference signal scans), or both a base medium and a sample medium (for the sample signal scan).
    Type: Grant
    Filed: February 25, 2010
    Date of Patent: October 23, 2012
    Assignee: Goodrich Corporation
    Inventors: Robert Noll, Aaron Turner, Alexander Majewski
  • Patent number: 8285508
    Abstract: An apparatus includes a test signal generation unit supplying test signals to an orthogonal modulator and a control unit that based on a result of decision by comparison and decision of detection results of a detector detecting envelopes of modulated signals output from the orthogonal modulator responsive to the test signals, derives adjustment values and a compensation value. An estimation means estimates a DC offset and an IQ mismatch of the orthogonal modulator, based on the derived compensation value. The test signals includes a first set including a first test signal (I1, Q1) and a second test signal (I2, Q2) having a predetermined relationship with the first test signal, and a second set of which in-phase and quadrature components have predetermined relationships respectively with in-phase and quadrature components of the first set.
    Type: Grant
    Filed: July 9, 2008
    Date of Patent: October 9, 2012
    Assignee: NEC Corporation
    Inventors: Kiyoshi Yanagisawa, Noriaki Matsuno
  • Patent number: 8285491
    Abstract: Devices and methods for measuring the fraction of a liquid in a wet gas flow are described, the device including one or more light sources emitting at a first wavelength at which the liquid is highly absorbing and emitting at a second wavelength close to the first wavelength and at which the liquid is not highly absorbing; and one or more sensor for detecting the transmittance of the light at the first and second wavelengths through said gas flow, the device further including processing means for determining a liquid fraction of the liquid in the wet gas flow by correcting the transmittance measured at the first wavelength for the effects of scattering using the transmittance measured at the second wavelength. By making use of cross-correlations or know flow rate meters the device can be used as a flow meter.
    Type: Grant
    Filed: May 16, 2006
    Date of Patent: October 9, 2012
    Assignee: Schlumberger Technology Corporation
    Inventors: Cheng-Gang Xie, Paul Hammond
  • Patent number: 8285510
    Abstract: Objects such as manufactured goods or articles, works of art, media such as identity documents, legal documents, financial instruments, transaction cards, other documents, and/or biological tissue are sampled via sequential illumination in various bands of the electromagnetic spectrum, a test response to the illumination is analyzed with respect to reference responses of reference objects. The sequence may be varied. The sequence may define an activation order, a drive level and/or temperature for operating one or more sources. Illumination may be in visible, infrared, ultraviolet, or other portions of the electromagnetic spectrum. Elements of the evaluation system may be remote from one another, for example coupled by a network.
    Type: Grant
    Filed: June 16, 2011
    Date of Patent: October 9, 2012
    Assignee: Visualant, Inc.
    Inventors: Brian T. Schowengerdt, Thomas A. Furness, III, Nicholas E. Walker
  • Patent number: 8280667
    Abstract: Provided is a test apparatus that tests a device under test, comprising a waveform generator that generates a test signal to be supplied to the device under test; a digitizer that measures a response signal output by the device under test; a judging section that judges acceptability of the device under test based on the measurement result of the digitizer; and a loop-back path that connects an output terminal of the waveform generator to an input terminal of the digitizer when calibration is performed for the waveform generator and the digitizer. The loop-back path includes a noise removal filter that eliminates a noise component from a signal passed therethrough; and a path switching section that connects the waveform generator to the digitizer via the noise removal filter when the digitizer is being calibrated, and connects the waveform generator to the digitizer without including the noise removal filter therebetween when the waveform generator is being calibrated.
    Type: Grant
    Filed: October 15, 2009
    Date of Patent: October 2, 2012
    Assignee: Advantest Corporation
    Inventor: Masaki Miyasaka
  • Patent number: 8278940
    Abstract: A signal acquisition system has a signal acquisition probe having probe tip circuitry coupled to a resistive center conductor signal cable. The resistive center conductor signal cable is coupled to a compensation system in a signal processing instrument via an input node and input circuitry in the signal processing instrument. The signal acquisition probe and the signal processing instrument have mismatched time constants at the input node with the compensation system having an input amplifier with feedback loop circuitry and a compensation digital filter providing pole-zero pairs for maintaining flatness over the signal acquisition system frequency bandwidth.
    Type: Grant
    Filed: July 29, 2010
    Date of Patent: October 2, 2012
    Assignee: Tektronix, Inc.
    Inventors: Josiah A. Bartlett, Ira G. Pollock, Daniel G. Knierim, Lester L. Larson, Scott R. Jansen, Kenneth P. Dobyns
  • Publication number: 20120221277
    Abstract: Calibration equipment for calibrating multiple test stations in a test system is provided. Each test station may include a test unit, a test chamber with an over-the-air antenna, and a radio-frequency (RF) cable that connects the test unit to the test chamber. Reference devices under test (DUTs) may be used to calibrate uplink and downlink path loss (e.g., OTA path loss, RF cable path loss, and variations of the test unit) associated with each test station. The reference DUTs may calibrate each test station at desired frequencies to generate a path loss table. Once calibrated, the test chambers may be used during production testing to test factory DUTs. During production testing, the transmit/receive power efficiency of each factory DUT may be calculated based on values in the path loss table to determine whether a particular production DUT is a passing or failing DUT according to pass/fail criteria.
    Type: Application
    Filed: February 25, 2011
    Publication date: August 30, 2012
    Inventors: Justin Gregg, Tomoki Takeya, David A. Donovan
  • Patent number: 8255181
    Abstract: A correction algorithm may be applied for correcting misalignment of a radially-aligned array of sensors. Due to the tilt, signals from sensors that are further away from the media, may become slightly attenuated, while signals from sensors that are closer to the media are slightly increased. The error appears periodic and largely sinusoidal in nature around the array given the circular nature of the array of sensor elements. The algorithm determines the magnitude and phase of a sinusoidal function that best fits the wavelength data. In one embodiment, a discrete Fourier transform may be performed at the ‘frequency’ equivalent to one period around the array to determine the magnitude and phase estimate thereof. Then, a sinusoidal correction function may be generated using the magnitude and the phase in order to correct the reflectance data.
    Type: Grant
    Filed: January 12, 2009
    Date of Patent: August 28, 2012
    Assignee: Xerox Corporation
    Inventor: Thomas Edward Higgins
  • Publication number: 20120197577
    Abstract: A calibration method for radio frequency scattering parameter measurements enabling self-calibration, which calibration method using a transmission line segment calibrator, a series device calibrator, a shunt device calibrator and a tested object measuring instrument, in which the lengths of the transmission lines in the series device calibrator and the shunt device calibrator are equal to the length of the transmission lines in the tested object measuring instrument such that the series device calibrator and the shunt device calibrator have the same error box as the tested object measuring instrument; and after acquiring the scattering parameter matrix of the error box through the calibration method, it is possible to connect a tested electronic device onto the tested object measuring instrument and perform operations on uncorrected measurement data thereof thereby obtaining the radio frequency scattering parameter of the tested object.
    Type: Application
    Filed: January 27, 2011
    Publication date: August 2, 2012
    Inventor: Chien-Chang HUANG
  • Patent number: 8224609
    Abstract: Systems, methods, and other embodiments associated with MRI excitation are described. One example method includes performing a calibration to determine a set of transmission parameters for a set of excitation pulses for transmission channels available on a multi-channel MRI transmitter. The set of excitation pulses are configured to produce a resulting nuclear magnetic resonance (NMR) signal from an object exposed to the set of excitation pulses. The resulting NMR signal comprises NMR signal associated with a first NMR resonance associated with the object and NMR signal associated with a second NMR resonance associated with the object.
    Type: Grant
    Filed: March 20, 2009
    Date of Patent: July 17, 2012
    Inventors: Mark A. Griswold, Jeremiah Heilman
  • Patent number: 8224602
    Abstract: A system and method for synchronizing otherwise independent oscillators private to I2C Bus slave devices. An I2C Bus master device can issue two new general call commands, CALIBRATE and ZERO COUNTERS. The I2C Bus slave devices respond to the CALIBRATE command by counting the number of cycles its local, private oscillator makes through during the communication transfer period of the CALIBRATE command on the I2C Bus. All such I2C Bus slave devices measure the same communication transfer period on the I2C Bus, so the differences in the digital measurements obtained by each of them are proportional to their respective oscillator frequencies. The digital measurements are privately used by each I2C Bus slave device to calculate appropriate oscillator prescale factors, and to automatically load the values that will harmonize the final product frequencies of all of the local oscillators on all of the I2C Bus slave devices in the system.
    Type: Grant
    Filed: March 20, 2009
    Date of Patent: July 17, 2012
    Assignee: NXP B.V.
    Inventors: Jay Richard Lory, Alma Stephenson Anderson
  • Patent number: 8224610
    Abstract: A method of calibrating an oscillator within a Radio-Frequency Identification (RFID) tag includes storing a plurality of calibration values within a memory structure. Each of the calibration values corresponds to a respective oscillation frequency of the oscillator. A selected calibration value is selected from the plurality of calibration values stored, according to a first selection criterion. The oscillator is then calibrated in accordance with the selected calibration value.
    Type: Grant
    Filed: July 26, 2006
    Date of Patent: July 17, 2012
    Assignee: Impinj, Inc.
    Inventors: Christopher J. Diorio, Vadim Gutnik, Todd E. Humes
  • Patent number: 8214168
    Abstract: A sensor probe provides a pair of unique signal paths through a test material, wherein one configuration of the probe provides identical external portions of the signal paths such that a selected parameter of a measuring signal passing along at least two of the unique signal paths is measured. From these measurements, a method is provided for calculating at least one parameter of the test material, wherein the parameter can include an intrinsic parameter as well as a condition of state.
    Type: Grant
    Filed: September 7, 2004
    Date of Patent: July 3, 2012
    Assignee: Transonic Systems, Inc.
    Inventor: Yuri Shkarlet
  • Patent number: 8195422
    Abstract: First and second devices having clocks which may have different clock rates. Obtaining a measure of the distance of propagation of a signal passing between the devices involves transmitting a first signal 12 from the first device to the second device. After a turnaround time TAT, a second signal 14 is transmitted from the second device to the first device. Any error in the clocks may lead to an error in the measurement of the turnaround time TAT. One device contains circuitry to calculate the ratio of the clock rates of the first and second devices, either by adjusting frequency divider ratios until there is LO frequency match, or by determining the offset frequency of an envelope of a mixed signal. The ratio of the clock rates is used to compensate the turnaround time TAT, to mitigate error. The accurate distance measurement can be used to determine if a relay attack has taken place in a vehicle security system.
    Type: Grant
    Filed: November 30, 2005
    Date of Patent: June 5, 2012
    Assignee: Koninklijke Philips Electronics N.V.
    Inventors: Martin S. Wilcox, Adam S. Leitch
  • Publication number: 20120109565
    Abstract: A magnetic flux leakage inspection method generates a magnetic flux parallel to a surface of an inspected object, and detects a magnetic flux that leaks from the surface of the inspected object with a magnetic sensor. The method includes exciting coils that generate an alternating magnetic field having a variable frequency, an exciting coil power source, a magnetic sensor, a lock-in detector, and a signal analyzer that analyzes changes of a signal intensity and a phase of the output of the magnetic sensor with output signals of the lock-in detector. The method obtains cosine or sine as a trigonometric function of a phase obtained by adding to the phase at each measurement point of multipoint measurement, an adjustment phase common to all the measurement points, and displays an analytical value obtained by multiplying the signal intensity and the sine or cosine at each measurement point with any adjustment phase.
    Type: Application
    Filed: May 28, 2010
    Publication date: May 3, 2012
    Applicant: National University Corporation Okayama University
    Inventor: Keiji Tsukada