Using Radiant Energy Patents (Class 702/28)
  • Patent number: 8570512
    Abstract: Methods, storage mediums, and systems for correlating pulses generated from multiple interrogation regions in a flow cytometer to particular particles flowing through the flow cytometer are provided. Embodiments of the methods, storage mediums, and systems include configurations for calibrating a flow cytometer using a calibration particle having a unique signature to determine a time-of-flight for particles flowing through the flow cytometer. Based on the calculated time-of-flight and relative positions of interrogation regions corresponding to collectors of the flow cytometer, the methods, storage mediums, and systems may further include configurations for associating other signal pulses to particles of one or more different particle sets.
    Type: Grant
    Filed: April 3, 2012
    Date of Patent: October 29, 2013
    Assignee: Luminex Corporation
    Inventor: Adam Richard Schilffarth
  • Publication number: 20130282305
    Abstract: A method, apparatus and computer program product for measuring a composition of a multiphase fluid, including radiating a photon beam through the multiphase fluid and measuring radiation absorption by the multiphase fluid for at least three energy levels to obtain measured radiation absorption data, and providing the measured radiation absorption data to processing unit configured to calculate the composition of the multiphase fluid using the measured radiation absorption data, whereby an effect of an injected fluid on the absorption of the photon beam is taken into account during calculation of the composition of the multiphase fluid.
    Type: Application
    Filed: June 18, 2013
    Publication date: October 24, 2013
    Inventors: Gilles Roux, Roman Korkin, Lev Zakharov
  • Publication number: 20130268210
    Abstract: A spectrometer for determining a composition of a sample is described. The spectrometer includes a radiation source, a detector, and a processing device coupled to the radiation source and the detector. The radiation source is configured to generate a primary beam of radiation to be directed toward the sample. The detector is configured to generate a detector signal representative of a secondary beam of radiation from the sample after being impinged by the primary beam of radiation. The processing device is configured to control operation of the spectrometer in connection with performing a first elemental analysis of the sample. The processing device is also configured to determine an alloy grade of the sample based on the detector signal generated in connection with the first elemental analysis. Furthermore, the processing device is configured to determine at least one measurement condition based at least partially on the alloy grade.
    Type: Application
    Filed: April 5, 2012
    Publication date: October 10, 2013
    Inventor: John I.H. Patterson
  • Patent number: 8548748
    Abstract: A method for determining chemical composition from optical properties of a stack formed with a process, by preparing test samples of the stack using known and intentional variations to the process to affect a variation in the chemical composition, measuring the optical properties of the test samples, measuring the chemical composition of the test samples, performing a processor-based regression analysis to determine an optical state function including correlations between the optical properties of the test samples and the chemical composition of the test samples, fabricating production samples of the stack using the process, measuring the optical properties of the production samples, and estimating the chemical composition of the production samples using the optical state function.
    Type: Grant
    Filed: August 1, 2011
    Date of Patent: October 1, 2013
    Assignee: KLA-Tencor Corporation
    Inventor: Carlos L. Ygartua
  • Patent number: 8536519
    Abstract: The amplification of secondary-electron multipliers in mass spectrometers is automatically adjusted by generating mass spectra with single ion signals, determining the average value of the peak heights of these single ion signals, and setting the amplification so that the average peak height assumes a desired nominal value. The amplification may be set via the supply voltage of the secondary-electron multiplier and can be increased or decreased by a desired factor using the known characteristic of the secondary-electron multiplier.
    Type: Grant
    Filed: February 20, 2009
    Date of Patent: September 17, 2013
    Assignee: Bruker Daltonik GmbH
    Inventor: Armin Holle
  • Patent number: 8525112
    Abstract: A method and associated apparatus for topographically characterizing a workpiece. The workpiece is scanned with a scanning probe along a first directional grid, thereby scanning a reference surface and an area of interest subportion of the reference surface, at a variable pixel density including a first pixel density outside the area of interest and a second pixel density inside the area of interest to derive a first digital file characterizing topography of the workpiece. The workpiece is further scanned along the reference surface and the area of interest with the scanning probe along a second directional grid that is substantially orthogonal to the first directional grid and at a constant pixel density to derive a second digital file characterizing topography of the workpiece. A processor executes computer-readable instructions stored in memory that generate a topographical profile of the workpiece in relation to the first and second digital files.
    Type: Grant
    Filed: August 10, 2010
    Date of Patent: September 3, 2013
    Assignee: Seagate Technology LLC
    Inventors: Lin Zhou, Huiwen Liu, Dale Egbert, Peter Gunderson, John Ibele
  • Patent number: 8527212
    Abstract: Radiation scattering is one of the main contributors to the uncertainty of near infrared (NIR) measurements. Enhanced absorption-measurement accuracy for NIR sensors is achieved by using a combination of NIR spectroscopy and time-of-flight techniques to select photons that are the result of a given mean free path within a moving sample target. By measuring absorption as a function of path length or by windowing signals that are attributable to excessive scattering of NIR radiation within the sample, this technique affords the calculation of more accurate and more universal calibrations. The NIR sensor employs short or ultra-short laser pulses to create NIR that is directed to the moving sample and emerging radiation is detected over time. Windowing effectively truncates non-contributing measurements.
    Type: Grant
    Filed: February 14, 2011
    Date of Patent: September 3, 2013
    Assignee: Honeywell ASCa Inc.
    Inventors: Michael Kon Yew Hughes, Sebastien Tixier
  • Patent number: 8521451
    Abstract: Embodiments of a probe for measuring an oil viscosity are provided. In one embodiment, the probe includes a housing, a magnetoelastic ribbon, an electromagnetic coil, a temperature sensor and an electrical board. The housing is mounted to an oil containing member. The magnetoelastic ribbon is fixed to an inside of the housing through a first insert member at one end and is at least partially immersed in the oil at an opposite end. The electromagnetic coil is disposed in the housing to surround the magnetoelastic ribbon. The temperature sensor is mounted to the housing for measuring a temperature of the oil. The electrical board is electrically connected to the electromagnetic coil and the temperature sensor.
    Type: Grant
    Filed: December 23, 2010
    Date of Patent: August 27, 2013
    Assignee: Korea Institute of Science and Technology
    Inventors: Ho Sung Kong, Hung Gu Han, Liubou Vasilievna Markova, Mikhail Savich Semenyuk, Vladimir Mikhailovich Makarenko
  • Patent number: 8513603
    Abstract: A method utilizing characteristic x-ray emission from a single thin film or multilayer thin film when an electron beam impinges at a grazing angle with respect to the surface of the sample to capture structural and physical properties of the layers such as layer thickness, interfacial roughness, and stoichiometry of the sample.
    Type: Grant
    Filed: May 12, 2011
    Date of Patent: August 20, 2013
    Assignee: West Virginia University
    Inventors: David Lederman, Thomas Hubbard Myers, II, Sandeep Chandril
  • Patent number: 8515686
    Abstract: The invention relates to the detection and quantification of polypeptides using mass spectrometry. Specifically, the invention provides a method for testing whether a target polypeptide is present in a sample of a set of polypeptides, a method for deriving a value for distinguishing polypeptides of a set of polypeptides from each other, a database containing values for distinguishing each polypeptide of a set of polypeptides from each other, and an apparatus for configuring a mass scan of a mass spectrometer to test whether a target polypeptide of a set of polypeptides is present in a sample of the set.
    Type: Grant
    Filed: December 18, 2007
    Date of Patent: August 20, 2013
    Assignee: Macquarie University
    Inventors: Keith Ashman, Matthew McKay, James Sherman, Mark Molloy
  • Publication number: 20130211734
    Abstract: Protein confidence values are calculated in proteomic analysis. A protein database is searched for proteins matching peptides found from mass spectrometry of a sample producing a set of proteins and a corresponding set of peptides. Peptide confidence values for the set of peptides are determined. Protein confidence values are calculated for the set of proteins based on the peptide confidence values. A protein is selected from the set of proteins with a largest protein confidence value, the largest protein confidence value is saved for the protein, the protein is removed from the set of proteins, and one or more peptides corresponding to the protein are removed from the set of peptides. Protein confidence values are recalculated for the set of proteins based on the peptide confidence values and an effect of removing the one or more peptides from the set of peptides.
    Type: Application
    Filed: May 12, 2011
    Publication date: August 15, 2013
    Applicant: DH TECHNOLOGIES DEVELOPMENT PTE LTD
    Inventor: Ignat V. Shilov
  • Publication number: 20130197817
    Abstract: Methods of characterizing a chemical sample, and in particular, assessing stability of a sample, identifying trace amounts of an amorphous phase in a sample, and identifying structural variations in the internal structure of a sample.
    Type: Application
    Filed: March 13, 2013
    Publication date: August 1, 2013
    Applicant: The Trustees of Columbia University in the City of New York
    Inventor: The Trustees of Columbia University in the City of New York
  • Patent number: 8494786
    Abstract: Methods and systems are provided that include sampling a light intensity signal at different frequencies based on the waveform of the signal to produce a more accurate digitized signal. The light intensity signal is an analog signal proportional to the intensity of light received at a detector of a pulse oximetry system. In one embodiment, the signal may be sampled exponentially during pulse width periods, such that the end of the pulse width periods where the signal reaches a maximum amplitude may be sampled more frequently. The signal may also be exponentially sampled or oversampled during periods when the signal is expected to near maximum amplitude. Further, the signal may be sampled less frequently during low amplitude periods of the signal, and during dark periods, such that processing power may be conserved.
    Type: Grant
    Filed: July 30, 2009
    Date of Patent: July 23, 2013
    Assignee: Covidien LP
    Inventor: Raghunath Mammulli Kalathil
  • Patent number: 8489340
    Abstract: The present invention is directed to a method of using a near-infrared (NIR) model to predict the amount of accessible carbohydrate material in a feedstock sample. The NIR model is generated by subjecting a set of biomass calibration feedstock samples to near infrared spectroscopy which produces NIR spectroscopic data, measuring the chemical compositions of each said calibration feedstock sample by wet chemical techniques, and measuring the total amount of monosaccharides and disaccharides solubilized by each said calibration feedstock sample after processing under a defined pretreatment condition or defined enzyme load condition. The method is then applied to NIR spectral data obtained from a test feedstock sample to predict the amount of accessible carbohydrate material in the test feedstock sample.
    Type: Grant
    Filed: October 31, 2008
    Date of Patent: July 16, 2013
    Assignee: Ceres, Inc.
    Inventors: Bonnie Hames, Tanya Kruse, Steven R. Thomas, Amr Saad Ragab
  • Patent number: 8481925
    Abstract: An apparatus for elemental analysis of particles such as single cells or single beads by mass spectrometry is described. The apparatus includes means for particle introduction; means to vaporize, atomize and ionize elements associated with a particle; means to separate the ions according to their mass-to-charge ratio; means to detect the separated ions, means to digitize the output of the means to detect the ions; means to transfer and/or to process and/or record the data output of the means to digitize, having means to detect the presence of a particle in a mass spectrometer; and means to synchronize one of the means for ion detection, data digitization, transfer, processing and recording with the means to detect the presence of a particle. Methods and computer readable code implementing aspects of the apparatus, and for reducing the rates of data generation, digitization, transfer, processing and recording are also described.
    Type: Grant
    Filed: June 24, 2011
    Date of Patent: July 9, 2013
    Assignee: DVS Sciences Inc.
    Inventors: Alexei Antonov, Dmitry Roman Bandura
  • Patent number: 8480110
    Abstract: Methods and apparatus for LC/IMS/MS analysis involve obtaining noisy raw data from a sample, convolving the data with an artifact-reducing filter, and locating, in retention-time, ion mobility, and mass-to-charge-ratio dimensions, one or more ion peaks of the convolved data.
    Type: Grant
    Filed: April 13, 2012
    Date of Patent: July 9, 2013
    Assignee: Waters Technologies Corporation
    Inventors: Marc V. Gorenstein, Guo-Zhong Li
  • Patent number: 8447562
    Abstract: A method of determining a parameter of an object using penetrating radiation such as X-rays. The parameter of the object could be weight or mass or volume. The method comprises the step of passing the penetrating radiation through the object; determining a first value derived from the total energy of penetrating radiation absorbed by the object; determining a second value related to the mean energy per unit area of penetrating radiation absorbed by the object and determining the parameter from the first and second values. An algorithm representing a proportionality relationship is derived from the first and second value. The parameter is determined by establishing an exponential relationship to an amount derived from the algorithm.
    Type: Grant
    Filed: July 9, 2008
    Date of Patent: May 21, 2013
    Assignee: Illinois Tool Works
    Inventor: Alain Dekker
  • Publication number: 20130116934
    Abstract: Provided is a method for quantitatively estimating the probability of substance identification based on the result of an MS2 analysis using a certain MS1 peak as the precursor ion, before performing the MS2 analysis. Based on the result of MS1 and MS2 analyses and substance identification performed for each of a number of fractionated samples obtained from a known preparatory sample, an identification probability estimation model creator grasps m/z and S/N ratios of MS1 peaks having high probabilities of successful identification, calculates a parameter which determines the order of MS1 peaks and a parameter representing an identification probability estimation model, and stores the parameters in a memory. When identifying a substance, an approximate order is calculated for an MS1 peak obtained by the analysis. The identification probability for that peak is estimated from the approximate order with reference to the identification probability estimation model.
    Type: Application
    Filed: November 6, 2012
    Publication date: May 9, 2013
    Applicant: SHIMADZU CORPORATION
    Inventor: SHIMADZU CORPORATION
  • Publication number: 20130116933
    Abstract: Embodiments of the present invention are directed to apparatus and methods for performing mass spectrometry. Data pair information is subjected to an ion audit process in which data pair information that relates to scored compounds is subtracted from the data pair information. The depleted information more readily reveals data pair information for compounds present with smaller signals.
    Type: Application
    Filed: November 7, 2011
    Publication date: May 9, 2013
    Inventors: Scott J. GEROMANOS, Guo-Zhong Li, Jeffrey C. Silva, Marc V. Gorenstein, Hans Vissers
  • Patent number: 8412468
    Abstract: A method and apparatus for wavelet based elemental spectrum analysis is described. The system and method set forth allows for elemental decomposition of sampling spectral data to determine the presence of materials in the interrogated object. The method utilized and set forth implements wavelet decomposition of a spectrum and elemental analysis without requiring an empty background spectrum for subtraction of the background noise from the sampling spectrum. The system and method measures the presence of elements present in the sample being analyzed. The system may also measure the ratio of elements present in the sample being analyzed.
    Type: Grant
    Filed: April 8, 2010
    Date of Patent: April 2, 2013
    Assignee: Western Kentucky University
    Inventor: Bruce Kessler
  • Publication number: 20130054153
    Abstract: A material analysis method by a focused electron beam and an equipment for performing such an analysis where an electron map B is created describing the intensity of emitted back-scattered electrons at various points on a sample, and a spectral map S is created describing the intensity of emitted X-rays at points on the sample depending on the radiation energy. For selected chemical elements, X-ray maps Mi are created representing the intensity of X-rays characteristic for such elements. The X-ray maps Mi and the electron map B are converted into differential X-ray maps Di, which are subsequently merged into a final differential X-ray map D. The final differential X-ray map D is then used to search particles. Subsequently, a cumulative X-ray spectrum Xj is calculated for each particle and subsequently the classification of particles based on the peak intensities and the intensity of back-scattered electron is performed.
    Type: Application
    Filed: February 16, 2012
    Publication date: February 28, 2013
    Applicant: TESCAN, a.s.
    Inventors: David MOTL, Vojtech FILIP
  • Patent number: 8374801
    Abstract: A system and method for determining at least one geometric property of a particle in a sample. A sample is irradiated to thereby generate Raman scattered photons. These photons are collected to generate a Raman chemical image. A first threshold is applied wherein the first threshold is such that all particles in the sample are detected. A particle in the sample is selected and a second threshold is applied so that at least one geometric property of the selected particle can be determined. At least one spectrum representative of the selected particle is analyzed to determine whether or not it is a particle of interest. The step of determining a second threshold may be iterative and automated via software so that candidate second thresholds are applied until a satisfactory result is achieved.
    Type: Grant
    Filed: January 8, 2010
    Date of Patent: February 12, 2013
    Assignee: ChemImage Corporation
    Inventors: Michael Fuhrman, Ryan Priore, Oksana Olkhovyk, Oksana Klueva
  • Publication number: 20130035872
    Abstract: A method for determining chemical composition from optical properties of a stack formed with a process, by preparing test samples of the stack using known and intentional variations to the process to affect a variation in the chemical composition, measuring the optical properties of the test samples, measuring the chemical composition of the test samples, performing a processor-based regression analysis to determine an optical state function including correlations between the optical properties of the test samples and the chemical composition of the test samples, fabricating production samples of the stack using the process, measuring the optical properties of the production samples, and estimating the chemical composition of the production samples using the optical state function.
    Type: Application
    Filed: August 1, 2011
    Publication date: February 7, 2013
    Applicant: KLA-TENCOR CORPORATION
    Inventor: Carlos L. Ygartua
  • Publication number: 20130030717
    Abstract: A method of characterizing an object includes determining a depth-wise composition of the object at a measurement site within the object. A property of the object within a region adjacent to the measurement site can, optionally, be estimated based on the determining. Another method of characterizing an object includes disposing at least a portion of an object within a measurement region of a metrology tool, aligning a feature of the object and a location of a designated measurement site within the measurement region relative to each other, and performing a performing a compositional analysis of a portion of the object occupying the measurement site. Various apparatus for performing these methods are also disclosed, as are methods of monitoring manufacturing processes based on these methods.
    Type: Application
    Filed: July 25, 2012
    Publication date: January 31, 2013
    Applicant: ELECTRO SCIENTIFIC INDUSTRIES, INC.
    Inventors: Jonathan D. Halderman, Ciaran John Patrick O'Connor, Jay Wilkins
  • Patent number: 8362415
    Abstract: A method of analyzing biological material by exposing the biological material to a recognition element, that is coupled to a mass tag element, directing an ion beam of a mass spectrometer to the biological material, interrogating at least one region of interest area from the biological material and producing data, and distributing the data in plots.
    Type: Grant
    Filed: May 26, 2010
    Date of Patent: January 29, 2013
    Assignees: Lawrence Livermore National Security, LLC, Lawrence Berkeley National Laboratory
    Inventors: James S. Felton, Kuang Jen J. Wu, Mark G. Knize, Kristen S. Kulp, Joe W. Gray
  • Patent number: 8354634
    Abstract: A mass spectrometer is disclosed wherein an ion signal is split into a first and second signal. The first and second signals are multiplied by different gains and are digitised. Arrival time and intensity pairs are calculated for both digitised signals and the resulting time and intensity pairs are combined to form a high dynamic range spectrum. The spectrum is then combined with other corresponding spectra to form a summed spectrum.
    Type: Grant
    Filed: May 22, 2008
    Date of Patent: January 15, 2013
    Assignee: Micromass UK Limited
    Inventors: Martin Green, Steven Derek Pringle, Jason Lee Wildgoose
  • Publication number: 20130006539
    Abstract: The present invention includes generating a three-dimensional design of experiment (DOE) for a plurality of semiconductor wafers, a first dimension of the DOE being a relative amount of a first component of the thin film, a second dimension of the DOE being a relative amount of a second component of the thin film, a third dimension of the DOE being a thickness of the thin film, acquiring a spectrum for each of the wafers, generating a set of optical dispersion data by extracting a real component (n) and an imaginary component (k) of the complex index of refraction for each of the acquired spectrum, identifying one or more systematic features of the set of optical dispersion data; and generating a multi-component Bruggeman effective medium approximation (BEMA) model utilizing the identified one or more systematic features of the set of optical dispersion data.
    Type: Application
    Filed: June 15, 2012
    Publication date: January 3, 2013
    Applicant: KLA-TENCOR CORPORATION
    Inventors: Ming Di, Torsten R. Kaack, Qiang Zhao, Xiang Gao, Leonid Poslavsky
  • Patent number: 8344315
    Abstract: The invention is a process for finding the accurate masses of subfragments comprising an unknown compound from the accurate-mass mass spectral data of the unknown compound obtained on a mass spectrometer. This process generates these accurate masses of subfragments using mass differences of fragment ions and a listing of plausible masses. In this way, the accurate masses of subfragments, useful for generating modular structures, can be obtained very rapidly.
    Type: Grant
    Filed: May 27, 2010
    Date of Patent: January 1, 2013
    Assignee: Math Spec, Inc.
    Inventor: Daniel Leo Sweeney
  • Patent number: 8340920
    Abstract: The disclosure relates to a method for measuring a flow rate, in particular in an inductive flowmeter, in which an electrical signal is applied to a measuring medium flowing in a measuring tube at electrodes, and the response function at measuring electrodes is determined as a measure of the flow rate, and to a corresponding flowmeter device. So that the flow effects of gas bubbles and/or particles in the measuring medium can be distinguished from other faults and the determination of the flow rate is thus more reliable, the disclosure proposes that, in order to detect gas bubbles and/or particles in the measuring medium, a magnetic and/or electric field is applied to the latter and the potential and/or current is/are read out at one or more electrodes, the signal profile A(t), together with its signal-to-noise component, is measured electronically as a function of the time, and a statistical evaluation is used to infer the existence of gas bubbles and/or particles.
    Type: Grant
    Filed: October 30, 2008
    Date of Patent: December 25, 2012
    Assignee: ABB AG
    Inventors: Daniel Schrag, Harald Grothey, Kai Hencken, Jakob Fritsche
  • Publication number: 20120310550
    Abstract: The invention relates to the identification of molecules using electromagnetic write-heads and magneto-resistive sensors. In one embodiment, an electromagnetic write-head magnetically excites a molecule with an alternating magnetic field. A magneto-resistive sensor measures the resonant response of the magnetically excited molecule. A processor compares the resonant response to a table of known responses of different molecules to identify the chemical composition of the target molecule.
    Type: Application
    Filed: June 1, 2011
    Publication date: December 6, 2012
    Applicant: INTERNATIONAL BUSINESS MACHINES CORPORATION
    Inventors: Allen Keith Bates, Anna Wanda Topol, Daniel James Winarski
  • Patent number: 8324569
    Abstract: An MS analysis is performed for each micro area within a specified mass analysis area on a sample. Based on the data obtained by this analysis, a distribution image of a specified m/z ratio of m/z range is created and displayed on a display screen (S10-S14). When an operator selects a substance of interest on the displayed image and indicates its m/z (S15), one or more micro areas in which the MS spectrum intensity at the specified m/z is equal to or higher than a threshold are extracted, and an MS/MS analysis using the m/z of the substance of interest as the precursor is performed on the extracted micro areas (S26 and S27). An average MS/MS spectrum is calculated from the MS/MS spectrum data obtained for those micro areas (S28), and the substance of interest is identified based on the information relating to the peaks appearing on the average MS/MS spectrum (S19).
    Type: Grant
    Filed: July 3, 2008
    Date of Patent: December 4, 2012
    Assignee: Shimadzu Corporation
    Inventor: Shigeki Kajihara
  • Publication number: 20120282641
    Abstract: Methods of identifying polypeptides have been developed using a de novo sequencing technique. Methods use photodissociation and low-energy fragmentation and the spectra of peptide ions obtained therefrom, such as obtained by post-source decay (PSD), have been developed. The methods include photodissociation and the spectra therefrom obtainable from treating ions with predetermined wavelengths of radiation in the vacuum ultraviolet range of the electromagnetic spectrum. The confidence of amino acid assignments based on x-type ions is evaluated by observing complementary y-, v- and w-type ions that provide additional constraints to sequence identification.
    Type: Application
    Filed: December 31, 2010
    Publication date: November 8, 2012
    Applicant: Indiana University Research and Technology Corporation
    Inventors: James P. Reilly, Liangyi Zhang
  • Patent number: 8306758
    Abstract: Reference features are updated based on a previous scan during each mass spectrometry scan of a sample. Reference features with reference feature confidence values are generated from a plurality of initial scans. For each subsequent scan of a sample, sample features and sample feature confidence values are calculated. The reference features and sample features are aligned to determine common features. Constants are determined for an equation of mass of the mass spectrometer using confidence weighted regression of the common features. The constants and the equation of mass are used to calculate new mass values for the sample features. The reference features are updated using the sample features and the reference feature confidence values are recalculated in order to maintain the accuracy of reference features for calibration.
    Type: Grant
    Filed: October 2, 2009
    Date of Patent: November 6, 2012
    Assignee: DH Technologies Development Pte. Ltd.
    Inventors: Nic G. Bloomfield, Gordana Ivosev
  • Patent number: 8301397
    Abstract: A method of determining physico-chemical properties of a petroleum sample from two-dimensional gas chromatography. The amounts of molecular compounds present in the sample are determined by means of two-dimensional gas chromatography. At least one physical property, such as the octane number, is then determined from these amounts. A previously calibrated relation connecting the physical property to the amounts is used to this end.
    Type: Grant
    Filed: May 12, 2009
    Date of Patent: October 30, 2012
    Assignee: IFP
    Inventors: Fabrice Bertoncini, Benoît Celse, Cyril Dartiguelongue
  • Publication number: 20120271562
    Abstract: The present invention relates to a method of energy spectrum analysis for sodium iodide (NaI) detector, by which an energy spectrum characteristic obtained from a sodium iodide (NaI) detector is analyzed and used for establishing a system capable of qualitative nuclide identification and activity determination that can be adapted in applications of waste clearance management.
    Type: Application
    Filed: July 28, 2011
    Publication date: October 25, 2012
    Applicant: Institute of Nuclear Energy Research Atomic Energy Council, Executive Yuan
    Inventors: KUO-JEN LIN, Chung-Chih Lin, Mao-Chen Liu, Jinn-Yih Wu
  • Patent number: 8283624
    Abstract: An apparatus for elemental analysis of particles such as single cells or single beads by mass spectrometry is described. The apparatus includes means for particle introduction; means to vaporize, atomize and ionize elements associated with a particle; means to separate the ions according to their mass-to-charge ratio; means to detect the separated ions, means to digitize the output of the means to detect the ions; means to transfer and/or to process and/or record the data output of the means to digitize, having means to detect the presence of a particle in a mass spectrometer; and means to synchronize one of the means for ion detection, data digitization, transfer, processing and recording with the means to detect the presence of a particle. Methods and computer readable code implementing aspects of the apparatus, and for reducing the rates of data generation, digitization, transfer, processing and recording are also described.
    Type: Grant
    Filed: August 14, 2007
    Date of Patent: October 9, 2012
    Assignee: DVS Sciences Inc.
    Inventors: Alexei Antonov, Dmitry Roman Bandura
  • Publication number: 20120245858
    Abstract: Apparatuses, methods, software, and systems for analyzing homogenous samples containing signal-emitting entities, such as, but not limited to, radioisotopes, are disclosed. The apparatuses mainly involve sample-container apparatuses that shape samples into different thicknesses; equipment; and software for detecting, processing, preserving, and presenting the signals and computational results. The methods mainly involve characteristic signal acquisition and processing in order to compute sample self-attenuation of signals emitted from within special sample-container apparatuses. The software intelligently pairs characteristic signals from samples of varying thicknesses; carries out the sample self-attenuation, transmittance, and other computations related to signal-detection-efficiency calibration of the detection system; and identifies and quantifies signal emitters.
    Type: Application
    Filed: March 17, 2011
    Publication date: September 27, 2012
    Inventors: Scott Alan Carpenter, Raymond C. Gatti
  • Patent number: 8271207
    Abstract: Absolute quantitation of protein in a sample is provided by comparing a sum or average of the N highest ionization intensities observed for peptides of a particular protein along with a calibration standard. The calibration standard can be in the form of a table generated by prior protein peptide analysis performed using one or more pre-determined proteins. The comparison is used to determine a corresponding absolute quantity of protein based on the observed sum or average of ionization intensities. A simple conversion factor can be applied to the calibration standard value to determine the absolute quantity of protein in the sample.
    Type: Grant
    Filed: June 2, 2006
    Date of Patent: September 18, 2012
    Assignee: Waters Technologies Corporation
    Inventors: Scott Geromanos, Jeffrey Cruz Silva, Hans Vissers, Guo-Zhong Li
  • Patent number: 8265110
    Abstract: A laser and monitoring system is provided. In another aspect of the present invention, the system includes a laser, pulse shaper and detection device. A further aspect of the present invention employs a femtosecond laser and binary pulse shaping (BPS). Still another aspect of the present invention uses a laser beam pulse, a pulse shaper and a SHG crystal. In yet another aspect of the present invention, a multiphoton intrapulse interference phase scan (hereinafter “MIIPS”) method is used to characterize the spectral phase of femtosecond laser pulses and to correct them. A further aspect of the system of the present invention is employed to monitor environmental chemicals and biological agents, including toxins, explosives, and diseases.
    Type: Grant
    Filed: June 22, 2009
    Date of Patent: September 11, 2012
    Assignee: Board of Trustees Operating Michigan State University
    Inventors: Marcos Dantus, Vadim V. Lozovoy, Matthew Comstock
  • Patent number: 8258465
    Abstract: A mass spectrometry apparatus configured to allow a user to designate an upper limit value UL together with a lower limit value, as a peak sorting condition. A data processing section is operable to determine whether respective peak intensities of a plurality of peaks appearing on a mass spectrum fall within an intensity range Ath defined by upper and lower limit values UL, LL, and exclude any peak out of the intensity range Ath. The remaining ions are selected as precursor ions, for example, in descending or ascending order of peak intensity so as to perform an MS2 analysis. The upper limit UL is adequately set to allow the MS2 analysis for a sample component with a low concentration, by priority, while avoiding a sample component exhibiting a high intensity and having no need for the MS2 analysis.
    Type: Grant
    Filed: November 28, 2008
    Date of Patent: September 4, 2012
    Assignee: Shimadzu Corporation
    Inventor: Mayumi Matsui
  • Publication number: 20120209536
    Abstract: Radiation scattering is one of the main contributors to the uncertainty of near infrared (NIR) measurements. Enhanced absorption-measurement accuracy for NIR sensors is achieved by using a combination of NIR spectroscopy and time-of-flight techniques to select photons that are the result of a given mean free path within a moving sample target. By measuring absorption as a function of path length or by windowing signals that are attributable to excessive scattering of NIR radiation within the sample, this technique affords the calculation of more accurate and more universal calibrations. The NIR sensor employs short or ultra-short laser pulses to create NIR that is directed to the moving sample and emerging radiation is detected over time. Windowing effectively truncates non-contributing measurements.
    Type: Application
    Filed: February 14, 2011
    Publication date: August 16, 2012
    Applicant: Honeywell ASCa Inc.
    Inventors: Michael Kon Yew Hughes, Sebastien Tixier
  • Publication number: 20120191371
    Abstract: A method and system for analyzing noisy terahertz spectroscopy data transforms the measured time-dependent data into frequency space, for example, using a discrete Fourier transform, and then transforms the frequency spectrum into wavelet frequency space. The twice-transformed data is analyzed to identify spectroscopic features of the signal, for example, to identify a resonance frequency. The method may be used, for example, in a stand-off detector to identify particular chemicals in a target.
    Type: Application
    Filed: January 25, 2012
    Publication date: July 26, 2012
    Applicant: University of Washington through its Center for Commercialization
    Inventors: Mohammad Hassan Arbab, Dale P. Winebrenner, Antao Chen, Eric I. Thorsos
  • Patent number: 8214158
    Abstract: A simplified X-ray imaging apparatus is capable of computationally determining effective atomic numbers with small error factors even for light elements. In one embodiment, the X-ray imaging apparatus has an X-ray generation unit 101 (400) for generating X-rays and a detector 105 (405) for detecting X-rays transmitted through an object of examination 104 (403). A computing unit 106 (406) computationally determines a quantity of an X-ray phase attributable to the object of examination and an X-ray transmittance of the object of examination from data detected by the detector. The computing unit also computationally determines an effective atomic number of the object of examination from ?et determined from the quantity of the X-ray phase and ?t determined from the X-ray transmittance.
    Type: Grant
    Filed: March 11, 2009
    Date of Patent: July 3, 2012
    Assignee: Canon Kabushiki Kaisha
    Inventors: Taihei Mukaide, Kazuhiro Takada, Masatoshi Watanabe
  • Publication number: 20120158318
    Abstract: A method for matching precursor ions to product ions generated in a chromatography—mass spectrometry experiment comprises: choosing a time window defining a region of interest for precursor ion data and product ion data generated by the experiment; constructing a plurality of extracted ion chromatograms (XICs) for the precursor ion data and the product ion data within the region of interest; automatically detecting and characterizing chromatogram peaks within each XIC and automatically generating synthetic analytical fit peaks thereof; discarding a subset of the synthetic analytical peaks which do not satisfy noise reduction rules; performing a respective cross-correlation score calculation between each pair of synthetic analytical fit peaks; and recognizing matches between precursor ions and product ions based on the cross correlation scores.
    Type: Application
    Filed: December 16, 2010
    Publication date: June 21, 2012
    Inventor: David A. WRIGHT
  • Patent number: 8204689
    Abstract: A mobile soil mapping system includes an implement for traversing a field to be mapped, and a reflectance module carried by the implement for collecting spectroscopic measurements of soil in the field. The reflectance module has a light source, an optical receiver for transmitting light to a spectrometer, and a shutter system that alters the optical path between the light source and the optical receiver. The shutter system allows the system to automatically collect a dark reference measurement and a known reference material measurement at timed intervals to compensate for drift of the spectrometer and the light source. A self-cleaning window on the reflectance module has a lower surface maintained in firm contact with the soil during operation. External reference blocks are used to calibrate the system to ensure standardized, repeatable data. Additional sensors are carried by the implement to collect other soil data, such as electrical conductivity and temperature.
    Type: Grant
    Filed: October 17, 2008
    Date of Patent: June 19, 2012
    Assignee: Veris Technologies, Inc.
    Inventors: Colin Christy, Paul Drummond
  • Patent number: 8195404
    Abstract: The system records the movement of tiny organisms housed in closed micro plates traversed by an infrared beam generating a signal as a function of the diffraction caused by the body of the microorganism. The behavior detection procedure includes processing the diffraction signal to discriminate the locomotor activity of the microorganism. The system may be used in the chronobiological field, longevity, toxicity, and pharmacology studies.
    Type: Grant
    Filed: November 14, 2007
    Date of Patent: June 5, 2012
    Assignees: Consejo Nacional De Investigaciones Cientificas Y Techicas (CONICET), Universidad Nacional De Quilmes, Inis Biotech LLC
    Inventors: Diego Andres Golombek, Sergio Hernan Simonetta
  • Patent number: 8195405
    Abstract: A new method is presented for characterizing the associative properties of a solution of macromolecules at high concentration. Sample aliquots spanning a range of concentrations are injected sequentially into a light scattering photometer. Equilibrium association constants and association stoichiometry are derived from an analysis of the angular and concentration dependence of the scattering signals. Thermodynamic nonideality, which becomes important at high concentrations, is dealt with in the analysis in a simplified manner which is applicable to multiple associated species.
    Type: Grant
    Filed: June 30, 2009
    Date of Patent: June 5, 2012
    Assignee: Wyatt Technology Corporation
    Inventor: Daniel I. Some
  • Publication number: 20120133516
    Abstract: A method for identifying a substance includes determining a first molecular interference function (MIF) for a first substance. The method also includes determining a second MIF for a second substance. The method further includes generating a residual MIF at least partially based on a comparison of the second MIF to the first MIF. The method also includes identifying the type of substance based on the residual MIF.
    Type: Application
    Filed: November 30, 2010
    Publication date: May 31, 2012
    Inventor: Geoffrey Harding
  • Publication number: 20120123697
    Abstract: A device for identifying a material of an object including: a source of X photons, and a spectrometric detector, the source irradiating the object with an incident beam and the detector measuring a magnitude of a backscattered beam from the incident beam after scattering in a volume of the material and an energy of the X photons of the backscattered beam, the incident and backscattered beams forming a scattering angle. Further, a mechanism adjusts position between the source, the detector, and the object for volume to be at different depths with a constant angle, and a mechanism processes the two magnitudes in two positions and the energy in one position to calculate an attenuation coefficient for estimating the density of the material.
    Type: Application
    Filed: July 19, 2010
    Publication date: May 17, 2012
    Applicant: COMMISSARIAT A L'ENERGIE ATOMIQUE ET AUX ENE ALT
    Inventors: Elisa Fabiani, Jean Rinkel, Joachim Tabary, Jean-Marc Dinten
  • Patent number: 8178834
    Abstract: Methods and apparatus for LC/IMS/MS analysis involve obtaining noisy raw data from a sample, convolving the data with an artifact-reducing filter, and locating, in retention-time, ion mobility, and mass-to-charge-ratio dimensions, one or more ion peaks of the convolved data.
    Type: Grant
    Filed: May 25, 2007
    Date of Patent: May 15, 2012
    Assignee: Waters Technologies Corporation
    Inventors: Marc V. Gorenstein, Guo-Zhong Li