Abstract: A method including calculating, using an objective function, which includes a regression model used to estimate an array of a plurality of regions on a substrate and a regularization term used to limit a value of a coefficient of the regression model, a value of each of a plurality of coefficients included in the regression model, with which the objective function becomes not more than a reference value, extracting, based on the calculated values, the coefficient having the value not less than a threshold value from the plurality of coefficients, and obtaining, using a regression model including only the extracted coefficient, an array of a plurality of regions on a substrate.

Abstract: Embodiments of the present disclosure relate to systems, techniques, methods, and computer-readable mediums for one or more database systems for data processing, including database and file management, as well as systems for accessing one or more databases or other data structures and searching, filtering, associating, and analyzing data. The present disclosure further relates to computer systems and techniques for interactive data visualization and presentation from one or more databases.

Abstract: A method of calculating the deviation relation of a population registered on an image includes: i.) identifying the objects in the image, ii.) estimating the number of identified objects, iii.) identifying abnormalities in the image, iv.) identifying objects with abnormalities in the image, v.) estimating the number of objects with abnormalities, vi.) calculating the relation of objects with abnormalities to all objects. A computer program, a handheld computer device, and a system are also provided.

Abstract: A method of evaluating an additive manufacturing process includes receiving a set of additive manufacturing parameters and an additive manufacturing part design at an analysis module, receiving a set of random values at the analysis module, determining a probability distribution of stochastic flaws within a resultant additively manufactured article using at least one multidimensional space physics model, and categorizing the additive manufacturing part design as defect free when the probability distribution is below a predefined threshold. Each value in the set of random values corresponds to a distinct variable in a set of variables. Each variable in the set of variables at least partially defines at least one of an uncontrolled additive manufacturing parameter and an uncontrollable additive manufacturing parameter.

Abstract: According to the disclosure, an inspection apparatus determines whether a defect has occurred in a plurality of first inspection objects by comparing a reference range with the measurement value of the plurality of first inspection objects, identifies a plurality of second inspection objects in which a first error has occurred, and a plurality of third inspection objects in which a second error has occurred based on a result of determination whether the defect has occurred, adjusts the reference range based on measurement values of the plurality of second and third inspection objects, determines at least one of an occurrence probability of the first error and the second error based on the adjusted reference range, and displays at least one of a graph indicating the result of determination whether the defect has occurred, the adjusted reference range, the determined occurrence probability of the first error and the second error.

Abstract: A method of calculating the deviation relation of a population registered on an image includes: i.) identifying the objects in the image, ii.) counting the number of identified objects, iii.) identifying abnormalities in the image, iv.) identifying objects with abnormalities in the image, v.) counting the number of objects with abnormalities, vi.) calculating the relation of objects with abnormalities to all objects. A computer program, a handheld computer device, and a system are also provided.

Abstract: A system for mitigation of cyberattacks employing an advanced cyber decision platform comprising a time series data store, a directed computational graph module, an action outcome simulation module, and observation and state estimation module, wherein the state of a network is monitored and used to produce a cyber-physical graph representing network resources, simulated network events are produced and monitored, and the network events and their effects are analyzed to produce security recommendations.

Abstract: Embodiments of the present disclosure relate to systems, techniques, methods, and computer-readable mediums for one or more database systems for data processing, including database and file management, as well as systems for accessing one or more databases or other data structures and searching, filtering, associating, and analyzing data. The present disclosure further relates to computer systems and techniques for interactive data visualization and presentation from one or more databases.

Abstract: A system includes a void filter that receives sensor data employed to produce or inspect a manufactured part, the void filter generates a void data subset indicating voids detected in the manufactured part. A stress analyzer processes the void data subset from the void filter and determines coordinate data and force data for the respective detected voids in the manufactured part. At least one deterministic model analyzes the coordinate data and the force data from the stress analyzer determined for the detected voids from the void data subset. The deterministic model analyzes failure of the detected voids with respect to time and generates deterministic output data indicating failure over a deterministic timeframe. A prognostic analyzer processes the deterministic output data from the at least one deterministic model and generates a failure prediction for the as manufactured part.

Abstract: A method and an arrangement for increasing the throughput in a workpiece measurement with a coordinate measuring machine (CMM) is provided. The CMM measures a workpiece, and the measurement is described by at least one measurement parameter, a value of which is variable. The method includes setting an initial value of the at least one measurement parameter, the initial value being a predetermined value of the at least one measurement parameter valid for measuring the workpiece, measuring the workpiece with the initial value, determining a value of at least one predetermined test characteristic based on results of the measuring of the workpiece, determining whether the at least one predetermined test characteristic satisfies a predetermined iteration criterion; and changing the initial value of the at least one measurement parameter and repeating the prior steps upon determining that the at least one test characteristic satisfies the predetermined iteration criterion.

Abstract: A system includes an inspection device and an image processing unit. The inspection device is configured to scan a wafer to generate an inspected image. The image processing unit is configured to receive the inspected image, and is configured to analyze the inspected image by using at least one deep learning algorithm in order to determine whether there is any defect image shown in a region of interest in the inspected image. When there is at least one defect image shown in the region of interest in the inspected image, the inspection device is further configured to magnify the region of interest in the inspected image to generate a magnified inspected image for identification of defects.

Abstract: An inspection management system that manages inspection of an inspection apparatus in a production line including a manufacturing apparatus of a product and the inspection apparatus includes: an acquisition unit configured to acquire inspection content data including an inspection standard for each component; an inspection content setting unit configured to set inspection content; a setting-related information acquisition unit configured to acquire setting-related information including at least a time at which new inspection content is set when the inspection content setting unit sets the new inspection content; a storage unit configured to retain the setting-related information in association with a history of the setting of the inspection content; a setting-related information reading unit configured to read the setting-related information retained in the storage unit; and an output unit configured to be able to output the setting-related information.

Abstract: A method for monitoring a coordinate-measuring machine (CMM), having a monitoring device which is set up to monitor at least one location region of the CMM, in which a movable part of the CMM is movable, wherein the method includes: monitoring the at least one location region with the monitoring device, wherein the monitored location region is variable in terms of its size, ascertaining the position of the movable part of the CMM relative to a fixed position associated with the location region and/or ascertaining the movement of the movable part relative to the fixed position, and setting or varying the size of the monitored location region in dependence on the position and/or the movement of the movable part relative to the fixed position.

Abstract: A system for identifying timeframes for borescope inspections for a gas turbine engine, having: monitoring systems monitor engine conditions, derive engine condition information and communicate such information to processors; feature interpreter module electronically communicates (i) with processors to process engine condition information, and (ii) feature interpreter information to processors, such information defines a probability of a FOD event; accumulator module electronically communicates (i) with processors to processes feature interpreter information, stored information since a last borescope inspection, and (ii) accumulator information to processors, such information defines an accumulated probability of a FOD event; and predictor and inspection planner module electronically communicates (i) with processors to processes accumulator information and stored information defines a threshold limits for a probability of a FOD event, and (ii) predictor and inspection planner information to processors, such i

Abstract: Methods and systems for detecting defects on a wafer using adaptive local thresholding and color filtering are provided. One method includes determining local statistics of pixels in output for a wafer generated using an inspection system, determining which of the pixels are outliers based on the local statistics, and comparing the outliers to the pixels surrounding the outliers to identify the outliers that do not belong to a cluster of outliers as defect candidates. The method also includes determining a value for a difference in color between the pixels of the defect candidates and the pixels surrounding the defect candidates. The method further includes identifying the defect candidates that have a value for the difference in color greater than or equal to a predetermined value as nuisance defects and the defect candidates that have a value for the difference in color less than the predetermined value as real defects.

Abstract: Embodiments of the present disclosure relate to systems, techniques, methods, and computer-readable mediums for one or more database systems for data processing, including database and file management, as well as systems for accessing one or more databases or other data structures and searching, filtering, associating, and analyzing data. The present disclosure further relates to computer systems and techniques for interactive data visualization and presentation from one or more databases.

Abstract: A system is provided for programming workpiece feature inspection operations for a coordinate measuring machine. The system includes a computer aided design (CAD) file processing portion, an inspection motion path generation portion and a user interface. The user interface includes a workpiece inspection program simulation portion and auxiliary collision avoidance volume creation elements. The workpiece inspection program simulation portion displays a 3D view and the auxiliary collision avoidance volume creation elements are operable to create or define auxiliary collision avoidance volumes that are displayed in the 3D view. In various implementations, rather than requiring a user to model a physical object (e.g., as part of a workpiece or CMM) in a CAD file, the user may instead create and position an auxiliary collision avoidance volume at a location where the physical object is expected to be, so as to prevent collisions that could occur with the physical object.

Abstract: According to one embodiment, a memory system includes a nonvolatile memory and a controller. The nonvolatile memory includes erase blocks. The controller is configured to provide a host device with first information. The first information is indicative of whether or not an erase block to which data associated with a first stream are written and data unassociated with the first stream are not written is used for a garbage collection operation of the nonvolatile memory.

Abstract: A manufacturing adjustment system includes a decision part and a tolerance setting part. The decision part decides whether part dimensions calculated by a part dimension calculation part fall within a predetermined range of dimensions and a total machining time calculated by a total machining-time calculation part falls within a predetermined time. The tolerance setting part sets a workpiece tolerance for each machine based on the decision result of the decision part when the workpieces are produced by the machines.

Abstract: A method for determining if an individual integrated circuit was manufactured using an individual instance of tooling includes collecting from the individual integrated circuit first data representing at least one attribute that varies as a function of the tooling used to manufacture the individual integrated circuit and second data identifying the integrated circuit as having been manufactured using the individual instance of tooling. The first data is compared to a signature of the individual instance of tooling identified by the second data. The signature is derived from the at least one attribute measured from a population of integrated circuits that were manufactured using the individual instance of tooling. The individual integrated circuit is identified as having been manufactured using the individual instance of tooling identified in the second data collected from the individual integrated circuit if the first data correlates to the signature by a predetermined threshold.

Abstract: An apparatus and an associated method selects rates at which received signals are sampled in a multi-user communication system. The signals are sampled at initial sampling rates during a first period. An estimate is made of the number of received signals, and selection is made of an updated sampling rate, based in part upon the estimate.

Abstract: Methods and systems for managing policy configurations of different device types are described herein. An interface may be provided to a user where individual settings of different device types that are similar or the same are mapped to the same setting on the interface. The valid options or values for the individual device types are evaluated to identify common options or values. The user may select the common options or values of each common setting. The values selected as common settings values may be saved as the values for the corresponding individual settings of the different device types.

Abstract: According to an exemplary embodiment of the present invention, a photomask includes a transparent substrate and a polarizing pattern. A polarizing pattern is disposed on a transparent substrate. The polarizing pattern polarize light.

Abstract: An apparatus and an associated method selects rates at which received signals are sampled in a multi-user communication system. The signals are sampled at initial sampling rates during a first period. An estimate is made of the number of received signals, and selection is made of an updated sampling rate, based in part upon the estimate.

Abstract: Methods and systems for generating a wafer inspection process are provided. One method includes storing output of detector(s) of an inspection system during scanning of a wafer regardless of whether the output corresponds to defects detected on the wafer and separating physical locations on the wafer that correspond to bit failures detected by testing of the wafer into a first portion of the physical locations at which the defects were not detected and a second portion of the physical locations at which the defects were detected. In addition, the method includes applying defect detection method(s) to the stored output corresponding to the first portion of the physical locations to detect defects at the first portion of the physical locations and generating a wafer inspection process based on the defects detected by the defect detection method(s) at the first portion of the physical locations.

Abstract: A verification method and apparatus for do-not-inspect region rules include storing information specifying do-not-inspect regions, and storing a pixel unit size which defines a length of a single pixel unit. A minimum size verification process includes calculating sizes of do-not-inspect regions, and verifying whether a minimum size rule is obeyed, the minimum size rule requiring that a size of a do-not-inspect region is equal to or greater than a single pixel unit size while referring to the stored pixel unit size. A distance verification process includes calculating distances between pairs of do-not-inspect regions from among the do-not-inspect regions, and verifying whether a distance rule is obeyed, the distance rule requiring that the distance is in a range of greater than zero and less than a predetermined distance.

Abstract: Embodiments of the invention relate to dynamically assessing and managing probing of a system for resource availability. A predicted resource usage pattern is acquired, and critical points in the pattern pertaining to predicted changes in resource consumption are identified. Probing the system for resource availability is limited to the identified critical points, or to real-time changes in the resource usage pattern.

Abstract: Described herein are methods and systems for providing corrective maintenance using global knowledge sharing. A method to provide corrective maintenance with a CM system includes performing a query to generate a ranking of fixable causes based on factors (e.g., symptoms, configuration, test). The ranking may be determined based on a fixable cause percent match with the factors. The ranking of fixable causes may be associated with one or more solutions for each fixable cause. The ranking can be updated based on performing tests or solutions.

Abstract: A testing apparatus and a method for testing products are provided. The method includes the following steps. First, a first testing procedure is performed to at least one product to be tested in response to a test starting command to test a plurality of first items to be tested of the at least one product. When the first testing procedure corresponding to the at least one product to be tested and a manual testing procedure of the at least one product to be tested are finished, a testing result of each of the at least one produce is reported. The manual testing procedure of each of the at least one product to be tested is configured to test a plurality of second items to be tested of the at least one product.

Abstract: A method for dynamically altering manufacturing routings to add, remove, or skip operations and combinations of operations within a shop floor control system in real-time to respond to current conditions. One aspect of the present invention is a computer-implemented method for dynamically generating a manufacturing production work flow. One embodiment of this method comprises receiving indication that an assembly has completed a manufacturing operation, the assembly having a work flow and a sampling strategy associated therewith; querying a data source for characteristics of a plurality of previously sampled components; querying a manufacturing floor control system for current production status; and dynamically updating the work flow for the assembly based at least in part on the sampling strategy, characteristics of the plurality of previously sampled components, and the current production status.

Abstract: A method of detecting bitmap failure associated with physical coordinates is provided. In the method, data of wafer mapping inspection are obtained first, and the data include images of defects in each of layers within a wafer and a plurality of physical coordinates of the defects. Thereafter, a bitmap failure detection is performed to obtain digital coordinates of failure bits within the wafer. The digital coordinates are converted into a plurality of physical locations, and the physical locations are overlapped with the physical coordinates so as to rapidly obtain correlations between the failure bits and the defects.

Abstract: A test system for generating a test file includes an information obtaining module, a file header generation module, an identification module, and a measuring module. The information obtaining module reads an original information of an electronic component. The file header generation module generates a file header according to the original information. The identification module determines a manufacturing process of the electronic component according to the original information, and generates test items according to the manufacturing process. The measuring module activates measuring program according to the manufacturing process to measure the electronic device for obtain a measuring result corresponding to the test items.

Abstract: The present invention provides a remote monitoring system for monitoring the operation of a fluid treatment system and/or the qualities, characteristics, properties, etc., of the fluid being processed or treated by the fluid treatment system. The system includes a remote computer that may be associated with a database that accesses data transmitted from the fluid treatment system with the data collected, acquired, etc., from one or more sensors placed in the fluid treatment system for measuring fluid quality and/or equipment operation in a fluid treatment system. The remote computer may then analyze or manipulate the data to generate an analysis result or analysis report that may be sent or communicated along with the data and/or any historical or expected information or data to a remote viewing device for viewing by a user. A method is further provided for the operation of the remote monitoring system of the present invention.

Abstract: An image detection program creating system comprise a parameter setting module, an image loading module, a programming module, and a program conversion module. The parameter setting module sets parameters of a Dimensional Measuring Interface Specification (DMIS). The image loading module loads a 3D image. The programming module programs the DMIS program according to the parameters of the DMIS and the 3D image. The program conversion module converts the compiled DMIS into an image detection program.

Abstract: A sensor device includes: a sensor module mounted on a conductor board; a sensitive element which is sensitive to a variable; a self-test control unit implementing a self-test program, the self-test control unit applying a self-test variable to the sensitive element, taking the self-test program into account; a detection unit detecting a characteristic of the sensitive element which is altered as a result of the applied self-test variable and providing an actual self-test response, taking the altered characteristic into account; and a comparator unit provided on or in the sensor module, the comparator unit comparing the actual self-test response to at least one specified setpoint self-test response and providing comparative information.

Abstract: A method, system or computer usable program product for extracting attribute fail rates for manufactured devices including testing manufactured devices having a set of attributes to provide a set of test results stored in memory; generating a yield model of the manufactured devices parsed by the set of attributes; populating the yield model based on the set of test results; and utilizing a processor to perform statistical analysis of the populated yield model to extract fail rates of the selected subset of attributes.

Abstract: Methods for decomposing event information for a machine are described. In one aspect, a method includes receiving event data identifying events associated with a machine on a first communications channel, and receiving trend data for the machine associated with the identified events on a second communications channel separate from the first communications channel. Systems and machine-readable media are also described.

Abstract: Generating a machine tool program for performing coordinate measurements. The machine tool program may be communicated to a machine tool controller such that the machine tool controller is operable to execute the machine tool program. The machine tool program may be generated from a dimensional metrology program. As part of generating the machine tool program, a path definition and a machine definition may be combined. Measurement data resulting from an execution of the machine tool program may be received by a data server and analyzed using dimensional metrology analysis. Indicators may be provided within the machine tool program to be used during dimensional metrology analysis.

Abstract: Techniques, including systems and methods, for generating data are disclosed and suggested herein. Original data used in connection with one or more applications is analyzed in order to determine one or more distribution characteristics for the original data. The distribution characteristics are used to generate data that is similarly distributed. The generated data may be used as seed data for demonstrating, testing, or otherwise using one or more applications.

Abstract: Methods, systems, computer-program products and program-storage devices for determining whether or not to perform an action based at least partly on an estimated maximum test-range. One method comprises: attaining results generated from a parametric test on semiconductor devices included in a control set; selecting from the semiconductor devices at least one extreme subset including at least one of a high-scoring subset and a low-scoring subset; plotting at least results of the at least one extreme subset; fitting a plurality of curves to a plurality of subsets of the results; extending the curves to the zero-probability axis for the low-scoring subset or the one-probability axis for the high-scoring subset to define a corresponding plurality of intersection points; defining an estimated maximum test range based on at least one of the intersection points; and determining whether or not to perform an action based at least partly on the estimated maximum test range.

Abstract: A test device for testing an electronic device, includes an alternating current (AC) input port used to connect to an AC power source. An AC output port used to connect to a power port of the electronic device, a switch unit connected between the AC input port and the AC output port, a first USB port, a startup control unit, and a power on maintaining unit. The switch unit is used to establish a connection between the AC input port and the AC output port, or to cut off the connection. The first USB port connects to a second USB port of the electronic device. The startup control unit turns on the switch unit after the electronic device is turned off for a predetermined time. The power on maintaining unit maintains the switch unit to turn on after the electronic device is turned on.

Abstract: A frequency measurement device includes: a counter section that counts a supplied pulse stream signal to be measured at a predetermined time interval and outputs a stream of count values corresponding to the frequency of the signal to be measured; and a low-pass filter section that performs a filtering process on the stream of count values, the low-pass filter section including moving average filters in multiple stages, and an output of at least one moving average filter among the moving average filters in multiple stages is downsampled.

Abstract: A method of establishing statistically valid assay means and ranges for quality control materials, used to qualify medical testing machines, utilizes tests on a new lot of quality control material to establish an assay mean, and uses data from a database of historical test results to establish an assay range. The system may estimate the variability of test results from prior lot data, and then compute the limits of the assay range such that a new test on a new lot of the quality control material will be expected to fall within the range with a specified probability. Because historical data is used to estimate the test variability, the number of new tests required to specify a statistically valid mean and range may be dramatically reduced, as compared with establishing the mean and range based only on tests of the new lot of material.

Abstract: An engineering component with a designed defect and use of an engineering component with a designed defect to evaluate a production component are disclosed. A test component having a known defect is manufactured. This known defect is a flaw that is intentionally included in the test component. The test component is then analyzed to obtain a test profile of the defect. In addition, the engineering component to be tested is analyzed to obtain a production profile. This production profile is compared with the test profile to determine whether the engineering component has a defect that corresponds to the known defect.

Abstract: An inspecting method and an inspecting equipment including a dividing unit, a determining unit, a transferring unit and an inspecting unit for inspecting a disk are provided. The inspecting method includes the following steps. First, a plane is divided into several zones with equal area. Next, several measuring locations are determined within these zones. Next, these measuring locations are transferred into several sets of measuring locations corresponding to the disk through a coordinate transfer. Then, the disk is inspected according to these sets of measuring locations.

Abstract: An optimized measurement recipe is determined by reducing the set of measurement technologies and ranges of machine parameters required to achieve a satisfactory measurement result. The reduction in the set of measurement technologies and ranges of machine parameters is based on available process variation information and spectral sensitivity information associated with an initial measurement model. The process variation information and spectral sensitivity information are used to determine a second measurement model having fewer floating parameters and less correlation among parameters. Subsequent measurement analysis is performed using the second, constrained model and a set of measurement data corresponding to a reduced set of measurement technologies and ranges of machine parameters.

Abstract: Disclosed herein is a forged seal imprint checking method which includes a step ST-101 of generating a reference seal imprint from a genuine seal (ST-110) and a step ST-121 of comparing a compared seal imprints with the reference seal imprint to calculate characteristic values of the compared seal imprint with respect to the reference seal imprint (ST-140). According to experimental results, forged seal imprints obtained by seals forged by etching a zinc plate or a resin plate can be recognized and forged seal imprints generated by seals forged through computer copy can be also recognized. Accordingly, an objective basis on which it can be determined whether seal imprints on documents are forged in civil and criminal cases can be provided to prevent errors which may be generated when seal imprints are inspected with the naked eyes or microscopes.

Abstract: Methods and systems are provided for fabricating and measuring features of a semiconductor device structure. An exemplary method of fabricating a semiconductor device structure involves fabricating a feature of the semiconductor device structure on a wafer of semiconductor material, determining a hybrid recipe for measuring the feature, configuring a plurality of metrology tools to implement the hybrid recipe; and obtaining a hybrid measurement of the feature in accordance with the hybrid recipe.

Abstract: A probe circuit is provided in an electronic device that includes a circuit which is under test and outputs a response signal corresponding to an input signal in synchronization with an operation clock. The probe circuit includes a sampling clock supplying section that outputs a sampling clock having a predetermined frequency, and a sampling section that outputs, outside the electronic device, a probe output signal of which frequency is lower than a frequency of the response signal and which corresponds to a sampling result obtained by sampling the response signal using the sampling clock. The response signal has a prescribed signal pattern repeated with a predetermined recurrence period, and the sampling clock supplying section outputs the sampling clock of which relative phase with respect to the signal pattern sequentially changes in each recurrence period.

Abstract: An efficient method of boxing fuel injectors with a good yield where a predetermined quality is secured in a predetermined number of fuel injectors forming a set for one engine, that is, a method of boxing fuel injectors, a first number of which are scheduled to be mounted in an engine, in a single box in a second number larger than the first number, provided with a step of measuring a characteristic value for the second number of fuel injectors, wherein when the first number of the characteristic values forms a set, the number of combinations of the characteristic values where a total value of this one set's worth of the characteristic values becomes a first management value or less when selecting one set's worth of the characteristic values from the second number of the characteristic values, is defined as the “number of good part combinations”, and the number of possible combinations of one set's worth of the characteristic values is defined as the “number of possible combinations”, the fuel injectors bein