By Penetrator Or Indentor Patents (Class 73/81)
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Patent number: 7685869Abstract: A new type of indenter is described. This device combines certain sensing and structural elements of atomic force microscopy with a module designed for the use of indentation probes, conventional diamond and otherwise, as well as unconventional designs, to produce high resolution and otherwise superior indentation measurements.Type: GrantFiled: March 13, 2007Date of Patent: March 30, 2010Assignee: Asylum Research CorporationInventors: Flavio Alejandro Bonilla, Roger Proksch, Jason Cleveland, Tim Sauter
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Publication number: 20100064783Abstract: Provided is a device for determining a mechanical property of a sample to be analyzed, comprising an indenter and means for heating this indenter using laser light. The indenter has an indenter tip at the end directed toward the sample. At least one light guide for conducting the laser light to the indenter, particularly to the indenter tip, is provided as the means for heating this indenter. The aforesaid device relates to an indenter for use in the field of nanotechnology, having an elongated shape, an end region configured as the indenter tip, and means for heating by way of laser light. The indenter may comprise a light guide which is guided at least partially inside the indenter, the light emission end of which is disposed close to the indenter tip.Type: ApplicationFiled: April 23, 2008Publication date: March 18, 2010Inventor: Wolfgang Stein
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Publication number: 20100038531Abstract: A foreign matter detecting apparatus includes a detecting device for detecting foreign matter by measuring smoothness of a surface of an object undergoing measurement, a marking device for providing a dent on the surface of the object with a predetermined horizontal distance from the foreign matter detected by the detecting device, and a mass spectrum measuring device for irradiating and scanning a small area with a primary ion beam, as a part of the object, including the foreign matter and the dent, so as to measure a mass spectrum of secondary ions emitted from the foreign matter located at a position within a predetermined horizontal distance from the dent.Type: ApplicationFiled: October 27, 2009Publication date: February 18, 2010Applicant: CANON KABUSHIKI KAISHAInventors: Kazuhiro Jindai, Hideto Yokoi
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Publication number: 20100024534Abstract: A method of measuring the elastic modulus and hardness of a thin film on substrate using nanoindentation technique is provided. The method includes calculating a series of experimental corrected stiffness and contact radius pairs associated with one or more presumed parameters and information obtained from a loading curve associated with the thin film and substrate. Also, the method includes calculating a series of theoretical corrected stiffness and contact radius pairs associated with the same one or more presumed parameters and information obtained from the loading curve associated with the thin film and substrate. Furthermore, the method includes using results obtained from the experimental and theoretical corrected stiffness and contact radius pairs to compute the elastic modulus and hardness of the film material.Type: ApplicationFiled: July 21, 2009Publication date: February 4, 2010Inventors: Han Li, Joost Vlassak
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Patent number: 7628065Abstract: A method for measuring toughness of interfacial adhesion including applying a normal force with a probe to a surface of a coating joined to a major surface of a substrate, wherein the surface is substantially parallel to the major surface, and applying a lateral force to the coating with the probe by laterally moving a position of the probe relative to the major surface such that the probe forms at least one delaminated region in the coating as the position of the probe moves laterally across the major surface, the delaminated region having a starting point and an ending point. The method further includes measuring a magnitude of the lateral force over time, and determining a toughness of interfacial adhesion between the coating and the major surface based on changes in magnitude of the lateral force as the position of the probe moves from the starting point to ending point.Type: GrantFiled: December 22, 2005Date of Patent: December 8, 2009Assignee: Hysitron, Inc.Inventors: Dehua Yang, David J. Vodnick, Richard J. Nay, Thomas J. Wyrobek
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Patent number: 7629577Abstract: A foreign matter or abnormal unsmoothness inspection apparatus is constituted by a detecting member for detecting a foreign matter or abnormal unsmoothness by measuring smoothness of a surface of a substrate-like measuring object, a marking device for providing an dent on the surface of the measuring object with a predetermined horizontal distance from the foreign matter or abnormal unsmoothness, and a mass spectrum measuring device for measuring a mass spectrum of secondary ion emitted from a position with a predetermined distance from the dent by detecting the dent through impact and scanning of the surface of the measuring object with a primary ion beam.Type: GrantFiled: February 25, 2008Date of Patent: December 8, 2009Assignee: Canon Kabushiki KaishaInventors: Kazuhiro Jindai, Hideto Yokoi
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Patent number: 7621173Abstract: A nano-indentation ultrasonic detecting system for detecting mechanical properties of a target material. An indentation device, disposed on a surface of the target material, generates an indentation on the surface, obtaining the relation between the Young's modulus and the Poisson's ratio of the target material. An ultrasonic generator is movably disposed on the surface of the target material, generating at least two different ultrasonic signals thereon. An ultrasonic receiver is disposed on the surface of the target material and separated from the ultrasonic generator, receiving the ultrasonic signals. The result of a nano-indentation experiment are applied in the ultrasonic theory and iterated by the ultrasonic experimental data and theory, obtaining the Young's modulus of the target material. The obtained Young's modulus of the target material is substituted back in the result of the nano-indentation experiment, obtaining the Poisson's ratio of the target material.Type: GrantFiled: October 23, 2006Date of Patent: November 24, 2009Assignee: Industrial Technology Research InstituteInventors: Jiong-Shiun Hsu, Kai-Yu Cheng, Yu-Shyan Liu, Jeah-Sheng Wu, Yu-Yi Su, Chi-Sheng Chang
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Publication number: 20090193881Abstract: A method for determining an elastic ratio of indentation work of an indentation of a material surface to a sampling depth is described. The method may include: placing an indenter probe on the material surface; indenting the material surface to a maximum depth greater than the sampling depth by increasing a vertical force on the probe, while recording the force as a first function of depth; retracting the probe from the material surface by decreasing the force, while recording the force as a second function of depth; and calculating the elastic ratio of indentation work for the sampling depth from the recorded functions.Type: ApplicationFiled: January 31, 2008Publication date: August 6, 2009Inventor: Jorg Finnberg
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Patent number: 7568381Abstract: The present invention provides an apparatus and method for performing surface property measurements, such as workpiece hardness and other material property measurements, with in-process compensation for instrument frame distortion and the like.Type: GrantFiled: July 19, 2007Date of Patent: August 4, 2009Assignee: University of North Carolina at CharlotteInventors: Stuart T. Smith, Jonathan D. Ellis
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Patent number: 7565831Abstract: A production method of an indentation curve is given, in which when an indentation curve showing a relationship between indentation force and indentation depth in a process of indenting an indenter into a surface of a sample is produced, a measurement range using an (i?n)th (here, i and n are natural numbers) measurement value as a reference is provided, and the indentation depth or indentation force is temporarily measured when the indentation force or indentation depth is gradually changed, respectively, and when a temporarily measurement value obtained by the temporarily measurement is out of the determination range, indentation depth at the relevant indentation force or indentation force at the relevant indentation depth is measured and set as an ith measurement value, or the temporarily measurement value is used as the ith measurement value.Type: GrantFiled: October 31, 2006Date of Patent: July 28, 2009Assignee: National Institute for Materials ScienceInventor: Kensuke Miyahara
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Patent number: 7565841Abstract: In a hardness measurement system, selecting an operating frequency is facilitated by using a phase shift circuit. A hardness sensor is connected to an operating frequency selection apparatus and in a free end state the amplitude versus frequency characteristic is acquired, and the frequency and the phase of the peaks are measured and acquired as the free end characteristic. Next, the hardness sensor is placed into contact with a first test piece, and the frequency and the phase that change for the peaks are measured and acquired as the first characteristic. The same procedure is performed for a second test piece that is harder than the first test piece to yield the second characteristic. Based on these characteristics and a predetermined selection criterion a peak suitable for hardness measurement is selected and the operating frequency is set from the frequency of the peak.Type: GrantFiled: December 13, 2004Date of Patent: July 28, 2009Assignee: Nihon UniversityInventors: Sadao Omata, Yoshinobu Murayama, Katsuhito Honda
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Publication number: 20090165537Abstract: This invention relates to a device and method for optical nanoindentation measurement, according to which respective measurement results are obtained by having an indenter tip apply load to a fixed portion of a thin film, having an indenter tip apply load to a non-fixed portion of a thin film, and having a vibrating component transmit the dynamic properties of the vibration to the thin film. By combining the above measurement results in calculations, the Young's modulus, the Poisson's ratio, and the density of the thin film can be obtained.Type: ApplicationFiled: August 28, 2008Publication date: July 2, 2009Applicant: Industrial Technology Research InstituteInventors: Jiong-Shiun Hsu, Hui-Ching Lu, Chung-Lin Wu, Sheng-Jui Chen
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Publication number: 20090165538Abstract: Disclosed an indentation testing instrument including: a loading lever supported pivotally; an indenter provided on the loading lever; an indenter linkage section; a loading lever driving section; a reference lever supported pivotally having a same shaft center as the loading lever; an indenter reference section provided on the reference lever as a positional reference of a tip portion of the indenter; an indenter position detection section; a reference lever driving section; a stopper to stop the reference lever; a specimen surface reference measurement member to turn the loading lever from the state that the indenter reference section touches the specimen surface, and to measure a first indentation depth amount; and a machine frame reference measurement member to turn the loading lever from the state that the reference lever touches the stopper and the indenter reference section is spaced apart from the specimen surface, and to measure a second indentation depth amount.Type: ApplicationFiled: November 28, 2008Publication date: July 2, 2009Applicant: MITUTOYO CORPORATIONInventors: Takeshi Sawa, Eiji Furuta
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Publication number: 20090158826Abstract: A non-contact sensor is attached to the indenting module with its working range encompassing the tip of the indenter. The sensor directly measures penetration depth of the indenter during scratch, wear or instrumented hardness testing. During the test, the non-contact sensor records the height of the surface as the indenter penetrates the surface of the testing specimen.Type: ApplicationFiled: December 17, 2008Publication date: June 25, 2009Applicant: Micro Photonics, Inc.Inventor: Pierre Leroux
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Publication number: 20090145196Abstract: Disclosed is a hardness testing instrument which measures a hardness of a specimen, the hardness testing instrument including: a load applying section with the indenter or a flat indenter mounted thereon; a driving section to move the load applying section; a specimen table on which an object to be pressed is placed; a specimen table height adjustment section to adjust a height position; an indentation depth amount storage section to measure the indentation depth amount when the indenter is pressed to a reference block and to store the amount; a deformation amount storage section to measure the deformation amount of a load measuring instrument when the flat indenter is pressed to the load measuring instrument and to store the amount; a height position obtaining section to obtain a height position of the specimen table; and a calibration section to calibrate the load.Type: ApplicationFiled: November 28, 2008Publication date: June 11, 2009Applicant: MITUTOYO CORPORATIONInventors: Masaru Kawazoe, Masato Suzuki
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Publication number: 20090145208Abstract: The invention relates to a method for analyzing a scratch from a scratch test, applying a digital image acquisition device, a bulk and an indenter for applying a force on the bulk, the method comprising the following steps: determining the position of the beginning of the scratch relatively to the reference position, making the scratch on the bulk by means of the indenter while recording the applied force and at least one measurement parameter, as a function of the displacement of the indenter on the bulk relatively to the reference position, acquiring and recording the images of the whole of the significant portion of the scratch, the position on the scratch corresponding to the recorded images, being determined relatively to the reference position, synchronization of the recorded images, of the applied force and the measurement parameter, as a function of the displacement of the indenter, displaying the curves of the applied force and of the measurement parameter as a function of the displacement of theType: ApplicationFiled: November 26, 2008Publication date: June 11, 2009Applicant: CSM INSTRUMENTS SAInventors: Pierre-Jean COUDERT, Bertrand BELLATON
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Patent number: 7543519Abstract: A device for high precision generation and measurement of forces (both pressure and tension) and displacements along a single axis includes a shaft for transferring the forces along an axis X. At least two biased first leaf springs are attached to the shaft and clamped at each end. The device has great rigidity in an axis Y perpendicular to the axis X in which the forces and displacements are generated.Type: GrantFiled: January 25, 2006Date of Patent: June 9, 2009Assignee: ASMEC Advanced Surface Mechanics GmbHInventors: Thomas Chudoba, Volker Linss
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Publication number: 20090107221Abstract: A device for detecting the depth of penetration of the tip of an indenter of a hardness tester has a terminal crown turnable and slantable with respect to a cylindrical body of a reference sleeve, terminating with two spikes extending from diametrically opposed positions of a circular end surface of the terminal crown, the vertexes of which bear on the surface of the piece to be tested. The terminal crown having an end retained within the body of the sleeve and an inner circular surface defining a cuspid along a diameter orthogonal to the diameter of alignment of said two spikes, abutting on a planar circular end surface of the retaining body of the sleeve such to determine a linear or fulcrum abutment along diametrically aligned vertexes of said cuspid. The tester uses an indenter of a hard metal or compound by periodically recalibrating a hardness tester in function of said depth of penetration originally established on a reference sample of known and homogenous hardness.Type: ApplicationFiled: July 2, 2004Publication date: April 30, 2009Inventors: Alfred Ernst, Erik Ernst
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Publication number: 20090056427Abstract: Methods and instruments for characterizing a material, such as the properties of bone in a living human subject, using a test probe constructed for insertion into the material and a reference probe aligned with the test probe in a housing. The housing is hand held or placed so that the reference probe contacts the surface of the material under pressure applied either by hand or by the weight of the housing. The test probe is inserted into the material to indent the material while maintaining the reference probe substantially under the hand pressure or weight of the housing allowing evaluation of a property of the material related to indentation of the material by the probe. Force can be generated by a voice coil in a magnet structure to the end of which the test probe is connected and supported in the magnet structure by a flexure, opposing flexures, a linear translation stage, or a linear bearing.Type: ApplicationFiled: March 27, 2008Publication date: March 5, 2009Inventors: Paul Hansma, Barney Drake, Douglas Rehn, Jonathan Adams, Jason Lulejian
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Publication number: 20090044609Abstract: Disclosed a test management method for an indentation tester which includes a control section and forms an indentation on a surface of a heated or cooled sample by pressing an indenter to which a load is applied onto the surface of the sample, the test management method including the steps of: measuring a predetermined reference block as the sample under a plurality of temperature environments to obtain a test result; calculating a test error caused by temperature environment based on the test result by the control section; and judging whether or not the test error is within a predetermined range by the control section.Type: ApplicationFiled: August 6, 2008Publication date: February 19, 2009Applicant: MITUTOYO CORPORATIONInventors: Takeshi Sawa, Masaru Kawazoe, Kenji Okabe
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Patent number: 7487051Abstract: The present invention relates to a method of evaluating the fracture toughness of a material using the continuous indentation technique. In the method of this invention, the stress coefficient, strain hardening modulus and yield stress of the material are determined using the continuous indentation technique and, thereafter, the reduced elastic modulus (Er) of the material is calculated. The effective elastic modulus and the initial elastic modulus are calculated and, thereafter, the damage parameter is calculated using the void volume fraction. The critical elastic modulus and the characteristic fracture initiation point of the indentation depth are determined using the damage parameter and, thereafter, the fracture toughness of the material is evaluated. The present invention is advantageous in that the fracture toughness of a brittle material can be evaluated precisely using a nondestructive evaluation technique.Type: GrantFiled: September 14, 2005Date of Patent: February 3, 2009Assignee: Frontics, Inc.Inventors: Kwang-Ho Kim, Jung-Suk Lee, Yang-Won Seo, Yeol Choi
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Publication number: 20090025462Abstract: A drill bit includes a shank having a wasted shear safety section. Each bit is color coded to different shear safety ratings. The shank is fattened at the chuck end with flats extending on both sides of the wasted section. Safety ratings relate to the risk associated with different drilling situations and user expertise.Type: ApplicationFiled: October 3, 2008Publication date: January 29, 2009Inventor: David Rees MUGELI
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Patent number: 7472603Abstract: The present invention relates to a method of measuring residual stress and, more particularly, to a residual stress measuring method using a continuous indentation tester. Due to pile-up and sink-in of a material or a blunted tip, a conventional residual stress measuring method cannot compensate for error of a real contact (indentation) depth or directly remove stress through a thermal or mechanical technique in the conventional method of measuring residual stress of a weldment, so that it is very difficult to estimate a stress-free reference curve or to quantitatively measure residual stress. However, the present invention can precisely estimate a stress-free curve of a weldment using an indentation strength ratio (OIT ratio) of a stress-free base metal to the weldment, and compensates for error, occurring in the measurement of a material having a weldment or an anisotropic stress structure, based on the indentation strength ratio, thereby more precisely measuring residual stress.Type: GrantFiled: November 22, 2005Date of Patent: January 6, 2009Assignees: Frontics, Inc.Inventor: Kwang Ho Kim
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Publication number: 20080309069Abstract: A female element of a threaded tubular connection that is fitted to undergo diametrical expansion in a plastic deformation region. The female element is disposed at one end of a tubular component and includes on its external periphery a mechanism that absorbs scratch energy of a scratching body that may come into external contact with the female element and a mechanism that retains the scratch energy absorption mechanism. The retaining mechanism is configured to prevent release of debris from the scratch energy absorption mechanism during expansion of the threaded tubular connection.Type: ApplicationFiled: December 15, 2006Publication date: December 18, 2008Applicant: VALLOUREC MANNESMANN OIL & GAS FRANCEInventors: Nicolas Breziat, Benoit Duquesne, Philippe Henaut
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Publication number: 20080307863Abstract: A penetrometer that includes a hammer, an anvil, a penetrating rod, and an automated actuator. The penetrating rod extends from the anvil with the anvil between the hammer and the penetrating rod. The automated actuator is engaged with the hammer and configured to reciprocally impact the hammer against the anvil. The automated actuator is weight-supported by the anvil through the hammer with the penetrometer positioned with the automated actuator above the anvil and upon impact of the hammer against the anvil.Type: ApplicationFiled: June 14, 2007Publication date: December 18, 2008Inventor: Joel Sercel
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Patent number: 7458253Abstract: In a method for evaluating a fixing member to fix a toner having a surface layer, a hardness test is carried out by applying a pressure deformation from the surface side of the fixing member, and when a deformation of the surface layer by the pressure deformation is within an elastic range, the fixing member is regarded as a standard product.Type: GrantFiled: February 1, 2006Date of Patent: December 2, 2008Assignee: Ricoh Company, Ltd.Inventors: Norihiko Aze, Kyoichi Ashikawa, Kohji Kamiya, Minoru Matsuo, Takayuki Yoshii, Nozomu Takahata
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Patent number: 7454960Abstract: A hardness tester of a relatively large “cantilevering” and/or designed for permitting application of relatively large loads to the indenter may be constructed in a much slander and lighter manner by employing a loading mechanism based on the use of a second or auxiliary loading arm pivotally anchored to the frame of the tester and therefore completely independent of the stress structure of reference contained in the frame of the tester, which mechanical connects the anvil, on which the test object is placed, to the indenter. The load, applied to said second auxiliary arm is transmitted to the indenter carrying arm of the reference stress structure of the tester by unrestrained abutment of a rolling bearing solidly mounted on one of the two arms on a surface of the other arm. Along the trajectory of movement of the tip of the indenter toward the anvil.Type: GrantFiled: September 26, 2003Date of Patent: November 25, 2008Assignee: Erik ErnstInventor: Alfred Ernst
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Patent number: 7424822Abstract: A micro-hardness measurement method for calculating the hardness of a test sample by pushing an indenter in the test sample and forming an indentation thereon, including: a loading step for extracting load data showing the relationship between load L applied to the indenter and a depth ? to which the indenter is pushed in from the surface of the test sample; an unloading step of extracting unloading data showing the relationship between the load L applied to the indenter after the load is unloaded and the depth ?; a first step of judging, by comparing the unloading data with the load data, the load fluctuation amount from the maximum depth ?0 when unloading the load; and a second step of judging the load at the depth ?1(?1<?0) when unloading the load or the load fluctuation amount in the vicinity of the depth ?1.Type: GrantFiled: December 19, 2006Date of Patent: September 16, 2008Assignee: Renias Co. Ltd.Inventor: Yoshinori Isomoto
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Patent number: 7415900Abstract: Blast pressure gauges and methods for detecting blast pressure during a blast test. The gauges operate independently of power sources, are portable, and are used in harsh environments including test ranges. Each embodiment is constructed to detect blast pressures as required in the circumstances of a particular blast test.Type: GrantFiled: January 31, 2007Date of Patent: August 26, 2008Assignee: The United States of America as represented by the Secretary of the NavyInventor: Rex N. Randolph
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Patent number: 7412870Abstract: A method and apparatus wherein a material or object to be tested is placed on a base support. A stopper assembly having a stopper tip on one end in contact with the test material or object, and a washer on the opposite end attached to a rod. A projectile is propelled with a selected level of force along the rod and impacts the washer, which transmits the force of impact through the stopper tip to the test material or object. The level of propelling force, the mass of the projectile, the construction of the stopper assembly and the location of impact on the test material or object may be precisely adjusted to simulate real-life impacts.Type: GrantFiled: December 2, 2005Date of Patent: August 19, 2008Assignee: California Micro DevicesInventor: Anguel S. Brankov
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Publication number: 20080141763Abstract: The portable magnetic hardness tester support assembly is made for testing the hardness of small or large ferrous metallic specimens. The hardness tester is made up of a hardness tester head which uses the standard test method for Rockwell hardness testing and of a magnet, the two of which are held together by a nonmagnetic support body. The portable magnetic hardness tester attaches to the specimen through the magnetic force generated by the magnet.Type: ApplicationFiled: June 3, 2007Publication date: June 19, 2008Inventor: Margareta Antonescu
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Patent number: 7380443Abstract: A hardness testing apparatus has an indenter shaft having an indenter at a top thereof, a force motor for moving the indenter shaft in its axial direction and applying a predetermined test force to a sample through the indenter, an external force detection section for detecting an external force applied from outside of the hardness testing apparatus to the indenter shaft when the indenter shaft is moved by the force motor, and an external force adjustment and control section for controlling the force motor to apply the predetermined test force to the sample while deadening the external force detected by the external force detection section.Type: GrantFiled: August 30, 2006Date of Patent: June 3, 2008Assignee: Mitutoyo CorporationInventors: Masaharu Tsujii, Fumihiko Koshimizu, Eiji Furuta, Ryouji Nakamura, Satoko Nomaguchi, Ryotaro Fukuchi
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Patent number: 7354617Abstract: A method for evaluating a fixing belt includes forming a fixing belt which includes a substrate, an elastic layer laminated on the substrate, and a mold releasing layer laminated on the elastic layer. A universal hardness test for the fixing belt is performed. The fixing belt is judged as an acceptable product if a creep value CHU is included within a range of 0.40?CHU ?3.50 (%) when the universal hardness test is performed for the fixing belt and when the creep value CHU, which is measured from the side of the mold releasing layer, is defined by the following formula: CHU=(h2-hl)/hl×100 (%) where h1 is a pushed depth when a test load reaches a predetermined value which is kept for a predetermined period of time, and h2 is a pushed depth when a predetermined period of time is elapsed after the test load is removed.Type: GrantFiled: January 14, 2005Date of Patent: April 8, 2008Assignee: Ricoh Company, Ltd.Inventors: Kohji Kamiya, Kyoichi Ashikawa, Norihiko Aze, Minoru Matsuo, Nozomu Takahata
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Patent number: 7352271Abstract: A probe body (200) includes a middle closing portion (250) formed upright on a connector front portion (261A) and a female thread (261D) into which a male screw (110) is screwed. A sensor module (300) includes a slidable-contact portion (322) that slidably contacts with the connector front portion (261A), a pressing member (321) that is pressed against the middle closing portion (250) and an insertion hole (325). The insertion hole (325) has a widened portion (325B) that is inclined in such a manner that a distance between an opening on the pressing portion (321) side, the opening positioned on a screw-hole-forming-portion end surface (324), and the pressing portion (321) gradually becomes larger toward the slidable-contact portion (322) side. The insertion hole (325) has a diameter larger than that of the male screw (110).Type: GrantFiled: May 14, 2007Date of Patent: April 1, 2008Assignee: Mitutoyo CorporationInventors: Kentaro Nemoto, Takeshi Yamamoto
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Publication number: 20080028840Abstract: The present invention provides an apparatus and method for performing surface property measurements, such as workpiece hardness and other material property measurements, with in-process compensation for instrument frame distortion and the like.Type: ApplicationFiled: July 19, 2007Publication date: February 7, 2008Inventors: Stuart T. Smith, Jonathan D. Ellis
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Patent number: 7316155Abstract: A test table for measuring lateral forces and displacements while simultaneously applying, if necessary, normal forces, particularly in nanoidenters and in scratch and wear testers. The test table is mounted in a manner that enables it to be laterally displaced, and the lateral force and displacement can be determined by means of a measured-value acquisition. The test table is fixed between at least two vertically upright leaf springs, which can be laterally deflected in the direction of the lateral (horizontal) motion of the test table to be effected.Type: GrantFiled: October 23, 2003Date of Patent: January 8, 2008Assignee: ASMEC Advanced Surface Mechanics GmbHInventors: Thomas Chudoba, Norbert Schwarzer, Ilja Hermann
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Patent number: 7302831Abstract: A device and method for scratch and/or mar testing the surface of a material specimen. In an embodiment, the scratch testing device comprises a scratching member. In addition, the scratch testing device comprises a carriage operable to move the scratching member. Further, the scratch testing device comprises a load mechanism, wherein the load mechanism applies a load to the scratching member.Type: GrantFiled: December 15, 2005Date of Patent: December 4, 2007Inventors: Allan H. Moyse, Hung-Jue Su
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Patent number: 7287419Abstract: A method for measuring toughness of interfacial adhesion including applying a normal force with a probe to a surface of a coating joined to a major surface of a substrate of a medical stent, wherein the surface is substantially parallel to the major surface, and applying a lateral force to the coating with the probe by laterally moving a position of the probe relative to the major surface such that the probe forms at least one delaminated region in the coating as the position of the probe moves laterally across the major surface, the delaminated region having a starting point and an ending point. The method further includes measuring a magnitude of the lateral force over time, and determining a toughness of interfacial adhesion between the coating and the major surface based on changes in magnitude of the lateral force as the position of the probe moves from the starting point to ending point.Type: GrantFiled: December 22, 2005Date of Patent: October 30, 2007Assignee: Hysitron, Inc.Inventors: Dehua Yang, David J. Vodnick, Richard J. Nay, Thomas J. Wyrobek
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Patent number: 7287420Abstract: A method for measuring toughness of interfacial adhesion including applying a normal force with a probe to a surface of a coating joined to a major surface of a substrate of a medical device, wherein the surface is substantially parallel to the major surface, and applying a lateral force to the coating with the probe by laterally moving a position of the probe relative to the major surface such that the probe forms at least one delaminated region in the coating as the position of the probe moves laterally across the major surface, the delaminated region having a starting point and an ending point. The method further includes measuring a magnitude of the lateral force over time, and determining a toughness of interfacial adhesion between the coating and the major surface based on changes in magnitude of the lateral force as the position of the probe moves from the starting point to ending point.Type: GrantFiled: December 22, 2005Date of Patent: October 30, 2007Assignee: Hysitron, Inc.Inventors: Dehua Yang, David J. Vodnick, Richard J. Nay, Thomas J. Wyrobek
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Patent number: 7287418Abstract: A method for measuring toughness of interfacial adhesion including applying a normal force with a probe to a surface of a coating joined to a major surface of a substrate of an electronic structure, wherein the surface is substantially parallel to the major surface, and applying a lateral force to the coating with the probe by laterally moving a position of the probe relative to the major surface such that the probe forms at least one delaminated region in the coating as the position of the probe moves laterally across the major surface, the delaminated region having a starting point and an ending point. The method further includes measuring a magnitude of the lateral force over time, and determining a toughness of interfacial adhesion between the coating and the major surface based on changes in magnitude of the lateral force as the position of the probe moves from the starting point to ending point.Type: GrantFiled: December 22, 2005Date of Patent: October 30, 2007Assignee: Hysitron, Inc.Inventors: Dehua Yang, David J. Vodnick, Richard J. Nay, Thomas J. Wyrobek
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Publication number: 20070193346Abstract: Modifications to the indenter probe tips and transducer, and proper selection of optics in an indentation system allow straight down optical viewing of the sample surface under the indentation tip by a microscope, by providing an optical path through the transducer from the sample surface under the tip to a microscope objective, thereby simplifying alignment of the tip to features on the sample.Type: ApplicationFiled: February 20, 2007Publication date: August 23, 2007Inventor: Wayne A. Bonin
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Publication number: 20070157710Abstract: A micro-hardness measurement method for calculating the hardness of a test sample by pushing an indenter in the test sample and forming an indentation thereon, including: a loading step for extracting load data showing the relationship between load L applied to the indenter and a depth ? to which the indenter is pushed in from the surface of the test sample; an unloading step of extracting unloading data showing the relationship between the load L applied to the indenter after the load is unloaded and the depth ?; a first step of judging, by comparing the unloading data with the load data, the load fluctuation amount from the maximum depth ?0 when unloading the load; and a second step of judging the load at the depth ?1 (?1<?0) when unloading the load or the load fluctuation amount in the vicinity of the depth ?1.Type: ApplicationFiled: December 19, 2006Publication date: July 12, 2007Applicant: RENIAS CO., LTD.Inventor: Yoshinori Isomoto
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Publication number: 20070151340Abstract: A nano-indentation ultrasonic detecting system for detecting mechanical properties of a target material. An indentation device, disposed on a surface of the target material, generates an indentation on the surface, obtaining the relation between the Young's modulus and the Poisson's ratio of the target material. An ultrasonic generator is movably disposed on the surface of the target material, generating at least two different ultrasonic signals thereon. An ultrasonic receiver is disposed on the surface of the target material and separated from the ultrasonic generator, receiving the ultrasonic signals. The result of a nano-indentation experiment are applied in the ultrasonic theory and iterated by the ultrasonic experimental data and theory, obtaining the Young's modulus of the target material. The obtained Young's modulus of the target material is substituted back in the result of the nano-indentation experiment, obtaining the Poisson's ratio of the target material.Type: ApplicationFiled: October 23, 2006Publication date: July 5, 2007Applicant: INDUSTRIAL TECHNOLOGY RESEARCH INSTITUTEInventors: Jiong-shiun Hsu, Kai-Yu Cheng, Yu-Shyan Liu, Jeah-Sheng Wu, Yu-Yi Su, Chi-Sheng Chang
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Patent number: 7232415Abstract: A system and method are disclosed for noninvasively diagnosing limb compartment syndrome by measuring a quantitative modulus of hardness. In the preferred embodiment, a nonmovable pressure probe mounted in the center of a movable spring loaded platform is applied against a limb compartment. Force is gradually applied to the probe and the platform, compressing a limb compartment. Pressure on the probe is measured as the probe pushes into the limb. The spring loaded platform displaces, and the distance of the probe tip to the platform is measured. This distance is the depth of compression into the limb by the probe. The relationship of incremental pressures in the probe and the corresponding distance of the probe tip to the platform for each pressure is plotted. A linear regression analysis is performed whose slope forms a quantitative modulus of hardness.Type: GrantFiled: June 14, 2006Date of Patent: June 19, 2007Assignee: NCSE, LLCInventor: Bruce Steinberg
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Patent number: 7194896Abstract: It is possible to blast air on a surface portion of a measured object from a hole of pressing means, project illumination light in a concentric pattern with an optical element and shoot the measured object with a CCD so as to visually grasp hardness distribution on the surface portion from distortion of the concentric pattern displayed on an observed image. As for the hardness distribution, it is possible to detect luminance distribution of a measured object image obtained by the CCD so as to display the concentric pattern which is the luminance distribution as a conspicuous representation of the hardness distribution. And the luminance distribution can also be represented in the concentric pattern by multiplying a luminance value by an overflowing coefficient.Type: GrantFiled: September 15, 2004Date of Patent: March 27, 2007Assignees: Makoto Kaneko and Tomohiro Kawahara, Fujinon Corporation, Shinji TanakaInventors: Makoto Kaneko, Shinji Tanaka, Tomohiro Kawahara, Shinji Takeuchi
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Patent number: 7162919Abstract: Blast pressure gauges and methods for detecting blast pressure during a blast test. The gauges operate independently of power sources, are portable, and are used in harsh environments including test ranges. Each embodiment is constructed to detect blast pressures as required in the circumstances of a particular blast test.Type: GrantFiled: April 29, 2005Date of Patent: January 16, 2007Assignee: The United States of America as represented by the Secretary of the NavyInventor: Rex N. Randolph
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Patent number: 7162932Abstract: In a method for determining the radial modulus of elasticity of paper or a corresponding web-like material that can be reeled or wound on a reel, the connection between the force and deflection of a material arranged in layers is measured. The measurements of force and deflection necessary for calculating the radial modulus of elasticity are performed on a reel of paper or corresponding material outside the reeling or winding position by loading the reel with a press member.Type: GrantFiled: October 22, 2003Date of Patent: January 16, 2007Assignee: Metso Paper, Inc.Inventor: Marko Jorkama
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Patent number: 7121136Abstract: A hardness testing apparatus has an indenter shaft having an indenter at a top thereof, a force motor for moving the indenter shaft in its axial direction and applying a predetermined test force to a sample through the indenter, an external force detection section for detecting an external force applied from outside of the hardness testing apparatus to the indenter shaft when the indenter shaft is moved by the force motor, and an external force adjustment and control section for controlling the force motor to apply the predetermined test force to the sample while deadening the external force detected by the external force detection section.Type: GrantFiled: December 24, 2003Date of Patent: October 17, 2006Assignee: Mitutoyo CorporationInventors: Masaharu Tsujii, Fumihiko Koshimizu, Eiji Furuta, Ryouji Nakamura, Satoko Nomaguchi, Ryotaro Fukuchi
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Patent number: 7102517Abstract: A test fixture for evaluating an RF identification system and related methods for evaluating an RF tag and/or an RF antenna, are disclosed. The test fixture provides predefined RF tag positions that can be used to test: read position, distance and antenna capability and adjustments. By placing an actual RF tag in each of the predefined positions, a read of the tag information can be performed. A three dimensional plot can then be established for the sensitivity field of the antenna. By placing the RF tag in various positions and orientations, the antenna can be adjusted until an optimum field is produced. The invention can also be used to determine RF tag performance within the optimized field.Type: GrantFiled: August 20, 2004Date of Patent: September 5, 2006Assignee: International Business Machines CorporationInventors: Ray A. Reyes, David L. Schmoke, Edward Sherwood
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Patent number: 7096720Abstract: A hardness tester for measuring hardness of a sample by applying a predetermined test load to the sample with an indenter attached to an indenter attaching member so as to form an indentation on the sample, comprises: the indenter attaching member to which the indenter is attached detachably; the indenter which comprises an identification member with identification information to identify the indenter; an indenter information storing member to store indenter information and the identification information of the indenter, where the indenter information is matched with the respective identification information; an identification information acquiring member to acquire the identification information from the identification member when the indenter is attached to the indenter attaching member; an indenter information acquiring member to acquire the indenter information corresponding to the identification information acquired by the identification information acquiring from the indenter information storing member.Type: GrantFiled: August 29, 2005Date of Patent: August 29, 2006Assignee: Mitutoyo CorporationInventors: Hirotaka Hayashi, Takeshi Sawa, Noriyoshi Ozawa