Electrical Property Patents (Class D10/75)
Oscilloscope or oscillograph (Class D10/76)
Battery, vaccum tube, transistor or spark plug tester (11) (Class D10/77)
Provided with handle, or hand-held (Class D10/78)
Element or attachment (4) (Class D10/80)
  • Operator with printer for analyzing machine of liquid chromatograph
    Patent number: D356745
    Type: Grant
    Filed: November 19, 1993
    Date of Patent: March 28, 1995
    Assignee: Hitachi, Ltd.
    Inventors: Atsushi Ninomiya, Seiji Kamimura, Isamu Takekoshi, Hironori Kaji, Hideo Seki, Kaoru Hagiya
  • On-site oil analyzing apparatus
    Patent number: D358105
    Type: Grant
    Filed: February 28, 1994
    Date of Patent: May 9, 1995
    Assignee: On-Site Analysis, Inc.
    Inventor: Carlton S. Joyce
  • Portable protocol analyzer
    Patent number: D360150
    Type: Grant
    Filed: March 30, 1994
    Date of Patent: July 11, 1995
    Assignee: Hewlett-Packard Company
    Inventor: Carlton Glitzke
  • Meter set for a motor vehicle
    Patent number: D360151
    Type: Grant
    Filed: May 16, 1994
    Date of Patent: July 11, 1995
    Assignee: Daewoo Heavy Industries Co., Ltd.
    Inventors: Yong-Hee Kim, Beung-Jin Kim
  • Console for measurement scanner for semi-conductor
    Patent number: D360598
    Type: Grant
    Filed: July 26, 1994
    Date of Patent: July 25, 1995
    Assignee: Hitachi, Ltd.
    Inventors: Toshihiko Wada, Osamu Yamada, Shinobu Otsuka
  • Measurement scanner for semi-conductor
    Patent number: D360599
    Type: Grant
    Filed: July 26, 1994
    Date of Patent: July 25, 1995
    Assignee: Hitachi, Ltd.
    Inventors: Toshihiko Wada, Tadashi Ohtaka, Nobuyoshi Hashimoto
  • Computer user interface enclosure for use with a container inspection machine
    Patent number: D360644
    Type: Grant
    Filed: September 9, 1994
    Date of Patent: July 25, 1995
    Assignee: Emhart Glass Machinery Investments Inc.
    Inventor: Monti D. Emery
  • Container inspection machine
    Patent number: D361339
    Type: Grant
    Filed: September 9, 1994
    Date of Patent: August 15, 1995
    Assignee: Emhart Glass Machinery Investments Inc.
    Inventor: Monti D. Emery
  • Apparatus for measuring electric field strength
    Patent number: D362197
    Type: Grant
    Filed: September 30, 1994
    Date of Patent: September 12, 1995
    Assignee: DX Antenna Co., Ltd.
    Inventor: Yoshio Fujino
  • Automobile block heater circuit monitor
    Patent number: D363241
    Type: Grant
    Filed: March 29, 1994
    Date of Patent: October 17, 1995
    Inventors: Kenneth R. Thomson, Gary U. Kempert
  • Laboratory nephelometer
    Patent number: D363676
    Type: Grant
    Filed: October 29, 1993
    Date of Patent: October 31, 1995
    Assignee: Hach Company
    Inventors: Mark E. Anderson, Richard J. Cooper, Ernie R. Paoli, Robert D. Stream
  • Leakage protector
    Patent number: D363680
    Type: Grant
    Filed: January 20, 1995
    Date of Patent: October 31, 1995
    Inventor: Wu W. Shan
  • Process control panel
    Patent number: D364382
    Type: Grant
    Filed: November 15, 1994
    Date of Patent: November 21, 1995
    Assignee: Kabushiki Kaisha Toshiba
    Inventor: Kazuharu Yamamoto
  • Chromatograph
    Patent number: D364576
    Type: Grant
    Filed: January 13, 1995
    Date of Patent: November 28, 1995
    Assignee: Hewlett-Packard Company
    Inventor: Michael D. Glaser
  • Leakage protector
    Patent number: D364826
    Type: Grant
    Filed: January 20, 1995
    Date of Patent: December 5, 1995
    Inventor: Wen S. Wu
  • Line isolation monitor
    Patent number: D365030
    Type: Grant
    Filed: January 5, 1994
    Date of Patent: December 12, 1995
    Assignee: Square D Company
    Inventors: Stephen P. Benesh, David W. Hasenohrl
  • Spectrophotometer
    Patent number: D365291
    Type: Grant
    Filed: August 5, 1994
    Date of Patent: December 19, 1995
    Inventor: Nigel B. Chitty
  • Semiconductor manufacturing device
    Patent number: D365584
    Type: Grant
    Filed: June 6, 1994
    Date of Patent: December 26, 1995
    Assignees: Tokyo Electron Kabushiki Kaisha, Tokyo Electron Yamanashi Kabushiki Kaisha
    Inventors: Tatsuya Nakagome, Takashi Tozawa
  • Oil analysis apparatus
    Patent number: D366625
    Type: Grant
    Filed: January 5, 1995
    Date of Patent: January 30, 1996
    Assignee: Thermo Jarrell Ash Corporation
    Inventor: Charles E. Carroll
  • Electrical current sensor
    Patent number: D367013
    Type: Grant
    Filed: April 13, 1995
    Date of Patent: February 13, 1996
    Assignee: Liaisons Electroniques-Mecaniques Lem S.A.
    Inventor: Pierre Cattaneo
  • Antenna performance analyzer
    Patent number: D368270
    Type: Grant
    Filed: October 3, 1994
    Date of Patent: March 26, 1996
    Assignee: MFJ Enterprises, Inc.
    Inventor: Martin F. Jue
  • Electronic meter
    Patent number: D369563
    Type: Grant
    Filed: December 21, 1993
    Date of Patent: May 7, 1996
    Assignee: Tektronix, Inc.
    Inventor: Howard M. Meehan
  • Enclosure for a brightness sensor
    Patent number: D371516
    Type: Grant
    Filed: June 20, 1995
    Date of Patent: July 9, 1996
    Assignee: IBM Corporation
    Inventors: Wolfgang Guber, Volker Boettinger
  • Spectro photometer
    Patent number: D373315
    Type: Grant
    Filed: July 27, 1995
    Date of Patent: September 3, 1996
    Assignee: Hitachi, Ltd.
    Inventors: Atsushi Ninomiya, Isamu Takekoshi, Masaya Kojima
  • Process monitoring controller
    Patent number: D373345
    Type: Grant
    Filed: August 9, 1995
    Date of Patent: September 3, 1996
    Assignee: Kabushiki Kaisha Toshiba
    Inventors: Mikio Hamada, Mitsugu Ueno
  • DC biopotential measuring unit
    Patent number: D374184
    Type: Grant
    Filed: June 7, 1995
    Date of Patent: October 1, 1996
    Assignee: Biofield Corp.
    Inventors: John D. Stephens, Seth D. Nathanson, LeRoy J. LaCelle, Ted F. Pierson, Laura Welland
  • Network analyzer
    Patent number: D377319
    Type: Grant
    Filed: December 12, 1995
    Date of Patent: January 14, 1997
    Assignee: Advantest Corporation
    Inventors: Hiroaki Amano, Chizuru Arai
  • Electronics enclosure
    Patent number: D377339
    Type: Grant
    Filed: June 30, 1995
    Date of Patent: January 14, 1997
    Assignee: Motorola, Inc.
    Inventors: Michael S. Beruscha, Michael R. Lenz
  • Electroacoustic transducer
    Patent number: D377353
    Type: Grant
    Filed: April 30, 1996
    Date of Patent: January 14, 1997
    Assignee: Star Micronics Co., Ltd.
    Inventors: Kazushige Tajima, Yoshio Imahori
  • Electroacoustic transducer
    Patent number: D377936
    Type: Grant
    Filed: March 7, 1996
    Date of Patent: February 11, 1997
    Assignee: Star Micronics Co., Ltd.
    Inventor: Yoshio Imahori
  • Electronics enclosure
    Patent number: D380199
    Type: Grant
    Filed: June 30, 1995
    Date of Patent: June 24, 1997
    Assignee: Motorola, Inc.
    Inventors: Michael S. Beruscha, Michael R. Lenz
  • Process control instrument
    Patent number: D381590
    Type: Grant
    Filed: May 8, 1996
    Date of Patent: July 29, 1997
    Assignee: Elsag International N.V.
    Inventors: Stewart Thoeni, Trevor Aland
  • Electric meter
    Patent number: D382498
    Type: Grant
    Filed: April 26, 1996
    Date of Patent: August 19, 1997
    Assignee: Siemens Measurements Limited
    Inventor: Ronald Warwick
  • Housing for#electrical measuring, monitoring, regulating and controlling instruments
    Patent number: D383401
    Type: Grant
    Filed: February 22, 1996
    Date of Patent: September 9, 1997
    Assignee: Gestra Aktiengesellschaft
    Inventor: Hans Kehlbeck
  • Housing for electrical measuring, monitoring, regulating and controlling instruments
    Patent number: D383403
    Type: Grant
    Filed: February 22, 1996
    Date of Patent: September 9, 1997
    Assignee: Gestra Aktiengesellschaft
    Inventor: Hans Kehlbeck
  • Wafer prober
    Patent number: D383683
    Type: Grant
    Filed: April 25, 1996
    Date of Patent: September 16, 1997
    Assignee: Tokyo Electron Limited
    Inventors: Osamu Kamata, Masahiko Sugiyama, Munetoshi Nagasaka, Haruhiko Yoshioka, Kazumi Yamagata
  • Mini faulted circuit indicator
    Patent number: D386098
    Type: Grant
    Filed: June 24, 1996
    Date of Patent: November 11, 1997
    Assignee: Dipl.-Ing H. Horstmann GmbH
    Inventor: Hendrik Horstmann
  • Portable machinery analyzer
    Patent number: D386099
    Type: Grant
    Filed: June 24, 1996
    Date of Patent: November 11, 1997
    Assignee: Machinexpert, LLC
    Inventor: Ralph Douglas Billington
  • Radar display unit
    Patent number: D390484
    Type: Grant
    Filed: March 14, 1997
    Date of Patent: February 10, 1998
    Assignee: Japan Radio Co., Ltd.
    Inventors: Shinichiro Nishimura, Shigeru Namaizawa, Toshiro Taki, Tomokazu Abe
  • Calorimetric wattmeter for testing microwave ovens
    Patent number: D391502
    Type: Grant
    Filed: November 29, 1996
    Date of Patent: March 3, 1998
    Inventor: Paul G. Moerman
  • Transmission impairment measuring instrument
    Patent number: D391876
    Type: Grant
    Filed: March 20, 1996
    Date of Patent: March 10, 1998
    Assignee: Convex Corportion
    Inventor: James F. Turner
  • Electrical field detector
    Patent number: D391877
    Type: Grant
    Filed: May 16, 1997
    Date of Patent: March 10, 1998
    Inventor: John Cassidy
  • Repair station cabinet
    Patent number: D392199
    Type: Grant
    Filed: December 27, 1996
    Date of Patent: March 17, 1998
    Assignee: Electronic Packaging Co.
    Inventors: Evan J. Evans, Raymond DeWine Heistand, II
  • Probe controller housing
    Patent number: D399152
    Type: Grant
    Filed: May 9, 1997
    Date of Patent: October 6, 1998
    Assignee: Scientific Instrument Services Inc.
    Inventor: John N. Manos
  • Machine tool operation console
    Patent number: D399493
    Type: Grant
    Filed: May 12, 1997
    Date of Patent: October 13, 1998
    Assignee: Toshiba Kikai Kabushiki Kaisha
    Inventors: Seiji Nakajima, Takeshi Momochi
  • Electrical current sensor
    Patent number: D401171
    Type: Grant
    Filed: October 29, 1997
    Date of Patent: November 17, 1998
    Assignee: Liaisons Electroniques-Mecaniques LEM S.A.
    Inventor: Pierre Cattaneo
  • Adjustable controls housing and cabinet therefore
    Patent number: D411960
    Type: Grant
    Filed: March 25, 1997
    Date of Patent: July 13, 1999
    Assignee: Wagner International AG
    Inventor: Horst Adams
  • Automated work station
    Patent number: D413341
    Type: Grant
    Filed: May 15, 1998
    Date of Patent: August 31, 1999
    Assignee: Dowty Aerospace Yakima
    Inventors: Walter G. Gellerson, Robert B. Kingsley, Randall G. Cline
  • Machine for forming a semiconductor wafer film
    Patent number: D414503
    Type: Grant
    Filed: March 20, 1998
    Date of Patent: September 28, 1999
    Assignee: Tokyo Electron Limited
    Inventor: Susumu Katoh
  • Wafer level burn-in tester
    Patent number: D426785
    Type: Grant
    Filed: November 29, 1999
    Date of Patent: June 20, 2000
    Assignee: Matsushita Electric Industrial Co., Ltd.
    Inventors: Yoshihiko Asai, Yoshikazu Ezawa