Patents Represented by Attorney, Agent or Law Firm Ashok K. Janah
  • Patent number: 7901552
    Abstract: A sputtering chamber has a sputtering target comprising a backing plate and a sputtering plate. The backing plate comprises a backside surface having a plurality of concentric circular grooves and a plurality of arcuate channels which intersect the circular grooves. The sputtering target can be positioned abutting a heat exchanger housing which holds heat transfer fluid and a plurality of rotatable magnets.
    Type: Grant
    Filed: October 5, 2007
    Date of Patent: March 8, 2011
    Assignee: Applied Materials, Inc.
    Inventor: Cristopher M. Pavloff
  • Patent number: 7858503
    Abstract: In an ion implantation method, a substrate is placed in a process zone and ions are implanted into a region of the substrate to form an ion implanted region. A porous capping layer is deposited on the ion implanted region. The substrate is annealed to volatize at least 80% of the porous capping layer overlying the ion implanted region during the annealing process. An intermediate product comprises a substrate, a plurality of ion implantation regions on the substrate, and a porous capping layer covering the ion implantation regions.
    Type: Grant
    Filed: February 6, 2009
    Date of Patent: December 28, 2010
    Assignee: Applied Materials, Inc.
    Inventors: Jose Ignacio Del Agua Borniquel, Tze Poon, Robert Schreutelkamp, Majeed Foad
  • Patent number: 7824498
    Abstract: A substrate support has a support structure and a coating on the support structure having a carbon-hydrogen network. The coating has a contact surface having a coefficient of friction of less than about 0.3 and a hardness of at least about 8 GPa. The contact surface of the coating is capable of reducing abrasion and contamination of a substrate that contacts the contact surface. In one version, the support structure has a dielectric covering an electrode. A plurality of mesas on the dielectric have a coating with the contact surface thereon.
    Type: Grant
    Filed: February 24, 2004
    Date of Patent: November 2, 2010
    Assignee: Applied Materials, Inc.
    Inventors: Vijay D. Parkhe, Kurt J. Ahmann, Matthew C. Tsai, Steve Sansoni
  • Patent number: 7705275
    Abstract: A substrate support comprises top, middle and bottom plates which are brazed together. The top plate has a top surface with a plurality of outwardly projecting mesas dispersed across a recessed pocket, a network of recessed grooves, a vacuum port terminating in the recessed grooves, and plurality of gas ports. The middle plate has a plurality of middle feedthroughs aligned to corresponding top feedthroughs of the top plate, and the bottom plate has a plurality of bottom feedthroughs aligned to the middle feedthroughs of the middle plate. The top and middle plates are joined by a first brazed bond layer and the middle and bottom plates are joined by a second brazed bond layer.
    Type: Grant
    Filed: August 17, 2006
    Date of Patent: April 27, 2010
    Assignee: Applied Materials, Inc.
    Inventors: Salvador P. Umotoy, Lawrence Chung-Lai Lei, Gwo-chun Tzu, Xiangxiong (John) Yuan, Michael S. Jackson, Hymam Lam
  • Patent number: 7476880
    Abstract: A shaped particle beam writing strategy can be used to write a pattern with a particle beam onto a substrate. The pattern comprises a circuit design that is fractured into a plurality of arbitrary polygons. The writing strategy comprises transforming and fracturing the arbitrary polygons into a plurality of restricted polygons, each restricted polygon being represented by a location coordinate, at least two dimension coordinates, and at least one external edge indicator. Thereafter, the restricted polygons are tiled into a set of tiles comprising interior tiles and external edge tiles. Flash data is assigned for each tile such that the interior tiles are assigned a first flash area and the external edge tiles are assigned a second flash area that is smaller than the first flash area. The flash data is arranged in a selected order to write the pattern with a modulated particle beam, such as an electron beam, on a substrate.
    Type: Grant
    Filed: October 3, 2005
    Date of Patent: January 13, 2009
    Assignee: Applied Materials, Inc.
    Inventors: Benyamin Buller, Richard L. Lozes, Robert M. Sills
  • Patent number: 7442388
    Abstract: Phospholipid based powders for drug delivery applications are disclosed. The powders comprise a polyvalent cation in an amount effective to increase the gel-to-liquid crystal transition temperature of the particle compared to particles without the polyvalent cation. The powders are hollow and porous and are preferably administered via inhalation.
    Type: Grant
    Filed: May 8, 2001
    Date of Patent: October 28, 2008
    Inventors: Jeffry G. Weers, Thomas E. Tarara, Luis A. Dellamary, Jean G. Riess, Ernest G. Schutt
  • Patent number: 7368102
    Abstract: The present invention is directed to the administration of aminoglycosides. In particular, the present invention is directed to compositions and methods for the pulmonary administration of aminoglycosides. According to a preferred embodiment, compositions and methods are provided for the localized treatment of respiratory infections.
    Type: Grant
    Filed: December 19, 2002
    Date of Patent: May 6, 2008
    Assignee: Nektar Therapeutics
    Inventors: Thomas E. Tarara, Jeffry G. Weers, Geraldine Venthoye
  • Patent number: 7160521
    Abstract: A substrate processing apparatus has a process chamber and an effluent treatment reactor. The process chamber has a substrate support, a process gas supply, a gas energizer, and an exhaust conduit. The effluent treatment reactor has an effluent inlet to receive effluent from the exhaust conduit of the process chamber, a plasma cell having one or more electrodes electrically connected to a voltage source adapted to electrically bias the electrodes to couple energy to effluent received in the plasma cell, a scrubbing cell coaxially exterior to the plasma cell, the scrubbing cell having a scrubbing fluid inlet to introduce scrubbing fluid into effluent in the scrubbing cell and a scrubbing fluid outlet, and an effluent outlet to release the treated effluent.
    Type: Grant
    Filed: January 13, 2003
    Date of Patent: January 9, 2007
    Assignee: Applied Materials, Inc.
    Inventors: Peter Porshnev, Sebastien Raoux, Mike Woolston, Christopher L. Aardahl, Rick J. Orth, Kenneth G. Rappe
  • Patent number: 7141236
    Abstract: Methods and compositions for delivering macromolecules to or via the respiratory tract, such that the macromolecules exhibit improved local and/or systemic bioavailability are provided. Such methods utilize lipid-based microstructures formed in combination with at least one bioactive macromolecule, which have a superior ability to rapidly release the bioactive macromolecule(s) thereby resulting in improved local and/or systemic bioavailability of the bioactive macromolecule(s). Such improved bioavailability is believed to be due, in part, to reduction of scavenging by bronchoalveolar macrophages and/or mucociliary clearance.
    Type: Grant
    Filed: April 26, 2002
    Date of Patent: November 28, 2006
    Assignee: Nektar Therapeutics
    Inventors: Adrian I. Bot, Luis A. Dellamary, Dan J. Smith
  • Patent number: 7041200
    Abstract: In a magnetron sputtering chamber, a substrate is placed in the chamber and a deposition shield is maintained about the substrate to shield internal surfaces in the chamber. The deposition shield has a textured surface that may be formed by a hot pressing process or by a coating process, and that allows the accumulated sputtered residues to stick thereto without flaking off. An electrical power is applied to a high density sputtering target facing the substrate to form a plasma in the chamber while a rotating magnetic field of at least about 300 Gauss is applied about the target to sputter the target. Advantageously, the sputtering process cycle can be repeated for at least about 8,000 substrates without cleaning the internal surfaces in the chamber, and even while still generating an average particle count on each processed substrate of less than 1 particle per 10 cm2 of substrate surface area.
    Type: Grant
    Filed: April 19, 2002
    Date of Patent: May 9, 2006
    Assignee: Applied Materials, Inc.
    Inventors: Hien-Minh Huu Le, Keith A. Miller, Hoa T. Kieu, Kenny King-Tai Ngan
  • Patent number: 6872322
    Abstract: A process for etching multiple layers on a substrate 25 in an etching chamber 30 and cleaning a multilayer etchant residue formed on the surfaces of the walls 45 and components of the etching chamber 30. In multiple etching steps, process gas comprising different compositions of etchant gas is used to etch layers on the substrate 25 thereby depositing a compositionally variant etchant residue inside the chamber 30. In one cleaning step, a first cleaning gas is added to the process gas to clean a first residue or to suppress deposition of the first residue onto the chamber surfaces. In a second cleaning step, another residue composition is cleaned off the chamber surfaces using a second cleaning gas composition.
    Type: Grant
    Filed: July 27, 1999
    Date of Patent: March 29, 2005
    Assignee: Applied Materials, Inc.
    Inventors: Waiching Chow, Raney Williams, Thorsten B. Lill, Arthur Y. Chen
  • Patent number: 6831742
    Abstract: A substrate processing apparatus 27 comprises a chamber 35 capable of processing a substrate 20, a radiation source 58 to provide a radiation, a radiation polarizer 59 adapted to polarize the radiation to one or more polarization angles that are selected in relation to an orientation 33 of a feature 25 being processed on the substrate 20, a radiation detector 54 to detect radiation reflected from the substrate 20 during processing and generate a signal, and a controller 100 to process the signal.
    Type: Grant
    Filed: October 23, 2000
    Date of Patent: December 14, 2004
    Assignee: Applied Materials, Inc
    Inventors: Zhifeng Sui, Hongqing Shan, Nils Johansson, Hamid Noorbakhsh, Yu Guan
  • Patent number: 6777045
    Abstract: A domed enclosure wall for a plasma processing chamber is made from a dielectric material having a roughened surface with a roughness average of from about 150 to about 450 microinches. A plasma sprayed ceramic coating is applied on the roughened surface of the dielectric material. The plasma sprayed coating comprises a textured surface having a roughness with an average skewness that is a negative value. When the enclosure wall is used in a plasma processing chamber, sputtered material generated by a plasma formed in a plasma processing chamber has good adherence to the textured surface.
    Type: Grant
    Filed: June 27, 2001
    Date of Patent: August 17, 2004
    Assignee: Applied Materials Inc.
    Inventors: Shyh-Nung Lin, Mark D. Menzie, Joe F. Sommers, Daniel Owen Clawson, Glen T. Mori, Lolita L. Sharp
  • Patent number: 6750156
    Abstract: In a method of depositing a titanium oxide layer on a substrate, a substrate is placed on a support in a process zone of a sputtering chamber. A target containing titanium faces the substrate. A sputtering gas containing an oxygen-containing gas, such as oxygen, and a non-reactive gas, such as argon, is introduced into the process zone. A pulsed DC voltage is applied to the target to sputter titanium from the target. The sputtered titanium combines with oxygen from the oxygen-containing gas to form a titanium oxide layer on the substrate. A multiple layer titanium oxide deposition process may also be implemented.
    Type: Grant
    Filed: October 24, 2001
    Date of Patent: June 15, 2004
    Assignee: Applied Materials, Inc.
    Inventors: Hien-Minh Huu Le, Hoa Thi Kieu
  • Patent number: 6712927
    Abstract: A process chamber 35 for processing a substrate 30 and monitoring the process conducted on the substrate 30, comprises a support 45, a gas distributor, and an exhaust 85. The process chamber 35 has a wall which may comprise a window or radiation transmitting portion 130 that allows light to be transmitted therethrough. Residue deposits onto the window 130 during processing of the substrate 30 may be reduced. In one version, the window 130 comprises a transparent plate 135 covered by an overlying mask 140 that has at least one aperture 145 extending through the mask 140 so that light can be transmitted through the aperture 145 and the transparent plate 135.
    Type: Grant
    Filed: July 5, 2000
    Date of Patent: March 30, 2004
    Assignee: Applied Materials Inc.
    Inventors: Michael N. Grimbergen, Xue-Yu Qian
  • Patent number: 6713987
    Abstract: A rechargeable battery has a battery cell at least partially enclosed by a casing. The battery cell comprises (1) a substrate; (2) a cathode and cathode current collector on the substrate, the cathode being electrically coupled to the cathode current collector; (3) an electrolyte electrically coupled to the cathode or cathode current collector; and (4) a permeable anode current collector having a first surface electrically coupled to the electrolyte and an opposing second surface, the permeable anode current collector: (1) having a thickness that is less than about 1000 Å and that is sufficiently small to allow cathode material to permeate therethrough to form an anode on the opposing second surface of the permeable anode current collector when the battery cell is electrically charged, and (2) that is absent an overlayer on the opposing second surface of the anode current collector. Positive and negative terminals are electrically connected to the battery cell.
    Type: Grant
    Filed: February 28, 2002
    Date of Patent: March 30, 2004
    Assignee: Front Edge Technology, Inc.
    Inventors: Victor Krasnov, Kai-Wei Nieh, Fan-Hsiu Chang, Chun-Ting Lin
  • Patent number: 6699399
    Abstract: A process for etching a substrate 25 in an etching chamber 30, and simultaneously cleaning a thin, non-homogeneous, etch residue deposited on the surfaces of the walls 45 and components of the etching chamber 30. In the etching step, process gas comprising etchant gas is used to etch a substrate 25 in the etching chamber 30 thereby depositing etch residue inside the chamber 30. Cleaning gas is added to the process gas for a sufficient time and in a volumetric flow ratio that is sufficiently high, to react with and remove substantially all the etch residue deposited by the process gas. The present method advantageously cleans the etch residue in the chamber 30, during the etching process, and without use of separate cleaning, conditioning, and seasoning process steps.
    Type: Grant
    Filed: September 8, 2000
    Date of Patent: March 2, 2004
    Assignee: Applied Materials, Inc
    Inventors: Xue-Yu Qian, Zhi-Wen Sun, Weinan Jiang, Arthur Y. Chen, Gerald Zheyao Yin, Ming-Hsun Yang, Ming-Hsun Kuo, David S. L. Mui, Jeffrey Chinn, Shaoher X. Pan, Xikun Wang
  • Patent number: 6692903
    Abstract: A method of processing a substrate 30 comprises exposing the substrate 30 to an energized process gas to etch features 67 on the substrate 30 and exposing the substrate 30 to an energized cleaning gas to remove etchant residue 70 and/or remnant resist 60 from the substrate 30. To enhance the cleaning process, the substrate 30 may be treated before, during or after the cleaning process by exposing the substrate 30 to an energized treating gas comprising a halogen species.
    Type: Grant
    Filed: December 13, 2000
    Date of Patent: February 17, 2004
    Assignee: Applied Materials, Inc
    Inventors: Haojiang Chen, James S. Papanu, Mark Kawaguchi, Harald Herchen, Jeng H. Hwang, Guangxiang Jin, David Palagashvili
  • Patent number: 6676760
    Abstract: A substrate processing chamber has a substrate support to support a substrate, and an exhaust conduit about the substrate support. A first process gas distributor directs a first process gas, such as a non-reactive gas, about the substrate perimeter and toward the exhaust conduit at a first flow rate to form a curtain of non-reactive gas about the substrate. A second process gas distributor directs a second process gas, such as reactive CVD or etchant gas, toward a central portion of the substrate at a second flow rate which is lower than the first flow rate. A gas energizer energizes the first and second process gases in the chamber. A controller operates the substrate support, gas flow meters, gas energizer, and throttle valve, to process the substrate in the energized gas.
    Type: Grant
    Filed: August 16, 2001
    Date of Patent: January 13, 2004
    Assignee: Appiled Materials, Inc.
    Inventors: Arnold V. Kholodenko, Dan Katz, Wing L. Cheng
  • Patent number: 6673199
    Abstract: A substrate etching chamber has a substrate support, a gas supply to introduce a process gas into the chamber; an inductor antenna to sustain a plasma of the process gas in a process zone of the chamber, and an exhaust to exhaust the process gas. A magnetic field generator disposed about the chamber has first and second solenoids. A controller is adapted to control a power supply to provide a first current to the first solenoid and a second current to the second solenoid, thereby generating a magnetic field in the process zone of the chamber to controllably shape the plasma in the process zone to reduce etch rate variations across the substrate.
    Type: Grant
    Filed: March 7, 2001
    Date of Patent: January 6, 2004
    Assignee: Applied Materials, Inc.
    Inventors: John M. Yamartino, Peter K. Loewenhardt, Dmitry Lubomirsky, Saravjeet Singh