Abstract: A fractional-N frequency synthesizer has a modulus controller with multiple inputs that control an initial output frequency of the frequency synthesizer, an increment of variation of tuning of the frequency synthesizer, and a difference between two adjacent output frequency settings. The fractional frequency synthesizer includes a modulus controller, which controls the modulus factor for a multiple modulus frequency divider. The modulus controller has a modulus selection circuit that provides a modulus control signal to the modulus divider to select the modulus factor of the modulus divider as a function of a sum of one input factor and a product of a second input and the gain factor. Control signal is an overflow from a continuous summation of the second digital data word and a product of the first digital data word and the gain factor digital data word repetitively with itself.

Abstract: Apparatus and methods for testing an active pixel sensor ensure that a signal proportional to the quantity of light energy impinging on the active pixel sensor is reliably and accurately captured and made available for further on processing the rest of the APS system circuitry. The apparatus and method determines the capacitance of a photo-conversion device of the active pixel sensor. The apparatus and method determines that an active pixel sensor is functioning correctly. The apparatus and method determines the performance of an active pixel sensor. Where the performance of the active pixel sensor is a measure of linearity of the active pixel sensor and a connected chain of circuitry that process the signal converted by the photo-conversion device of the active pixel sensor.

Abstract: A method and system for the design of an electronic device adjusts the resistance and capacitance values employed in preliminary timing analysis during physical synthesis of the electronic device. The physical synthesis uses resistance and capacitance unit values to determine the listing of the component circuits. The resistance and capacitance unit values are calibrated by preliminarily placing the initially synthesized component circuits to create a listing describing physical locations of the component circuits within the electronic device. A preliminary routing of the interconnections is performed to create a listing describing a network of physical wire segments that form each interconnection of the component circuits. A timing analysis of the electronic device determines the delay created by the component circuit and the networks of physical wire segments.

Abstract: An nonvolatile memory device having improved endurance is comprised of an array of nonvolatile memory cells arranged in rows and columns. Each memory cell of each row is connected to a word line and a source select line, and each memory cell of each column connected to a first bit line and a second bit line. Each memory cell is composed of a first transistor and second transistor. The first and second transistors have control gate connected to the word line receive a word line voltage, a source connected the source select line to receive a source line voltage, and a floating gate onto which an electronic charge is placed representing a data bit stored within the nonvolatile memory device. The first transistor has a drain connected the first bit line to receive a first bit line voltage and the second transistor a drain connected to the second bit line to receive a second bit line voltage.

Abstract: A method and apparatus for estimating burn-in time for integrated circuit die on a wafer employs a reliability testing structure placed in a scribe line area of a wafer to permit improved estimation of burn-in time for integrated circuit on a wafer. Each reliability testing structure has a plurality of evaluation device structures formed on the substrate. Groups of the evaluation device structures are stacked on the surface of the substrate. The device structures are created to permit evaluation of one of a plurality of failure mechanisms of the integrated circuit. A forcing input pad and a sensing output pad are connected through a selection circuit to at least one of the evaluation devices. The selection circuit selects which of the evaluation devices are to receive a stimulus and to transmit a response. The stimulus is activated and the substrate is then stressed.

Abstract: A system for transmitting digitized samples of analog signals while concealing unrecoverable digitized samples of analog signals to maintain a level of fidelity in reproducing the analog signals. The digitized samples of the analog signals are burst transmitted such that the probability of interference with the transmission and thus corruption of the digitized samples of the analog signals is minimized. The digitized samples are received without synchronizing a receiving clock with a transmitting clock to capture the digitized samples of the analog signals. The digitized samples are converted from various sampling rates to digitized samples of the analog signals having a rate. Any large groups of digitized samples that are in error or corrupted in transmission are softly muted to avoid annoying clicks. Any long term difference between a transmit clock and a receive clock is tracked and the digitized samples are interpolated or decimated to eliminate any underrun or overrun of the digitized samples.

Abstract: An MRAM array has groupings of MRAM cells that are interconnected by word control lines, bit lines, primary program control lines, and secondary program control lines. Each MRAM cell is comprised of a magnetic tunnel junction and a primary switching device connected between the magnetic tunnel junction and one of the primary program control lines to provide the write current through the pinned layer of the magnetic tunnel junction. In a first embodiment, the pinned ferromagnetic layer is connected directly to a segmented local program control line that eliminates parasitic currents during read or write of an MRAM cell. In a second embodiment, the MRAM cell includes a secondary switching device connected between the second side of the ferromagnetic layer the local program control line. The secondary program control lines are segmented to eliminate parasitic currents during a read or write of an MRAM cell.

Abstract: A process monitor system collects process execution status data such as work-in-process information from multiple manufacturing execution systems controlling multiple fabrication lines of factories of a firm. The process monitor system converts and encapsulates the process execution status data with a common standard formatting. The process execution status data is then published to subscribers of specific subjects of the process execution status data. The converted and encapsulated process execution status data is logged to a message ledger to certify publication and receipt by subscribers. A periodic diagnostic messaging or heartbeat is transmitted between elements processing and publishing the process execution status data to provide failure recovery. The elements processing and publishing the process execution status data are connected as a distributed queue of parallel process and have a designated scheduler to provide a balancing of loading.

Abstract: A method to planarize the surface of a semiconductor substrate having shallow trench isolation (STI) reduces erosion of a silicon nitride planarization stop layer, reduces dishing of large areas of the shallow trench isolation, and prevents under polishing of the surface of the semiconductor substrate that will leave portions of the silicon dioxide that fills the shallow trenches covering the silicon nitride planarization stop exposed, is described. The method to planarize the surface of a semiconductor substrate having shallow trenches begins by chemical/mechanical planarization polishing at a first product of platen pressure and platen speed to planarize the semiconductor substrate. Polishing at a first product of platen pressure and platen speed will cause a high rate of material removal with low selectivity to increase production throughput. The silicon nitride stop layer will be examined to determine an end point exposure of the silicon nitride stop layer.

Abstract: A system for transmitting, receiving, recovering, and reproducing digitized samples of analog signals while concealing unrecoverable digitized samples of analog signals to maintain a level of fidelity in reproducing the analog signals. The digitized samples of the analog signals are burst transmitted such that the probability of interference with the transmission and thus corruption of the digitized samples of the analog signals is minimized. The digitized samples are received without synchronizing a receiving clock with a transmitting clock to capture the digitized samples of the analog signals. The digitized samples are converted from various sampling rates to digitized samples of the analog signals having a rate. Any large groups of digitized samples that are in error or corrupted in transmission are softly muted to avoid annoying clicks.

Abstract: A temperature compensating biasing circuit is constructed by first determining a piecewise function substantially describing a required bias current with respect to temperature. Reference signals are created such that each reference signal describes an amount of contributing currents that, when summed together, generate a master biasing current. The biasing current generator is further constructed to create a thermal signal indicating an operating temperature. Each of the reference signals is compared to the thermal signal. The biasing current generator then identifies which of the contributing currents or portions of the contributing currents are being included to generate the master biasing current. The identified contributing currents and the portions of the contributing currents are then summed to form the master biasing current. The master biasing current may be mirrored to form bias currents that have the temperature compensation bias function.

Abstract: A method of forming a virtual three-dimensional radar display on a radar page comprising the steps of (i) establishing a split window display showing a 2-dimensional view of altitude representation of own ship and target's information; and (ii) combining range and azimuth information onto the radar page, thereby the radar page provides the pilot of an aircraft with a three-dimensional perspective of the own ship and targets' profile. The three-dimensional perspective of the own ship and targets information greatly enhances the situation awareness of the pilot.

Abstract: A manufacturing execution system determines production rates of tool elements of a manufacturing system and from the production rates, the efficiency of the tool elements and the efficiency of the manufacturing process system. The manufacturing execution system is in communication with a plurality of tool elements of the manufacturing process system. The manufacturing execution system includes a process data collection device, a data retaining device such as a memory, a time recording device, and a production rate calculator. The process data collection device is in communication with sensors located on the tool elements to receive tool element status data. The data retaining device is in communication with the process data collection device to record and retain the tool element status data. The time recording device records times of changes of the tool element status data to the data retaining device.

Abstract: A piecewise linear phase locked loop frequency generator generates a voltage signal controlled by an input voltage. This frequency generator has a variable static frequency generator, whose frequency is selected by a control voltage and whose transfer function between control voltage and output frequency is further selected by a piecewise linear determination parameter. The piecewise linear determination parameter is the number which selects which portion of the frequency spectrum is being represented by the control voltage to frequency transfer function being selected and is a function of an input control voltage. The frequency generator has a set of n low pass filters, used to work in conjunction with the corresponding control voltage to provide frequency transfer functions which are selected by the piecewise linear determination parameter.

Abstract: A method for hiding primary digital information in an initial digital document begins by first breaking down the initial document by determining a reference digital document as a function of the initial digital document by a fractal transformation method. Secondary digital information is created as a function of the primary digital information to be hidden and the reference digital document. A modified image is computed by the sum of the reference digital document and the secondary digital information such that the modified digital document approximates the initial document but integrating substantially indiscernible the primary digital information to be hidden. The method enables retrieval of digital information hidden in a multimedia document in a dual manner. The method is based on the concept of auto-similarity and ensures that the input information is not visible but finally be retrieved without providing knowledge of the original documents.

Abstract: A non-volatile integrated circuit memory having an AND-like array structure that is capable of simultaneous reading and writing of digital data to multiple memory cells within the integrated circuit memory has memory cells within an array block of memory cells are arranged in columns and rows. A plurality of block bit lines is in communication with each array block of memory cells such that each block bit line interconnects the memory cells of one column of memory cells within one array block. A plurality of word lines is in communication with each array block of memory cells such that each word line interconnects the memory cells of one row within one array block. The integrated circuit memory further includes a plurality of global bit lines in communication with the array blocks to select a column of the array blocks and to transfer the digital data from and to the array blocks. A bit line selector selectively connects the plurality of global bit lines to the block bit lines.

Abstract: A combination erase method to erase data from a flash EEPROM eliminates electrical charges trapped in the tunneling oxide of a flash EEPROM to maintain proper separation of the programmed threshold voltage and the erased threshold voltage after extended programming and erasing cycles. A first embodiment method to erase a flash EEPROM cell begins by negative gate erasing to remove charges from the floating gate, followed by a source erasing to further remove charges from the floating gate, and finally followed by a channel erasing to detrap charges. A second embodiment begins with a negative gate erasing having a incremental stepping of the voltages to remove the charges from the floating gate. This followed by a source erasing to detrap the tunneling oxide of the EEPROM cell. A third embodiment begins with a source erasing having a incremental stepping of the voltages to remove the charges from the floating gate. This followed by a channel erasing to detrap the tunneling oxide of the EEPROM cell.

Abstract: A system for transmitting, receiving, recovering, and reproducing digitized samples of analog signals while concealing unrecoverable digitized samples of analog signals to maintain a level of fidelity in reproducing the analog signals. The digitized samples of the analog signals are burst transmitted such that the probability of interference with the transmission and thus corruption of the digitized samples of the analog signals is minimized. The digitized samples are received without synchronizing a receiving clock with a transmitting clock to capture the digitized samples of the analog signals. The digitized samples are converted from various sampling rates to digitized samples of the analog signals having a rate. Any large groups of digitized samples that are in error or corrupted in transmission are softly muted to avoid annoying clicks.

Abstract: A dynamic source coupled ESD protection circuit that dissipates an ESD voltage coupled to an electrical contact pad to protect internal circuits on an integrated circuits chip is described. The ESD protection circuit lowers the snapback voltage of the ESD protection circuit to allow a thinner gate oxide within the internal circuits of the integrated circuit chip. The dynamic substrate coupled electrostatic discharge protection circuit consists of a gated MOS transistor, a capacitor, and a resistor. The gated MOS transistor has a drain region connected to the electrical contact pad. The gate and source are connected to a power supply voltage source. The power supply voltage source will either be a substrate biasing voltage or ground reference point for a gated NMOS transistor. The power supply voltage source will be the power supply voltage source VDD for the gated PMOS transistor.

Abstract: Embedded DRAM cells within an ASIC having a pass transistor with a gate oxide having a thickness equal to the thickness of the gate oxide of the logic core. This allows the embedded DRAM cell to be activated by signals having voltage levels equal to the voltage levels created by the logic core. If the gate oxide has a thickness that is equal to the gate oxide thickness of the peripheral circuits, a signal provided by the word line voltage generator has voltage levels equal to those provided by peripheral circuits, and signal provided by the bit line voltage generator has voltage levels equal to those provided by logic circuits within the logic core. If the gate oxide has a thickness that is equal to the thickness of the gate oxide of the logic circuits, a signal provided by the word line voltage generator has voltage levels equal to those provided by the logic circuits, and the bit line voltage generator has voltage levels equal to those provided by the logic circuits.