Abstract: A method is disclosed for improving design criteria and importantly timing criteria following a metal-only engineering change. The method involves making initial logical changes involving new books (gate-level, filler-cell circuits, called ‘eco books’), running placement and routing with the new books, and timing the resulting logic. If there are timing violations, existing, non-filler books which are in close proximity are considered for swapping with the eco books. The book swaps are all done with wire connections only (i.e. the book placements are not affected). This way, critical paths and non-critical paths can be traded-off to achieve a faster design, even though books are not allowed to be moved. Some simple algorithms are discussed; however, there are many heuristic and analytic algorithms that can be applied in choosing swaps, based on the needs of the particular design.

Abstract: New Frequency dependent RLC extraction and modeling for on chip integrity and noise verification employs: A) 2D scan line algorithm for the collection of adjacent signal and power conductor coordinates; B) In core pair-wise frequency Dependent RL extraction; C) In core equivalent circuit synthesis; D) caching and partitioning RL extraction techniques for run time efficiency; and E) Techniques for synthesizing stable circuits to represent frequency dependent RL circuits for non-mono tonic R12.

Abstract: A method for manufacturing an organic electronic device including a stack of layers with a lateral structure on a substrate, at least one of the layers being an organic material layer. A method includes with the step of providing a stamp with at least one protrusion of the surface area corresponding to the lateral structure. The stack of layers is deposited with a first face on the surface area of the protrusion of the stamp. A second face of the stack that is opposite to the first face is brought into adhesive contact with the substrate. The stamp is released from the stack.

Abstract: More “timing closure efficient” Timing Driven Placements by implementing our new net weight for negative slack paths to enhance timing closure behavior is provided by a NSRF (Negative Slack Recover Factor). This new weight would not be based on the absolute amount of negative slack in a path, but rather it would be based on the proportion or percentage of the path's total net delay adder that must be recovered in order to achieve timing closure (zero slack). After an initial or previous placement has been created, then a list of paths with timing violations with a Negative Slack Recover Factor (NSRF) is created for each net in each of the timing paths on the list of paths, and then calculating a NSRF net weight factor for use in subsequent placements and also assigning nets in the list of paths with no timing violations a NSRF default value of one.

Abstract: The output register of an array and the Multiple Input Signature Register (MISR) logic is implemented with one set of L1/L2 master/slave latches and single additional slave latch. This new combined logic uses less critical area on a chip without a performance impact on the array access time or circuit testing.

Abstract: The on-chip power supply noise sensor detects high frequency overshoots and undershoots of the power supply voltage. By creating two identical current sources and attaching a time constant circuit to only one, the high frequency transient behavior differs while the low frequency behavior is equivalent. By comparing these currents, the magnitude of very high frequency power supply noise can be sensed and used to either set latches or add to a digital counter. This has the advantage of directly sensing the power supply noise in a manner that does not require calibration. Also, since the sensor requires only one power supply, it can be used anywhere on a chip. Finally, it filters out any lower frequency noise that is not interesting to the circuit designer and can be tuned to detect down to whatever frequency is needed.

Abstract: An SRAM cell that is accessed by a single word line and separate access transistors for read and write operations. A pair of write bit line transfer devices provide respectively access to the right and left sides of cross coupled pull-up, pull-down transistor pairs for a write operation, and a single read bit line transistor in series with the word line transistor, when selected, reads the content of the cell.

Abstract: A programmable delay circuit that delays the C2 clock signal by a variable amount that allows the output from the L1 latch to be captured even when there is a large delta between the L1 latch and its L2 latch. This allows the C2 signal to be adjusted within the system dependent upon the amount of cycle steal is needed. The C2 clock delay is inhibited during scan operation to prevent glitches and the trailing edge of the delayed C2 is controlled to maintain a constant C2 duty cycle.

Abstract: A circuit for use in a microprocessor, comprising a 4-2 compressor circuit having a full adder formed of dual XOR/XNOR cells and a 2-1 MUX. The full adder uses minimum sized XOR/XNOR cells.

Abstract: A synchronous input to output protocol translator supporting multiple reference oscillator frequencies and fixed latency data computation and chip crossing circuits enables implementation of a method for delaying osc2 relative to osc1 in a configurable way to provide a constant, minimal Tptcc over a range of refosc frequencies between circuits for data transferred. It requires that the data transferred from a register R1 be sent over multiple wires via configurable delay circuitry for osc2, capture circuitry at the input to R2, and a circuit to transfer a synchronizing signal from a non-delayed clock domain to a delayed clock domain. Relative to osc1, osc2 is a delayed, synchronous clock.

Abstract: A circuit design method utilizes existing late mode worst case slack calculation functions inherent in timing path trace algorithms which only need to record the worst arrival and worst required arrival times at each netlist node as traced paths. Because of this, most individual path tracing is curtailed due to the likelihood that a more critical arrival or required arrival time has already been recorded at a given netlist node. Worst case slacks are then determined by subtracting the worst case arrival time from the worst case required arrival time. In this manner, worst case slack values are calculated for the entire netlist within a reasonable amount of time. The method uses these existing functions by querying the worst case slack at each netlist node under varied timing model scenarios. These varied timing model scenarios include altering the cell and net delays and arrival times in the model.

Abstract: Passing input strings through an application programming interface between functions that take null byte terminated strings as arguments, where at least some of said input strings contain null bytes internally. This is accomplished by storing the positions of the null bytes relative to the start of the block and storing the non-null bytes in their relative order to prevent said internal null strings from being treated as terminal null strings.

Abstract: A method for minimizing the area of a binary orthogonality checker implemented in static CMOS circuits for minimizing the gate count and area needed for checker implementation. The method is adaptable to various libraries of logical gates to implement the circuit and the area for each gate in the library. The optimal mix of hierarchical levels and stages is determined such that the orthogonality checker achieves the minimized circuit area. An orthogonality checker is employed in a scalable selector system for controlling data transfers and routing in a data processing system to allow. Combining orthogonality checking with existing selector hierarchically allows for the maximum reuse of circuits, signals, and proximity; thus potentially reducing wiring as well. Multiple hierarchical checks are used in favor of one large. This structure is extended to multiple hierarchical levels and works with orthogonality checks of any size or implementation.

Abstract: An output of an element under test is captured and stored, through a multiplexer, in a capture register. At a clock edge (either rising or falling edge) the element under test catches the “edge” and “strobes” the output. The multiplexer is strobed, and the delay and duty cycle are measured. Both the rising and falling edge are used as the timer.

Abstract: An electrically blowable fuse circuit having a fuse which may be placed in a condition to be blown. The circuit includes a first transistor having a body, a source, a drain, and a gate. The source is connected to one end of the fuse and the drain is connected to ground. The first transistor further includes a controllable parasitic device in its body. A second transistor is connected to the parasitic device such that when the second transistor is turned on, the parasitic device turns on the first transistor, allowing the fuse to be blown when the fuse is placed in a condition to be blown.

Abstract: A domino SRAM array restore pulse generation system launches the work decode line by the same local clock as the restore pulse, thus eliminating any race issues with the word line select. This system allows the global bit select (or column select) to have fast activation by releasing the reset signal (with the earliest arriving array clock, ck1), while guaranteeing almost perfect tracking with the bit decode system. This allows for the widest possible write window; earliest release of the pre-charge in the global column select, and resetting only after the bit decode system is deactivated.

Abstract: This method for decoupling capacitance analysis improves upon existing techniques to attempt to give a more accurate representation of the power supply fluctuations on a chip while keeping runtime comparable. This method employs the following techniques; a) a method for descending through hierarchy and dividing the design into a variable sized grid; b) an algorithm to determine which grid locations of a design don't have enough decoupling capacitors for all of the devices in that grid location; c) an algorithm to determine which grid locations are subject to harmful neighboring effects; and d) a method to display the results of the calculations in a graphical manor to allow easy identification of problem areas.

Abstract: A semiconductor memory circuit enabling replacement of defective memory elements and associated circuitry with non-defective spare elements of the RAM and associated circuitry, is scanned to enable replacement of a defective RAM element prior to repair of the RAM. A set of set/reset latches are coupled to receive the signal from the memory elements, and a multiplexer control circuit coupled to receive a shift signal and a ram_inhibit signal from a multiplexer to provide specific input signals to the multiplexer components. When a scan operation begins an active clock signal sets a set/reset latch to ram_inhibit mode and this blocks the memory elements from influencing the state of memory output latches, whereby when an memory operation begins, an active clocking signal will reset the set/reset latch into system mode to cause the multiplexers pass appropriate signals from the memory elements to the output latches, and the spare memory element is activated to replace a defective memory element.

Abstract: A soft-fust test algorithm is distributed on-chip from an ABSIT engine through an LSSD shift register chain to dynamically evaluate a plurality of arrays with redundancy compensation for bad elements and repair those that are fixable. Using single-bit MISR error evaluation an ABSIT test sequence is executed concurrently on all arrays through the shift register chain. If any arrays are in error, redundancy compensation is employed and the ABIST test is repeated for all possible array redundant combinations until a functional configuration for each array is identified or all possible redundant combinations have been tried. Once functioning array configurations are verified, the associated soft-fuse states can be used to blow fuses and/or extracted for further system setup, permanent fuse-blowing and yield analysis. Multiple shift register chains driven by separate ABIST engines may be required to test all arrays on a chip.

Abstract: A method and hardware design is disclosed for allowing the bring-up of a large scale system of interfaces that need to undergo a sequence of calibration steps. The method involves the use of a flexible broadcast scheme whereby groups of interfaces within a chip are assigned to groups to which commands can be broadcast. The scheme allows for the maximum amount of flexibility, allowing interfaces to be assigned to multiple groups which can overlap and be subsets of one another, and still allows for groups to be excluded from broadcast commands and be access individually. A method is also disclosed for using a chip-global status summary that can be accessed as any other register on the chip and can report calibration results for an entire chip with only one command. According to the invention a service utilizing the method embodied with code for implementing the method can now be provided.