Abstract: In one embodiment, a router inspects at a network layer source addresses of network layer packets flowing through the router. The router compares the source addresses to addresses of computers employed by spammers, and performs a predetermined action on a particular network layer packet having a source address that belongs to a computer of a spammer. The predetermined action may involve dropping the particular network layer packet or limiting the data transfer rate of the particular network layer packet.

Abstract: The present application discloses a method for selecting an optical configuration for a high-precision scatterometric measurement. A geometric parameterization of a grating is determined, wherein the grating comprises a periodic structure. The geometric parameterization is used to generate a representative set of model structures. An eigenvalue method is utilized to compute, for each model structure, a set of solutions which satisfy a Rayleigh condition within the grating. The Raleigh condition within the grating is satisfied when a vertical component of a propagating mode within the grating is zero. Other embodiments, features and aspects are also disclosed herein.

Abstract: One embodiment relates to a method of providing dual-homing in a layer 2 switch. A determination is made as to whether a link is available to an upstream network on for a currently active port. If the link is unavailable, then the layer 2 switch a) performs a switchover such that the currently active port becomes a newly passive port, and a currently passive port becomes a newly active port, b) clears entries in an address table of the layer 2 switch, and c) spoofs MAC addresses out of the newly active link. Other embodiments are also disclosed.

Abstract: One embodiment disclosed relates to a method of fault recovery by a switch in a local area network. A link failure is detected at a port of the switch. In response to the link failure detection, a medium access control (MAC) address table of the switch is cleared. Clearing the address table causes a discovery process to fill the table to begin immediately. In addition, a link on another port of the switch may be dropped to propagate the link failure.

Abstract: In one embodiment, a rescue device is employed to disinfect a computer infected with a virus. The rescue device may comprise solid state memory. The rescue device may be removable from the computer and reusable for update and/or upgrade over a computer network. The rescue device may comprise a bootable partition, a virus scanning engine and a virus pattern file.

Abstract: In one embodiment, a magnetron sputtering apparatus includes one or more magnet arrays for moving ions or charged particles on at least two plasma discharge paths on a target. Charged particles on one of the plasma discharge paths are moved in one direction, while charged particles on the other plasma discharge path are moved in the opposite direction to reduce rotational shifting of deposition flux on the patterned substrates. The plasma discharge paths may be formed by two symmetric magnet arrays or a single asymmetric magnet array rotated from behind the target.

Abstract: In one embodiment, a peer-to-peer computer network has a multilevel tree structure that includes a plurality of computers. Each computer belonging to the network is assigned to a level such that it can receive a message from an upstream computer and push the message to a downstream computer. The message, which may be a pattern file of an antivirus program, may be rapidly propagated to available computers belonging to the network by pushing the message from a pattern file server to computers on a top level of the network, from computers on the top level of the network to computers on a lower level, and so on.

Abstract: One embodiment relates to a thermal field emission electron gun. The electron gun includes a high-vacuum chamber, a thermal field emission cathode including a filament and a tip, a suppressor electrode, an extraction electrode, and a high-voltage power source. The high-voltage power source is coupled to the filament and to the suppressor and extraction electrodes such that the suppressor electrode is at a negative voltage potential in relation to the filament and the extraction electrode is at a positive voltage potential in relation to the filament. A current-limiting resistor is electrically coupled in series with the suppressor electrode. Applicant has determined that such a current-limiting resistor substantially reduces undesirable discharges and improve the reliability and lifetime of the electron gun. Other embodiments, aspects and features are also disclosed.

Abstract: In one embodiment, the erosion profile of a shaped target (e.g., hollow cathode target) of a magnetron apparatus is enhanced by using a plurality of sputtering tracks, such as plasma loops, on the target. The erosion profile may be optimized by recording the erosion profile and making adjustments to the magnetic configuration of the magnetron. The recording may include two-dimensional plots of erosion/redepostion rates or a grid overlay tracing of a static burn test, for example. The magnetic configuration of the magnetron may include a rotating magnetic array. The rotating magnetic array may be adjusted to change the shape or location of the plurality of plasma loops to achieve an optimum erosion profile. The target may have a flared lip to increase erosion on the lip, if needed.

Abstract: One embodiment relates to an apparatus for inspecting a substrate using charged particles. The apparatus includes an illumination subsystem, an objective subsystem, a projection subsystem, and a beam separator interconnecting those subsystems. The apparatus further includes a detection system which includes a scintillating screen, a detector array, and an optical coupling apparatus positioned therebetween. The optical coupling apparatus includes both refractive and reflective elements. Other embodiments and features are also disclosed.

Abstract: One embodiment pertains to a method of electron beam lithography. An illumination electron beam is formed, and a dynamic pattern generating device is used to generate an electron-reflective pattern of pixels and to reflect the illumination electron beam from said pattern so as to form a patterned electron beam. The patterned electron beam is projected onto a platter configured to hold and rotate a plurality of target substrates. Said generated pattern of pixels is shifted in correspondence with the rotation of the platter so that the patterned electron beam writes a swath path of pixels over the target substrates. Other features, aspects and embodiments are also disclosed.

Abstract: One embodiment relates to an electron beam apparatus. The apparatus includes a mechanism for moving a substrate relative to the electron beam column at a controlled speed. A probe beam gun is configured to generate a probe beam through the column, and a pre-charging beam gun configured to generate a pre-charging beam through the column. Control circuitry configured to pre-scan a scan line with the pre-charging beam at least once and to subsequently sense scan the scan line with the probe beam at least once. The control circuitry is further configured so that there is a prescribed delay time between said pre-scanning and said sense scanning of the scan line. In another embodiment, a single electron beam and a deflection system configured to deflect the electron beam into pre-scans and sense scans. Other embodiments and features are also disclosed.

Abstract: One embodiment relates to a high-resolution Auger electron spectrometer in a scanning electron beam apparatus. An electron source generates a primary electron beam, and an immersion objective lens is configured to focus the primary electron beam onto a surface of a target substrate. A Wien filter is configured within the immersion objective lens and to deflect and disperse secondary electrons from the surface. A position sensitive detector is configured to receive the secondary electrons so as to detect an Auger electron spectrum. A first electron-optical lens may be positioned after the Wien filter so as to transfer a minimal-dispersion plane to an aperture plane. A second electron-optical lens may be positioned after the aperture so as to transfer a virtual focused-spectrum plane to a detector plane. Other embodiments, aspects and features are also disclosed.

Abstract: In one embodiment, harmful solar cell polarization is prevented or minimized by providing a conductive path that bleeds charge from a front side of a solar cell to the bulk of a wafer. The conductive path may include patterned holes in a dielectric passivation layer, a conductive anti-reflective coating, or layers of conductive material formed on the top or bottom surface of an anti-reflective coating, for example. Harmful solar cell polarization may also be prevented by biasing a region of a solar cell module on the front side of the solar cell.

Abstract: In one embodiment, a technique for controlling traffic in a computer network includes modifying a packet generated by a first computer. The packet may be intended for a second computer, but is modified to be redirected to a third computer. The packet may be processed in the third computer prior to being forwarded from the third computer to the second computer. The packet may be scanned for viruses at the third computer, for example. Among other advantages, the technique allows for scanning of early generated packets, redirection of selected packets, and routing of packets from a computer in general.

Abstract: A method for evaluating the quality of data collection in a manufacturing environment is provided. Said data are intended to be analyzed by a process control system. The method comprising the following steps (A) collecting raw data according to a Data Collection plan specifying, and for each data item, a sampling time reference indicating at which time interval it is expected, and associating to each collected data item a timestamp indicating its actual collection time, (B) for at least a part of the raw data included inside a predetermined window, determining a Data Collection Quality Value (DCQV) by: (a) reading the timestamps; (b) computing at least one quality indicator value from the relationship between each timestamp and the corresponding time reference, wherein a shift represents a malfunction of the equipment or of the data collection system; (c) after steps (b) and (c) have been performed for all data items, computing a single data collection quality value (DCQV) indicator for said time window.

Abstract: One embodiment relates to a method of behind-the-lens dark-field imaging using a scanning electron microscope apparatus. An incident beam is focused onto a specimen surface using an immersion objective lens, and the incident beam is deflected so as to scan the incident electron beam over a field of view of the specimen surface. A secondary electron beam is detected using a segmented detector to obtain a set of pixel data for each segment of the detector. Scan-dependent movement of the secondary electron beam over the segmented detector is compensated for by processing using a dynamic centering algorithm to generate a set of virtual pixel data for each segment of a virtual detector. At least one set of the virtual pixel data is used to generate a dark field image. Other embodiments, aspects, and features are also disclosed.

Abstract: A system and a method generates at least one signature associated with document. In one embodiment, a document comprised of text is received and parsed to generate a token set. The token set includes a plurality of tokens. Each token corresponds to the text in the document that is separated by a predefined character characteristic. A score is calculated for each token in the token set based on a frequency and distribution of the text in the document. Each token is then ranked based on the calculated score. A subset of the ranked tokes is selected and a signature is generated for each occurrence of the selected tokens. The selected list of signatures is then output.

Abstract: One embodiment relates to a method of inspecting a substrate using electrons. Mirror-mode electron-beam imaging is performed on a region of the substrate at multiple voltage differences between an electron source and a substrate, and image data is stored corresponding to the multiple voltage differences. A calculation is made of a measure of variation of an imaged aspect of a feature in the region with respect to the voltage difference between the electron source and the substrate. Other embodiments and features are also disclosed.

Abstract: One embodiment pertains to a switching device which is configured to provide multicast traffic management in a layer 2 network without layer 3 devices A specific embodiment relates to a method of implementing IGMP multicasting in a layer 2 network. IGMP packets are snooped by multiple switches in the layer 2 network. IGMP query messages are generated by each of the multiple switches. IGMP join report messages are forwarded by each of the multiple switches to all ports on which a querier is present. Other embodiments are also disclosed.