Patents Represented by Attorney Omund R. Dahle
  • Patent number: 5534111
    Abstract: A thermal isolation microstructure fabricated by a process which allows the ultra thinning of support legs for the microdetector.
    Type: Grant
    Filed: February 29, 1988
    Date of Patent: July 9, 1996
    Assignee: Honeywell Inc.
    Inventors: G. Benjamin Hocker, James O. Holmen, Robert G. Johnson
  • Patent number: 5286976
    Abstract: A microstructure design for high IR sensitivity having a two level infrared bolometer microstructure, the lower level having a reflective metal film surface such as Pt, Au, or Al to reflect IR penetrating to that level, the upper level being separated from the lower level by an air gap of about 1-2 microns which allows the reflected IR to interfere with the incident IR and increase the sensitivity to a higher level.
    Type: Grant
    Filed: November 7, 1988
    Date of Patent: February 15, 1994
    Assignee: Honeywell Inc.
    Inventor: Barrett E. Cole
  • Patent number: 5193143
    Abstract: The invention relates to a problem-state monitoring system which includes an automated reasoning technique for providing moment-by-moment advice concerning the operation of a process. The reasoning technique involves the representation of states a problem can attain during the problem solving process which provides greater flexibility for the monitoring and advisory functions.
    Type: Grant
    Filed: November 7, 1989
    Date of Patent: March 9, 1993
    Assignee: Honeywell Inc.
    Inventors: William F. Kaemmerer, James R. Allard
  • Patent number: 5187674
    Abstract: A non membrane-based overpressure proof gas pressure microsensor. It is not a membrane-based microsensor but is based on an open microbridge sensor structure. A method and apparatus is described to determine gas pressure from thermal conductivity, k, and volumetric specific heat, c.sub.pu, as well as pressure, P, using a microbridge sensor.
    Type: Grant
    Filed: December 28, 1989
    Date of Patent: February 16, 1993
    Assignee: Honeywell Inc.
    Inventor: Ulrich Bonne
  • Patent number: 5177696
    Abstract: A method of determination of gas properties at reference conditions of temperature and pressure. This determination is needed in systems including mass flow meters, combustion control systems, gas meters and the like. The system disclosed enables the determination of properties including specific heat and thermal conductivity at reference conditions.
    Type: Grant
    Filed: December 28, 1989
    Date of Patent: January 5, 1993
    Assignee: Honeywell Inc.
    Inventor: Ulrich Bonne
  • Patent number: 4913647
    Abstract: A method and system for regulating and maintaining a predetermined desired fuel-air mixture for a fuel of interest as represented by a desired fuel number disclosed which utilizes a known relationship between the radiation intensity ratios of selected chemical species in the products of combustion and the fuel number as a basis to adjust the proportion of fuel within the fuel-air mixture to control at the desired fuel number.
    Type: Grant
    Filed: March 19, 1986
    Date of Patent: April 3, 1990
    Assignee: Honeywell Inc.
    Inventors: Ulrich Bonne, Brian C. Krafthefer
  • Patent number: 4900448
    Abstract: The instant invention provides a method and system for dehumidifying air by microphorous organic hollow fibers having a hygroscopic liquid disposed in the pores thereof for providing a concentration gradient sufficient to provide a continuous water removal mechanism.
    Type: Grant
    Filed: December 21, 1988
    Date of Patent: February 13, 1990
    Assignee: Honeywell Inc.
    Inventors: Ulrich Bonne, David W. Deetz, Juey H. Lai, David J. Odde, J. David Zook
  • Patent number: 4895616
    Abstract: A microbridge air flow sensor which has a sealed etched cavity beneath the silicon nitride diaphragm so that the cavity is not susceptible to contamination from residual films or other material accumulating within the cavity. The cavity thermally isolates the heater and detectors which are encapsulated in the diaphragm. The cavity is fabricated by front side etching of the silicon wafer. Narrow slots are made through the silicon nitride diaphragm to expose a thin film (400 angstrom) rectangle of aluminum. A first etch removes the aluminum leaving a 400 angstrom very shallow cavity under the diaphragm. Anisotropic etch is then introduced into the shallow cavity to etch the silicon pit.
    Type: Grant
    Filed: April 24, 1989
    Date of Patent: January 23, 1990
    Assignee: Honeywell Inc.
    Inventors: Robert E. Higashi, James O. Holmen, Steven D. James, Robert G. Johnson, Jeffrey A. Ridley
  • Patent number: 4891977
    Abstract: An improved connector pad stack structure for use in microstructure devices having a silicon nitride surface in which the sensor metal such as platinum or Ni-Fe is eliminated from the pad bonding site and only adhesion promoting metals are used on the Si.sub.3 N.sub.4 to provide a stronger, more durable and reliable pad stack.
    Type: Grant
    Filed: December 16, 1988
    Date of Patent: January 9, 1990
    Assignee: Honeywell Inc.
    Inventors: Robert G. Johnson, James O. Holmen, Jeffrey A. Ridley
  • Patent number: 4885914
    Abstract: The invention relates to a coefficient of performance deviation meter for vapor compression type refrigeration systems. The measurement of the coefficient of performance of a mechanical vapor compression refrigeration system requires that the two parameters be known which are the input power and the heat absorbed or, conversely, the input power and the heat rejected. Manufacturers of vapor compression machines publish performance data on the power used versus the cooling effect at various condenser water supply temperature (Tcws) and various evaporator chilled water supply temperature (Tchws). These data can be used to calculate specific coefficients of performance (COPs) at various Tcws and Tchws. The meter has inputs connected to sensors in a vapor compression system which provide the data for the input power and the heat absorbed parameters. One input is connected to a wattmeter set in the compressor motor power supply circuit which provides the input power.
    Type: Grant
    Filed: February 14, 1989
    Date of Patent: December 12, 1989
    Assignee: Honeywell Inc.
    Inventor: Arthur N. J. Pearman
  • Patent number: 4885938
    Abstract: Certain relationships among the mass flow signal the thermal conductivity, specific heat and density of the fluid measured can be used to correct a mass flowmeter measurement with respect to changes in composition of the fluid.
    Type: Grant
    Filed: December 16, 1988
    Date of Patent: December 12, 1989
    Assignee: Honeywell Inc.
    Inventor: Robert E. Higashi
  • Patent number: 4814851
    Abstract: A complementary (Al,Ga)As/GaAs heterostructure insulated gate field-effect transistor (HIGFET) approach is described in which both the n-channel and p-channel transistors utilize a two-dimensional electron (hole) gas in undoped high mobility channels to form planar, complementary GaAs-based integrated circuits.
    Type: Grant
    Filed: April 28, 1988
    Date of Patent: March 21, 1989
    Assignee: Honeywell Inc.
    Inventors: Jonathan K. Abrokwah, Nicholas C. Cirillo, Jr., Michael S. Shur, Obert N. Tufte
  • Patent number: 4810969
    Abstract: An improved FET capacitance driver logic circuit having an inverter feedback stage 22 connected from output to input of output FET 23 to allow the output FET to have a large capacitance charging current surge followed by a reduced conduction thereafter.
    Type: Grant
    Filed: April 11, 1988
    Date of Patent: March 7, 1989
    Assignee: Honeywell Inc.
    Inventor: David E. Fulkerson
  • Patent number: 4784721
    Abstract: A microbridge air flow sensor having a silicon nitride diaphragm formed on the surface of a single crystal silicon wafer. A rectangular 500 angstrom thick sacrificial layer was deposited on the silicon surface before the silicon nitride to define the exact position of the diaphragm. A series of etches from the backside of the wafer is performed to fabricate the device. A first silicon anisotropic etch from the backside is stopped at the sacrificial layer. A sacrificial layer selective etch is applied from the backside first pit to the sacrificial layer to remove all of the rectangular sacrificial layer. Anisotropic etch is again applied into the space created by the removed sacrificial layer whereby the second etch attacks the silicon exposed by the removal of the sacrificial layer and etches downward forming a second anisotropic etch pit. Thus all the etches are from the backside of the silicon wafer.
    Type: Grant
    Filed: February 22, 1988
    Date of Patent: November 15, 1988
    Assignee: Honeywell Inc.
    Inventors: James O. Holmen, Steven D. James, Jeffrey A. Ridley
  • Patent number: 4783591
    Abstract: A color mark sensor utilizing the cumulative chromatic aberration in an extended planar gradient-index (GRIN) lens to provide unambiguous primary color separation in a continuum along the lens axis. An appropriately chosen GRIN lens length provides separation and focus of any primary color from the general polychromatic background.
    Type: Grant
    Filed: November 9, 1987
    Date of Patent: November 8, 1988
    Assignee: Honeywell Inc.
    Inventor: Charles T. Sullivan
  • Patent number: 4762426
    Abstract: A remote passive condition sensor apparatus such as a temperature or humidity sensor apparatus. A corner cube reflector at a remote location, where it is not feasible to have electrical connections or batteries, receives and reflects back radiant energy to an optical readout instrument. Condition responsive elements in the corner reflector affect the amount of reflected radiant energy as a function of the condition sensed.
    Type: Grant
    Filed: December 19, 1986
    Date of Patent: August 9, 1988
    Assignee: Honeywell Inc.
    Inventor: Norman A. Foss
  • Patent number: 4762382
    Abstract: This invention discloses an optical interconnect structure for routing and distributing optical signals on silicon chip carriers to realize high-density packaged optical interconnects for discrete GaAs optoelectronic IC's.
    Type: Grant
    Filed: June 29, 1987
    Date of Patent: August 9, 1988
    Assignee: Honeywell Inc.
    Inventors: Anis Husain, Charles T. Sullivan
  • Patent number: 4752694
    Abstract: A two-dimensional bolometer array having electronic array uniformity correction. The individual resistive sensors in the bolometer array are not electrically uniform and uniformity is a requirement to permit efficient electrical readout of signals. An electronic correction circuit in this invention automatically corrects for non-uniformity in the array.
    Type: Grant
    Filed: January 12, 1987
    Date of Patent: June 21, 1988
    Assignee: Honeywell Inc.
    Inventors: Rudolph R. Hegel, Jr., R. Andrew Wood
  • Patent number: 4739657
    Abstract: The sensors and heater of a microbridge flow sensor are each compensated for non-linear curvature of the resistance versus temperature curve by the use of a section of permalloy in series with a section of platinum thin film resistor. The platinum exhibits non-linearity in one direction and the permalloy exhibits non-linearity in the opposite direction.
    Type: Grant
    Filed: June 22, 1987
    Date of Patent: April 26, 1988
    Assignee: Honeywell Inc.
    Inventors: Robert E. Higashi, Robert G. Johnson
  • Patent number: 4729000
    Abstract: A low power complementary (Al,Ga)As/GaAs heterostructure insulated gate field-effect transistor (HIGFET) approach is described in which the n-channel transistor utilizes an In.sub.x Ga.sub.1-x As semiconductor gate to reduce threshold voltage (V.sub.t) of the n-channel FET to allow low power circuit operation.
    Type: Grant
    Filed: August 1, 1986
    Date of Patent: March 1, 1988
    Assignee: Honeywell Inc.
    Inventor: Jonathan K. Abrokwah